semiconductor light
semiconductor light, Total:49 items.
The international standard classification for "semiconductor light" includes: Optoelectronics. Laser equipment .
The Chinese standard classification for "semiconductor light" includes: Technical management , Technical management , Technical management , Special electronic technology material , Technical management , Technical management , Laser device .
Military Standard of the People's Republic of China-General Armament Department
- GJB 8120-2013 General specification for semiconductor optoelectronic module
- GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
- GJB 33/20-2011 Semiconductor optoelectronic device.Detail specification for type GH302 photocoupler
- GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
- GJB 8119-2013 General specification for semiconductor optoelectronic device
- GJB 33/23-2011 Semiconductor optoelectronic device.Detail specification for type GH3201Z-4 photocoupler
- GJB 33/19-2011 Semiconductor optoelectronic device.Detail specification for type GH302-4 photocoupler
- GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
- GJB 33/22-2011 Semiconductor optoelectronic device.Detail specification for type GO103 photocoupler
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
- GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
- GJB 8121-2013 General specification for semiconductor optoelectronic assembly
Professional Standard - Electron
- SJ 2215.5-1982 Method of measurement for reverse breakdown voltage of semiconductor photocouplers (diodes)
- SJ 20642.4-1998 Semiconductor optoelectronic module - Detail specification for Type GH81 opto-couplers
- SJ 2215.14-1982 Method of measurement for input-to-output isolation voltage of semiconductor photocouplers
- SJ 20642.6-1998 Semiconductor optoelectronic module - Detail specification for Type GH83 opto-couplers
- SJ 2215.12-1982 Method of measurement for input-to-output capacitance of semiconductor photocouplers
- SJ 2215.7-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor photocouplers (diodes)
- SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
- SJ 20786-2000 General specification for semiconductor opto-electronic assembly
- SJ 2219-1982 Semiconductor photocouplers in the transistor mode
- SJ 2215.4-1982 Method of measurement for reverse current of semiconductor photocouplers (diodes)
- SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
- SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
- SJ 2215.9-1982 Method of measurement for reverse cut-off current of semiconductor photocouplers transistors
- SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
- SJ 20072-1992 Semiconductor discrete device-Detail specification for semiconductor opto-couplers for Type GH24,GH25 and GH26
- SJ 2215.2-1982 Method of measurement for forward voltage of semiconductor photocouplers (diodes)
- SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
- SJ 20642-1997 Semiconductor opto-electronic module-General specification for
- SJ 2215.6-1982 Method of measurement for junction capacitance of semiconductor photocouplers (diodes)
- SJ 2218-1982 Semiconductor photocouplers in the diode mode
- SJ 50033/3-1994 Semiconductor discrete device - Detail specification for semiconductor opto-couplers for type GH21, GH22 and GH23 of GP, GT and GCT classes
- SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
- SJ 2215.10-1982 Method of measurement for direct current transfer ratio of semiconductor photocouplers
- SJ 20642.5-1998 Semiconductor optoelectronic module - Detail specification for Type GH82 opto-couplers
- SJ 2215.8-1982 Method of measurement for output saturation voltage of semiconductor photocouplers (diodes)
- SJ 50923/1-1995 Detail specification for Types A6-02A-M2/Z2 and A6-01B-M1/Z1 metal case for semiconductor photocouplers
- SJ 2215.13-1982 Method of measurement for input-to-output isolation resistance of semiconductor photocouplers
- SJ 2215.3-1982 Method of measurement for forward current of semiconductor photocouplers (diodes)
- SJ/T 11397-2009 Phosphors for light emitting diodes
Group Standards of the People's Republic of China
- T/QGCML 4031-2024 Semiconductor optical wafer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31359-2015 Test methods of semiconductor lasers
RU-GOST R
- GOST 24458-1980 Semiconductor optoelectronic couplers. Essential parameters
British Standards Institution (BSI)
- PD IEC TR 61292-9:2023 Optical amplifiers. Semiconductor optical amplifiers (SOAs)
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
SCC
- BS PD IEC TR 61292-9:2023 Optical amplifiers-Semiconductor optical amplifiers (SOAs)
- BS PD IEC/TR 61292-9:2013 Optical amplifiers-Semiconductor optical amplifiers (SOAs)
- BS PD IEC/TR 61292-9:2017 Optical amplifiers-Semiconductor optical amplifiers (SOAs)
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