SJ 2247-1982 in English

Name: SJ 2247-1982 English Version
Brand: China Standards Store
SKU: SJ2247-1982-EN
Availability: InStock
Rating: 4.9 (128 reviews)

VALID

Outlines dimension for semiconductor optoelectronic devices

Issued on:1982-12-24
Implemented on:1983-07-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $300.00
$291.00

Details of SJ 2247-1982
Sample PDF

Standard No:	SJ 2247-1982
Document status:	VALID
Title in English:	Outlines dimension for semiconductor optoelectronic devices
Title in Chinese:	半导体光电子器件外形尺寸
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	1982-12-24
Implemented on:	1983-07-01
Chinese Classification:	F01-Technical management
Professional Classification:	SJ-Electronics
Related Keywords:	outlines dimension optoelectronic devices devices outlines dimension
Related Topics:	semiconductor light Optoelectronics Optoelectronic devices semiconductor light semiconducting light wave semiconductor photooxidation UV semiconductor gap iso conductor size Semiconductor light agent Two-photon in-body thermoelectric semiconductor Semiconductor UV Spectrum Edge UV Spectrum Semiconductor Semiconductor UV Spectroscopy Semiconductor optoelectronic components general Semiconductors and Photocurrents Optoelectronics Semiconductor UV Data Semiconductor photoelectric properties Optoelectronic device core Dimensions Semiconductor photoelectric properties semiconductor photoluminescence Semiconductor electrostatic in Dimensions Semiconductor Light Performance in vitro gametes Dimensions Semiconductor UV Spectroscopy photon device electronic device External cavity semiconductor laser UV gap semiconductor solid ultraviolet semiconductor UV semiconductor External cavity semiconductor laser UV ruler Exosome size UV semiconductor bandgap UV Spectrum Semiconductor Semiconductor Silicon Particles photon device Foreign electronic accessories UV semiconductor detection sub-optoelectronic device Optoelectronic devices Semiconductor electrostatic in vivo and in vitro half-life Semiconductor electronics Semiconductor lasers at home and abroad Dimensional measurement of semiconductor chips semiconductor semi-quantitative electronics volume photon Semiconductors and UV light Semiconductor UV Diagram Conductors and Electrical Appliances Electronic components Electronic semiconductor equipment transportation Electronic components. Transportation of electronic semiconductor equipment Semiconductor electronics industry anti-static Semiconductor particle number reversal conditions Spectral sample size IEC60747-12 Optoelectronic Devices Electronic semiconductor chemical sampling Semiconductor polishing materials Semiconductor appearance Semiconductor laser appearance Dimensional requirements test Semiconductor light emitting device metrology

More samples: GB 50021-2001(2009) JJG 21-2008 DL/T 368-2010

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