sj/t 11532.1-2015

sj/t 11532.1-2015, Total:143 items.

The international standard classification for "sj/t 11532.1-2015" includes: .

The Chinese standard classification for "sj/t 11532.1-2015" includes: .

Professional Standard - Electron

SJ/T 11494-2015 Test methods for photoluminescence analysis of single crystal silicon for III-V impurities
SJ/T 11540-2015 General specification for active speakers
SJ/T 11520.8.9-2015 Coaxial Communication Cables Part 8-9: Detailed Specification for Type 75-250 Polytetrafluoroethylene (PTFE) Insulated Semi-Flexible Cables
SJ/T 11560-2015 Minimum allowable value of energy efficiency and energy grade of audio power amplifiers-Professional class D
SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
SJ/T 11310.5-2015 Information device intelligent grouping and resource sharing. Part 5: Device type
SJ/T 2658.4-2015 Measuring method for semiconductor infrared-emitting diode. Part 4: Total capacitance
SJ/T 11520.8.4-2015 Coaxial Communication Cables Part 8-4: Detailed Specification for Type 50-141 Polytetrafluoroethylene (PTFE) Insulated Semi-Flexible Cables
SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
SJ/T 11553-2015 93% A1203 ceramics for vacuum electronic device
SJ/T 11548.1-2015 Information technology.Social service and management.Technical specification for three dimensional digital social service and management system.Part 1: General principles
SJ/T 11521.2-2015 Interactive platform for digital television receiving equipment. Part 2: Applicatin Programming Interface
SJ/T 11512-2015 Test methods of electronic pastes for integrated circuit performent
SJ/T 11436-2015 Technical specification for air-conditioning energy consumption of fan-coil unit monitoring system
SJ/T 11516-2015 Specification for thin film transistor (TFT) mask
SJ/T 11549-2015 No-clean flux used for crystalline silicon photovoltaic (PV) modules
SJ/T 11310.3-2015 Information equipment resource sharing and collaboration services Part 3: Basic applications
SJ/T 11532.1-2015 General technical requirements of electronic label for dangerous chemical gas cylinder identification. Part 1: Gas cylinder electronic identification code
SJ/T 11339-2015 General specification for digital television plasma displays
SJ/T 11506-2015 Aluminum etching solution for Integrated Circuit
SJ/T 11534-2015 Copper-clad PTFE woven glass fabric laminate for microwave circuit
SJ/T 11310.2-2015 Information device intelligent grouping and resource sharing. Part 2: Application profile
SJ/T 11490-2015 Test method for measuring etch pit density(EPD) in low dislocation density gallium arsenide wafers
SJ/T 11530-2015 Information technology. General specification for swithching power adapter
SJ/T 11485-2015 LED type naming rules
SJ/T 11521.3-2015 Interactive platform for digital television receiving equipment. Part 3: System testing specification
SJ/T 2354-2015/0352 Measuring methods for photodiodes of PIN、APD
SJ/T 11556-2015 Determination of Ag, Au、Ca、Cu, Fe、K、Na concentration of nitric acid by AAS
SJ/T 11503-2015 Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers
SJ/T 11528-2015 Information technology. Mobile storage.General specification of memory cards
SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
SJ/T 11518-2015 Surface Mount Technology Print Stencil
SJ/T 11488-2015 Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals
SJ/T 11551-2015 Resin-coated copper foil for high-density interconnection printed circuits
SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode. Part 1: General
SJ/T 11565.1-2015 Information technology service-Consulting and design- Part 1:General requirements
SJ/T 11564.4-2015 Information technology service-Maintenance- Part4:Specification for data center
SJ/T 11497-2015 Test method for thermal stability testing of gallium arsenide wafers
SJ/T 11531-2015 Wireless technical standards and test methods of read-write device for electronic label
SJ/T 11550-2015 Tin-based solder dipping ribbon used for crystalline silicon photovoltaic (PV) modules
SJ/T 2658.7-2015 Measuring method for semiconductor infrared-emitting diode. Part 7: Radiant flux
SJ/T 10754-2015 Test methods for gold, silver and their alloy brazing for electron device Determination of cleanness, spatter
SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
SJ/T 11510-2015 Aluminum etching solution for LCD
SJ/T 11460.6.2-2015 Backlight unit for liquid crystal display. Part 6-2: Measuring methods of dynamic optical and optoelectrical parameters
SJ/T 11496-2015 Determination of boron concentration in gallium arsenide by infrared absorption
