Ion Chromatography and Semiconductors
Ion Chromatography and Semiconductors, Total:94 items.
The international standard classification for "Ion Chromatography and Semiconductors" includes: Other standards related to optics and optical measurements , Chemical analysis , Testing of metals , Alcohols. Ethers , Products of the chemical industry in general , Fertilizers , Analytical chemistry , Burners. Boilers , Geology. Meteorology. Hydrology .
The Chinese standard classification for "Ion Chromatography and Semiconductors" includes: chromatograph , Industrial gas and chemical gas , Semimetal and semiconductor material analysis method , Basic standards and general methods for dye , Basic standards and general methods on chemical fertilizers , Special electronic technology material , Analysis methods for toxic substances in water , Drugs for antipyretic, anodyne, anesthesia and central nervous system , Boiler and its auxiliary equipment , Meteorology .
Professional Standard - Agriculture
- JJF 2115-2024 Liquid chromatography-inductively coupled plasma mass spectrometry instrument calibration specification
- 790兽药典 一部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
- 2311药典 二部-2010 Appendix V J Ion Chromatography
- 184药典 三部-2015 Chromatography 0513 General Principles of Ion Chromatography 25
- 161药典 三部-2010 Appendix III Chromatography IIIE Ion Chromatography
- JJG(教委) 020-1996 Verification Regulations for Ion Chromatography
- 783兽药典 二部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
- 1769药典 一部-2010 Appendix VI G Ion Chromatography
- 83药典 四部-2015 0513 Ion chromatography
- 64药典 四部-2020 0513 Ion chromatography
- 203药典 三部-2020 Chromatography 0513 Ion Chromatography
Military Standard of the People's Republic of China-General Armament Department
- GJB 5018-2001 General requirements for screening and acceptance of semiconductor optoelectronic devices
- GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37182-2018 Gas analysis--Gas chromatograph with plasma emission detector
- GB/T 40395-2021 Determination of ammonium in methanol for industrial use—Ion chromatography
- GB/T 36240-2018 Ion chromatographs
- GB/T 37385-2019 Test method for chloride content of silicon—Ion chromatography method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 11446.7-2013 Test Method for Trace Anion in Electronic Grade Water by Ion Chromatography
- GB/T 29400-2012 Determination of microamount of inorganic anions in fertilizers by ion chromatography
- GB/T 23978-2009 Liquid dyes—Determination of chloride ion—Ion chromatography
- GB/T 42276-2022 Determination of fluorine ion and chloride ion in silicon nitride powder—Ion chromatography method
- GB/T 32193-2015 Standard practice for testing flame ionization detectors used in gas or supercritical fluid chromatography
- GB/T 28726-2012 Gas analysis—Gas chromatograph with helium ionization detector
Professional Standard - Commodity Inspection
- SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method
- SN/T 5032-2017 Determination of chloride ions in petroleum products. Ion chromatography
Group Standards of the People's Republic of China
- T/CECS 10206-2022 Determination of Chloride Ion and Sulfate Ion in Concrete by Ion Chromatography
- T/DLAS 004-2021 Determination of five kinds of selenium in selenium-enriched agricultural products by ion chromatography-inductively coupled plasma mass spectrometry
Professional Standard - Environmental Protection
- HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method
National Metrological Verification Regulations of the People's Republic of China
- JJG 823-2014 Verification regulation for ion chromatograph
- JJG 823-1993 Verification Regulation of Ion Chromatograph
- JJG(地质) 1008-1990 Verification Regulations for Ion Chromatography
Professional Standard - Water Conservancy
- SL 86-1994 Determination of inorganic anions in water (Ion chromatography method)
Professional Standard - Aerospace
- QJ 10005-2008 Test guidelines of single event effects induced by heavy ions of semiconductor devices for space applications
Professional Standard - Building Materials
- JC/T 2133-2012 Determination of impurities in silica sol for polishing solution in semiconductor industry—Inductively coupled plasma atomic emission spectrometric method
Professional Standard - Electricity
- DL/T 1127-2010 Guide for design and operation of plasma ignition system
- DL/T 1127-2023 Guide for design and operation of plasma ignition system
- DL/T 1127-2010(英文版) Plasma ignition system design and operation guidelines
Henan Provincial Standard of the People's Republic of China
- DB41/T 778-2013 Determination of Chloride Ion Content in Chemical Fertilizers by Ion Chromatography
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35664-2017 Determination of ammonium in the wet precipitation--Ion chromatography
农业农村部
- NY/T 3556-2020 Determination of selenocysteine and selenomethionine in cereals—Liquid chromatography-inductively coupled plasma mass spectrometry
Professional Standard - Education
