SJ/T 2214-2015 in English

VALID

Measuring methods for semiconductor photodiode and phototransistor

Issued on:2015-04-30
Implemented on:2015-10-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $560.00
$544.00

Standard No:	SJ/T 2214-2015
Document status:	VALID
Title in English:	Measuring methods for semiconductor photodiode and phototransistor
Title in Chinese:	半导体光电二极管和光电晶体管测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2015-04-30
Implemented on:	2015-10-01
Superseding:	SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors SJ 2214.9-1982 Method of measurement for pulse rise and fall time of semiconductor photodiodes and phototransistors
Professional Classification:	SJ-Electronics
Related Keywords:	semiconductor photodiode semiconductor photodiodes phototransistor scopethis standard semiconductor methods
Related Topics:	semiconductor light Photodiode the crystal light pipe Used Transistor Testers Photocurrent semiconductor light semiconducting light wave Test photocurrent semiconductor photooxidation sj/t 11438-2015 Two-electrode three-electrode system diode Semiconductor light agent sj/t 11486-2015 Measurement of Semiconductor Photocurrent Synoptic crystal phototransistor two electrode system sj/t 11540-2015 Photocurrent semiconductor tube + test sj t 11540 2015 sj/t+11540-2015 thermoelectric semiconductor sj/t 2214-2015 SJ/T11540-2015 Electrode pad test method Semiconductors and Photocurrents Photocurrent+ phototransistor How to test photocurrent Semiconductor photoelectric properties sj/t 11503-2015 Photodiode Photocurrent test+ Photoelectric test sj/t 11508-2015 Photocurrent+Test+ Semiconductor photoelectric properties sj/t+2214 semiconductor photoluminescence two-dimensional semiconductor sj/t 11528-2015 Semiconductor electrostatic crystal method Semiconductor Light Performance electrode material dendrite Photodiode Parameters sj/t11508-2015 sj/t11508/2015 method of producing crystals photoelectric crystal photoelectric crystal Semiconductor Optoelectronics Photodiode voltage Crystal Core Optoelectronics Photoelectric English Rated photodiode Four-electrode conductance and two-electrode conductance Transistor tester capacitive organic transistor method of making crystals phototransistor Molybdenum telluride phototransistor semi-dry electrode Photoelectric Characteristics of Photodiodes two-dimensional semiconductor Test method for semiconductor laser diode components sj/t 11543-2015 Electrode Conductivity Test Method polar crystals and non-polar crystals Two-electrode and three-electrode systems Semiconductor Optical Measurement array photodiode Three-electrode method and two-electrode method Three-electrode system and two-electrode system Three-electrode system and two-electrode system monolithic photodiode Semiconductor Optoelectronics Semiconductor Test Technology Transistor development sj/t 11436-2015 Electrode method and degree method two electrode method Semiconductor electrostatic Three-electrode test and two-electrode Semiconductor temperature test sj/t11499-2015 sj/t 11546-2015 electrode method photodiode and light Three-electrode system and two-electrode system Two electrode test voltage Transistor ft tester Photodiode Photoelectric Characteristics sj/t 11541-2015 Two-electrode method and three-electrode method sj/t 11501-2015 sj/t 11526-2015 sj/t 11528/2015 sj/t 11532.1-2015 High Efficiency Photodiode sj/t 11558.5-2015 Jujing Optoelectronics Principles of Semiconductor Testing body light sj/t 11521.1-2015 sj/t 11564.4-2015 sj/t 11512-2015 sj t 11530-2015 Photodiode Test Parameters semiconductor Diode Test Circuit How Photodiodes Detect semiconductor Conductivity Meters and Electrodes sj/t 11556-2015 Semiconductor Process Management Semiconductor electrode conductor photoelectric Photodiode Nitrogen Detector How to use conductivity electrodes Disadvantages of si photodiodes Sensing angle of photodiode Test method for electrode conductivity Conductivity electrode activation method Semiconductor polishing materials How to test diodes with a graphic analyzer Conductivity electrode calibration method Photodiode quality inspection Conductivity electrode maintenance methods Calibration method of conductivity cell constant Dimer and monomer detection methods How to store conductivity meter electrodes sj/t 11485-2015 Photodiode current collection method sj/t 11502-2015 sj/t11555-2015 Semiconductor Photocurrent Image Analysis Method sj/t11531-2015

标准的主要内容包括半导体光敏管的正向压降暗电流等参数的术语和定义测试原理测试步骤测试条件。

Scope

This standard specifies the testing methods for the optoelectronic parameters of semiconductor photodiodes and phototransistors (hereinafter referred to as "devices"). This standard is applicable to the testing of photoelectric parameters of semiconductor photodiodes and phototransistors. This standard does not apply to the testing of PIN and avalanche photodiodes.

More samples: DL/T 5154-2012 DL/T 368-2010 JGJ 94-2008

Sample only — not a preview of SJ/T 2214-2015

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