Semiconductor electrostatic

Semiconductor electrostatic, Total:460 items.

The international standard classification for "Semiconductor electrostatic" includes: Plug-and-socket devices. Connectors , Electrical engineering (Vocabularies) , Testing of metals , Semiconductor devices in general , Integrated circuits. Microelectronics , Semiconductor devices , Fire-protection , Rectifiers. Convertors. Stabilized power supply , Testing of metals in general , Semiconducting materials , Electronic components in general , Paper and board , Measurement of force, weight and pressure , Other electromechanical components , Electromechanical components in general , Optoelectronics. Laser equipment , Aerospace electric equipment and systems .

The Chinese standard classification for "Semiconductor electrostatic" includes: Electronic industry production equipment in general , Connector , Basic standards and general methods , Metal physical property test method , Semiconductor discrete devices in general , Semiconductor integrated circuit , Microcircuit in general , Power semiconductor device and parts , Fire protection technology , Semimetal and semiconductor material in general , Basic standards and general methods , Paper , Transformer , Industrial automation and control device in general , Technical management , Optoelectronic device assembly , Laser device , Electronic components .

Group Standards of the People's Republic of China

T/JSXH 0002-2020 Regeneration solution for semiconductor
T/QGCML 4031-2024 Semiconductor optical wafer
T/SDDP 3-2020 Conductive (anti) static electricity construction and acceptance specification group standard
T/CEPEA 0102-2023 Electrostatic chuck for etching process of compound semiconductor devices

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 14264-2024 Terminology of semiconductor materials
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climatic test methods—Part 26: Electrostatic discharge (ESD) sensitivity testing—Human body model（HBM）
GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
GB/T 3859.3-1993 Semiconductor convertors—Transformers and reactors
GB/T 30116-2013 Requirements for Semiconductor Manufacturing Facility Electromagnetic Compatibility
GB/T 2900.32-1994 Electrotechnical terminology - Power semiconductor device
GB/T 13422-1992 Power semiconductor converters－Electrical test methods
GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 17950-2000 Semiconductor converter - Part 6: Application guide for the protection of semiconductor converters against overcurrent by fuses
GB 5839-1986 Rating systems for electronic tubes and semiconductor devise
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27: Electrostatic discharge(ESD) sensitivity testing—Machine model(MM)
GB/T 13422-2013 Semiconductor converters—Electrical test methods
GB/T 3430-1989 The rule of type designation for semiconductor integrated circuits
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
GB/T 15872-2013 Power supply interface for semiconductor equipment
GB/T 14113-1993 of packages for semiconductor integrated circuits
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 3859.2-1993 Semiconductor convertors Application guide
GB/T 20515-2006 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
GB/T 7971-2007 Semiconducting electric cable paper
GB/T 8446.1-1987 Heat sink for power semiconductor device
GB/T 15662-1995 Method of testing volume resistivity of conducting and antistatic plastics
GB/T 42974-2023 Semiconductor integrated circuits—Flash memory(FLASH)
GB/T 5839-1986 Rating systems for electronic tubes and semiconductor devise
GB/T 14264-1993 Semiconductor materials－Terms and definitions
GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
GB 6648-1986 Blank detail specification for static read/write memories for semiconductor integrated circuits (available for certification)
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)

Military Standard of the People's Republic of China-General Armament Department

GJB 597/12A-1998 Detailed specifications for semiconductor integrated circuit HCMOS gate circuits
GJB 1420A-1999 General Specification for Semiconductor Integrated Circuit Enclosures
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 8121-2013 General specification for semiconductor optoelectronic assembly
GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
GJB 597A-1996 General Specification for Semiconductor Integrated Circuits
GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
GJB 8119-2013 General specification for semiconductor optoelectronic device
GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
GJB 8120-2013 General specification for semiconductor optoelectronic module
GJB 597B-2012 General specification for semiconductor integrated circuits

Guizhou Provincial Standard of the People's Republic of China

DB52/T 796-2013 Industrial semiconductor electric detonator
DB52/T 844-2013 Semiconductor Current Regulator

