Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)
semiconductor materials fluid scopethis standard wire cutting cutting semiconductor coastal automatic identification system general application scopegraphical symbols longitudinal beam bending lines
GB/T 31469-2015 in English

GB/T 31469-2015 in English

VALID

Semiconductor materials cutting fluid

  • Issued on:2015-05-15
  • Implemented on:2016-01-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $100.00
$97.00
Standard No: GB/T 31469-2015
Document status: VALID
Title in English: Semiconductor materials cutting fluid
Title in Chinese: 半导体材料切削液
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2015-05-15
Implemented on: 2016-01-01
Chinese Classification: L90-Special electronic technology material
Professional Classification: GB-National Standard
Related Keywords: semiconductor materials
fluid scopethis standard
wire cutting
cutting
semiconductor
Related Topics: liquid resistant material
Semiconductor material
Organic Semiconductor Materials
cutting fluid
Semiconductor Material Cutting Fluid
Semiconductor Material Cutting Fluid
GB/T 31469-2015
Semiconducting sulfur
semiconductor mass spectrometry
Semiconductor material testing
Molybdenum ditelluride - a new semiconductor material
icp-ms semiconductor
icp-ms and semiconductors
new semiconductor materials
Semiconductor material
new semiconductor materials
Properties of Organic Semiconductor Materials
Semiconductor material purity
Semiconductor Material Density
Half change
cobalt semiconducting
liquid material
Semiconductor liquid tank
Molybdenum ditelluride-a new semiconductor material
semiconductor icp-ms
semiconductor material growth
Semiconductor main material
Commonly Used Semiconductor Materials
Liquid thermal conductivity meter
Semiconductor Material Properties
Material Semiconductor Thin Film
Molybdenum ditelluride new semiconductor material
cut
Liquid thermal conductivity meter
conductor
Advanced Semiconductor Materials
and semiconductor materials
Semiconductor Materials and Technologies
Optoelectronic Materials and Semiconductor Lighting
Semiconductor material testing
semiconductor energy level
Optoelectronic Materials Semiconductor Lighting
Semiconductor material testing
cobalt phosphide semiconductor
electrical semiconductor material
Semiconductor paint
cutting equipment
Semiconductor plastic
conductor material
conductor material
Semiconductor outgassing
liquid conductivity
semiconductor effect
Semiconductor Materials Microscope
Semiconductor inspection
Semiconductor material properties
semiconductor energy level
semiconductor cv
Semiconductor material properties
quinone semiconductor
Semiconductor materials and semiconductor photocatalytic materials
body material
Semiconductor materials are isotropic
Semiconductor Material Density
Commonly Used Semiconductor Materials
semiconductor material
semiconducting layer material
compound semiconductor material
semiconductor cv
Semiconductor strip edge
Plasma Materials Semiconductor Materials
semiconductor chip material
phase of semiconductor material
Semiconductor Materials Microscope
UV Analysis of Semiconductor Materials
Semiconductor material series
what liquid material
semiconducting layer material
semiconductor
Semimetals and Semiconductor Materials
semiconducting material semiconducting material
GBT31469
GB/T 31469-2015
CdZnTe semiconductor material
conductor
liquid thermal conductivity
Calculation of cutting fluid concentration
EFA and PFA Semiconductors
EFM analysis of semiconductors
What are the commonly used semiconductor materials?
Semiconductor material luminescence characteristics testing
Cutting Fluids International
Cutting fluid water ratio
Semiconductor technology
Cleaning Standards for Semiconductor Application Materials
Preparation method of semiconductor materials
Semiconductor material purification methods
Cutting fluid detection
Spray paint resistant to cutting fluid
Semiconductor polishing materials
Semiconductor equipment materials
Semiconductor appearance
Hydrogen content testing of semiconductor materials
Semiconductor inspection
China Semiconductor
Semiconductor material certification
Liquid medicinal materials
Execution of Semiconductor Raw Materials
Semiconductor raw material inspection standards
Semiconductor equipment plastics
Semiconductor device material references

《GB/T 31469-2015半导体材料切削液》由TC203(全国半导体设备和材料标准化技术委员会)归口,主管部门为国家标准化管理委员会。
本标准规定了半导体材料切削液的各项技术要求、试验方法、检验规则、标志、包装、储存及运输等要求。
本标准适用于半导体材料线切割加工采用的切削液。


Scope

This standard stipulates various technical requirements, test methods, inspection rules, marking, packaging, storage and transportation requirements of cutting fluid for semiconductor materials. This standard applies to cutting fluids used in wire cutting of semiconductor materials.

Sample only — not a preview of GB/T 31469-2015
Page: 1 / 0
100%

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend