Semiconducting sulfur

Semiconducting sulfur, Total:466 items.

The international standard classification for "Semiconducting sulfur" includes: Optoelectronics. Laser equipment , Semiconductor devices in general , Semiconducting materials , Rectifiers. Convertors. Stabilized power supply , Chemical analysis , Plug-and-socket devices. Connectors , Nuclear energy in general , Testing of metals , Other products of non-ferrous metals , Aluminium products , Therapy equipment .

The Chinese standard classification for "Semiconducting sulfur" includes: Optoelectronic device assembly , Technical management , Technical management , Technical Management , Technical management , Technical management , Semiconductor discrete devices in general , Semimetal and semiconductor material in general , Special electronic technology material , Power semiconductor device and parts , Precious metals and their alloys , Laser device , Industrial gas and chemical gas , Connector , Nuclear instrument and detector in general , Metal physical property test method , Others , Semimetal , Temperature and pressure instrument , Light metals and their alloys , Thermal Measurement .

Professional Standard - Electron

SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
SJ 2433-1984 Bonding sheet for semiconductor tubes
SJ/T 11395-2009 Semiconductor lighting terminology
SJ/T 10414-2015 Solder for semiconductor device
SJ/T 10414-1993 Solder for semicoductor device
SJ/Z 9021.1-1987 Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices
SJ 50033/5-1994 Semiconductor discrete device-Detail specification for semiconductor yellow light emitting diodes for type GF311 of GP and GT classes
SJ 20786-2000 General specification for semiconductor opto-electronic assembly
SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
SJ 20072-1992 Semiconductor discrete device-Detail specification for semiconductor opto-couplers for Type GH24,GH25 and GH26
SJ/T 10535-1994 Tungsten boat for semiconductor devices
SJ/T 11775-2021 Multi-wire saw used for semiconductor materials
SJ 20642-1997 Semiconductor opto-electronic module-General specification for
SJ 50033/3-1994 Semiconductor discrete device - Detail specification for semiconductor opto-couplers for type GH21, GH22 and GH23 of GP, GT and GCT classes

Military Standard of the People's Republic of China-General Armament Department

GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
GJB 597A-1996 General Specification for Semiconductor Integrated Circuits
GJB 33-1985 General Specification for Semiconductor Discrete Devices
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
GJB 33A-1997 General Specification for Semiconductor Discrete Devices
GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 37031-2018 Semiconductor lighting terminology
GB/T 15872-2013 Power supply interface for semiconductor equipment
GB/T 7678-1987 Semiconductor self-commutated convertors
GB/T 34971-2017 Guide for gaseous effluent handling in semiconductor industry
GB/T 8750-1997 Gold wire for semiconductor devices lead bonding
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
GB/T 7677-1987 Semiconductor direct d. c. convertors
GB/T 8646-1998 Fine aluminum-1% silicon wire for semiconductor lend-bonding
GB/T 45716-2025 Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)
GB/T 31469-2015 Semiconductor materials cutting fluid
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 15167-1994 General specification for light source of semiconductor lasers
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 31359-2015 Test methods of semiconductor lasers
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 15651.4-2017 Semiconductor devices-Discrete devices-Part 5-4:Optoelectronic devices-Semiconductor lasers
GB/T 3859.2-1993 Semiconductor convertors Application guide
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 8750-2007 Gold bonding wire for semiconductor devices
GB/T 31358-2015 General specification for semiconductor lasers
GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
GB/T 3859.4-2004 Semiconductor converter - Self-commutated semiconductor converters including direct d.c.converters
GB/T 8750-2014 Gold bonding wire for semiconductor package
GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
GB/T 14264-1993 Semiconductor materials－Terms and definitions
GB/T 45719-2025 Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors
GB/T 17950-2000 Semiconductor converter - Part 6: Application guide for the protection of semiconductor converters against overcurrent by fuses

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1873-2016 semiconductor refrigeration wine cabinet

