Crystal Optoelectronics
Crystal Optoelectronics, Total:14 items.
The international standard classification for "Crystal Optoelectronics" includes: .
The Chinese standard classification for "Crystal Optoelectronics" includes: .
Group Standards of the People's Republic of China
- T/CPIA 0020-2020 Electroluminescence Test Method for Crystalline Silicon Photovoltaic Cells
- T/ZZB 1389-2019 Monocrystalline silicon photovoltaic cells
ES-UNE
- UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
SE-SIS
- SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays
German Institute for Standardization
- DIN EN 120003:1996 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
- DIN EN 120003:1996-11 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
European Standard for Electrical and Electronic Components
- EN 120003:1992 Blank detail specification: phototransistors, photodarlington transistors, phototransistor arrays
Association Francaise de Normalisation
- NF C93-120-003*NF EN 120003:1992 Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
- NF EN 120003:1992 Special framework specification: phototransistors, photodarlington transistors, phototransistor networks
Lithuanian Standards Office
- LST EN 120003-2001 Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
SCC
- DANSK DS/EN 120003:2016 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
British Standards Institution (BSI)
- BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
- BS EN 120003:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
CZ-CSN
- CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
crystal,Crystallization,Crystal form,crystal crack,crystallinity crystal,crystal axis crystal axis,Amorphous nanocrystalline,Jingjing,Crystal Core Optoelectronics,nanocrystalline amorphous,Crystal Optoelectronics,Crystal faces,crystal form,Crack Jingjing,Jujing Optoelectronics,Crystalline phase,Crystallization Seed,intergranular condition,Grain-along,Nanocrystalline-amorphous