Professional Standard - Machinery

JB/T 8268-2015 Standard test method for surface defect of photoconductor for electrostatic process
JB/T 10096-1999 Selection Guidance of Case for Power Semiconductor Device
JB/T 7061-1993 Silicon Wafers Intended to Be Used in Power Semiconductor Devices
JB/T 10501-2005 Ceramic parts of case for power semiconductor devices
JB/T 7063-1993 Rated Voltage and Current of Power Semiconductor Devices
JB/T 7786-1995 Sampling Method for Test of Power Semiconductor Devices
JB/T 7483-1994 Semiconductor resistance strain sensor
JB/T 2423-1999 Type designation for power semiconductor device
JB/T 7059-1993 Guide for Preparation of Standard for Power Semiconductor Modules
JB/T 9684-2000 Selecting guide of heat sink for power semiconductor device
JB/T 9644-1999 Reactor for semiconductor electric drive
JB/T 10097-2000 Case for power semiconductor device
JB/T 5835-1991 Gate assemblies for power semiconductor devices
JB/T 8757-1998 Hot Pipe Radiators Intended to be Used in Power Semiconductor Devices
JB/T 10096-2000 Selection guidance of case for power semiconductor device
JB/T 5842-2005 Rings for dies of semiconductor devices
JB/T 9687.1-1999 Molybdenum Disk for Power Semiconductor Devices
JB/T 5844-1991 Directional relays and power relays with two input energizing quantities (IEC 60255-12: 1980 NEQ)
JB/T 10097-1999 Cases for Power Semiconductor Devices
JB/T 5842-1991 Die alignment rings for power semiconductor devices
JB/T 4277-1996 Packing of Power Semiconductor Parts
JB/T 8271-2015 Comparison scale for surface defect of photoconductor of electrostatic copying process
JB/T 9687.2-1999 Tungsten disk for power semiconductor devices
JB/T 8661-1997 Construction Parts of Electric Semiconductor Modules
JB/T 5843-2005 Connectors for power semiconductor devices
JB/T 5843-1991 Connectors for Power Semiconductor Devices
JB/T 7483-2005 Semiconductor resistance strain gauge force stransducer/sensor
JB/T 5835-2005 Components of gate terminal for power semiconductor devices

国家机械工业局

JB 9644-1999 Reactor for semiconductor electric transmission
JB/T 8270-1999 Method for measuring the thickness of electrophotographic photoconductor films

Professional Standard - Electron

SJ 50597/38-1995 Semiconductor integrated circuits-Detail specification for Type JM2148H NMOS 1024*4 bit static random access memory
SJ 20786-2000 General specification for semiconductor opto-electronic assembly
SJ 2433-1984 Bonding sheet for semiconductor tubes
SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
SJ 20642-1997 Semiconductor opto-electronic module-General specification for
SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
SJ 1795-1981 Detail specification for 50-1000mA low current thyristors
SJ/T 11395-2009 Semiconductor lighting terminology

机械电子工业部

JB 5835-1991 Gate assembly for power semiconductor devices
JB 5842-1991 Die positioning rings for power semiconductor devices
JB 5843-1991 Connectors for power semiconductor devices

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 15651.4-2017 Semiconductor devices-Discrete devices-Part 5-4:Optoelectronic devices-Semiconductor lasers

Taiwan Provincial Standard of the People's Republic of China

CNS 11900-1987 Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)
CNS 13802.5-1997 Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
CNS 7011-1981 Numbering of Electrodes in Multiple Electrode Semiconductor Devices and Designation of Units in Multiple Unit Semiconductor Devices
CNS 13802-5-1997 Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)

Professional Standard - Aerospace

QJ 259-1977 器件
QJ 786-1983 Semiconductor Integrated Circuits - Specifications for Screening
QJ 2212-1991 Semiconductor Integrated Circuit Design Guidelines

机械工业部

JB/T 6306-1992 Power semiconductor module dimensions

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 37031-2018 Semiconductor lighting terminology
GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1873-2016 semiconductor refrigeration wine cabinet

