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UV Spectrum Semiconductor

UV Spectrum Semiconductor, Total:52 items.

The international standard classification for "UV Spectrum Semiconductor" includes: Optics and optical measurements , Other inorganic chemicals , Analytical chemistry in general , Optoelectronics. Laser equipment , Capacitors , Jewellery .

The Chinese standard classification for "UV Spectrum Semiconductor" includes: Inorganic chemicals in general , Inorganic salt , Electrochemical, thermochemistry and optical profile type analyzer , Special electronic technology material , Technical management , Semiconductor emitting device , Microwave and millimeter wave diode and triode , chromatograph , Artistic handicrafts .


国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 29856-2013 Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
  • GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
  • GB/T 37131-2018e Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
  • GB/T 44567-2024 Optics crystal—Ultraviolet grade calcium fluride crystal
  • GB/T 37131-2018(英文版) Nanotechnology - Testing method of UV-visible diffuse reflectance spectrum of semiconductor nanopowder materials

Professional Standard - Electron

  • SJ 2658.12-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width
  • SJ 2684-1986 Physical demensions for light emitting device of semiconductor
  • SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules
  • SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
  • SJ 2750-1987 Outline dimensions for semiconductor laser diodes
  • SJ/T 11401-2009 Series program for semiconductor light emitting diodes
  • SJ/T 11818.2-2022 Semiconductor UV Emitting Diodes Part 2: Chip Specifications
  • SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
  • SJ/T 11818.1-2022 Semiconductor UV-emitting diodes Part 1: Test methods
  • SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
  • SJ/T 11818.3-2022 Semiconductor UV-emitting diodes Part 3: Device Specifications

Military Standard of the People's Republic of China-General Armament Department

  • GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
  • GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
  • GJB 8190-2015 General specification for semiconductor solid-state light sources for aircraft exterior lighting
  • GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices

Taiwan Provincial Standard of the People's Republic of China

  • CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers

Professional Standard - Education

  • JY/T 022-1996 General rules for ultraviolet and visible absorption spectrometry

Group Standards of the People's Republic of China

Shandong Provincial Standard of the People's Republic of China

  • DB37/T 4115-2020 Jewelry and jade identification by ultraviolet-visible spectroscopy

Professional Standard - Agriculture

Korean Agency for Technology and Standards (KATS)

  • KS D 2717-2008(2018) Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS-NIR absorption spectroscopy
  • KS H ISO 4735-2014(2019) Oils of Citrus-Determination of CD value by ultraviolet spectrometric analysis

Association Francaise de Normalisation

  • NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
  • NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials

International Commission on Illumination (CIE)

  • CIE 151-2003 SPECTRAL WEIGHTING OF SOLAR ULTRAVIOLET RADIATION

KR-KS

  • KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials

British Standards Institution (BSI)

  • BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
  • BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
  • BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
  • BS IEC 60747-14-11:2021 Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

GSO

  • OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
  • GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
  • OS GSO ISO 4735:2015 Oils of Citrus -- Determination of CD value by ultraviolet spectrometric analysis

American Society for Testing and Materials (ASTM)

  • ASTM E2193-16 Standard Test Method for Ultraviolet Transmittance of Monoethylene Glycol (using Ultraviolet Spectrophotometry)
  • ASTM G177-03(2020) Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37° Tilted Surface
  • ASTM G177-03(2012) Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37deg; Tilted Surface
  • ASTM E958-13(2021) Standard Practice for Estimation of the Spectral Bandwidth of Ultraviolet-Visible Spectrophotometers

Spanish Association for Standardization (UNE)

  • UNE-ISO 4735:2009 Oils of Citrus. Determination of CD value by ultraviolet espectrometric analysis

SCC

  • 09/30186157 DC BS ISO 10677. Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
  • CEI 45-35:1997 Standardized test methods of semiconductor X-ray spectrometers

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

  • JEDEC JEP78-1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors

Society of Automotive Engineers (SAE)

NL-NEN

  • NEN 6306-1990 Vegetable and animal oils and fats Determination of extinction co?ffici?nt in the ultraviolet spectre

GOST

  • GOST ISO 24443-2016 Cosmetic sun protection products Method for determining in vitro the value of the protective factor against ultraviolet radiation of spectrum A