conductor
conductor, Total:193 items.
The international standard classification for "conductor" includes: Electrical wires and cables in general , Other methods of testing of metals , Aluminium products , Electrical engineering in general , Semiconductor devices in general , Plug-and-socket devices. Connectors , Optoelectronics. Laser equipment , Rectifiers. Convertors. Stabilized power supply , Semiconducting materials , Testing of metals in general , Electricity. Magnetism. Electrical and magnetic measurements , Integrated circuits. Microelectronics , Electrical engineering (Vocabularies) , Cables , Other products of non-ferrous metals , Electrical wires and cables , Electrical and electromechanical components , Aerospace electric equipment and systems , Semiconductor devices , Other non-ferrous metals and their alloys , Power stations in general , Other fiber optic equipment , Hydraulic energy engineering , Lightning protection .
The Chinese standard classification for "conductor" includes: Cable and its accessory , Metal physical property test method , Light metals and their alloys , Hygiene, safety and labor protection , Semiconductor discrete devices in general , Connector , Laser device , Low voltage apparatus in general , Special electronic technology material , Power semiconductor device and parts , Semimetal and semiconductor material in general , Basic standards and general methods , Semiconductor integrated circuit , Microcircuit in general , Precious metals and their alloys , Electronic industry production equipment in general , Electrical system and equipment , Temperature and pressure instrument , Optoelectronic device assembly , Technical Management , Technical management , Semiconductor triode , Technical management , Technical management , Microwave and millimeter wave diode and triode , Power transmission and transformation engineering , Electronic components , Telephone communication equipment , Optical communication equipment , Electrotechnical material and universal parts in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 14048.8-1998 Low-voltage switchgear and controlgear Ancillary equipment Section 2:Protective conductor terminal blocks for copper conductors
- GB/T 3956-1997 Conductors of insulated cables
- GB/T 30116-2013 Requirements for Semiconductor Manufacturing Facility Electromagnetic Compatibility
- GB/T 12113-2003 Methods of measurement of touch current and protective conductor current
- GB/T 14264-1993 Semiconductor materials-Terms and definitions
- GB/T 15872-2013 Power supply interface for semiconductor equipment
- GB/T 12113-2023 Methods of measurement of touch current and protective conductor current
- GB/T 25897-2010 Superconductivity:Residual resistance ratio measurement of Nb-Ti composite superconductors
- GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
- GB/T 6108.1-2003 Basic dimensions of winding wires - Part 1: Diameters of conductors for round winding wires
- GB/T 3048.4-1994 Test methods for determining electrical properties of electric cables and wires-Measurement of D.C. resistance of conductors
- GB/T 9327.1-1988 Test methods for compression and mechanical connectorsfor conductors of power cables--General
- GB/T 31358-2015 General specification for semiconductor lasers
- GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
- GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
- GB/T 14315-2008 Compression type terminal lugs and ferrules with copper or aluminum for power cables conductors
- GB 16895.3-2004 Electrical installations of buildings--Part 5-54:Selection and erection of electrical equipment-Earthing arrangements,protective conductors and protective bonding conductors
- GB/T 4728.3-2005 Graphical symbols for electrical diagrams - Part 3: Conductors and connecting devices
- GB/T 12667-1990 General specification for excitation assembly with semiconductor for synchronous motor
- GB/T 4937.1-2006 Semiconductor devices - Mechanical and climatic test methods - Part 1 : General
- GB/T 3859.4-2004 Semiconductor converter - Self-commutated semiconductor converters including direct d.c.converters
- GB/T 14048.8-2016 Low-voltage switchgear and controlgear―Part 7-2:Ancillary equipment―Protective conductor terminal blocks for copper conductors
- GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
- GB/T 6108.3-2003 Basic dimensions of winding wires - Part 3: Dimensions of conductors of insulated rectangular copper winding wires
- GB/T 18891-2009 Identification by hour numbers of the phase conductors of 3-phase electric systems
- GB/T 21546-2008 Critical current measurement - DC critical current of Nb-Ti composite superconductors
- GB/T 27676-2011 Aluminium and aluminium alloy tube bus conductors
- GB/T 8750-2007 Gold bonding wire for semiconductor devices
- GB/T 29299-2012 General specification of semiconductor laser rangefinder
- GB/T 2900.32-1994 Electrotechnical terminology - Power semiconductor device
- GB 7947-1997 Identification of conductors by colous or numerals
- GB/T 31469-2015 Semiconductor materials cutting fluid
- GB/T 31359-2015 Test methods of semiconductor lasers
- GB/T 14113-1993 of packages for semiconductor integrated circuits
- GB/T 22587-2008 Superconductivity - Matrix to superconductor volume ratio measurement - Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
- GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials
- GB/T 42973-2023 Semiconductor integrated circuits—Digital-analog(DA)converter
- GB/T 18891-2002 Identificatoin by hour numbers of the phase conductors of 3-phase electric systems
- GB/T 17950-2000 Semiconductor converter - Part 6: Application guide for the protection of semiconductor converters against overcurrent by fuses
- GB/T 18213-2000 Guide to the calculation of resistance of plain and coated copper conductor of low-frequency cables and wires
- GB/T 4728.3-1998 Graphical symbols for diagrams. Part 3 Conductors and connecting devices
- GB/T 14315-1993 Compression type terminal lugs and ferrules for power cables with copper or aluminium conductors
- GB/T 3956-2008 Conductors of insulated cables
- GB/T 5839-1986 Rating systems for electronic tubes and semiconductor devise
- GB/T 14264-2009 Semiconductor materials - Terms and definitions
- GB/T 42043-2022 Aerospace—Wire, aluminium alloy and copper-clad aluminium conductors—General performance requirements
Henan Provincial Standard of the People's Republic of China
- DB41/T 1055-2015 Copper clad aluminum conductor plastic insulated control cable
- DB41/T 1056-2015 Copper clad aluminum conductor plastic insulated computer cable
- DB41/T 846-2013 copper clad aluminum conductor for cable
Professional Standard - Non-ferrous Metal
- YS/T 614-2006 Sliver palladium thick film conductor paste
- YS/T 604-2006 Gold based thick film conductor pastes
- YS/T 603-2006 Sintering silver conductive paste
- YS/T 606-2006 Curable silver conductive paste
Professional Standard - Machinery
- JB/T 8268-2015 Standard test method for surface defect of photoconductor for electrostatic process
- JB/T 5537-2006 Semiconductor pressure sensors
- JB/T 5835-1991 Gate assemblies for power semiconductor devices
- JB/T 5843-2005 Connectors for power semiconductor devices
- JB/T 7059-1993 Guide for Preparation of Standard for Power Semiconductor Modules
- JB/T 7064-1993 General Specifications for Semiconductor Inverters
- JB/T 8271-2015 Comparison scale for surface defect of photoconductor of electrostatic copying process
- JB/T 11778-2014 Copper Aluminium Compound Busways
- JB/T 1505-1975 Method for Designing Types of Power Semiconductor Converters
- JB/T 9687.1-1999 Molybdenum Disk for Power Semiconductor Devices
- JB/T 11623-2013 Thick film metal oxide semiconductor gas sensor
Liaoning Provincial Standard of the People's Republic of China
- DB21/T 3155-2019 Conductor cross-sectional area measurement method
Professional Standard - Electron
- SJ 1988-1981 Detail specification for low frequency low noise field-effect transistors,Type CS15
- SJ 20788-2000 Measurment method for thermal impedance of semiconductor diodes
- SJ 50033/163-2003 Semiconductor discrete device Detail specification of type 3DK457 for power switching transistors
- SJ/T 11397-2009 Phosphors for light emitting diodes
- SJ 1985-1981 Detail specification for low frequency low noise field-effect transistors,Type CS12
- SJ 20642-1997 Semiconductor opto-electronic module-General specification for
- SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
- SJ/T 10455-1993 Copper conductor paste for thick film hybrid integrated circuits
- SJ 1986-1981 Detail specification for low frequency low noise field-effect transistors,Type CS13