Professional Standard - Textile

FZ/T 01042-1996 Determination of electrostatic half-life of electrostatic properties of textile materials

工业和信息化部

QB/T 5369-2019 Semiconductor refrigeration appliance

Jiangxi Provincial Standard of the People's Republic of China

DB3603/T 4-2022 Technical specifications for the manufacture of semiconducting glazes for electric porcelain

Semiconductor Equipment and Materials International (SEMI)

SEMI E129-0709-2009 GUIDE TO ASSESS AND CONTROL ELECTROSTATIC CHARGE IN A SEMICONDUCTOR MANUFACTURING FACILITY

RU-GOST R

GOST R 53734.5.6-2021 Electrostatics. Protection of electronic devices against electrostatic phenomena. Integrated circuits and semiconductor devices
GOST 24688-1981 Static semiconductor exciters for three-phase synchronous engines. General technical requirements
GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
GOST 26284-1984 Semiconductor power converters. Conventional designations
GOST 4.137-1985 Product-quality index system. Power semiconductor devices. Nomenclature of indices
GOST 26567-1985 Semiconductor energy converters. Test methods
GOST 18986.10-1974 Semiconductor diodes. Methods for measuring inductance
GOST R IEC 60748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GOST 12.2.007.11-1975 Occupation safety standards system. Semiconductor converters of electric energy. Safety requirements
GOST 18986.4-1973 Semiconductor diodes. Methods for measuring capacitance
GOST 30617-1998 Power semiconductor modules. General specifications
GOST 20859.1-1989 Power semiconductor devices. General technical requirements
GOST 23414-1984 Semiconductor power converters. Terms and definitions

NEMA - National Electrical Manufacturers Association

NEMA PV 5-1976 constant-potential-type electric utility (semiconductor static converter) battery chargers
NEMA CB-4:1989 Semiconductor Graphite
NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT

RO-ASRO

STAS 12124/1-1982 Semiconductor devices BIPOLAR TRANZISTORS Methods for measuring electrical static parameters
STAS 12124/4-1983 Semiconductor devices FIELD-EFECT TRANZISTORS Methods for measuring electrical static parameters
STAS 12124/3-1983 Semiconductor devices FIFL D-EFFECT TRANZISTORS Methods for measuring electrical static parameters
STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology
STAS 11381/13-1981 Graphical symbols for electrical diagrams SEMICONDUCTOR DEVICES
STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics

German Institute for Standardization

DIN 41752:1982 Static power convertors; semiconductor convertor equipment; rating code
DIN EN 60749-27:2013-04 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012); German version EN 60749-27:2006 + A1:2012 / Note: DIN EN 60749-27 (2007-01) re...
DIN 41762-2:1974-02 Static power convertors; rating code designation for semiconductor convertor stacks and assemblies, monocrystalline semiconductor convertor stacks and assemblies
DIN 41772 Beiblatt 1:1979-02 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
DIN 41772 Beiblatt 1:1979 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
DIN 41777:1986 Static power convertors; semiconductor rectifier equipment for trickle charging of lead-acid batteries
DIN 41772 Bb.1:1979 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
DIN 41776:1983-01 Static power convertors; semiconductor rectifier equipment with I characteristic for charging of batteries; requirements
DIN 41776:1983 Static power convertors; semiconductor rectifier equipment with I characteristic for charging of batteries; requirements
DIN 41772:1979-02 Static power convertors; semiconductor rectifier equipment, shapes and letter symbols of characteristic curves
DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN EN 60749-26:2007 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2006); German version EN 60749-26:2006
DIN 41751:1977 Static power convertors; semiconductor convertor assemblies and equipments, cooling methods
DIN 41762-2:1974 Static power convertors; rating code designation for semiconductor convertor stacks and assemblies, monocrystalline semiconductor convertor stacks and assemblies
DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
DIN 41774:1987 Static power convertors; semiconductor rectifier equipment with W-characteristic for charging of lead-acid batteries; requirements
DIN 41772 Beiblatt 2:1979 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for equipment operating in parallel with batteries
DIN 41772 Beiblatt 2:1979-02 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for equipment operating in parallel with batteries
DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers
DIN 41775:1979-04 Static power convertors; semiconductor rectifier equipment with "W"-characteristic for charging of nickel/cadmium and nickel/iron batteries, requirements
DIN 41772:1979 Static power convertors; semiconductor rectifier equipment, shapes and letter symbols of characteristic curves
DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.

