Jujing Optoelectronics
Jujing Optoelectronics, Total:72 items.
The international standard classification for "Jujing Optoelectronics" includes: Glass products , Semiconducting materials .
The Chinese standard classification for "Jujing Optoelectronics" includes: Technical management , Special glass , Industrial technical glass , Material and component for instrument and meter , Elemental semiconductor material .
Group Standards of the People's Republic of China
- T/CSTM 00316-2022 Optoelectric single crystals - Lithium tantalate single crystals for pyroelectric infrared detection
- T/CSTM 00463-2022 Classification of black rings in N-type crystalline silicon photovoltaic cells
- T/CPIA 0048.2-2023 Guidelines for Manufacturing Standard Crystalline Silicon Photovoltaic Cells for Production Lines Part 2: Heterogeneous Crystalline Silicon Photovoltaic Cells
- T/CVIA 84-2021 Mini LED Backlight LCD TV Technical Requirements
- T/CPIA 0055.2-2024 Crystalline silicon photovoltaic cells Part 2: Heterojunction photovoltaic cells
- T/CVIA 83-2021 Mini LED Backlight LCD TV Test Method
- T/ZJSEE 0010-2023 Test and defect judgement method for crystalline silicon moudules in photovoltaic power staion by electroluminescence(EL)imaging
- T/ZZB 1389-2019 Monocrystalline silicon photovoltaic cells
- T/CPIA 0041-2022 Measurement of light and elevated temperature induced degradation(LETID) of crystalline silicon solar cells
- T/CPIA 0020-2020 Electroluminescence Test Method for Crystalline Silicon Photovoltaic Cells
- T/CPIA 0048.1-2022 Guidelines for making crystalline silicon reference photovoltaic cellof production lines-Part 1: Homojunction crystalline siliconphotovoltaic cell
- T/CSTM 00463-2023 Classification of black rings in N-type crystalline silicon photovoltaic cells
Taiwan Provincial Standard of the People's Republic of China
- CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
Professional Standard - Electron
- SJ/T 11802-2024 Front silver paste for crystalline silicon photovoltaic cells
- SJ/T 2217-2014 Technical specification for phototransistor of silicon
- SJ 50033/111-1996 Semiconductor optoelectronic devices - Detail specification for Type GT16 Si. NPN phototransistor
- SJ/T 11801-2024 Silver paste for back side of crystalline silicon photovoltaic cells
- SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
Professional Standard - Building Materials
- JC/T 2129-2012 Laminated electron - switchable visibility - control glass functioned by liquid crystal material
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35847-2018 Switchable glazing filmed by polymer dispersed liquid crystal
Fujian Provincial Standard of the People's Republic of China
- DB35/T 1126-2011 Low-light amorphous silicon solar cell
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 29055-2019(英文版) Multi crystalline silicon wafers for photovoltaic solar cell
- GB/T 42666-2023 Electronic dyed liquid crystal dimmable glass
- GB/T 15651.7-2024 Semiconductor devices—Part 5-7: Optoelectronic devices—Photodiodes and phototransistors
Professional Standard - Machinery
- JB/T 9495.1-1999 Optical Crystals
Military Standard of the People's Republic of China-General Armament Department
- GJB 9463-2018 Rubidium titanyl phosphate (RTP) electro-optical crystal specifications
Professional Standard - Aviation
- HBm 66.33-1989 Minivan Transistor Flasher Relay
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41325-2022 Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
- GB/T 12964-2018 Monocrystalline silicon polished wafers
未注明发布机构
- SEMI M55-0308-2008 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS
ES-UNE
- UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
- UNE-EN IEC 63202-1:2020 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- UNE-EN 120004:1992 BDS: AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTORS OUTPUT. (Endorsed by AENOR in September of 1996.)
SE-SIS
- SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays
German Institute for Standardization
- DIN EN 120003:1996 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
- DIN EN 120003:1996-11 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
European Standard for Electrical and Electronic Components
- EN 120003:1992 Blank detail specification: phototransistors, photodarlington transistors, phototransistor arrays
- CECC 20 004- 006 ISSUE 1-1988 Photocoupler with Phototransistors Output Type Number: SFH 601 (En)
Association Francaise de Normalisation
- NF C93-120-003*NF EN 120003:1992 Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
- NF EN 120003:1992 Special framework specification: phototransistors, photodarlington transistors, phototransistor networks
- NF C57-331*NF EN IEC 63202-1:2019 Photovoltaic cells - Part 1 : measurement of light-induced degradation of crystalline silicon photovoltaic cells
- NF EN IEC 63202-1:2019 Photovoltaic cells - Part 1: measuring light-induced degradation of crystalline silicon photovoltaic cells
- NF EN 62595-2:2013 Backlit LCD screen - Part 2: electro-optical measurement methods for an LED backlit screen
- NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
Lithuanian Standards Office
- LST EN 120003-2001 Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
SCC
- DANSK DS/EN 120003:2016 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
- BS PD IEC TS 63202-2:2021 Photovoltaic cells-Electroluminescence imaging of crystalline silicon solar cells
- DANSK DS/EN IEC 63202-1:2019 Photovoltaic cells – Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- CEI EN IEC 63202-1:2020 Photovoltaic cells Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- BS PD IEC TS 63202-4:2022 Photovoltaic cells-Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
- DANSK DS/IEC TS 63202-2:2022 Photovoltaic cells – Part 2: Electroluminescence imaging of crystalline silicon solar cells
- 09/30192488 DC BS EN 62595. Electro-optical measurement methods of LED backlight unit for liquid crystal displays
British Standards Institution (BSI)
- BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
- BS EN 120003:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
- BS EN IEC 63202-1:2019 Photovoltaic cells - Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- PD IEC TS 63202-2:2021 Photovoltaic cells. Electroluminescence imaging of crystalline silicon solar cells
- PD IEC TS 63202-4:2022 Photovoltaic cells - Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
CZ-CSN
- CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
- CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
Korean Agency for Technology and Standards (KATS)
- KS C 8561-2015 Crystalline silicone photovoltaic(PV) module(performance)
- KS B 5242-2001 Optical parallels
- KS B 5242-1985 Optical parallels
Japanese Industrial Standards Committee (JISC)
- JIS B 7431:1977 Optical parallels
European Committee for Electrotechnical Standardization（CENELEC）
- EN IEC 63202-1:2019 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
International Electrotechnical Commission (IEC)
- IEC 63202-1:2019 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
- IEC TS 63202-2:2021 Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
GSO
- GSO IEC 63202-1:2021 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- BH GSO IEC 63202-1:2022 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
- BH GSO IEC 60747-5-7:2022 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
- GSO IEC 60747-5-7:2021 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
RO-ASRO
- STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