Professional Standard - Light Industry

QB/T 5369-2019 Semiconductor refrigeration appliance

Group Standards of the People's Republic of China

T/CIET 776-2024 Technical Requirements for Special Gases for Semiconductors
T/QGCML 4122-2024 Semiconductor chip sorting machine
T/CASAS 002-2021 Terminology for wide bandgap semiconductors
T/ZSA 224-2024 Equipment front end module
T/ZZB 1718-2023 Gold bonding wire for semiconductor package
T/CASME 581-2023 Technical requirements for silicon rings for semiconductors
T/QGCML 4030-2024 Semiconductor car heating and cooling box
T/CIET 765-2024 Thermally conductive silicone gel for semiconductor chip packaging
T/CECA 35-2019 Metal oxide semiconductor gas sensor
T/CASME 1438-2024 Semiconductor device processing specification
T/CASME 698-2023 Semiconductor laser therapy apparatus
T/CEEIA 782-2024 Low-voltage Semiconductor（solidstate） Circuit-Breaker
T/CIET 722-2024 High purity sputtering targets for semiconductors
T/CEMIA 030-2022 Positive photoresist developer for semiconductor manufacture
T/ZZB 1718-2020 Gold bonding wire for semiconductor package
T/CIET 941-2024 Semiconductor etching equipment
T/IAWBS 019-2023 Equipment front end module
T/JGXH 008-2020 Diode pump solid state laser
T/JSXH 0002-2020 Regeneration solution for semiconductor
T/QGCML 4031-2024 Semiconductor optical wafer

Guizhou Provincial Standard of the People's Republic of China

DB52/T 796-2013 Industrial semiconductor electric detonator
DB52/T 844-2013 Semiconductor Current Regulator

Professional Standard - Machinery

JB/T 10097-1999 Cases for Power Semiconductor Devices
JB/T 11828-2014 Coal-fired Dry/Semi-dry Flue Gas Desulphurization Equipment - Commissioning Guide
JB/T 5537-2006 Semiconductor pressure sensors
JB/T 10097-2000 Case for power semiconductor device
JB/T 7059-1993 Guide for Preparation of Standard for Power Semiconductor Modules
JB/T 8661-1997 Construction Parts of Electric Semiconductor Modules
JB/T 4277-1996 Packing of Power Semiconductor Parts
JB/T 10096-2000 Selection guidance of case for power semiconductor device

Professional Standard - Aerospace

QJ 2225-1992 Semiconductor Device Usage Rules
QJ 1511-1988 Acceptance Specification for Semiconductor Devices

Taiwan Provincial Standard of the People's Republic of China

CNS 7011-1981 Numbering of Electrodes in Multiple Electrode Semiconductor Devices and Designation of Units in Multiple Unit Semiconductor Devices
CNS 6137-1988 Color Coding of Discrete Semiconductor Devices

Professional Standard - Post and Telecommunication

YD 576-1992 Semiconductor rectifier equipments For telecommunications

Professional Standard - Non-ferrous Metal

YS/T 641-2007 Aluminium wire for semiconductor lead bonding
YS/T 1105-2024 Silver bonding wire for semiconductor package
YS/T 678-2008 Copper wire for semiconductor lead bonding
YS/T 543-2006 Fine aluminum-1% silicon wire for semiconductor lend-bonding
YS/T 641-2024 Aluminum bonding wire for semiconductor package
YS/T 1105-2016 Silver bonding wire for semiconductor package
YS/T 678-2024 Copper bonding wire for semiconductor package

Professional Standard - Medicine

YY/T 0998-2015 Semiconductor heating and/or cooling therapy equipment

Fujian Provincial Standard of the People's Republic of China

DB35/T 1193-2011 Semiconductor LED chip

National Metrological Verification Regulations of the People's Republic of China

JJG 363-1984 Semiconductor Themistor Themometer

Magyar Szabványügyi Testület

MNOSZ 700-15.lap-1955 Determination of sulfate content in STMicroelectronics
MSZ 700/41.lap-1961 STMicroelectronics testing. Quickly determine total sulfur content
MSZ 9200/18-1980 Electronic signals. semiconductor
MSZ 700/23.lap-1965 STMicroelectronics tests coke
MNOSZ 700-16.lap-1955 Detection of Nickel Content in Semiconductors
MSZ 700/24.lap-1965 STMicroelectronics Coke Test
MNOSZ 700-18.lap-1956 Detection of chlorine content in semiconductors
MNOSZ 700-19.lap-1955 STMicroelectronics Pitch Content
MSZ 771/5-1979 Mechanical properties of semiconductor materials
MSZ 700/36.lap-1961 Semiconductor testing experiments in coal mines

German Institute for Standardization

DIN EN IEC 62969-2:2018-09*VDE 0884-69-2:2018-09 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN IEC 62969-4:2019-03*VDE 0884-69-4:2019-03 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN IEC 62969-1:2018-08*VDE 0884-69-1:2018-08 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN IEC 62969-3:2018-12*VDE 0884-69-3:2018-12 Semiconductor devices – Semiconductor interface for automotive vehicles
DIN EN 62779-2:2017-01*VDE 0884-79-2:2017-01 Semiconductor devices – Semiconductor interface for human body communication
DIN EN 62779-1:2017-01*VDE 0884-79-1:2017-01 Semiconductor devices – Semiconductor interface for human body communication
DIN EN 62779-3:2017-03*VDE 0884-79-3:2017-03 Semiconductor devices – Semiconductor interface for human body communication
DIN IEC 747-11:1992 Semiconductor devices; Sectional specification for semiconductor devices
DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN VDE V 0884-11:2017-01*VDE V 0884-11:2017-01 Semiconductor devices
DIN 4518-3:1974 Semiconductor Paper
DIN EN IEC 60747-17:2021-10*VDE 0884-17:2021-10 Semiconductor devices
DIN EN IEC 60747-5-5:2021-10*VDE 0884-5:2021-10 Semiconductor devices
DIN IEC 60747-14-5 E:2008-03 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
DIN EN 60146-2:2001-02*VDE 0558-2:2001-02 Semiconductor converters
DIN IEC 60747-14-5 E:2008 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
DIN EN 62258-1:2011-04*VDE 0884-101:2011-04 Semiconductor die products
DIN EN IEC 63244-1:2023-11*VDE 0884-244-1:2023-11 Semiconductor devices – Semiconductor devices for wireless power transfer and charging
DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.
DIN EN 60747-15:2004 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2003); German version EN 60747-15:2004
DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
DIN EN IEC 63287-1:2020-06 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020 / Note: Date of issue 2020-05-08*Intended as replacem...
DIN 40700-8:1972 Semiconductor device graphic symbols
DIN IEC 60747-14-4 E:2002-09 Draft Document - Discrete semiconductor devices - Part 14-4: Semiconductor accelerometers (IEC 47E/220/CD:2002)
DIN EN 62779-1 E:2013-01 Draft Document - Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (IEC 47/2152/CD:2012)
DIN EN 60146-2:2001 Semiconductor convertors - Part 2: Self-commutated semiconductor convertors including direct d.c. convertors (IEC 60146-2:1999); German version EN 60146-2:2000
DIN IEC 60747-14-4 E:2002 Draft Document - Discrete semiconductor devices - Part 14-4: Semiconductor accelerometers (IEC 47E/220/CD:2002)
DIN 44476-3:1982 Semiconductor devices and integrated circuits
DIN EN 62880-1 E:2014-08 Semiconductor devices - Semiconductor wafer level reliability - Part 1: Copper stress migration test method
DIN IEC 60747-10:1987 Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
DIN EN 62779-2 E:2013-01 Draft Document - Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (IEC 47/2153/CD:2012)
DIN VDE 0556:1966 Regulations for polycrystal semiconductor-rectifiers
DIN EN 62779-1 E:2013 Draft Document - Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (IEC 47/2152/CD:2012)
DIN IEC 60747-10:1987-10 Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe

British Standards Institution (BSI)

BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS IEC 60747-5-4:2022+A1:2024 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
BS IEC 60747-5-13:2021 Semiconductor devices. Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
BS EN IEC 60747-15:2024 Semiconductor devices - Discrete devices. Isolated power semiconductor devices
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
07/30164953 DC IEC 60747-14-5. Semiconductor devices. Discrete devices. Part 14-5. Semiconductor sensors. PN-junction semiconductor temperature sensor
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication
BS PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS IEC 60747-1:2006 Semiconductor devices. General
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS IEC 60747-1:2006+A1:2010 Semiconductor devices - General
BS EN 62779-3:2016 Semiconductor devices. Semiconductor interface for human body communication. Functional type and its operational conditions
BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
05/30137514 DC IEC 60747-14-4. Discrete semiconductor devices. Part 14-4. Semiconductor accelerometers
23/30478757 DC BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines - Part 3. Guidelines for reliability qualification plans for power semiconductor module
BS PD IEC TR 63378-1:2021 Thermal standardization on semiconductor packages-Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
13/30264596 DC BS EN 60747-14-7. Semiconductor devices. Part 14-7. Semiconductor sensor. Flow meter
PD IEC TR 63378-1:2021 Thermal standardization on semiconductor packages. Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
BS EN IEC 62969-1:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS EN 60191-4:2000 Mechanical standardization of semiconductor devices-Coding system and classification into forms of package outlines for semiconductor device packages
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
08/30181404 DC BS IEC 60747-14-3. Semiconductor devices. Part 14-3. Semiconductor sensors. Pressure sensors
BS 4417:1969 Specification for semiconductor rectifier equipments
07/30162213 DC BS EN 60747-15. Semiconductor devices. Discrete devices Part 15. Isolated power semiconductor devices
19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
13/30264591 DC BS EN 60747-14-6. Semiconductor devices. Part 14-6. Semiconductor sensor. Humidity sensor
BS 3934-1:1992 Mechanical standardization of semiconductor devices - Recommendations for the preparation of drawings of semiconductor devices
BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
BS 3363:1968 Schedule of letter symbols for semiconductor devices
23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
BS EN IEC 62969-4:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. Evaluation method of data interface for automotive vehicle sensors
23/30451654 DC BS EN IEC 60747-15. Semiconductor devices. Part 15. Isolated power semiconductor devices. Discrete devices
08/30181401 DC BS IEC 60747-14-1. Semiconductor devices. Part 14-1. Semiconductor sensors. Generic specification for sensors
BS EN IEC 60749-34-1:2025 Semiconductor devices. Mechanical and climatic test methods - Power cycling test for power semiconductor module
13/30264600 DC BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid
BS 3934-4:1992 Mechanical standardization of semiconductor devices-Recommendations for a coding system and classification into forms of package outlines for semiconductor devices
BS 3934-6:1992 Mechanical standardization of semiconductor devices-Specification for the preparation of outline drawings of surface mounted semiconductor device packages

Czech Standards Institute (UNMZ)

CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
CSN 35 8701 Z1-1997 Semiconductor naming
CSN 35 1531-1973 Silicon semiconductor rectifiers
CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
CSN 35 1530-1979 Power semiconductor converters
CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance
CSN 01 3368-1990 Graphical symbols for semiconductor devices
CSN 34 5910-1986 Gold bonding wire for semiconductor devices
CSN 01 3347-1989 Graphical symbols for semiconductor devices
CSN 35 8773-1977 Meaaurement of semiconductor devices. Thyristors. Meaaurement of blocking current and reverse blocking current.
CSN 35 8710-1975 Letter symbols for semiconductor devices
CSN 35 1540-1979 Tests of power semiconductor converters
CSN 35 1560-1969 Power semiconductor Rectifiers

Standard Association of Australia （SAA）

AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
AS C379.1:1970 Mechanical standardization of semiconductor devices - Preparation of drawings of semiconductor devices
AS 60146.2:2001/Amdt 1:2001 Semiconductor converters Self-commutated semiconductor converters include direct-to-dc converters
AS 60146.2:2001(R2013) Semiconductor converters Self-commutated semiconductor converters include direct-to-dc converters
AS 60146.2:2001 Semiconductor converters - Self-commutated semiconductor converters including direct d.c. converters
AS 1955.3:1983 Semiconductor Convertors, Part 3: Semiconductor Direct D.C. Convertors (D.C. Chopper Convertors)

GCC Standardization Organization

GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
GSO IEC 60747-14-2:2014 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
GSO IEC 62779-1:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
GSO IEC 60747-14-1:2014 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
GSO IEC 60747-14-3:2014 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
GSO IEC 62779-2:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
GSO IEC 63287-1:2024 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
GSO IEC 60747-14-4:2014 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
GSO IEC 62779-3:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions

International Electrotechnical Commission (IEC)

IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
IEC 60146:1973 Semiconductor convertors
IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
IEC 60747-5-4:2022+AMD1:2024 CSV Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-14-3:2001 Semiconductor devices - Part 14-3: Semiconductor sensors; Pressure sensors
IEC 60747-5-4:2024 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)
IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
IEC 60747-15:2024 RLV Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devices (Edition 1.0)
IEC 60747-15:2024 Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
IEC 60747-5-13:2021 Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60146-3:1977 Semiconductor Convertors Part 3: Semiconductor Direct D.C. Convertors (D.C. Chopper Convertors) (Edition 1.0)
IEC 60747-5-4:2022/AMD1:2024 Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 62779-1:2016 Dispositifs à semiconducteurs – Interface à semiconducteurs pour les communications via le corps humain – Partie 1: Exigences générales (Edition 1.0)
IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
IEC 60191-1:1966 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices
PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits
IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
IEC 62951-7:2019 Semiconductor devices – Flexible and stretchable semiconductor devices – Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor (Edition 1.0)
IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
IEC 60191-1C:1974 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices.
IEC 60191-1A:1969 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices.
IEC 60146A:1974 first supplement - Semiconductor convertors
IEC 60146:1973/AMD1:1975 Amendment 1 - Semiconductor convertors
IEC 60148:1963 Letter symbols for semiconductor devices
IEC 60146-2:1999 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters

Japan Electronics and Information Technology Industries Association

JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

Yugoslav Association for Standardization

JUS N.R1.322-1979 Semiconductor components THYRISTORS Terms and definitions
JUS N.A3.500-1980 Semiconductor devices. Graphical symbols
JUS N.R1.520-1988 Discrete Semiconductor Components DRAWING REQUIREMENTS
JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes
JUS N.R1.352-1979 Letter symbohfor semkonductor devices. Thyristors.

American Society for Testing and Materials (ASTM)

ASTM STP 850-1984 Semiconductor processing
ASTM STP 960-1987 Emerging Semiconductor Technologies
ASTM F42-02 Test methods for conductivity types of semiconductor materials
ASTM F1191-88 Guidelines for Radiation Testing of Semiconductor Memory
ASTM STP 990-1989 Semiconductor Manufacturing Technology and Metrology

National Electrical Manufacturers Association（NEMA)

NEMA CB-4:1989 Semiconductor Graphite

National Fire Protection Association (NFPA)

NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

European Committee for Electrotechnical Standardization（CENELEC）

EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
EN IEC 60747-15:2024 Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
EN 60747-15:2004 Discrete semiconductor devices Part 15: Isolated power semiconductor devices
EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

Aerospace Industries Association

AIA NAS717 Semiconductor Diodes

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 256-1963 SEMICONDUCTOR DIODES
IEEE 59-1962 SEMICONDUCTOR RECTIFIER COMPONENTS

Comitato Elettrotecnico Italiano

CEI EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements
CEI EN 62258-1:2011 Semiconductor devices - Semiconductor die products Part 1: Procurement and use
CEI EN 60747-15:2012 Semiconductor devices - Discrete devices Part 15: Isolated power semiconductor devices
CEI EN IEC 60747-15:2025 Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
CEI EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances
CEI EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
CEI EN 62779-3:2017 Semiconductor devices - Semiconductor interface for human body communication Part 3: Functional type and its operational conditions
CEI EN 60146-2:2001 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
CEI EN IEC 63287-1:2022 Semiconductor devices - Generic semiconductor qualification guidelines Part 1: Guidelines for IC reliability qualification