British Standards Institution (BSI)

BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS EN IEC 60749-26:2018 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
BS EN 60749-26:2006 Semiconductor devices - Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
BS EN 60749-26:2014 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
BS EN 60749-27:2006+A1:2012 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS EN IEC 62969-1:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
BS IEC 62899-203:2024 Printed electronics - Materials. Semiconductor ink
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
BS IEC 60748-1:2002 Semiconductor devices - Integrated circuits - General
19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
BS 6493-2.1:1985 Semiconductor devices - Integrated circuits - General
BS EN IEC 63244-1:2021 Semiconductor devices. Semiconductor devices for wireless power transfer and charging. General requirements and specifications
BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integr...
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
BS EN 62415:2010 Semiconductor devices - Constant current electromigration test
BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
BS 3839:1978 Specification for oxygen-free high-conductivity copper for electronic tubes and semiconductor devices
BS EN 60749-28:2017 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
13/30264600 DC BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid
BS IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation. - Part 2: Thermo power based thermoelectric energy harvesting
BS EN IEC 60749-28:2022 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS IEC 62899-203:2018 Printed electronics. Materials. Semiconductor ink
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
BS IEC 60747-1:2006+A1:2010 Semiconductor devices - General
BS EN 60747-16-4:2004+A2:2017 Semiconductor devices - Microwave integrated circuits. Switches
BS EN 62047-19:2013 Semiconductor devices. Micro-electromechanical devices. Electronic compasses
BS IEC 62951-9:2022 Semiconductor devices. Flexible and stretchable semiconductor devices - Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication
BS EN IEC 62969-3:2018 Semiconductor devices. Semiconductor interface for automotive vehicles - Shock driven piezoelectric energy harvesting for automotive vehicle sensors

SCC

BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
MIL MIL-M-28787/463-1991 MODULES, STANDARD ELECTRONIC SEMICONDUCTOR MEMORY ARRAY, STATIC RAM, 256K MODULE, KEY CODE JMJ
BS 3839:1965 Oxygen free high conductivity copper for electronic tubes and semiconductor devices
DANSK DS/EN IEC 60749-26:2018 Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)
CEI EN 60749-26:2016 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
DANSK DS/EN 60749-26:2014 Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)
CEI EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
CEI 3-17:2005 Segni grafici per schemi - Semiconduttori e tubi elettronici
IEC 60146:1973 Semiconductor convertors
DANSK DS/EN IEC 63244-1:2021 Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General requirements and specifications
BS 3363:1961 Schedule of letter symbols for light-current semiconductor devices
DIN IEC 60747-10:1987 Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
CEI EN IEC 63244-1:2022 Semiconductor devices - Semiconductor devices for wireless power transfer and charging Part 1: General requirements and specifications
CEI EN 62415:2011 Semiconductor devices - Constant current electromigration test
DIN IEC 60747-14-5 E:2008 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
DANSK DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
AENOR UNE 53615:1989 Elastomers. Anti-electrostatic and conductive products for hospital use. Electrical resistance characteristics.
AENOR UNE 53606:1996 Elastomers. Anti-electrostatic and conductive products for industrial use. Electrical resistance limit.
CEI EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements
11/30250232 DC BS EN 60749-26. Semiconductor devices. Mechanical and climatic test methods. Part 26. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
DIN EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
CEI EN IEC 63287-1:2022 Semiconductor devices - Generic semiconductor qualification guidelines Part 1: Guidelines for IC reliability qualification
CEI EN 60749-27/A1:2007 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing Machine model (MM)
CEI EN 60749-27:2007 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing Machine model (MM)
07/30164953 DC IEC 60747-14-5. Semiconductor devices. Discrete devices. Part 14-5. Semiconductor sensors. PN-junction semiconductor temperature sensor
BS PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
DANSK DS/EN 60749-27/A1:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
DANSK DS/EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
DANSK DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
MIL MIL-DTL-19491J-2014 Semiconductor Devices, Packaging of
BS IEC 60747-1:2006 Semiconductor devices. General
CEI EN 62258-1:2011 Semiconductor devices - Semiconductor die products Part 1: Procurement and use
AENOR UNE 21017:1959 BARE, SEMI-RIGID COPPER CABLES FOR ELECTRICAL CONDUCTORS
DANSK DS/EN 62830-2:2017 Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 2: Thermo power based thermoelectric energy harvesting
DANSK DS/EN IEC 62969-1:2018 Semiconductor devices – Semiconductor interface for automotive vehicles – Part 1: General requirements of power interface for automotive vehicle sensors
CEI EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles Part 1: General requirements of power interface for automotive vehicle sensors

