thermoelectric semiconductor

thermoelectric semiconductor, Total:434 items.

The international standard classification for "thermoelectric semiconductor" includes: Semiconductor devices in general , Plug-and-socket devices. Connectors , Measurement of force, weight and pressure , Other electromechanical components , Electromechanical components in general , Semiconductor devices , Electrical engineering (Vocabularies) , Mechanical structures for electronic equipment , Plastics and rubber insulating materials , Integrated circuits. Microelectronics , Testing of metals , Testing of metals in general , Rectifiers. Convertors. Stabilized power supply , Mechanical testing of metals , Electronic components in general , Semiconducting materials , Other electrical accessories , Optoelectronics. Laser equipment , Aerospace electric equipment and systems .

The Chinese standard classification for "thermoelectric semiconductor" includes: Power semiconductor device and parts , Transformer , Industrial automation and control device in general , Basic standards and general methods , Electrical insulating material and its products , Connector , Microcircuit in general , Metal physical property test method , Semiconductor integrated circuit , Metal nondestructive testing method , Semiconductor discrete devices in general , Semimetal and semiconductor material in general , Basic standards and general methods , Optoelectronic device assembly , Technical management , Technical management , Laser device , Electronic components .

Professional Standard - Machinery

JB/T 2423-1999 Type designation for power semiconductor device
JB/T 7483-1994 Semiconductor resistance strain sensor
JB/T 10501-2005 Ceramic parts of case for power semiconductor devices
JB/T 10097-2000 Case for power semiconductor device
JB/T 7063-1993 Rated Voltage and Current of Power Semiconductor Devices
JB/T 7786-1995 Sampling Method for Test of Power Semiconductor Devices
JB/T 7059-1993 Guide for Preparation of Standard for Power Semiconductor Modules
JB/T 8175-1999 Outline dimensions of extruded heat sink for power semiconductor devices
JB/T 10096-2000 Selection guidance of case for power semiconductor device
JB/T 5842-1991 Die alignment rings for power semiconductor devices
JB/T 5781-1991 Sectioned Radiator for Power Semiconductor Devices. Technical Specification
JB/T 5842-2005 Rings for dies of semiconductor devices
JB/T 5843-2005 Connectors for power semiconductor devices
JB/T 11331-2013 Heat-shrinkable Semi-conductive Tubing
JB/T 5835-2005 Components of gate terminal for power semiconductor devices
JB/T 5835-1991 Gate assemblies for power semiconductor devices
JB/T 9644-1999 Reactor for semiconductor electric drive
JB/T 9687.1-1999 Molybdenum Disk for Power Semiconductor Devices
JB/T 8669-1997 Semiconductor Frequency Changing Unit Intended to Be Used in Medium Frequency Induction Heating
JB/T 7483-2005 Semiconductor resistance strain gauge force stransducer/sensor
JB/T 5843-1991 Connectors for Power Semiconductor Devices
JB/T 9684-2000 Selecting guide of heat sink for power semiconductor device
JB/T 10096-1999 Selection Guidance of Case for Power Semiconductor Device
JB/T 8757-1998 Hot Pipe Radiators Intended to be Used in Power Semiconductor Devices
JB/T 10097-1999 Cases for Power Semiconductor Devices
JB/T 7061-1993 Silicon Wafers Intended to Be Used in Power Semiconductor Devices
JB/T 8661-1997 Construction Parts of Electric Semiconductor Modules
JB/T 9687.2-1999 Tungsten disk for power semiconductor devices
JB/T 4277-1996 Packing of Power Semiconductor Parts
JB/T 5844-1991 Directional relays and power relays with two input energizing quantities (IEC 60255-12: 1980 NEQ)

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)
GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 8446.1-1987 Heat sink for power semiconductor device
GB/T 13422-2013 Semiconductor converters—Electrical test methods
GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
GB/T 8446.2-2004 Heat sink for power semiconductor device - Part 2: Measuring method of thermal resistance and imput fluid-output fluid pressure difference
GB/T 42736-2023 Heat-shinkable semiconductive polyolefin sleeving
GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
GB/T 13422-1992 Power semiconductor converters－Electrical test methods
GB/T 8446.1-2004 Heat sink for power semiconductor device—Part 1:Casting kind series
GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GB/T 7423.3-1987 Heat sink of semiconductor devices--Heat sink, staggered fingers shapes
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
GB/T 3430-1989 The rule of type designation for semiconductor integrated circuits
GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
GB/T 17950-2000 Semiconductor converter - Part 6: Application guide for the protection of semiconductor converters against overcurrent by fuses
GB/T 2900.32-1994 Electrotechnical terminology - Power semiconductor device
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
GB/T 8446.2-1987 Measuring method of thermal resistance and input fluid-output fluid pressure difference of heat sink for power semiconductor device
GB/T 7423.1-1987 Heat sink of semiconductor devices--Generic specification
GB/T 5839-1986 Rating systems for electronic tubes and semiconductor devise
GB/T 14862-1993 Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits
GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
GB/T 15872-2013 Power supply interface for semiconductor equipment
GB 7423.3-1987 sink of semiconductor devices - Heat sink, staggered fingers shapes
GB/T 3859.2-1993 Semiconductor convertors Application guide
GB/T 7423.2-1987 Heat sink of semiconductor devices--Heat sink, Extruded shapes
GB/T 14113-1993 of packages for semiconductor integrated circuits
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3859.3-1993 Semiconductor convertors—Transformers and reactors
GB 5839-1986 Rating systems for electronic tubes and semiconductor devise
GB/T 42974-2023 Semiconductor integrated circuits—Flash memory(FLASH)
GB/T 8446.3-1988 Insulators and fasteners for heat sink for power semiconductor device
GB 7423.1-1987 sink of semiconductor devices - Generic specification
GB/T 14264-1993 Semiconductor materials－Terms and definitions
GB/T 20515-2006 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
GB/T 8446.3-2004 Metallic materials - Wire - Wrapping test
GB 7423.2-1987 sink of semiconductor devices - Heat sink, Extruded shapes

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 37031-2018 Semiconductor lighting terminology
GB/T 8446.1-2022 Heat sinks for power semiconductor devices—Part 1: Radiators
GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits
GB/T 8446.3-2022 Heat sinks for power semiconductor devices—Part 3: Insulators and fasteners
GB/T 8446.2-2022 Heat sinks for power semiconductor devices—Part 2: Measurement methods of thermal resistance and inlet-outlet fluid pressure drop

Military Standard of the People's Republic of China-General Armament Department

GJB 597A-1996 General Specification for Semiconductor Integrated Circuits
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 8120-2013 General specification for semiconductor optoelectronic module
GJB 597B-2012 General specification for semiconductor integrated circuits
GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
GJB 8121-2013 General specification for semiconductor optoelectronic assembly
GJB 1420A-1999 General Specification for Semiconductor Integrated Circuit Enclosures
GJB 8119-2013 General specification for semiconductor optoelectronic device
GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
GJB 597/12A-1998 Detailed specifications for semiconductor integrated circuit HCMOS gate circuits
GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

机械电子工业部

JB 5781-1991 Technical conditions of profile radiators for power semiconductor devices
JB 5842-1991 Die positioning rings for power semiconductor devices
JB 5835-1991 Gate assembly for power semiconductor devices
JB 5843-1991 Connectors for power semiconductor devices

Guizhou Provincial Standard of the People's Republic of China

DB52/T 844-2013 Semiconductor Current Regulator
DB52/T 796-2013 Industrial semiconductor electric detonator
DB52/T 1104-2016 Transient test method for junction-case thermal resistance of semiconductor devices

Professional Standard - Electron

SJ 1795-1981 Detail specification for 50-1000mA low current thyristors
SJ/T 11067-1996 Commonly used terms for semiconductor photoelectric materials and pyroelectric materials in infrared detecting materials
SJ 20788-2000 Measurment method for thermal impedance of semiconductor diodes
SJ 2433-1984 Bonding sheet for semiconductor tubes
SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
SJ/T 11395-2009 Semiconductor lighting terminology
SJ 20787-2000 Measurement method for thermal resistance of semiconductor bridge rectifieres
SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
SJ 20642-1997 Semiconductor opto-electronic module-General specification for
SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
SJ 20786-2000 General specification for semiconductor opto-electronic assembly
SJ/T 11742-2019 Thermally conductive non-prepreg prepreg for printed circuit
SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor

国家机械工业局

JB 9644-1999 Reactor for semiconductor electric transmission

Taiwan Provincial Standard of the People's Republic of China

CNS 13802.5-1997 Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
CNS 13802-5-1997 Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
CNS 7011-1981 Numbering of Electrodes in Multiple Electrode Semiconductor Devices and Designation of Units in Multiple Unit Semiconductor Devices
CNS 11900-1987 Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 15651.4-2017 Semiconductor devices-Discrete devices-Part 5-4:Optoelectronic devices-Semiconductor lasers
GB/T 35010.6-2018 Semiconductor die products—Part 6:Requirements for concerning thermal simulation