SJ/T 10464-2015 Metallized polypropylene film for capacitors
SJ/T 11310.6-2015 Information device intelligent grouping and resource sharing.Part 6: Service type
SJ/T 2658.13-2015 Measuring method for semiconductor infrared-emitting diode. Part 13: Temperature coefficient for radiant power
SJ/T 11546-2015 Technical requirements and methods of measurement for integration of display wall
SJ/T 11562-2015 Technology specification of software collaborative development platform
SJ/T 11533-2015 General specification for 24-pin dot matrix print head
SJ/T 11522-2015 Main performance test methods for theater speaker systems
SJ/T 2658.5-2015 Measuring method for semiconductor infiared-emitting diode. Part 5: Series connection resistance
SJ/T 11378.6.1-2015 Plasma display devices Part 6-1: Detailed specifications for color plasma display devices for digital television sets
SJ/T 10465-2015 Metallized polyester film for capacitors
SJ/T 11544-2015 Technical requirements and methods of measurement for optical engine of rear projection displays of digital television
SJ/T 11523-2015 Speaker performance test method for line array loudspeaker systems
SJ/T 11532.2-2015 General technical requirements of electronic label for dangerous chemical gas cylinder identification. Part 2: Application technical specification
SJ/T 11545-2015 General specification for micro-display Projector AC ultra pressure mercury lamp
SJ/T 11011-2015 Test method for lead, bismuth, zinc, cadmium, iron, magnesium, aluminium, tin, antimony and phosphorus in pure silver brazing for electron device by ICP-AES
SJ/T 11532.3-2015 General specification of electronic label for dangerous chemical gas cylinder identification. Part 3: Special requirements for reader/writer
SJ/T 11511-2015 Positive Photoresist developer for LCD
SJ/T 11407.3.1-2015 Content protection specifications for digital interface.Part3-1: Specification for DTV-CI content protection system
SJ/T 11340-2015 General specifications for front projectors
SJ/T 11520.8.5-2015 Coaxial Communication Cables Part 8-5: Detailed Specification for Type 50-250 Polytetrafluoroethylene (PTFE) Insulated Semi-Flexible Cables
SJ/T 11542-2015 Technical requirement and test method of 3D projector
SJ/T 10414-2015 Solder for semiconductor device
SJ/T 11499-2015 Test method for measuring electrical properties of monocrystalline silicon carbide
SJ/T 11492-2015 Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence
SJ/T 2658.6-2015 Measuring method for semiconductor infrared-emitting diode. Part 6: Radiant power
SJ/T 11539-2015 General specification for contact image sensor
SJ/T 2658.10-2015 Measuring method for semiconductor infrared-emitting diode. Part 10: Modulation bandwidth
SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
SJ/T 11520.8.3-2015 Coaxial Communication Cables Part 8-3: Detailed Specification for Type 50-086 Polytetrafluoroethylene (PTFE) Insulated Semi-Flexible Cables
SJ/T 11378.7-2015 Plasma display devices Part 7: Reliability test methods for plasma display devices for digital televisions
SJ/T 11514-2015 Thermosetting Conductive Paste for Printed Circuit Board (PCB)
SJ/T 11558.5-2015 LED power supply-Part S:Measuring methods
SJ/T 11563-2015 Processes and environments of network-based trustworthy software production
SJ/T 2658.8-2015 Measuring method for semiconductor infrared-emitting diode. Part 8: Radiant intensity
SJ/T 11343-2015 General specifications for digital television liquid crystal displays
SJ/T 11029-2015 Analytical methods for gold nickel brazing for electron device Determination of nickel by EDTA volumetry
SJ/T 11561-2015 Specification for software component runtime environment
SJ/T 11493-2015 Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
SJ/T 11509-2015 ITO etching solution for liquid crystal display
SJ/T 11407.3.2-2015 Content protection specifications for digital interface.Part 3-2: Test specification for DTV-CI content protection system
SJ/T 11552-2015 Test methods for measurement of interstitial oxygen content of silicon wafers by infrared absorption with P-polarized radiation incident at the Brewster angle
SJ/T 2089-2015 Type designation for electronic measuring instruments
SJ/T 2658.2-2015 Measuring method for semiconductor infrared-emitting diode. Part 2: Forward voltage
SJ/T 11527-2015 General specification for redundant array of independent disks
SJ/T 11495-2015 Guide to conversion factors for interstitial oxygen in silicon
SJ/T 11535-2015 General specification for magnetron modulator
SJ/T 10753-2015 Gold, silver and their alloy brazing for electron device
SJ/T 11529-2015 General specification for radio frequency identification system of garment product line
SJ/T 11486-2015 Technical specification for low power light. emitting diode chips
SJ/T 11489-2015 Test method for measuring etch pit density(EPD) in low dislocation density indium phosphide wafers
SJ/T 11504-2015 Test method for measuring surface quality of polished monocrystalline silicon carbide
SJ/T 11519-2015 Specification for tinned copper wire of electronic connection used
SJ/T 2938-2015 Technical requirements and test methods for signal generator of television video
SJ/T 11491-2015 Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry
SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry
SJ/T 11439-2015 Information technology.General specification of area type two-dimensional bar code reading engine
SJ/T 11438-2015 Information technology.General specification for commercial thermal paper rolls
SJ/T 11536.1-2015 High performance computer. Blade server. Part1: Technical requirement for management module
SJ/T 11435-2015 Information technology service.Service management.Technical requirements
SJ/T 11557-2015 General specification for low-voltage composite switch
SJ/T 11520.8.8-2015 Coaxial Communication Cables Part 8-8: Detailed Specification for Type 75-141 Polytetrafluoroethylene (PTFE) Insulated Semi-Flexible Cables
SJ/T 11513-2015 Aluminium paste for solar cell
SJ/T 2658.3-2015 Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current
SJ/T 11507-2015 Oxide coating etching buffer for integrated circuit
SJ/T 11517-2015 Gases for electronic industry-Carbon monoxide
SJ/T 11521.1-2015 Interactive platform for digital television receiving equipment. Part 1: System architecture
SJ/T 2216-2015 Technical specification for photodiode of silicon
SJ/T 11515-2015 Pb-free glass powder for plasma display panel
SJ/T 11526-2015 Information technology.SCSI object-based storage device commands
SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
SJ/T 11524-2015 General specification for digital sound console
SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
SJ/T 2658.9-2015 Measuring method for semiconductor infiared-emitting diode. Part 9: Spatial distribution of radiant intensity and half-intensity angle
SJ/T 11554-2015 Determination of the metals'concentration of hydrofluoric acid by ICP-OES
SJ/T 11520.8.2-2015 Coaxial Communication Cables Part 8-2: Detailed Specification for Type 50-047 Polytetrafluoroethylene (PTFE) Insulated Semi-Flexible Cables
SJ/T 11030-2015 Test method for lead, phosphorus and zinc in gold copper and gold nickel brazing for electron device by ICP-AES
SJ/T 11508-2015 Positive Photoresist developer for Integrated Circuit
SJ/T 11505-2015 Sapphire single crystal polished wafers specification
SJ/T 11543-2015 Technical requirements and methods measurement for optical engine of front projection
SJ/T 11028-2015 Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry
SJ/T 2658.11-2015 Measuring method for semiconductor infrared-emitting diode. Part 11: Response time
SJ/T 11525-2015 General specification for digital photo frame
SJ/T 11537-2015 High performance computer. Cluster. Technical requirement for monitoring system
SJ/T 11577-2016 SJ/T 11394-2009 "Semiconductor Light Emitting Diode Test Methods" Application Guide
SJ/T 11437-2015 Information technology.Mobile storage.General specification of portable digital audio-visual players
SJ/T 11541-2015 Method of measurement for the image quality of stereoscopic television
SJ/T 11538-2015 General specification for thermal print head
SJ/T 11460.6.1-2015 Backlight unit for liquid crystal display. Part 6-1: Measuring method of optical and optoelectrical parameters
SJ/T 11346-2015 Methods of measurement for electronic projectors
SJ/T 11555-2015 Determination of the metals' concentration of nitric acid by ICP-MS
SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
SJ/T 11484-2015 Aluminum doped zinc oxide type transparent conductive oxide coated glass

Tianjin Provincial Standard of the People's Republic of China

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Hebei Provincial Standard of the People's Republic of China

DB13/T 3006-2017 Specifications for the application and management of electronic labels for vehicle gas cylinders
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Group Standards of the People's Republic of China

T/CCGA 40002-2019 Application management specification of the electronic label for hydrogen energy vehicle cylinders

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