- SJ 1983-1981 Detail specification for low frequency low noise field-effect transistors,Type CS10
- SJ 1977-1981 Detail specification for high frequency field-effect transistors,Type CS4
- SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
- SJ 1980-1981 Detail specification for high frequency field-effect transistors,Type CS7
- SJ 2004-1981 Detail specification for N channel junction pair field-effect transistors,Type CS34
- SJ 50033.55-1994 Semiconductor discrete device - Detail specification for type 2CK82 silicon switching diode
- SJ 1989-1981 Detail specification for Nchannel junction pair field-effect transistors,Type CS19
- SJ 2215.2-1982 Method of measurement for forward voltage of semiconductor photocouplers (diodes)
- SJ/T 11395-2009 Semiconductor lighting terminology
- SJ/T 11514-2015 Thermosetting Conductive Paste for Printed Circuit Board (PCB)
- SJ 1981-1981 Detail specification for high frequency field-effect transistors,Type CS8
- SJ 50033/148-2000 ~
- SJ 1990-1981 Detail specification for N channel junction pair field-effect transistors,Type CS20
- SJ/Z 9021.4-1987 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor devices
- SJ 50033/12-1994 Discrete Semiconductor Devices Detailed Specifications for 3DK209 Power Switching Transistors
- SJ 1984-1981 Detail specification for low frequency low noise field-effect transistors,Type CS11
- SJ 1992-1981 Detail specification for N channel junction pair field-effect transistors,Type CS22
- SJ 1994-1981 Detail specification for N channel junction pair field-effect transistors,Type CS24
- SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
- SJ 2669-1986 Generic specification for ribbon cables with unshielded round conouctor
- SJ 1975-1981 Detail specification for low frequency field-effect transistors,Type CS2
- SJ 2934-1988 Detail specification for nonshielded ribbon cables with round conductor for Type DVY-1
- SJ 1978-1981 Detail specification for high frequency field-effect transistors,Type CS5
Professional Standard - Electricity
- DL/T 5222-2005 Design technical rule for selecting conductor and electrical equi
- DL/T 5222-2021 Code for design of the conductor and electrical equipment selection
Professional Standard - Aerospace
- QJ 1908A-1998 Acceptance Uncovering Check Method of Semiconductor Devices
- QJ/Z 32-1977 Testing methods for semi-conductor integrated comparison amplifiers
- QJ 787-1983 Semiconductor Discrete Devices - Specifications for Screening
- QJ/Z 152-1985 Detailed Rules for Installation Process of Round Conductor Ribbon Cable
Professional Standard - Hydroelectric Power
- SDGJ 14-1986 Design technical regulations for selecting conductor and electrical equipment
Military Standard of the People's Republic of China-General Armament Department
- GJB 33B-2021 General Specification for Semiconductor Discrete Devices
- GJB 8119-2013 General specification for semiconductor optoelectronic device
- GJB 1640A-2021 Aerospace wire and cable conductor varieties and cross-section series
- GJB 1934A-2009 Cables,raido frequency,coaxial,semirigid,corrugated outer conductor,general specification for
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
- GJB 923B-2021 General Specification for Semiconductor Discrete Device Enclosures
- GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
Professional Standard - Post and Telecommunication
- YD/T 2338-2011 Telecommunication Cable. Foamed Polyethylene Dielectric
- YD/T 2161-2010 Telecommunication Cable - Foamed Polyethylene Dielectric, Copper-clad Aluminum Tube Inner Conductor, Corrugated Aluminum Tube Outer Conductor, 50Ω Radio Frequency Coaxial Cables for Wireless Communication
- YD/T 2287-2011 Insulated Wires With Conductor Diameter Below 0.8 mm
- YD/T 940-1999 Semiconductor arrester for The over-voltage protection of telecommunications installations
- YD/T 1687.2-2007 Technical Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 1:2.5Gbit/s Uncooled Direct Modulation Semiconductor Laser Assembly
- YD 576-1992 Semiconductor rectifier equipments For telecommunications
Group Standards of the People's Republic of China
- T/ZZB 2046-2021 Copper clad steel for inner conductor of CATV coaxial cable Drop wire
- T/ZZB 1755-2020 Compression type terminal lugs and ferrules with copper or aluminum for power cables conductors
- T/CASAS 002-2021 Terminology for wide bandgap semiconductors