Professional Standard - Aerospace

QJ 259-1977 器件
QJ 786-1983 Semiconductor Integrated Circuits - Specifications for Screening
QJ 2212-1991 Semiconductor Integrated Circuit Design Guidelines

机械工业部

JB/T 6306-1992 Power semiconductor module dimensions

Professional Standard - Ferrous Metallurgy

YB/T 6113-2023 Silicon carbide heat conductor for electric heating furnace

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1873-2016 semiconductor refrigeration wine cabinet

Group Standards of the People's Republic of China

T/IAWBS 009-2019 High Voltage Bias Steady-state Temperature Humidity Test for Power Semiconductor Devices
T/JSXH 0002-2020 Regeneration solution for semiconductor
T/QGCML 4031-2024 Semiconductor optical wafer

工业和信息化部

QB/T 5369-2019 Semiconductor refrigeration appliance

Jiangxi Provincial Standard of the People's Republic of China

DB3603/T 4-2022 Technical specifications for the manufacture of semiconducting glazes for electric porcelain

GOSTR

GOST 18577-1980 Thermoelectric semiconductor devices. Terms and definitions

SCC

BS PD IEC TR 63378-1:2021 Thermal standardization on semiconductor packages-Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
DANSK DS/EN 62830-2:2017 Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 2: Thermo power based thermoelectric energy harvesting
BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
DIN EN 62830-2 E:2014 Draft Document - Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting (IEC 47/2190/CD:2014)
BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
CEI EN 62416:2011 Semiconductor devices - Hot carrier test on MOS transistors
AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
DANSK DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS 3839:1965 Oxygen free high conductivity copper for electronic tubes and semiconductor devices
BS PD ES 59008-4-3:2000 Data requirements for semiconductor die. Specific requirements and recommendations-Thermal
CEI 3-17:2005 Segni grafici per schemi - Semiconduttori e tubi elettronici
IEC 60146:1973 Semiconductor convertors
DANSK DS/EN IEC 63244-1:2021 Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General requirements and specifications
CEI EN IEC 63244-1:2022 Semiconductor devices - Semiconductor devices for wireless power transfer and charging Part 1: General requirements and specifications
BS 3363:1961 Schedule of letter symbols for light-current semiconductor devices
CEI EN 62415:2011 Semiconductor devices - Constant current electromigration test
DIN IEC 60747-14-5 E:2008 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
DIN IEC 60747-10:1987 Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
DANSK DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
MIL MIL-H-87111/5B-1986 HEAT SINKS, ELECTRICAL-ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICE, CLASS I (FORMED) (S/S BY MIL-H-87111/5C)
CEI EN IEC 63287-1:2022 Semiconductor devices - Generic semiconductor qualification guidelines Part 1: Guidelines for IC reliability qualification
CEI EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements
BS PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
07/30164953 DC IEC 60747-14-5. Semiconductor devices. Discrete devices. Part 14-5. Semiconductor sensors. PN-junction semiconductor temperature sensor
DANSK DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
AS 1102.5:1972 Graphical symbols for electrotechnology - Semiconductor devices
MIL MIL-DTL-19491J-2014 Semiconductor Devices, Packaging of
BS IEC 60747-1:2006 Semiconductor devices. General
CEI EN 62258-1:2011 Semiconductor devices - Semiconductor die products Part 1: Procurement and use
AENOR UNE 21017:1959 BARE, SEMI-RIGID COPPER CABLES FOR ELECTRICAL CONDUCTORS
AS C379.1:1970 Mechanical standardization of semiconductor devices - Preparation of drawings of semiconductor devices
DANSK DS/EN IEC 62969-1:2018 Semiconductor devices – Semiconductor interface for automotive vehicles – Part 1: General requirements of power interface for automotive vehicle sensors

British Standards Institution (BSI)

