Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

Ion Chromatography and Semiconductors

Ion Chromatography and Semiconductors, Total:94 items.

The international standard classification for "Ion Chromatography and Semiconductors" includes: Other standards related to optics and optical measurements , Chemical analysis , Testing of metals , Alcohols. Ethers , Products of the chemical industry in general , Fertilizers , Analytical chemistry , Burners. Boilers , Geology. Meteorology. Hydrology .

The Chinese standard classification for "Ion Chromatography and Semiconductors" includes: chromatograph , Industrial gas and chemical gas , Semimetal and semiconductor material analysis method , Basic standards and general methods for dye , Basic standards and general methods on chemical fertilizers , Special electronic technology material , Analysis methods for toxic substances in water , Drugs for antipyretic, anodyne, anesthesia and central nervous system , Boiler and its auxiliary equipment , Meteorology .


Professional Standard - Agriculture

Military Standard of the People's Republic of China-General Armament Department

  • GJB 5018-2001 General requirements for screening and acceptance of semiconductor optoelectronic devices
  • GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices

国家市场监督管理总局、中国国家标准化管理委员会

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 11446.7-2013 Test Method for Trace Anion in Electronic Grade Water by Ion Chromatography
  • GB/T 29400-2012 Determination of microamount of inorganic anions in fertilizers by ion chromatography
  • GB/T 23978-2009 Liquid dyes—Determination of chloride ion—Ion chromatography
  • GB/T 42276-2022 Determination of fluorine ion and chloride ion in silicon nitride powder—Ion chromatography method
  • GB/T 32193-2015 Standard practice for testing flame ionization detectors used in gas or supercritical fluid chromatography
  • GB/T 28726-2012 Gas analysis—Gas chromatograph with helium ionization detector

Professional Standard - Commodity Inspection

  • SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method
  • SN/T 5032-2017 Determination of chloride ions in petroleum products. Ion chromatography

Group Standards of the People's Republic of China

  • T/CECS 10206-2022 Determination of Chloride Ion and Sulfate Ion in Concrete by Ion Chromatography
  • T/DLAS 004-2021 Determination of five kinds of selenium in selenium-enriched agricultural products by ion chromatography-inductively coupled plasma mass spectrometry

Professional Standard - Environmental Protection

  • HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Water Conservancy

  • SL 86-1994 Determination of inorganic anions in water (Ion chromatography method)

Professional Standard - Aerospace

  • QJ 10005-2008 Test guidelines of single event effects induced by heavy ions of semiconductor devices for space applications

Professional Standard - Building Materials

  • JC/T 2133-2012 Determination of impurities in silica sol for polishing solution in semiconductor industry—Inductively coupled plasma atomic emission spectrometric method

Professional Standard - Electricity

Henan Provincial Standard of the People's Republic of China

  • DB41/T 778-2013 Determination of Chloride Ion Content in Chemical Fertilizers by Ion Chromatography

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 35664-2017 Determination of ammonium in the wet precipitation--Ion chromatography

农业农村部

  • NY/T 3556-2020 Determination of selenocysteine and selenomethionine in cereals—Liquid chromatography-inductively coupled plasma mass spectrometry

Professional Standard - Education

Guangdong Provincial Standard of the People's Republic of China

  • DB44/T 417-2007 Determination of bromate in drinking water using ion chromatography

American Society for Testing and Materials (ASTM)

  • ASTM D7980-15 Standard Guide for Ion-Chromatographic Analysis of Anions in Grab Samples of Ultrapure Water (UPW) in the Semiconductor Industry
  • ASTM D7980-15(2023) Standard Guide for Ion-Chromatographic Analysis of Anions in Grab Samples of Ultrapure Water (UPW) in the Semiconductor Industry
  • ASTM D5794-95 Standard Guide for Determination of Anions in Cathodic Electrocoat Permeates by Ion Chromatography
  • ASTM D5794-95(2002) Standard Guide for Determination of Anions in Cathodic Electrocoat Permeates by Ion Chromatography
  • ASTM E1511-93(2010) Standard Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
  • ASTM E1511-93(2017) Standard Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
  • ASTM D8234-19 Standard Test Method for Anions in High Ionic Water by Ion Chromatography using Tandem Suppressed Conductivity and UV Detection

Association Francaise de Normalisation

  • NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
  • NF EN 62417:2010 Semiconductor Devices – Mobile Ion Testing for Metal Oxide Field Effect Semiconductor Transistors (MOSFETs)
  • NF EN ISO 15061:2001 Water quality - Determination of dissolved bromate - Liquid ion chromatography method
  • NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15: isolated semiconductor power devices

International Electrotechnical Commission (IEC)

  • IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Spanish Association for Standardization (UNE)

  • UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
  • UNE-EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)

Danish Standards Foundation

  • DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
  • DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

German Institute for Standardization

  • DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
  • DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.
  • DIN SPEC 1994:2017-02 Testing of materials for semiconductor technology - Determination of anions in weak acids
  • DIN SPEC 1994 E:2016-07 Testing of materials for semiconductor technology - Determination of anions in weak acids

SCC

  • CEI EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
  • DANSK DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
  • AWWA WQTC58858 Liquid Chromatography of Bromate and Bromoacetic Acids with Inductively Coupled Plasma Mass Spectrometry Detection
  • AWWA WQTC50392 A New Approach to the Determination of Inorganic Anions in Environmental Waters by Ion Chromatography
  • DANSK DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
  • CEI EN 60747-15:2012 Semiconductor devices - Discrete devices Part 15: Isolated power semiconductor devices
  • BS PD ISO/TS 19046-2:2017 Cheese. Determination of propionic acid level by chromatography-Method by ion exchange chromatography

US-ACEI

IPC - Association Connecting Electronics Industries

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

Korean Agency for Technology and Standards (KATS)

  • KS M 0035-1993 General rules for ion chromatographic analysis
  • KS C 6520-2008 Components and materials of semiconductor process-Measurement of wear characteristics by plasma
  • KS M 0035-2023 General rules for ion chromatographic analysis

Lithuanian Standards Office

  • LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)

KR-KS

RU-GOST R

  • GOST 20766-1975 Ionizing radiation semiconductor spectrometer detectors. Types and basic parameters
  • GOST 33914-2016 Juice products. Determination of anions by ion chromatography

SE-SIS

Japanese Industrial Standards Committee (JISC)

GSO

UNKNOWN

  • GB 20077663-T-604 Flame ionization detector test method for gas chromatography/supercritical fluid chromatography

HU-MSZT

GOST

  • GOST 34801-2021 Drinking water. Determination of bromate ions content by ion chromatography

RO-ASRO

  • STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology