GB/T 31359-2015 in English

VALID

Test methods of semiconductor lasers

Issued on:2015-02-04
Implemented on:2015-08-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $470.00
$456.00

Standard No:	GB/T 31359-2015
Document status:	VALID
Title in English:	Test methods of semiconductor lasers
Title in Chinese:	半导体激光器测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2015-02-04
Implemented on:	2015-08-01
ICS Classification:	31.260-Optoelectronics. Laser equipment
Chinese Classification:	L51-Laser device
Professional Classification:	GB-National Standard
Related Keywords:	semiconductor lasers semiconductor lasers scopethis standard test methods semiconductor laser components semiconductor
Related Topics:	semiconductor light laser A semiconductor laser Semiconductor gap measurement semiconductor light semiconducting light wave semiconductor photooxidation Semiconductor Test Program Semiconductor Test Instruments Semiconductor light agent laser unit Semiconducting sulfur spectral laser Semiconductors and Photocurrents Laser Half Maximum Width A semiconductor laser fluid laser laser semiconductor Laser Half Maximum Width Laser half width semiconductor laser semiconductor photoluminescence Semiconductor Light Performance laser half width Clustered Diode Laser Span zero Laser Test Instrument Series Diode Lasers External cavity semiconductor laser laser detector External cavity semiconductor laser small semiconductor laser Femtosecond Laser Detection laser detector Diode Laser Orientation unit laser Semiconductor paint Laser half width laser fluid semiconductor laser spectral laser laser fluid Semiconductor Optical Measurement GB/T 31359-2015 Semiconductor laser test method gb/t+31359 Semiconductor Test Technology Semiconductor Test Technology Laser test method Old-fashioned semiconductor laser Semiconductor temperature test Laser Instrument Method edge semiconductor laser Zero span Principles of Semiconductor Testing GB/T 31359 High energy semiconductor laser Domestic semiconductor laser Domestic Fiber Diode Laser Semiconductor lasers at home and abroad organic semiconductor laser Semiconductor laser instrument Laser Standard Series Diode Lasers Test methods for portable lasers alaser Semiconductor Laser Series Laser Test Laser Test Semiconductor Kelvin Test laser method GBT31359 GB/T 31359-2015 conductor Semiconductor laser structure Round laser test instrument EFA and PFA Semiconductors Laser measurement of conductivity laser transmission medium Semiconductor material luminescence characteristics testing Semiconductor Laser General Preparation method of semiconductor materials Semiconductor polishing materials Preparation method of compound semiconductor Laser emission wavelength test method Semiconductor laser radiation pulse test method Semiconductor laser brightness Semiconductor laser appearance Semiconductor laser device details Semiconductor laser head quality Semiconductor laser identification Optical waveguide testing Laser particle size testing method Laser high and low temperature testing Semiconductor laser industry Laser thermal conductivity testing Semiconductor protective film testing Semiconductor chemical purification methods gb31359 Semiconductor Photocurrent Image Analysis Method

《GB/T 31359-2015半导体激光器测试方法》由TC284（全国光辐射安全和激光设备标准化技术委员会）归口，主管部门为中国机械工业联合会。
本标准规定了半导体激光器主要光电参数的测试方法。
本标准适用于半导体激光器主要光电参数的测试。半导体激光器组件可参考执行。

Scope

This standard specifies the test methods for the main photoelectric parameters of semiconductor lasers. This standard applies to the testing of the main photoelectric parameters of semiconductor lasers. Semiconductor laser components can be implemented with reference.

More samples: JJG 21-2008 QC/T 942-2021 JC/T 2453-2018

Sample only — not a preview of GB/T 31359-2015

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

GB/T 44605-2024 in English

Laser and laser-related equipment—Absorption distribution measurement of optical laser components—Photothermal mapping method
2024-09-29
GB/T 47524-2026 in English

Lasers and laser-related equipment—Test method for angle resolved scattering
2026-04-30
GB/T 16530-1996 in English

Measuring method for polarization dependence of return loss of a single-mode fibre optic component
1996-09-09
GB/T 41265-2022 in English

Optical radiation safety requirements of wearable devices
2022-03-09
GB/T 30117.2-2013 in English

Photobiological Safety of Lamps and Lamp Systems - Part 2: Guidance on Manufacturing Requirements Relating to Non-Laser Optical Radiation Safety
2013-12-17
GB/T 26599.1-2011 in English

Lasers and laser-related equipment—Test methods for laser beam widths,divergence angles and beam propagation ratios—Part 1:Stigmatic and simple astigmatic beam
2011-06-16
GB/T 45239-2025 in English

Evaluation methods of nocturnal blue light radiation hazards
2025-01-24
GB/T 18490.1-2017 in English

Safety of machinery―Laser processing machines―Part 1:General safety requirement
2017-12-29