PD IEC TR 63378-1:2021 Thermal standardization on semiconductor packages. Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
BS IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation. - Part 2: Thermo power based thermoelectric energy harvesting
BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS IEC 62830-5:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Test method for measuring generated power from flexible thermoelectric devices
22/30443234 DC BS EN 63378-3. Thermal standardization on semiconductor packages - Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
23/30469010 DC BS EN IEC 63378-3. Thermal standardization on semiconductor packages - Part 3. Thermal circuit simulation models of discrete semiconductor packages for transient analysis
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS EN IEC 62969-1:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
BS IEC 62899-203:2024 Printed electronics - Materials. Semiconductor ink
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
18/30355426 DC BS EN 62830-5. Semiconductor devices. Semiconductor devices for energy harvesting and generation. Part 5. Test method for measuring generated power from flexible thermoelectric devices
19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
BS 6493-2.1:1985 Semiconductor devices - Integrated circuits - General
BS IEC 60748-1:2002 Semiconductor devices - Integrated circuits - General
BS EN IEC 63244-1:2021 Semiconductor devices. Semiconductor devices for wireless power transfer and charging. General requirements and specifications
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integr...
BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
23/30469486 DC BS EN IEC 63378-2. Thermal standardization on semiconductor packages - Part 2. 3D thermal simulation models of discrete semiconductor packages for steady-state analysis
BS EN 62415:2010 Semiconductor devices - Constant current electromigration test
BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
BS 3839:1978 Specification for oxygen-free high-conductivity copper for electronic tubes and semiconductor devices
13/30264600 DC BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
BS EN 62258-6:2006 Semiconductor die products - Requirements for information concerning thermal simulation
PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
BS IEC 62899-203:2018 Printed electronics. Materials. Semiconductor ink
BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
BS EN 60747-16-4:2004+A2:2017 Semiconductor devices - Microwave integrated circuits. Switches
BS IEC 60747-1:2006+A1:2010 Semiconductor devices - General
BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
BS EN 62047-19:2013 Semiconductor devices. Micro-electromechanical devices. Electronic compasses
BS IEC 62951-9:2022 Semiconductor devices. Flexible and stretchable semiconductor devices - Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication

Defense Logistics Agency

DLA DESC-DWG-84002-1984 HEAT SINKS FOR SEMICONDUCTOR DEVICES
DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
DLA MIL-S-19500/230 C VALID NOTICE 4-2011 Semiconductor Device, Diode, Silicon, High-Conductance Type JAN- 1N3207
DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF

PH-BPS

PNS IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

GSO

GSO IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
BH GSO IEC 62830-2:2022 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
OS GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
BH GSO IEC 60747-5-4:2016 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
OS GSO IEC 60748-11:2014 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60748-11:2014 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60747-14-2:2014 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
GSO IEC 60748-5:2015 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
BH GSO IEC 60747-14-2:2016 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
BH GSO IEC 60748-11-1:2016 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60748-11-1:2014 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
BH GSO IEC 60747-14-4:2016 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
OS GSO IEC 60747-14-4:2014 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
OS GSO IEC 60747-14-3:2014 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

CZ-CSN

CSN 35 1609-1983 Power semiconductor devices. Heat sinks. Testing methodo
CSN 35 1608-1983 Power semiconductor devices. Heat sinks. General technical requirements
CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
CSN 35 8785-1975 Semiconductor devices. Varicaps. Measurement of thermal capacitance coefflcient.
CSN 35 1606-1983 Power semiconductor devices. Heat sinks. Terms. Definitions. Letter symbols.
CSN 35 8773-1977 Meaaurement of semiconductor devices. Thyristors. Meaaurement of blocking current and reverse blocking current.
CSN 35 8701 Z1-1997 Semiconductor naming
CSN 35 8850 Cast.1-1984 Semiconductor radiators. Main parameters of measuring methods
CSN 35 8740-1973 Semiconduotor deviees. Transistore. Measurement of saturation voltage
CSN 35 8732-1964 Semiconductor diodes. Measurement of forward current
CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
CSN 35 8736-1964 Semiconductor diodes. Measurement of interelectrode capacitanoe
CSN 35 1531-1973 Silicon semiconductor rectifiers
CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
CSN 35 1603-1983 Power semiconductor devices. General methodes of measurements
CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current

CU-NC

NC 66-13-1984 Electronics. Thermal Dissipators for Semiconductors Quality Specifications

AIA/NAS - Aerospace Industries Association of America Inc.

NAS4121-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Formed
NAS4122-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Extruded
NAS4119-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Press-On Type
NAS4124-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Dual Link
NAS4118-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Retainer Clip Type
NAS4120-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Encapsulating Type@ TO-5
NAS4119-2011 HEAT SINK@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ PRESS-ON TYPE (Rev 1)
NAS4121-2012 HEAT SINK@ ELECTRICAL@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ FORMED (Rev 1)
NAS4122-2013 HEAT SINK@ ELECTRICAL-ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ EXTRUDED (REV 1)
NAS4124-2012 HEAT SINK@ ELECTRICAL/ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ DUAL LINK (Rev 1)
NAS4123-1995 Heat Sink@ Electrical-Electronic Component@ Semiconductor Devices@ for Dual Inline Packages (DIP)
NAS4118-2012 HEAT SINK@ ELECTRICAL@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ RETAINER CLIP TYPE (Rev 1)
NAS4120-2012 HEAT SINK@ ELECTRICAL@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ ENCAPSULATING TYPE@ TO-5 (Rev 1)

Aerospace Industries Association

AIA NAS 4122-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Extruded
AIA NAS 4119-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Press-On Type
AIA NAS 4124-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Dual Link
AIA NAS 4121-1996 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, Formed FSC 5999
AIA NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type
AIA NAS 4120-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Encapsulating Type, TO-5
AIA NAS 4123-1995 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, for Dual Inline Packages (DIP)

International Electrotechnical Commission (IEC)

IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
IEC TR 63378-1:2021 Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
IEC 60748-11:1990 Semiconductor devices; integrated circuits; part 11: sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 62830-5:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
IEC 60748-11:1990/AMD2:1999 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits; Amendment 2
IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
IEC 62415:2010 Semiconductor devices - Constant current electromigration test
IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
IEC 60747-14-3:2001 Semiconductor devices - Part 14-3: Semiconductor sensors; Pressure sensors
IEC 60748-11:1990/AMD1:1995 Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors

Aerospace Industries Association/ANSI Aerospace Standards

AIA/NAS NAS 4124-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Dual Link
AIA/NAS NAS 4122-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Extruded
AIA/NAS NAS 4119-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Press-On Type
AIA/NAS NAS4120-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, ENCAPSULATING TYPE, TO-5
AIA/NAS NAS4121-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, FORMED (Rev 1)
AIA/NAS NAS 4120-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Encapsulating Type, TO-5
AIA/NAS NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type
AIA/NAS NAS 4123-1995 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, for Dual Inline Packages (DIP)
AIA/NAS NAS4118-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, RETAINER CLIP TYPE (Rev 1)
AIA/NAS NAS4123-2012 HEAT SINK, ELECTRICAL-ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, FOR DUAL INLINE PACKAGES (DIP)
AIA/NAS NAS 4121-1996 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, Formed FSC 5999

HU-MSZT

MSZ 9200/18-1980 Electronic signals. semiconductor

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD51-1-1995 Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
JEDEC JESD51-1995 Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
JEDEC JEB5-A-1970 Methods of Measurement for Semiconductor Logic Gating Microcircuits

RU-GOST R

GOST 19656.15-1984 Semiconductor UHF diodes. Measurement methods of thermal resistance and pulse thermal resistance
GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
GOST 26284-1984 Semiconductor power converters. Conventional designations
GOST 4.137-1985 Product-quality index system. Power semiconductor devices. Nomenclature of indices
GOST 26567-1985 Semiconductor energy converters. Test methods
GOST 18986.10-1974 Semiconductor diodes. Methods for measuring inductance
GOST 12.2.007.11-1975 Occupation safety standards system. Semiconductor converters of electric energy. Safety requirements
GOST R IEC 60748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GOST 18986.4-1973 Semiconductor diodes. Methods for measuring capacitance
GOST 20859.1-1989 Power semiconductor devices. General technical requirements
GOST 23414-1984 Semiconductor power converters. Terms and definitions
GOST 30617-1998 Power semiconductor modules. General specifications

Underwriters Laboratories (UL)

UL 1557-2011 Electrically isolated semiconductor devices
UL 1557-1993 Electrically isolated semiconductor devices
UL 1557-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices Fourth Edition; Reprint with Revisions through and Including 6/26/2006
UL 1557-1997 Electrically isolated semiconductor devices

Association Francaise de Normalisation

NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
NF EN 62416:2010 Semiconductor Devices – Hot Carrier Testing on MOS Transistors
NF C80-202*NF EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
NF C96-015*NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices
NF C96-045:1992 Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits
NF C86-010:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
NF C80-201*NF EN 62415:2010 Semiconductor devices - Constant current electromigration test.
NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Integrated circuit reliability qualification guidelines
NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements
NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for power transfer and wireless charging - Part 1: general requirements and specifications
NF C63-244-1*NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : general requirements and specifications
NF EN 62258-6:2006 Semiconductor die products - Part 6: requirements for thermal simulation information
NF EN IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Harvesting piezoelectric shock energy for automotive sensors

