UV semiconductor detection

UV semiconductor detection, Total:78 items.

The international standard classification for "UV semiconductor detection" includes: Optics and optical measurements , Integrated circuits. Microelectronics , Semiconductor devices .

The Chinese standard classification for "UV semiconductor detection" includes: Semiconductor emitting device , Technical management , Inorganic chemicals in general , Microcircuit in general , Semiconductor triode , Thermal Measurement .

Professional Standard - Electron

SJ/T 11818.2-2022 Semiconductor UV Emitting Diodes Part 2: Chip Specifications
SJ/T 11818.1-2022 Semiconductor UV-emitting diodes Part 1: Test methods
SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
SJ/T 11818.3-2022 Semiconductor UV-emitting diodes Part 3: Device Specifications
SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 37131-2018e Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
GB/T 7581-1987 of outlines for semiconductor discrete devices
GB/T 37131-2018(英文版) Nanotechnology - Testing method of UV-visible diffuse reflectance spectrum of semiconductor nanopowder materials

Group Standards of the People's Republic of China

T/SZBSIA 007-2022 Semiconductor die bonder test specification
T/GDCKCJH 081-2023 Field test methods for UV germicidal lamp
T/CIE 120-2021 Semiconductor Integrated Circuit Hardware Trojan Horse Detection Method
T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment

机械工业部

JB/T 6306-1992 Power semiconductor module dimensions

National Metrological Verification Regulations of the People's Republic of China

JJG 363-1984 Semiconductor Themistor Themometer

Military Standard of the People's Republic of China-General Armament Department

GJB 1420A-1999 General Specification for Semiconductor Integrated Circuit Enclosures
GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode

Association Francaise de Normalisation

NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
NF EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IDO system - Part 1: Acoustic variation detection test method
NF EN 60749-3:2017 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 3 : examen visuel externe

British Standards Institution (BSI)

BS IEC 60747-14-11:2021 Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods - External visual examination
19/30390371 DC BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
18/30362458 DC BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD22-B118-2011 Semiconductor Wafer and Die Backside External Visual Inspection

HU-MSZT

MNOSZ 700-16.lap-1955 Detection of Nickel Content in Semiconductors
MNOSZ 700-18.lap-1956 Detection of chlorine content in semiconductors
MSZ 18289/7-1980 Durability testing of construction stones. UV and IR inspection

International Organization for Standardization (ISO)

ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials

German Institute for Standardization

DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
DIN EN 60749-3:2018-01 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017 / Note: DIN EN 60749-3 (2003-04) remains valid alongside this standard until 2020-04-07.
DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
DIN 50446:1995 Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers
DIN 50449-1:1997 Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 1: Carbon in gallium arsenide

International Electrotechnical Commission (IEC)

IEC 60747-14-11:2021 Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

KR-KS

KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
KS C IEC 60749-3-2019 Semiconductor devices — Mechanical and climatic test methods — Part 3: External visual examination

GSO

OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
OS GSO IEC 60749-3:2014 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection
GSO IEC 60749-3:2014 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection

Korean Agency for Technology and Standards (KATS)

KS D 2717-2008(2018) Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS－NIR absorption spectroscopy
KS C IEC 60749-3:2019 Semiconductor devices — Mechanical and climatic test methods — Part 3: External visual examination
KS C IEC 60748-11-1-2020 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-11-1:2004 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

SE-SIS

SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

TR-TSE

TS 2643-1977 Test Procedures For Bemiconductor Detectors For Ionizing Radiation

ES-UNE

UNE-EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Española de Normalización in July of 2017.)

SCC

CEI EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination
CEI EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system Part 1: Test method of sound variation detection
DANSK DS/EN IEC 63364-1:2023 Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection

Indonesia Standards

SNI 16-7060-2004 The measurement of ultraviolet ray radiation at work places

AENOR

UNE-EN 60749-3:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 3: External visual examination.

American Society for Testing and Materials (ASTM)

ASTM F584-06 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
ASTM F584-06e1 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire

Defense Logistics Agency

DLA SMD-5962-88635 REV A-1993 MICROCIRCUIT, DIGITAL, CMOS UV ERASABLE, PROGRAMMABLE LOGIC DEVICE

YU-JUS

JUS E.L8.006-1980 Determiriation ofethanol by enzymatic method (UV-test)
JUS E.L8.013-1980 Determination of starch by enzymatic method (UV -test)

American National Standards Institute （ANSI)

ANSI/IEEE 300:1988 Test Procedures for Semiconductor Charged-Particle Detectors

IN-BIS

IS 5000 OD.11-1971 Semiconductor device size device outline OD11
IS 5000 OB.4-1969 Basic overall dimensions of semiconductor devices OB4
IS 5000 OB.1-1969 Basic overall dimensions of semiconductor devices OB1
IS 5000 OD.1-1969 Semiconductor device size device outline OD1
IS 5000 OD.6-1969 Semiconductor device size device outline OD6
IS 5000 OB.7-1969 Basic overall dimensions of semiconductor devices OB7
IS 5000 OD.2-1969 Semiconductor device size device outline OD2
IS 5000 OD.16-1973 Semiconductor device size device outline OD16
IS 5000 OD.4-1969 Semiconductor device size device outline OD4
IS 5000 OD.31-1981 Semiconductor device size device outline OD31
IS 5000 OD.9-1969 Semiconductor device size device outline OD9
IS 5000 OD.10-1971 Semiconductor device size device outline OD1O
IS 5000 OD.30-1981 Semiconductor device size device outline OD30