HU-MSZT

MSZ 9200/18-1980 Electronic signals. semiconductor

GSO

GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
OS GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
BH GSO IEC 60747-5-4:2016 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
GSO IEC 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
OS GSO IEC 60748-11:2014 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60748-11:2014 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60747-14-2:2014 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
GSO IEC 60748-5:2015 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
BH GSO IEC 60747-14-2:2016 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
GSO IEC 60749-27:2014 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
BH GSO IEC 60748-11-1:2016 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60748-11-1:2014 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
BH GSO IEC 62830-2:2022 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
BH GSO IEC 60749-27:2016 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
OS GSO IEC 60749-27:2014 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
OS GSO IEC 60747-14-4:2014 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
BH GSO IEC 60747-14-4:2016 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
OS GSO IEC 60747-14-3:2014 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
BH GSO IEC 60747-15:2016 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

Defense Logistics Agency

DLA SMD-5962-79012 REV A-1986 MICROCIRCUITS, DIGITAL, CMOS, STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88595 REV A-1989 MICROCIRCUITS, DIGITAL, NMOS, 256 X 4 STATIC RAM (SRAM) MONOLITHIC SILICON
DLA SMD-5962-95595 REV N-2004 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 32-BIT
DLA SMD-5962-93187 REV L-2007 MICROCIRCUIT, HYBRID, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 32-BIT
DLA SMD-5962-81024 REV F-2005 MICROCIRCUIT, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-93128 REV A-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256K X 1 STATIC RANDOM ACCESS MEMORY (SRAM), SEPARATE I/O, MONOLITHIC SILICON
DLA SMD-5962-88594 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256 X 4 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-96617 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 18-STAGE STATIC REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88740 REV D-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-93156 REV B-2000 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 8-BIT
DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
DLA MIL-S-19500/230 C VALID NOTICE 4-2011 Semiconductor Device, Diode, Silicon, High-Conductance Type JAN- 1N3207
DLA SMD-5962-96728-1995 MICROCIRCUIT, DIGITAL, CMOS, STATIC 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-87002 REV E-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 DUAL PORT STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-89690 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-89712 REV B-2007 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 16K X 4 BITS SRAM, (STD POWER), MONOLITHIC SILICON
DLA SMD-5962-89883 REV B-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 9 SRAM (STANDARD POWER), MONOLITHIC SILICON
DLA SMD-5962-94611 REV R-2004 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 512K X 32-BIT, STATIC RANDOM ACCESS MEMORY, CMOS
DLA SMD-5962-89694 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 X 4 SRAM, MONOLITHIC SILICON
DLA SMD-5962-96694 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS/SOS, 4K X 1 STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-89692 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 4 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-96623 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-96877 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS, 128K X 8 STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-89691 REV A-1990 MICROCIRCUIT, MEMORY, DIGITAL CMOS, 8K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON [Superseded By: DLA SMD-5962-38294 REV H, DLA SMD-5962-38294 REV G, DLA SMD-5962-38294 REV F, DLA SMD-5962-38294 REV E, DLA SMD-5962-38294 REV D, DLA
DLA SMD-5962-93225-1994 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 4 SRAM, MONOLITHIC SILICON
DLA SMD-5962-96695 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS/SOS, 1K X 4 STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-96647 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 64-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-93157 REV G-2002 MICROCIRCUIT, MEMORY, HYBRID AND MONOLITHIC, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 256K X 8-BIT
DLA SMD-5962-84036 REV G-2005 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 16K (2048 X 8) BIT STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-96766 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS, 256 X 8 STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-92153 REV M-2006 MICROCIRCUIT, DIGITAL, CMOS, 32K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
DLA SMD-5962-95624 REV C-2006 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 512K X 32-BIT, STATIC RANDOM ACCESS MEMORY, CMOS
DLA SMD-5962-38294 REV H-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 8 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
DLA SMD-5962-93153 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 9 DUAL PORT, STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON

CZ-CSN

CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
CSN 35 8773-1977 Meaaurement of semiconductor devices. Thyristors. Meaaurement of blocking current and reverse blocking current.
CSN 35 8701 Z1-1997 Semiconductor naming
CSN 35 8740-1973 Semiconduotor deviees. Transistore. Measurement of saturation voltage
CSN 35 8732-1964 Semiconductor diodes. Measurement of forward current
CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
CSN 35 8736-1964 Semiconductor diodes. Measurement of interelectrode capacitanoe
CSN 35 1531-1973 Silicon semiconductor rectifiers
CSN 35 1603-1983 Power semiconductor devices. General methodes of measurements
CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current

Underwriters Laboratories (UL)

UL 1557-1993 Electrically isolated semiconductor devices
UL 1557-2011 Electrically isolated semiconductor devices
UL 1557-1997 Electrically isolated semiconductor devices
UL 1557-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices Fourth Edition; Reprint with Revisions through and Including 6/26/2006

Association Francaise de Normalisation

NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
NF C96-015*NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices
NF C96-022-26:2006 Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM).
NF C96-022-26*NF EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
NF EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: electrostatic discharge (ESD) susceptibility testing - Human body model (HBM)
NF C96-045:1992 Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits
NF C86-010:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
NF C63-111:1985 Low-voltage controlgear for industrial use. Part 2 : semi-conductor contactors (solid state contactors).
NF C80-201*NF EN 62415:2010 Semiconductor devices - Constant current electromigration test.
NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Integrated circuit reliability qualification guidelines
NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements
NF C96-022-27/A1*NF EN 60749-27/A1:2013 Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for power transfer and wireless charging - Part 1: general requirements and specifications
NF EN 60749-27/A1:2013 Semiconductor devices - Mechanical and climatic test methods - Part 27: electrostatic discharge (ESD) sensitivity test - Machine model (MM)
NF C96-022-27*NF EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM).
NF EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: testing for electrostatic discharge (ESD) sensitivity - Machine model (MM)
NF C63-244-1*NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : general requirements and specifications
NF EN IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Harvesting piezoelectric shock energy for automotive sensors

International Electrotechnical Commission (IEC)

IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60749-26:2003 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing; Human body model (HBM)
IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60749-26:2006 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60748-11:1990 Semiconductor devices; integrated circuits; part 11: sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60749-27:2003 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM)
IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
IEC 60748-11:1990/AMD2:1999 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits; Amendment 2
IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
IEC 62415:2010 Semiconductor devices - Constant current electromigration test
IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
IEC 60747-14-3:2001 Semiconductor devices - Part 14-3: Semiconductor sensors; Pressure sensors
IEC 60749-27:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 60748-11:1990/AMD1:1995 Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors

PL-PKN

PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

Spanish Association for Standardization (UNE)

UNE 20-109 Pt.2-1989 Low voltage control device. Contactors with semiconductors (static contactors)
UNE 53-605-1989 Determination of resistivity of elastomer conductors and antistatic elastomers
UNE-EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
UNE-EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
UNE-EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits

SE-SIS

SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SIS SEN 01 26 51-1969 Symbols for electrical diagrams Semi-conductors
SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SIS SEN 01 03 51-1966 Semiconductor devices Terminology

Korean Agency for Technology and Standards (KATS)

