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GB/T 8446.2-2004 in English

GB/T 8446.2-2004 in English

SUPERSEDED

Heat sink for power semiconductor device - Part 2: Measuring method of thermal resistance and imput fluid-output fluid pressure difference

  • Issued on:2004-02-04
  • Implemented on:2004-08-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $100.00
$97.00
Standard No: GB/T 8446.2-2004
Document status: SUPERSEDED
Superseded by: GB/T 8446.2-2022 Heat sinks for power semiconductor devices—Part 2: Measurement methods of thermal resistance and inlet-outlet fluid pressure drop
Superseded on: 2022-10-01
Title in English: Heat sink for power semiconductor device - Part 2: Measuring method of thermal resistance and imput fluid-output fluid pressure difference
Title in Chinese: 电力半导体器件用散热器 第2部分:热阻和流阻测试方法
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2004-02-04
Implemented on: 2004-08-01
Superseding: GB/T 8446.2-1987 Measuring method of thermal resistance and input fluid-output fluid pressure difference of heat sink for power semiconductor device
ICS Classification: 31.080-Semiconductor devices
Chinese Classification: K46-Power semiconductor device and parts
Professional Classification: GB-National Standard
Related Keywords: heat sink
heat tube heat sinks
air-cooling heat sink
self-cooling heat sink
water-cooling heat sink
Related Topics: thermal resistance
thermal stress dispersion
thermoelectric semiconductor
How to use resistors
Heat flow thermal conductivity meter
Heat flow thermal conductivity meter
Thermal resistance test
GB/T 8446.2
GB/T 8446.2-1987
GB/T 8446.2-2004
GB/T 8446.2-2022
semiconductor radiator
Semiconductor device
Radiator thermal resistance test system
Radiator Thermal Resistance Test System
Power semiconductor devices
Thermodynamic test methods for resistors and capacitors
flow resistance
Thermal resistance calibration method
Radiator thermal resistance test method
Calibration method of thermal resistance
Thermal resistance tester test method
Power semiconductor radiator

《GB/T 8446.2-2004电力半导体器件用散热器 第2部分:热阻和流阻测试方法》由TC60(全国电力电子系统和设备标准化技术委员会)归口,TC60SC6(全国电力电子系统和设备标准化技术委员会电力电子器件分会)执行,主管部门为中国电器工业协会。
GB/T8446的本部分给出了测试散热器热阻和流阻的原理,规定了风冷、自冷和水冷散热器的测试系统要求,测试条件和基本测量程序。
本部分适用于电力半导体器件用铸造类(包括挤压)散热器、型材类散热器和热管类散热器的热阻和流阻的测试。


1 Scope


This part of GB/T 8446 gives the principles for measuring the thermal resistance and flow resistance of heat sink and specifies the testing system requirements, testing conditions and basic measurement procedures for air-cooling, self-cooling and water-cooling heat sinks.
This part is applicable to the testing of thermal resistance and flow resistance for the cast (including extruded) heat sinks, profile heat sinks and heat tube heat sinks for power semiconductor device.

2 Principles and Heating Current

2.1 Principles

The thermal resistance of heat sink is a measure of the heat sink's capability for dissipating the heat from the tube core of semiconductor device. Its value is defined as: in thermal balance, the ratio of the temperature difference between the specified point on the heat sink worktop and the specified point of cooling medium to the dissipation power for such temperature difference between the two points, see Formula (1).

Foreword i
1 Scope
2 Principles and Heating Current
2.1 Principles
2.2 Heating Current
3 Requirements and Instructions for Testing System
3.1 General Principles of Testing System
3.2 Testing System for Air-cooling Heat Sink
3.3 Testing System for Self-Cooling Heat Sink
3.4 Testing System for Water-Cooling Heat Sink
4 Test Conditions
4.1 Size of Heating Power
4.2 Installation Force for Heat Sink and Heating Device
4.3 Cooling Conditions of Heat Sink
4.4 Position for Measuring the Temperature of Reference Point
5 Measurements and Calculations
5.1 Preparations for Measurement
5.2 Regulating and Controlling Conditions
5.3 Measurement and Recording of Intermediate Parameters
5.4 Calculation of P and

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