Professional Standard - Aviation
- HB 5831-1983 Technical Requirements of Semiconductor Diode and Triode for Aviation
Professional Standard - Water Conservancy
- SL 561-2012 Design code for selecting conductor and electrical equipment of water resources and hydropower projects
Taiwan Provincial Standard of the People's Republic of China
- CNS 11816-1987 Markings and Arrangements of Mainconnections and Small-Wiring for Marine Use
National Metrological Verification Regulations of the People's Republic of China
- JJG(核工) 4-1991 Verification Regulations for Semiconductor Telescopes (Working Class)
Professional Standard - Energy
- NB/T 42051-2015 Cross-linked polyethylene insulated cables with aluminum alloy conductor for rated voltage of 0.6/1kV
Shaanxi Provincial Standard of the People's Republic of China
- DB61/T 1250-2019 General Specification for Sic (Silicon Carbide) Material Semiconductor Discrete Devices
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 33588.4-2020 Lightning protection system components(LPSC)—Part 4:Requirements for conductor fasteners
Jiangxi Provincial Standard of the People's Republic of China
- DB3603/T 4-2022 Technical specifications for the manufacture of semiconducting glazes for electric porcelain
Japanese Industrial Standards Committee (JISC)
- JIS H 7304:2002 Superconductivity -- Part 5: Matrix to superconductor volume ratio measurement -- Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
IPC - Association Connecting Electronics Industries
- IPC 7721 4.3.1-1998 Conductor Cut@ Surface Conductors
- IPC 7721 4.3.2-1998 Conductor Cut@ Inner Layer Conductors
- IPC TM-650 2.5.4.1A-1997 Conductor Temperature Rise Due to Current Changes in Conductors
- IPC TM-650 2.5.4.1-1987 Conductor Temperature Rise Due to Current Changes in Conductors
Association Francaise de Normalisation
- UTE C15-106U*UTE C15-106:2003 Cross-sections of protective conductors, earthing conductors and equipotential bonding conductors
International Electrotechnical Commission (IEC)
- IEC 61788-5:2013 Superconductivity.Part 5: Matrix to superconductor volume ratio measurement.Copper to superconductor volume ratio of Cu/Nb-Ti composite superconducting wires
- IEC 61788-5:2000 Superconductivity - Part 5: Matrix to superconductor volume ratio measurement; Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- IEC TR 61597:1995 Overhead electrical conductors - Calculation methods for stranded bare conductors
- IEC TR 61597:2021 Overhead electrical conductors - Calculation methods for stranded bare conductors
- IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
TN-INNORPI
- NT AB 023-1970 Draden en kabels voor uitrustingen met massieve of verdeelde geleiders, met pvc geisoleerd, onder scherm, met een geleider of een tweedraads- groen.
CZ-CSN
- CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
British Standards Institution (BSI)
- BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
- BS EN 50182:2001(2006) Conductors for overhead lines — Round wire concentric lay stranded conductors
- BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
- BS EN 61788-5:2013 Superconductivity. Matrix to superconductor volume ratio measurement. Copper to superconductor volume ratio of Cu/Nb-Ti composite superconducting wires
- BS EN 50182:2001 Conductors for overhead lines - Round wire concentric lay stranded conductors
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS EN 61788-5:2001 Superconductivity - Matrix to superconductor volume ratio measurement - Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- BS EN 61788-5:2003 Superconductivity - Matrix to superconductor volume ratio measurement - Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
- BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
Spanish Association for Standardization (UNE)
- UNE-EN 50182:2002 Conductors for overhead lines - Round wire concentric lay stranded conductors.
- UNE-EN 61788-5:2002 Superconductivity - Part 5: Matrix to superconductor volume ratio measurement - Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors.
- UNE 21-401-1989 Coloring identification of insulated and bare conductors
- UNE-EN 50182:2002/AC:2013 Conductors for overhead lines - Round wire concentric lay stranded conductors
SCC
- AENOR UNE-EN 50182:2002 Conductors for overhead lines - Round wire concentric lay stranded conductors.
