GB/T 36360-2018 in English

Background of Standard Formulation and Analysis of Technological Evolution

Background: With the rapid development of semiconductor technology, power light-emitting diodes (LEDs) are increasingly used in lighting, display, and communication. In order to standardize the quality and performance of LED devices and ensure their reliability in different environments, the National Standard of the People's Republic of China GB/T 36360-2018 came into being.

Technological Evolution: From the early GaAlAs-based to the modern GaN-based LEDs, the efficiency and life of power LEDs have been significantly improved. This standard combines the latest technical research results to ensure that its test methods and technical requirements keep pace with the times.

Key Points

Limit Value Requirements (Table 1)

Table 1 lists the limit value requirements of power LEDs under different working conditions, including key parameters such as storage temperature, operating temperature and reverse voltage. These indicators provide a scientific basis for the reliability and durability of the device.

Optoelectronic and Chromaticity Characteristics (Table 2)

Table 2 specifies the optoelectronic and chromaticity characteristics of LEDs in detail, including parameters such as forward voltage, reverse current and luminous intensity. These requirements ensure the performance consistency of LEDs in different applications.

Implementation Suggestions

1. Test Condition Control: In actual testing, the temperature, humidity and voltage conditions specified in the standard should be strictly followed. Especially for reliability testing under high temperature and high humidity environments, the sealing and durability of the equipment must be ensured.
2. Static Sensitivity Protection: Power LEDs are sensitive to static electricity, and anti-static measures must be taken during handling and testing, such as wearing an anti-static wrist strap and using an anti-static workbench.
3. Quality Assessment Category: According to Section 2.6 of the standard, the quality assessment categories of devices are divided into Class I, Class II, and Class III. Different categories require different test methods and sampling plans (such as AQL or LTPD).