Semiconductor Test Program

Semiconductor Test Program, Total:84 items.

The international standard classification for "Semiconductor Test Program" includes: Semiconductor devices in general , Optoelectronics. Laser equipment , Aerospace electric equipment and systems .

The Chinese standard classification for "Semiconductor Test Program" includes: Semiconductor discrete devices in general , Laser device , Electronic components .

未注明发布机构

IEEE Std 82-2002(R2009) IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors
IEEE Std 300-1988(R2006) IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Taiwan Provincial Standard of the People's Republic of China

CNS 6802-1980 Standard Test Procedured for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits

Professional Standard - Electron

SJ/T 11874-2022 Stress test procedures for semiconductor discrete devices used in electric vehicles
SJ/T 11875-2022 Stress test procedures for semiconductor integrated circuits for electric vehicles

Military Standard of the People's Republic of China-General Armament Department

GJB 3233-1998 Semiconductor integrated circuit failure analysis procedures and methods
GJB 3157-1998 Semiconductor discrete device failure analysis methods and procedures

Group Standards of the People's Republic of China

T/CIE 119-2021 Test method and procedure of atmospheric-neutron induced single event effects in semiconductor devices

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 04008-1987 Trial Verification Regulations for QE1A Double-base Semiconductor Tube Tester

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 31359-2015 Test methods of semiconductor lasers

Professional Standard - Aerospace

QJ 1906A-1997 器件

Institute of Electrical and Electronics Engineers (IEEE)

IEEE No 256-1963 IEEE Test Procedure for Semiconductor Diodes
IEEE Std 300-1988 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
ANSI/IEEE Std 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
IEEE 857-1996 Recommended Practice for Test Procedures for High-Voltage Direct- Current Thyristor Valves
IEEE No 300-1969*USAS N42.1-1969 USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
IEEE 300-1969 USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
IEEE 82-1994 Test procedure for impulse voltage tests on insulated conductors
IEEE 82-2002 Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors
IEEE Std 82-1963 IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors
IEEE 82-1963 IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors
IEEE Std 301-1969*ANSI N42.2-1969 IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)
IEEE Std 82-1994 IEEE Standard test procedure for impulse voltage tests on insulated conductors
IEEE Std 82-2002 IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors

SCC

IEC 60333:1970 Test procedures for semiconductor detectors for ionizing radiation
IEC 60333:1983 Test procedures for semiconductor charged-particle detectors
DIN IEC 60333:1995 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures (IEC 60333:1993)
IEC 60340:1970 Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation
IEC 60340:1974 Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation
AENOR UNE-EN 61395:1999 Conductors for overhead power lines. Procedures for creep testing on stranded conductors.
IEC 60340A:1974 Supplement A - Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation
CEI EN 61395:1999 Overhead electrical conductors - Creep test procedures for stranded conductors

TR-TSE

TS 2643-1977 Test Procedures For Bemiconductor Detectors For Ionizing Radiation
TS 3433-1979 TEST PROCEDURES FOR AMPLIFIERS AND PREAMPLIFIERS FOR SEMICONDUCTOR DETECTORS FOR IONIZING RADIATION

ECIA - Electronic Components Industry Association

EIA CB-5:1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
EIA CB-5-1:1971 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices (Addendum to Bulletin No.5; (STABILIZED))

Electronic Components, Assemblies and Materials Association

ECA CB 5-1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
ECA CB 5-1-1971 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices Addendum to CB5

American National Standards Institute （ANSI)

ANSI/IEEE 300:1988 Test Procedures for Semiconductor Charged-Particle Detectors
ANSI/TIA/EIA 455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers
ANSI/IEEE 301:1988 Amplifiers and Preamplifiers for Semiconductor Detectors for lonizing Radiation, Test Procedures for

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
IEEE 301-1969 Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)
IEEE N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

GSO

GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
OS GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

CZ-CSN

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
CSN 35 1540-1979 Tests of power semiconductor converters

Korean Agency for Technology and Standards (KATS)

KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 61395:2014 Overhead electrical conductors — Creep test procedures for stranded conductors
KS C IEC 61395:2020 Overhead electrical conductors — Creep test procedures for stranded conductors
KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR

IN-BIS

IS 12641-1989 Environmental testing procedures for semiconductor devices and integrated circuits
IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
IS 11645-1985 Test procedures for amplifiers and preamplifiers of semiconductor detectors for ionizing radiation
IS 7412-1974 Life test of semiconductor devices

International Electrotechnical Commission (IEC)

IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

SE-SIS

SIS SS IEC 333:1986 Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors
SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
SIS SS IEC 340:1981 Nuclear instrumentation — Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation

(U.S.) Telecommunications Industries Association

TIA-455-128-1996(2014) Procedures for Determining Threshold Current of Semiconductor Lasers
TIA-455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD390A-1981 Standard Test Procedure for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits
JEDEC JEP140-2002 Beaded Thermocouple Temperature Measurement of Semiconductor Packages
JEDEC JESD74A-2007 Early Life Failure Rate Calculation Procedure for Semiconductor Components
JEDEC JEP151-2015 Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

KR-KS

KS C IEC 61395-2020 Overhead electrical conductors — Creep test procedures for stranded conductors

Danish Standards Foundation

DS/EN 61395:1998 Overhead electrical conductors. Creep test procedures for stranded conductors

HU-MSZT

MSZ 700/36.lap-1961 Semiconductor testing experiments in coal mines
MSZ 700/23.lap-1965 STMicroelectronics tests coke
MSZ 700/24.lap-1965 STMicroelectronics Coke Test

RO-ASRO

STAS 11066/2-1980 THYRISTORS Test methods

Defense Logistics Agency

DLA MIL-STD-750 F CHANGE 1-2013 TEST METHODS FOR SEMICONDUCTOR DEVICES

AENOR

UNE-EN 61395:1999 OVERHEAD ELECTRICAL CONDUCTORS. CREEP TEST PROCEDURES FOR STRANDED CONDUCTORS.

British Standards Institution (BSI)

BS EN 61395:1998 Overhead electrical conductors. Creep test procedures for stranded conductors

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