- CEI EN 50182:2002 Conductors for overhead lines - Round wire concentric lay stranded conductors
- DANSK DS/EN 50182:2001 Conductors for overhead lines - Round wire concentric lay stranded conductors
- BS 3058-2:1958 Varnish bonded glass braided copper conductors. Retangular conductors
- BS 1933-2:1958 Varnish bonded glass covered copper conductors. Rectangular conductors
- DANSK DS/EN 62219:2002 Overhead electrical conductors - Formed wire, concentric lay, stranded conductors
GSO
- GSO ISO 12617:2015 Road vehicles -- Liquefied natural gas (LNG) refuelling connector -- 3,1 MPa connector
- GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
Lithuanian Standards Office
- LST EN 50182+AC-2002/AC-2005 Conductors for overhead lines Round wire concentric lay stranded conductors
- LST EN 50182+AC-2002 Conductors for overhead lines - Round wire concentric lay stranded conductors
Danish Standards Foundation
- DS/EN 50182:2001 Conductors for overhead lines - Round wire concentric lay stranded conductors
- DS/EN 50182/AC:2013 Conductors for overhead lines - Round wire concentric lay stranded conductors
- DS/EN 50182/Corr.:2004 Conductors for overhead lines - Round wire concentric lay stranded conductors
- DS/IEC TR 61597:2021 Overhead electrical conductors – Calculation methods for stranded bare conductors
Korean Agency for Technology and Standards (KATS)
- KS C IEC 62219-2014(2019) Overhead electrical conductors — Formed wire, concentric lay, stranded conductors
- KS C IEC 61788-5-2016(2021) Superconductivity-Part 5:Matrix to superconductor volume ratio measurement-Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- KS C IEC 61788-5:2016 Superconductivity-Part 5:Matrix to superconductor volume ratio measurement-Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- KS C IEC 61788-5-2021 Superconductivity-Part 5:Matrix to superconductor volume ratio measurement-Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- KS C IEC 61395:2014 Overhead electrical conductors — Creep test procedures for stranded conductors
German Institute for Standardization
- DIN EN 50182:2001-12 Conductors for overhead lines - Round wire concentric lay stranded conductors; German version EN 50182:2001 / Note: DIN 48201-5 (1981-04), DIN 48201-6 (1981-04), DIN 48201-8 (1981-04), DIN 48203-5 (1984-03), DIN 48203-6 (1984-03), DIN 48203-8 (1984-03)...
- DIN EN 50182 Berichtigung 2:2016-02 Conductors for overhead lines - Round wire concentric lay stranded conductors; German version EN 50182:2001, Corrigendum to DIN EN 50182:2001-12; German version EN 50182:2001/AC:2013
- DIN EN 50182:2001 Conductors for overhead lines - Round wire concentric lay stranded conductors; German version EN 50182:2001
IN-BIS
- IS 7391 Pt.1-1974 Specification for cotton-clad copper conductors Part Ⅰ Round conductors
- IS 6162 Pt.2-1971 Specification for paper-clad aluminum conductors Part Ⅱ Rectangular conductors
- IS 7391 Pt.2-1974 Specification for cotton-clad copper conductors Part II Rectangular conductors
- IS 6162 Pt.1-1971 Specification for paper-clad aluminum conductors Part Ⅰ Round conductors
- IS 7404 Pt.2-1974 Specification for paper-clad copper conductors Part Ⅱ Rectangular conductors
KR-KS
- KS C IEC 61788-5-2016 Superconductivity-Part 5:Matrix to superconductor volume ratio measurement-Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors
- KS C IEC TR 61597-2023 Overhead electrical conductors Calculation methods for stranded bare conductors
SE-SIS
- SIS SEN 24 08 13-1974 Aluminium-aluminium alloy conductors for overheadpower transmission purposes. Combi-conductors
SAE - SAE International
- SAE AS6324-2017 Verification of New Conductor Alloys for AS29606 Conductors Qualification
UY-UNIT
- UNIT 120-1957 copper conductor
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 5.5.4.19-1998 Conductor Test
Standard Association of Australia (SAA)
- AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE S-135*IPCEA P46-426 IEEE- PECEA Power Cable Ampacities Copper Conductors Aluminum Conductors
- IEEE S-135 IEEE/IPECEA Power Cable Ampacities - Copper Conductors - Aluminum Conductors
RO-ASRO
- SR CEI 228 A-1996 Conductors of insulated cables Guide to the dimensional limits of circular conductors
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