- JY/T 0575-2020 General rules of analytical methods for ion chromatography
- JY/T 020-1996 General rules for ion chromatograpy
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 417-2007 Determination of bromate in drinking water using ion chromatography
American Society for Testing and Materials (ASTM)
- ASTM D7980-15 Standard Guide for Ion-Chromatographic Analysis of Anions in Grab Samples of Ultrapure Water (UPW) in the Semiconductor Industry
- ASTM D7980-15(2023) Standard Guide for Ion-Chromatographic Analysis of Anions in Grab Samples of Ultrapure Water (UPW) in the Semiconductor Industry
- ASTM D5794-95 Standard Guide for Determination of Anions in Cathodic Electrocoat Permeates by Ion Chromatography
- ASTM D5794-95(2002) Standard Guide for Determination of Anions in Cathodic Electrocoat Permeates by Ion Chromatography
- ASTM E1511-93(2010) Standard Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
- ASTM E1511-93(2017) Standard Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
- ASTM D8234-19 Standard Test Method for Anions in High Ionic Water by Ion Chromatography using Tandem Suppressed Conductivity and UV Detection
Association Francaise de Normalisation
- NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
- NF EN 62417:2010 Semiconductor Devices – Mobile Ion Testing for Metal Oxide Field Effect Semiconductor Transistors (MOSFETs)
- NF EN ISO 15061:2001 Water quality - Determination of dissolved bromate - Liquid ion chromatography method
- NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15: isolated semiconductor power devices
International Electrotechnical Commission (IEC)
- IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Spanish Association for Standardization (UNE)
- UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
- UNE-EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)
Danish Standards Foundation
- DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
- DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
German Institute for Standardization
- DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
- DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.
- DIN SPEC 1994:2017-02 Testing of materials for semiconductor technology - Determination of anions in weak acids
- DIN SPEC 1994 E:2016-07 Testing of materials for semiconductor technology - Determination of anions in weak acids
SCC
- CEI EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
- DANSK DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
- AWWA WQTC58858 Liquid Chromatography of Bromate and Bromoacetic Acids with Inductively Coupled Plasma Mass Spectrometry Detection
- AWWA WQTC50392 A New Approach to the Determination of Inorganic Anions in Environmental Waters by Ion Chromatography
- DANSK DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
- CEI EN 60747-15:2012 Semiconductor devices - Discrete devices Part 15: Isolated power semiconductor devices
- BS PD ISO/TS 19046-2:2017 Cheese. Determination of propionic acid level by chromatography-Method by ion exchange chromatography
US-ACEI
- IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method
IPC - Association Connecting Electronics Industries
- IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
- IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
- IPC WP-008 CD-2005 Setting Up Ion Chromatography Capability
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC WP-008-2005 Setting Up Ion Chromatography Capability
- IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A
Korean Agency for Technology and Standards (KATS)
- KS M 0035-1993 General rules for ion chromatographic analysis
- KS C 6520-2008 Components and materials of semiconductor process-Measurement of wear characteristics by plasma
- KS M 0035-2023 General rules for ion chromatographic analysis
Lithuanian Standards Office
- LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
KR-KS
- KS M 0035-2008(2023) General rules for ion chromatographic analysis
RU-GOST R
- GOST 20766-1975 Ionizing radiation semiconductor spectrometer detectors. Types and basic parameters
- GOST 33914-2016 Juice products. Determination of anions by ion chromatography
SE-SIS
- SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
Japanese Industrial Standards Committee (JISC)
- JIS K 0127:1992 General rules for ion chromatographic analysis
- JIS K 0127:2013 General rules for ion chromatography
- JIS K 0127:2001 General rules for ion chromatographic analysis
GSO
- GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
- BH GSO IEC 60747-15:2016 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
- OS GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
UNKNOWN
- GB 20077663-T-604 Flame ionization detector test method for gas chromatography/supercritical fluid chromatography
HU-MSZT
- MSZ 9200/18-1980 Electronic signals. semiconductor
GOST
- GOST 34801-2021 Drinking water. Determination of bromate ions content by ion chromatography
RO-ASRO
- STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology
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