Advanced Semiconductor Materials

Advanced Semiconductor Materials, Total:86 items.

The international standard classification for "Advanced Semiconductor Materials" includes: Semiconducting materials .

The Chinese standard classification for "Advanced Semiconductor Materials" includes: Semimetal and semiconductor material in general , Special electronic technology material .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 31469-2015 Semiconductor materials cutting fluid
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 14264-1993 Semiconductor materials－Terms and definitions

GSO

GSO ISO 14605:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
BH GSO ISO 19635:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antialgal activity of semiconducting photocatalytic materials
GSO ISO 19635:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antialgal activity of semiconducting photocatalytic materials
OS GSO ISO 14605:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
BH GSO ISO 14605:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
GSO ISO 19722:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
BH GSO ISO 19722:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
OS GSO ISO 10676:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
BH GSO ISO 18071:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of antiviral activity of semiconducting photocatalytic materials under indoor lighting environment — Test method using bacteriophage Q-beta
GSO ISO 18071:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of antiviral activity of semiconducting photocatalytic materials under indoor lighting environment — Test method using bacteriophage Q-beta
GSO ISO 14604:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Methods of test for ceramic coatings -- Determination of fracture strain

British Standards Institution (BSI)

BS ISO 27447:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antibacterial activity of semiconducting photocatalytic materials
BS ISO 22197-2:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials - Removal of acetaldehyde
BS ISO 22197-4:2021 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of formaldehyde
BS ISO 22197-3:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials - Removal of toluene
BS ISO 22197-5:2021 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of methyl mercaptan
BS ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
BS ISO 24448:2023 Fine ceramics (advanced ceramics, advanced technical ceramics). LED light source for testing semiconducting photocatalytic materials used under indoor lighting environment
BS ISO 10676:2010 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
BS ISO 17168-4:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of formaldehyde
BS ISO 17168-2:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of acetaldehyde
BS ISO 22551:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of bacterial reduction rate by semiconducting photocatalytic materials under indoor lighting environment. Semi-dry method for estimating antibacterial activity on the…
BS ISO 17168-5:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of methyl mercaptan
BS ISO 17168-3:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of toluene
BS ISO 19652:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for complete decomposition performance of semiconducting photocatalytic materials under indoor lighting environment. Decomposition of acetaldehyde
21/30425873 DC BS ISO 22197-4. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 4. Removal of formaldehyde
21/30425876 DC BS ISO 22197-5. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 5. Removal of methyl mercaptan
BS ISO 19810:2023 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for self-cleaning performance of semiconducting photocatalytic materials under indoor lighting environment. Measurement of water contact angle
BS ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of nitric oxide
BS ISO 22601:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of phenol oxidative decomposition performance of semiconducting photocatalytic materials by quantitative analysis of total organic carbon (TOC)

Korean Agency for Technology and Standards (KATS)

KS L ISO 27448-2021 Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for self-cleaning performance of semiconducting photocatalytic materials－Measurement of water contact angle
KS L ISO 10676-2022 Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
KS L ISO 22197-2:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 2: Removal of acetaldehyde
KS L ISO 22197-3:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 3: Removal of toluene
KS L ISO 22197-5:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 5: Removal of methyl mercaptan
KS L ISO 22197-1:2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 17168-2:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 2: Remova
KS L ISO 17168-4:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 4: Remova
KS L ISO 17168-3:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 3: Remova
KS L ISO 17168-1:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova

SCC

BS ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials-Removal of nitric oxide
08/30166877 DC BS ISO 27447. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antibacterial activity of semiconducting photocatalytic materials
09/30186157 DC BS ISO 10677. Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials

KR-KS

KS L ISO 22197-3-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 3: Removal of toluene
KS L ISO 22197-2-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 2: Removal of acetaldehyde
KS L ISO 22197-1-2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-5-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 5: Removal of methyl mercaptan
KS L ISO 17168-4-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 4: Remova
KS L ISO 17168-3-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 3: Remova
KS L ISO 17168-2-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 2: Remova
KS L ISO 17168-1-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova

International Organization for Standardization (ISO)

ISO 22197-2:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 2: Removal of acetaldehyde
ISO 22197-3:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 3: Removal of toluene
ISO 24448:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — LED light source for testing semiconducting photocatalytic materials used under indoor lighting environment
ISO 19810:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for self-cleaning performance of semiconducting photocatalytic materials under indoor lighting environment — Measurement of water contact angle
ISO 21859:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for plasma resistance of ceramic components in semiconductor manufacturing equipment

Defense Logistics Agency

DLA SMD-5962-93008-1994 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 16K X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-93152 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 32K X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-89567 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-89568 REV K-2003 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 4K X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-94567-1996 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, X 9 CLOCKED FIFO'S, MONOLITHIC SILICON
DLA SMD-5962-93173-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512 X 9 PARALLEL FIFO, MONOLITHIC SILICON
DLA SMD-5962-93177 REV E-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 9 PARALLEL FIFO, MONOLITHIC SILICON
DLA SMD-5962-93124 REV B-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 9 PARALLEL FIFO, MONOLITHIC SILICON
DLA SMD-5962-86846 REV C-2001 MICROCIRCUIT, DIGITAL, CMOS 64 X 5 PARALLEL FIFO, MONOLITHIC SILICON
DLA SMD-5962-94511 REV A-1996 MICROCIRCUIT, MEMORY, CMOS, 4K X 9 PARALLEL SYNCHRONOUS FIFO, MONOLITHIC SILICON
DLA SMD-5962-93138 REV C-2001 MICROCIRCUIT, MEMORY, CMOS, 1K X 8 PARALLEL SYNCHRONOUS FIFO, MONOLITHIC SILICON
DLA SMD-5962-92057-1993 MICROCIRCUIT, MEMORY, CMOS, 1K X 18 PARALLEL FIFO, MONOLITHIC SILICON
DLA SMD-5962-93249 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512 X 9 PARALLEL SYNCHRONOUS FIFO, MONOLITHIC SILICON
DLA SMD-5962-93189 REV C-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 18 PARALLEL SYNCHRONOUS FIFO, MONOLITHIC SILICON
DLA SMD-5962-89942 REV A-1993 MICROCIRCUITS, MEMORY, DIGITAL, CMOS 2K X 9 PARALLEL-SERIES FIFO, MONOLITHIC SILICON
DLA SMD-5962-92101 REV A-1995 MICROCIRCUIT, MEMORY, CMOS, 512 X 18 PARALLEL FIFO, MONOLITHIC SILICON
DLA SMD-5962-89661-1989 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, CASCADABLE 64 X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-89943 REV A-1994 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 9 PARALLEL SERIAL FIFO, MONOLITHIC SILICON
DLA SMD-5962-89664 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, CASCADABLE 64 X 8 FIFO, MONOLITHIC SILICON
DLA SMD-5962-89536 REV F-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1K X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-89863 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PARALLEL 512 X 9 FIFO, MONOLITHIC SILICON
DLA SMD-5962-91585 REV C-2006 MICROCIRCUIT, MEMORY, CMOS, 1K X 9 PARALLEL FIFO, MONOLITHIC SILICON

German Institute for Standardization

DIN ISO 22197-1:2018-12 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
DIN ISO 22197-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)