Semiconductors and UV light
Semiconductors and UV light, Total:40 items.
The international standard classification for "Semiconductors and UV light" includes: Optics and optical measurements , Optoelectronics. Laser equipment .
The Chinese standard classification for "Semiconductors and UV light" includes: Inorganic chemicals in general , Special electronic technology material , Technical management , Semiconductor emitting device .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 37131-2018(英文版) Nanotechnology - Testing method of UV-visible diffuse reflectance spectrum of semiconductor nanopowder materials
- GB/T 44567-2024 Optics crystal—Ultraviolet grade calcium fluride crystal
- GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
- GB/T 37131-2018e Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
Professional Standard - Electron
- SJ/T 11818.1-2022 Semiconductor UV-emitting diodes Part 1: Test methods
- SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules
- SJ 2750-1987 Outline dimensions for semiconductor laser diodes
- SJ 2684-1986 Physical demensions for light emitting device of semiconductor
- SJ/T 11818.3-2022 Semiconductor UV-emitting diodes Part 3: Device Specifications
- SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
- SJ/T 11818.2-2022 Semiconductor UV Emitting Diodes Part 2: Chip Specifications
- SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
Military Standard of the People's Republic of China-General Armament Department
- GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
- GJB 8190-2015 General specification for semiconductor solid-state light sources for aircraft exterior lighting
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
- GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
Professional Standard - Light Industry
- QB/T 8038-2024 Device for object surface disinfection based on UV or UV photocatalysis
Group Standards of the People's Republic of China
- T/QGCML 4323-2024 Intelligent semiconductor six-sided appearance optical image sorter
- T/QGCML 4031-2024 Semiconductor optical wafer
Association Francaise de Normalisation
- NF ISO 10677:2011 Technical ceramics - UV light sources for testing photocatalytic semiconductor materials
- NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
Korean Agency for Technology and Standards (KATS)
- KS D 2717-2008(2018) Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS－NIR absorption spectroscopy
- KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
British Standards Institution (BSI)
- BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- 09/30186157 DC BS ISO 10677. Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
- BS IEC 60747-5-4:2022+A1:2024 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
- BS IEC 60747-14-11:2021 Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
- 25/30510635 DC Draft BS EN 63567-3 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
- OS GSO ISO/TS 17915:2015 Optics and photonics -- Measurement method of semiconductor lasers for sensing
GCC Standardization Organization
- GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
- GSO ISO/TS 17915:2015 Optics and photonics -- Measurement method of semiconductor lasers for sensing
Standards Norway
- SN-CWA 17857:2022 Lens-based adaptor system for coupling fibre optic to infrared semiconductor lasers
Society of Automotive Engineers (SAE)
- SAE AIR5468-2000 Ultraviolet (UV) Lasers for Aerospace Wire Marking
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO/TS 17915:2017 Optics and photonics -- Measurement method of semiconductor lasers for sensing
International Electrotechnical Commission (IEC)
- IEC 60747-5-4:2022+AMD1:2024 CSV Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 60747-5-4:2024 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Semiconductors and Photocatalysis,Ultrapure Water and Semiconductors,Semiconductor UV Spectrum Edge,Ion Chromatography and Semiconductors,Semiconductor UV Spectroscopy,Photocatalysis and Semiconductor Photocatalysis,Semiconductors and Photocurrents,Photocatalysis and Semiconductors,Semiconductor Devices and Temperature,UV spectrometer and infrared,UV semiconductor,Optoelectronic Materials and Semiconductor Lighting,UV Spectrum Semiconductor,Principles and Applications of Ultraviolet Spectroscopy,Fluorescence and UV light,UV-Vis and UV Spectroscopy,New semiconductor materials and devices,UV Spectroscopy and Imaging,Semiconductors and UV light,Semimetals and Semiconductor Materials