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO IEC 60747-14-2:2016 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
BH GSO IEC 60747-14-4:2016 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
BH GSO IEC 62779-1:2022 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
BH GSO IEC 60747-15:2016 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
BH GSO IEC 60747-14-1:2016 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
BH GSO IEC 60747-5-4:2016 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
BH GSO IEC 60146-2:2016 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters

Association Francaise de Normalisation

NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements
NF EN IEC 60747-15:2024 Semiconductor devices - Part 15 : discrete devices - Isolated power semiconductor devices
NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15: isolated semiconductor power devices
NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
NF C96-015*NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices
NF C53-221:1980 Semiconductor self-commutated convertors.
NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for communications via the human body - Part 1: General requirements
NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF EN 62417:2010 Semiconductor Devices – Mobile Ion Testing for Metal Oxide Field Effect Semiconductor Transistors (MOSFETs)
NF C96-779-3*NF EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3 : functional type and its operational conditions
NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for communications via the human body - Part 2: Characterization of interfacing performance
NF C96-287-1*NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : guidelines for IC reliability qualification
NF C53-221*NF EN 60146-2:2002 Semiconductor converters - Part 2 : self-commutated semiconductor converters including direct d.c. converters
NF C96-611/A1:1972 Semiconductors Junction transistors Particular Standard Sheets
NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Integrated circuit reliability qualification guidelines

Korean Agency for Technology and Standards (KATS)

KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR
KS C IEC 60747-14-1:2003 Semiconductor devices － Part 14 － 1: Semiconductor sensors － General and classification
KS C IEC 60747-14-1:2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors
KS C IEC 60747-14-1-2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors
KS C IEC 60747-14-1-2019 Semiconductor devices — Part 14-1: Semiconductor sensors —Generic specification for sensors
KS C IEC 60747-14-1:2019 Semiconductor devices — Part 14-1: Semiconductor sensors —Generic specification for sensors
KS C 7013-1985 TYPE DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
KS C 7013-1971(2000) TYPE DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
KS C IEC 60146-6-2013 Semiconductor convertors － Part 6: Application guide for the protection of semiconductor convertors against overcurrent by fuses
KS C IEC 60146-2:2002 Semiconductor converters － Part 2: Self-commutated converters including direct d.c. converters
KS C IEC 60050-521-2022 Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2022) Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2017) Semiconductor devices and integrated circuits

Swedish Institute for Standards

SIS SEN 01 03 51-1966 Semiconductor devices Terminology
SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SS-EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
SS-EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SS-EN IEC 63287-1:2022 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
SS-EN 60146-2:2000 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
SIS SEN 01 26 51-1969 Symbols for electrical diagrams Semi-conductors

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC 60747-14-4:2014 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
OS GSO IEC 60747-14-3:2014 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
OS GSO IEC 60747-14-1:2014 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
OS GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
OS GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
OS GSO IEC 60146-2:2014 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters

Danish Standards Foundation

DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
DANSK DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
DANSK DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
DANSK DS/EN 62779-3:2016 Semiconductor devices – Semiconductor interface for human body communication – Part 3: Functional type and its operational conditions
DS/EN 60146-2:2000 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters

Defense Logistics Agency

DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
DLA MIL-PRF-19500 N-2005 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
DLA DESC-DWG-84002-1984 HEAT SINKS FOR SEMICONDUCTOR DEVICES
DLA QML-19500-QPD-2012 Semiconductor Devices, General Specification for
DLA MIL-S-19500/529 VALID NOTICE 4-2011 Semiconductor Device, Transistor, Silicon Type 2N3904
DLA QML-19500-31-2007 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
DLA QML-19500-2013 Semiconductor Devices, General Specification for
DLA QML-19500-QPD-2011 Semiconductor Devices, General Specification for
DLA MIL-STD-750F w/CHANGE 3-2021 Test Methods for Semiconductor Devices
DLA MIL-S-19500/216 A VALID NOTICE 3-2004 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON TYPE 2N1051
DLA QML-19500-2011 Semiconductor Devices, General Specification for
DLA QML-19500-QPD-2010 Semiconductor Devices, General Specification for
DLA QML-19500-2012 Semiconductor Devices, General Specification for
DLA MIL-S-19500/273 A VALID NOTICE 3-2011 Semiconductor Device, Transistor Type Type 2N744
DLA MIL-S-19500/303 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
DLA DSCC-DWG-91011 REV B-2003 SEMICONDUCTOR DEVICE, DIODE, ULTRA FAST
DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
DLA MIL-S-19500/179 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N1234
DLA MIL-S-19500/288 VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N2377
DLA MIL-PRF-19500/139 B NOTICE 2-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE JAN-2N1119
DLA MIL-S-19500/40 B VALID NOTICE 3-2011 Semiconductor, Transistor, NPN, Germanium, Power Type 2N326
DLA MIL-S-19500/170 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Type 2N1499A
DLA MIL-S-19500/216 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon Type 2N1051
DLA MIL-S-19500/288 (2)-1966 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE 2N2377
DLA MIL-STD-750 F CHANGE 1-2013 TEST METHODS FOR SEMICONDUCTOR DEVICES
DLA MIL-PRF-19500/210 B NOTICE 1-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, PHOTO TYPE 2N986

Belgian Standards Institute

NBN C 95-001-1977 Semiconductor equipment. the term
NBN C 95-001-1973 Semiconductor devices. specialized vocabulary

US-Unspecified Preparing Activity

DI-QCIC-80924 A-2006 SEMICONDUCTOR PROCESS SPECIFICATION

Military Standards (MIL-STD)

MIL MIL-DTL-19491J-2014 Semiconductor Devices, Packaging of
MIL MIL-S-19500/530-1979 SEMICONDUCTOR DEVICE, TRANSISTOR, SILICON TYPE 2N3906
MIL MIL-S-19500/529-1978 SEMICONDUCTOR DEVICE, TRANSISTOR, SILICON TYPE 2N3904
MIL MIL-PRF-19500P-2010 Semiconductor Devices, General Specification for
MIL MIL-S-19500/288-1964 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE 2N2377
MIL MIL-S-19500/289-1964 Semiconductor Device, Transistor, PNP, Silicon Type 2N2378
MIL MIL-S-19500/303-1964 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
MIL MIL-STD-750D-1995 SEMICONDUCTOR DEVICES (SUPERSEDING MIL-STD-750C)

Gosstandart of Russia

GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
GOST R 57439-2017 Semiconductor devices. Basic dimensions
GOST R 71055-2023 Semiconductor devices. System of designations
GOST 18472-1988 Semiconductor devices. Basic dimensions
GOST 11630-1984 Semiconductor devices. General specification
GOST 24458-1980 Semiconductor optoelectronic couplers. Essential parameters
GOST R 70999-2023 Semiconductor diodes. Parameters system
GOST R 57436-2017 Semiconductor devices. Terms and definitions
GOST 17465-1980 Semiconductor diodes. Basic parameters
GOST R 71069-2023 Semiconductor emitters. Parameters system
GOST 26239.7-1984 Semiconductor silicon. Method of oxygen, carbon and nitrogen determination
GOST 15133-1977 Semiconductor devices. Terms and definitions
GOST 24352-1980 Semiconductor photoemitters. Main parameters
GOST 26284-1984 Semiconductor power converters. Conventional designations
GOST 35101-2024 Semiconductor relays. Safety requirements

Spanish Association for Standardization (UNE)

UNE-EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)
UNE-EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
UNE-EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
UNE 20846-3:1994 SEMICONDUCTOR CONVERTORS. PART 3: SEMICONDUCTOR DIRECT D.C. CONVERTORS (D.C. CHOPPER-CONVERTORS).
UNE-EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions (Endorsed by AENOR in July of 2016.)
UNE-EN 60146-2:2000 Semiconductor converters -- Part 2: Self-commutated semiconductor converters including direct d.c. converters (Endorsed by AENOR in December of 2001.)

