GB/T 25185-2010 in English
VALIDSurface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
- Issued on:2010-09-26
- Implemented on:2011-08-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$185.00
《GB/T 25185-2010表面化学分析 X射线光电子能谱 - 荷电控制和荷电校正方法的报告》由TC38(全国微束分析标准化技术委员会)归口,TC38SC2(全国微束分析标准化技术委员会表面化学分析分会)执行,主管部门为国家标准化管理委员会。
Scope
This standard describes the measurement of the binding energy of energy levels in insulating samples by X-ray photoelectron spectroscopy with the minimum amount of information, and the charge control and charge correction methods that will be used when reporting the analysis results. Method information useful for charge control and charge correction during the measurement process.

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