Optoelectronics
Optoelectronics, Total:59 items.
The international standard classification for "Optoelectronics" includes: Optical measuring instruments , Fiber optic interconnecting devices , Other standards related to quality , Chemical analysis , Optoelectronics. Laser equipment , Measurement of electrical and magnetic quantities , Fibre optic systems in general .
The Chinese standard classification for "Optoelectronics" includes: Electron optics and other physical optics instrument , Carrier communication equipment , Basic standards and general methods , Semiconductor emitting device , Integrated test system , Optoelectronic device assembly , Semiconductor discrete devices in general , Semiconductor photosensing device , Laser device , Technical management , Technical management , Technical management , Microwave and millimeter wave diode and triode , Optical communication equipment .
Group Standards of the People's Republic of China
- T/ZZB 1373-2019 7N photoelectric class hyperpure ammonia
Military Standard of the People's Republic of China-General Armament Department
- GJB 33/22-2011 Semiconductor optoelectronic device.Detail specification for type GO103 photocoupler
- GJB 33/23-2011 Semiconductor optoelectronic device.Detail specification for type GH3201Z-4 photocoupler
- GJB 33/20-2011 Semiconductor optoelectronic device.Detail specification for type GH302 photocoupler
- GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
- GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
- GJB 33/19-2011 Semiconductor optoelectronic device.Detail specification for type GH302-4 photocoupler
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
- GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
- GJB 8119-2013 General specification for semiconductor optoelectronic device
- GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 33768-2017 Rfeliability test method for optoelectronic devices used in telecommunications
- GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
- GB/T 25185-2010 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
- GB/T 31472-2015 Standard guide to charge control and charge referencing techniques in X-ray photoelectron spectroscopy
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 36359-2018 Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes
- GB/T 21194-2007 Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
- GB/T 36360-2018 Semiconductor optoelectronic devices--Blank detail specification for middle power light-emitting diodes
- GB/T 15651.2-2003 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- GB/T 15651-1995 Semiconductor devices Discrete devices and integrated circuits Part 5: Optoelectronic devices
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 18904.5-2003 Semiconductor devices - Part 12-5: Optoelectronic devices - Blank detail specification for pin - Photodiodes with/without pigtail for fibre optic systems or subsystems
- GB/T 18904.3-2002 Semiconductor devices - Part 12-3: Optoelectronic devices-Blank detail specification for light emitting diodes - Display applicaton
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 36358-2018 Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
- GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
- GB/T 18904.4-2002 Semiconductor devices - Part 12-4: Optoelectronic devices-Blank detail specification for pin-FETmoules with/without pigtail for fiber optic systems or sub - Systems
- GB/T 12565-1990 Semiconductor devices Sectional specification for optoelectronic devices
- GB/T 18904.2-2002 Simiconductor devices-Part 12-2:Optoelectronic devices-Blank detail specification for laser diodes modules with pigtail for fiber optic systems or sub-systems
- GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
Professional Standard - Electron
- SJ/T 11400-2009 Semiconductor optoelectronic devices - Blank detail specification for lower-power light-emitting diodes
- SJ 20644.2-2001 Semiconductor optoelectronic devices Detail specification for type GD101 PIN photodiode
- SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
- SJ 50033/138-1998 Semiconductor optoelectronic devices - Detail specification for yellow light-emitting diode for Type GF318
- SJ 50033/99-1995 Semiconductor optoelectronic devices-Detail specification for o/G double colour light emitting diode for Type GF511
- SJ 50033/137-1997 Semiconductor discrete devices-Detail specification for orang-red light emitting diode for Type GF216
- SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
- SJ 50033/143-1999 Semiconductor optoelectronic devices - Detail specification for Type GF1120 red emitting diode
- SJ 50033/57-1995 Semiconductor optoelectronic device Detail specification for red light emitting diode for type GF115
- SJ 50033/113-1996 Semiconductor optoelectronic devices - Detail specification for Type GD3252Y photodiodes
- SJ 20644.1-2001 Semiconductor optoelectronic devices Detail specification for type GD3550Y PIN photodiode
- SJ 50033/111-1996 Semiconductor optoelectronic devices - Detail specification for Type GT16 Si. NPN phototransistor
- SJ 50033/142-1999 Semiconductor optoelectronic devices-Detail specification for Type GF4112 green emitting diode
- SJ 50033/110-1996 Semiconductor optoelectronic devices - Detail specification for Type GR9413 infrared light emitting diode
- SJ 50033/58-1995 Semiconductor optoelectronic device - Detail specification for green light emitting diode for Type GF413
- SJ 50033/112-1996 Semiconductor optoelectronic devices-Detail specification for Type GD3251Y photodiodes
- SJ 50033/136-1997 Semiconductor discrete devices - Detail specification for red light emitting diode for Type GF116
- SJ 50033/139-1998 Semiconductor optoelectronic devices-Detail specification for green light-emitting diode for Type GF4111
- SJ/T 11393-2009 Semiconductor optoelectronic devices - Blank detail specification for power light-emitting diodes
- SJ/T 11405-2009 Semiconductor optoelectronic devices for fibre optic system applications-Part 2:Measuring methods
- SJ 50033/114-1996 Semiconductor optoelectronic devices - Detail specification for Type GD3283Y position sensitive detector
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
- SJ 53930/1-2002 Semiconductor optoelectronic devices detail specification for type GR8813 infrared emitting diode
Professional Standard - Post and Telecommunication
- YD/T 2001.2-2011 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: measuring methods
- YD/T 2342-2011 Reliability Test Method for Optoelectronic Devices Used in Telecommunications
- YD/T 2001.1-2009 Semiconductor optoelectronic devices for fibre optic system applications-Part1: Specification template for essential rating and characteristics
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