The Institution of Engineering and Technology (IET)

HIST WLD SEMI IND-1990 A History of the World Semiconductor Industry

Underwriters Laboratories (UL)

UL 1557-1993 Electrically isolated semiconductor devices
UL 1557-2011 Electrically isolated semiconductor devices
UL 1557-1997 Electrically isolated semiconductor devices
UL 1557-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices Fourth Edition; Reprint with Revisions through and Including 6/26/2006

Electrostatic Discharge Association (ESDA)

ESD EP118-2007 Physics of Semiconductor Devices

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD14-1986 Semiconductor Power Control Modules
JEDEC JEP140-2002 Beaded Thermocouple Temperature Measurement of Semiconductor Packages
JEDEC JESD370B-1982 Designation System for Semiconductor Devices
JEDEC EIA-323-1966 Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices

Polski Komitet Normalizacyjny (PKN)

PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
PN T01503 ArkusZ50-1973 Information processing Database management systems Performance testing
PN T01503 ArkusZ06-1973 Semiconductor devices Dimensions Device A 24
PN T01503 ArkusZ16-1973 Semiconductor devices Dimensions Device A 51
PN T01503 ArkusZ01-1972 Semiconductor components Outlines and dimensions Complete component A1
PN T01503 ArkusZ15-1973 Information Processing Image Coding Standards

National Standardisation Body (ASRO)

STAS 1590/10-1974 SEMICONDUCTOR DEVICES Graphical symbols
STAS 11066/2-1980 THYRISTORS Test methods
STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology
STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology

Bureau of Indian Standards

IS 4411-1967 Semiconductor device name code
IS 5001 Pt.1-1969 Semiconductor Device Drawing Guide
IS 5001-1969 Semiconductor Device Drawing Guide
IS 5000 OC.4-1969 Semiconductor device size CASE OUTLINE OC4
IS 7412-1974 Life test of semiconductor devices
IS 5000 OD.34-1981 Semiconductor device size DEVICE OUTLINE 34

Association for Electrical, Electronic & Information Technologies (VDE)

VDE 0660-109-1986*DIN VDE 0660-109:1986 Switchgear and controlgear; Low-voltage switchgear and controlgear, Semiconductor contactors

The Institute of Electrical Engineers of Japan

JEC 2440-2005 SEMICONDUCTOR SELF-COMMUTATED CONVERTERS
JEC 2407-2007 INSULATED TYPE POWER SEMICONDUCTOR MODULES

Indonesia Standards

SNI 19-0429-1989 Guide for sampling of liquid and semi solid materials

Thai Industrial Standards Institute (TISI)

TIS 1863-2009 Semiconductor devices.discrete devices

Lithuanian Standards Office

LST EN 60747-15-2012 Semiconductor devices - Discrete devices -- Part 15: Isolated power semiconductor devices (IEC 60747-15:2010)
LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
LST 1412-1995 Semiconductor devices. Terms and definitions

South African Bureau of Standard

SANS 60146-2:1999 Semiconductor converters Part 2: Self-commutated semiconductor converters including direct d.c. converters
SANS 60146-6:1992 Semiconductor convertors Part 6: Application guide for the protection of semiconductor convertors against overcurrent by fuses

Ente Nazionale Italiano di Unificazione

UNI ISO 21400:2019 Pulp -- Determination of cellulose nanocrystal sulfur and sulfate half-ester content

SCC

FM Approvals 7701:2022 Tools Used in the Semiconductor Industry

Aerospace Industries Association/ANSI Aerospace Standards

NAS717-1963 Semiconductor Diodes (Rev 1)

European Standard for Electrical and Electronic Components

CECC MUAHAG VOL 9 IS 4-1993 Preferred Products List; Semiconductors (En)

American National Standards Institute （ANSI)

ANSI/EIA 370-B:1992 Semiconductor Devices, Designation System for
ANSI/EIA 321-C:1987 Numbering of Like-Named Terminal Functions in Semiconductor Devices and Designation of Units in Multiple-Unit Semiconductor Devices

Japanese Industrial Standards Committee (JISC)

JIS C 8377:2021 Requirements for fuse-links for the protection of semiconductor devices