tube + test

tube + test, Total:68 items.

The international standard classification for "tube + test" includes: Electronic tubes , Electronic display devices , Nuclear energy engineering , Thyristors , Glass , Optoelectronics. Laser equipment .

The Chinese standard classification for "tube + test" includes: Technical Management , Technical management , Technical management , Semiconductor emitting device , Technical management , Other electron tube , Electron beam tube , Nuclear detector , Power semiconductor device and parts , Material and component for instrument and meter .

Professional Standard - Electron

SJ 2658.4-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Capacitance
SJ 20475-1995 Methods of measurement for cold-cathode trigger tubes
SJ 20024-1992 Measuring methods of traveling wave tube
SJ/Z 9010.28-1987 Measurement of electrical properties of electronic tubes Part 28 Methods of measurement of color TV picture tubes
SJ 1705-1981 Measurement conditions of power klystrons
SJ/Z 9010.25-1987 Measurements of the electrical properties of electronic tubes. Part 25: Methods of measurement of Geiger-Muller counter tubes
SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules
SJ 442-1973 Measurement conditions for high-voltage rectifier tubes
SJ/Z 9010.16-1987 Measurements of electrical properties of electronic tubes and valves - Part 16: Methods of measurement for television picture tubes
SJ 430-1973 Measurement conditions for O-type backward-wave tubes
SJ 2658.2-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Forward Voltage Drop
SJ 2658.11-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Pulse Response Characteristics
SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
SJ 2658.7-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Radiant Flux
SJ 2658.13-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Output Optical Power Temperature Coefficient
SJ 2658.5-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Forward Series Resistance
SJ 20533-1995 Measuring methods of crossed field amplifier tubes
SJ 362-1973 Measurement conditions for reflex klystrons
SJ 2658.8-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Normal Radiance
SJ/T 31166-1994 Requirements of readiness and methods of inspection and assessment for the power source used to test pulsed magnetrons
SJ 2658.12-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width
SJ 2658.9-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for the Intensity Space Distribution and Half-intensity Angle of Radiation
SJ 1386-1978 Measurement conditions for noise-generator diodes and gas discharge noise tubes
SJ 20481-1995 Measuring methods of power klystrons
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
SJ 2658.6-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Output Optical Power
SJ/Z 9010.0-1987 Measurements of electrical properties of electronic tubes and valves--Part 0: Precautions relating to methods of measurement of electronic tubes and valves
SJ 2658.3-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Backward Voltage
SJ/T 10582-1994 Methods of measurement and test of vacuum switch tubes for low-voltage circuit breakers
SJ 419-1973 Measurement conditions for low noise travelling wave tubes
SJ 2658.10-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Modulated Wideband
SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
SJ/T 10576-1994 Methods of measurment and test of vacuum switch tubes for vacuum contactors

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 14184-1993 The methods of measurement for imageconverter tubes and image intensifier tubes
GB/T 9588-2008 Methods of test of Geiger - Müller counter tubes
GB/T 11480-1989 Methods of measurement for camera tubes
GB/T 15293-1994 Measuring methods for thyristor - Gate turn-off thyristor
GB/T 6428-1995 Methods of the measurement for hydrogen thyratron tubes
GB/T 7962.2-1987 Colourless optical glass test methods--Test method by collimator for optical homogeneity
GB/T 5998-1994 Methods of measurement of colour picture tubes
GB/T 15292-1994 Measuring methods for thyristor Reverse conducting triode thyristor
GB/T 9588-1988 Methods of measurement of Geiger-Muller counter tubes
GB/T 7271-1987 Methods of measurement for phototubes
GB/T 12571-1990 Methods of measurement of monochrome display tubes
GB/T 7270-1987 Methods of measurement for photomultiplier tubes
GB/T 15648-1995 Methods of measurement for glow discharge display tubes
GB/T 15427-1994 Methods of measurement of colour display tubes
GB/T 18896-2002 Methods of measurement of the colour projection picture tubes
GB/T 12567-1990 Methods of measurement of display storage tubes
GB/T 3790-1995 Methods of measurement of fluorescent display tubes