PL-PKN

PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

European Committee for Electrotechnical Standardization（CENELEC）

EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits

SE-SIS

SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SIS SEN 01 26 51-1969 Symbols for electrical diagrams Semi-conductors
SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SIS SEN 01 03 51-1966 Semiconductor devices Terminology

ES-UNE

UNE-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

Danish Standards Foundation

DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
DS/IEC 748-11/A1,2:2001 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
DS/EN IEC 63244-1:2021 Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General requirements and specifications

German Institute for Standardization

DIN EN 62416:2010-12 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

CENELEC - European Committee for Electrotechnical Standardization

EN 60747-15:2004 Discrete semiconductor devices Part 15: Isolated power semiconductor devices
EN 62415:2010 Semiconductor devices - Constant current electromigration test

Korean Agency for Technology and Standards (KATS)

KS C IEC 60050-521-2002(2022) Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2017) Semiconductor devices and integrated circuits
KS C IEC 60050-521-2022 Semiconductor devices and integrated circuits
KS C IEC 60748-11:2004 Semiconductor devices－Integrated circuits－Part 11：Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C 2607-1980 TESTING METHODS OF SEMICONDUCTOR
KS C 2607-1974(2000) TESTING METHODS OF SEMICONDUCTOR
KS C IEC 60748-11:2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-11-1-2020 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR
KS C IEC 60748-11-1:2004 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5:2003 Semiconductor devices－Integrated circuits－Part 5：Semicustom integrated circuits
KS R 5012-2003 MOUNTING DIMENSIONS OF SEMICONDUCTOR TYPE CHARGING ALTERNATORS FOR AUTOMOBILES
KS C IEC 60747-14-1:2003 Semiconductor devices－Part 14－1：Semiconductor sensors－General and classification
KS C IEC 60748-11-1-2004(2020) Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

ECIA - Electronic Components Industry Association

EIA CB-5:1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices

NEMA - National Electrical Manufacturers Association

NEMA CB-4:1989 Semiconductor Graphite
NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT

JP-JEITA

JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

RO-ASRO

STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology
STAS 12123/1-1982 Semiconductor devices RECTIFIER DIODES Measuring methods for electrical and thermal characteristics
STAS 11381/13-1981 Graphical symbols for electrical diagrams SEMICONDUCTOR DEVICES
STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties

National Fire Protection Association (NFPA)

NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

YU-JUS

JUS N.R1.322-1979 Terms and definitions for semiconductor ?evices. Thyristors
JUS N.R1.500-1980 Semioonductor ?evices. Acceptance. Electrical tests

Electronic Components, Assemblies and Materials Association

ECA CB 5-1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices

BELST

STB 2365-2014 Cooling radiators of semiconductor devices. Methods of calculation
STB 2340-2013 Cooling radiators of semiconductor devices. General specifications

American Society for Testing and Materials (ASTM)

ASTM D6095-99 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM D6095-05 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM D3004-02 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D3004-08(2020) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
ASTM D3004-97 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D6095-12 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM D6095-12(2023) Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials

Lithuanian Standards Office

LST EN 62416-2010 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 256-1963 SEMICONDUCTOR DIODES
IEEE 59-1962 SEMICONDUCTOR RECTIFIER COMPONENTS

ZA-SANS

SANS 60146-6:1992 Semiconductor convertors Part 6: Application guide for the protection of semiconductor convertors against overcurrent by fuses

KR-KS

KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-11-2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits

FI-SFS

SFS 5327-1987 Glossary of electronic technology. Semiconductor components and overall circuits

GOST

GOST R 71070-2023 Electronic semiconductor devices. Terms and definitions

American National Standards Institute （ANSI)

ANSI/ASTM D6095:2012 Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ANSI/UL 1557-2013 Standard for Safety for Electrically Isolated Semiconductor Devices

IN-BIS

IS 1885 Pt.7-1965 Electrical Vocabulary Part Ⅶ Semiconductor Devices

US-Unspecified Preparing Activity

DI-QCIC-80924 A-2006 SEMICONDUCTOR PROCESS SPECIFICATION

BE-NBN

NBN C 95-001-1977 Semiconductor equipment. the term

IEC - International Electrotechnical Commission

IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)

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