KS C IEC 61954:2002 Power electronics for electrical transmission and distribution systems-Testing of thyristor valves for static VAR Compensators
KS C IEC 60050-521-2002(2022) Semiconductor devices and integrated circuits
KS C IEC 60050-521-2022 Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2017) Semiconductor devices and integrated circuits
KS C IEC 60748-11:2004 Semiconductor devices－Integrated circuits－Part 11：Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C 2607-1980 TESTING METHODS OF SEMICONDUCTOR
KS C 2607-1974(2000) TESTING METHODS OF SEMICONDUCTOR
KS C IEC 60748-2-8:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-11:2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-11-1-2020 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR
KS C IEC 60748-11-1:2004 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5:2003 Semiconductor devices－Integrated circuits－Part 5：Semicustom integrated circuits
KS C IEC 60748-11-1-2004(2020) Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60747-14-1:2003 Semiconductor devices－Part 14－1：Semiconductor sensors－General and classification
KS R 5012-2003 MOUNTING DIMENSIONS OF SEMICONDUCTOR TYPE CHARGING ALTERNATORS FOR AUTOMOBILES
KS C IEC 60747-14-1:2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors

Standard Association of Australia （SAA）

AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
AS 1102.5:1972 Graphical symbols for electrotechnology - Semiconductor devices
AS C379.1:1970 Mechanical standardization of semiconductor devices - Preparation of drawings of semiconductor devices

CENELEC - European Committee for Electrotechnical Standardization

EN 60747-15:2004 Discrete semiconductor devices Part 15: Isolated power semiconductor devices
EN 60749-26:2006 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
EN 62415:2010 Semiconductor devices - Constant current electromigration test

European Committee for Electrotechnical Standardization（CENELEC）

EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
EN IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications

Danish Standards Foundation

DS/EN 60749-26:2006 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
DS/IEC 748-11/A1,2:2001 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
DS/EN IEC 63244-1:2021 Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General requirements and specifications
DS/EN 60749-27/A1:2013 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
DS/EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

JP-JEITA

JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

National Fire Protection Association (NFPA)

NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

YU-JUS

JUS N.R1.322-1979 Terms and definitions for semiconductor ?evices. Thyristors
JUS N.R1.500-1980 Semioonductor ?evices. Acceptance. Electrical tests

PH-BPS

PNS IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

IN-BIS

IS 12970 Pt.3/Sec.2-1992 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Measuring methods. Section 2: Static characteristics
IS 1885 Pt.7-1965 Electrical Vocabulary Part Ⅶ Semiconductor Devices

GOSTR

GOST 18577-1980 Thermoelectric semiconductor devices. Terms and definitions

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 256-1963 SEMICONDUCTOR DIODES
IEEE 59-1962 SEMICONDUCTOR RECTIFIER COMPONENTS

South African Bureau of Standard

SANS 60146-6:1992 Semiconductor convertors Part 6: Application guide for the protection of semiconductor convertors against overcurrent by fuses

KR-KS

KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-11-2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits

GOST

GOST R 71070-2023 Electronic semiconductor devices. Terms and definitions

FI-SFS

SFS 5327-1987 Glossary of electronic technology. Semiconductor components and overall circuits

Lithuanian Standards Office

LST EN 60749-26-2006 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2006)

VDE - VDE Verlag GmbH@ Berlin@ Germany

VDE 0884-749-26-2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2013); German version EN 60749-26:2014
VDE 0884-749-26-2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
VDE 0884-749-26-2017 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/2343/CDV:2017); German version prEN 60749-26:2017

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JEB5-A-1970 Methods of Measurement for Semiconductor Logic Gating Microcircuits

American National Standards Institute （ANSI)

ANSI/UL 1557-2013 Standard for Safety for Electrically Isolated Semiconductor Devices

IEC - International Electrotechnical Commission

IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)

US-Unspecified Preparing Activity

DI-QCIC-80924 A-2006 SEMICONDUCTOR PROCESS SPECIFICATION

BE-NBN

NBN C 95-001-1977 Semiconductor equipment. the term

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