UV semiconductor
UV semiconductor, Total:37 items.
The international standard classification for "UV semiconductor" includes: Optics and optical measurements , Optoelectronics. Laser equipment .
The Chinese standard classification for "UV semiconductor" includes: Inorganic chemicals in general , Special electronic technology material , Others , Technical management , Semiconductor emitting device .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
- GB/T 15167-1994 General specification for light source of semiconductor lasers
- GB/T 44567-2024 Optics crystal—Ultraviolet grade calcium fluride crystal
- GB/T 37131-2018(英文版) Nanotechnology - Testing method of UV-visible diffuse reflectance spectrum of semiconductor nanopowder materials
- GB/T 37131-2018e Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
Professional Standard - Electron
- SJ/T 11818.2-2022 Semiconductor UV Emitting Diodes Part 2: Chip Specifications
- SJ/T 11818.3-2022 Semiconductor UV-emitting diodes Part 3: Device Specifications
- SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
- SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
- SJ 2750-1987 Outline dimensions for semiconductor laser diodes
- SJ 2684-1986 Physical demensions for light emitting device of semiconductor
- SJ/T 11818.1-2022 Semiconductor UV-emitting diodes Part 1: Test methods
- SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules
Military Standard of the People's Republic of China-General Armament Department
- GJB 8190-2015 General specification for semiconductor solid-state light sources for aircraft exterior lighting
- GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
- GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
Professional Standard - Light Industry
- QB/T 8038-2024 Device for object surface disinfection based on UV or UV photocatalysis
Group Standards of the People's Republic of China
- T/QGCML 4031-2024 Semiconductor optical wafer
- T/QGCML 4323-2024 Intelligent semiconductor six-sided appearance optical image sorter
Association Francaise de Normalisation
- NF ISO 10677:2011 Technical ceramics - UV light sources for testing photocatalytic semiconductor materials
- NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
Korean Agency for Technology and Standards (KATS)
- KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
- KS D 2717-2008(2018) Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS－NIR absorption spectroscopy
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
British Standards Institution (BSI)
- BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- 09/30186157 DC BS ISO 10677. Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
- BS IEC 60747-5-4:2022+A1:2024 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
- BS IEC 60747-14-11:2021 Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
- 25/30510635 DC Draft BS EN 63567-3 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
GCC Standardization Organization
- GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
Society of Automotive Engineers (SAE)
- SAE AIR5468-2000 Ultraviolet (UV) Lasers for Aerospace Wire Marking
International Electrotechnical Commission (IEC)
- IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 60747-5-4:2022+AMD1:2024 CSV Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 60747-5-4:2024 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
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