Semiconductor Material Properties
Semiconductor Material Properties, Total:44 items.
The international standard classification for "Semiconductor Material Properties" includes: Semiconducting materials , Testing of metals , Testing of metals in general , Electricity. Magnetism. Electrical and magnetic measurements , Optics and optical measurements , Semiconductor devices in general .
The Chinese standard classification for "Semiconductor Material Properties" includes: Semimetal and semiconductor material in general , Special electronic technology material , Metal physical property test method , Electronic measurement and equipment in general , Inorganic chemicals in general , Technical management .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
- GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
- GB/T 14844-1993 of semiconductor materials
- GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
- GB/T 14844-2018 Designations of semiconductor materials
- GB/T 14264-1993 Semiconductor materials－Terms and definitions
- GB/T 31469-2015 Semiconductor materials cutting fluid
- GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials
- GB/T 13974-1992 methods for semiconductor device curve tracers
- GB/T 14264-2009 Semiconductor materials - Terms and definitions
- GB/T 14264-2024 Terminology of semiconductor materials
Professional Standard - Electron
- SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
- SJ/T 11775-2021 Multi-wire saw used for semiconductor materials
Group Standards of the People's Republic of China
- T/CASME 798-2023 Specialized processing tools for semiconductor materials
- T/CIET 723-2024 Technical Specifications for Semiconductor CMP Polishing Materials
- T/SHDSGY 135-2023 New Energy Semiconductor Silicon Wafer Material Technology
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer
National Metrological Technical Specifications of the People's Republic of China
- JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
British Standards Institution (BSI)
- BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
- 12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
- BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
- BS IEC 62899-203:2024 Printed electronics - Materials. Semiconductor ink
- BS IEC 62899-203:2018 Printed electronics. Materials. Semiconductor ink
- BS EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
German Institute for Standardization
- DIN CEN/TS 16599:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
- DIN EN 62779-2 E:2013-01 Draft Document - Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (IEC 47/2153/CD:2012)
- DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
- DIN 50439:1982-10 Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
Magyar Szabványügyi Testület
- MSZ 771/5-1979 Mechanical properties of semiconductor materials
International Electrotechnical Commission (IEC)
- IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
- IEC 62899-203:2024 Printed electronics – Part 203: Materials – Semiconductor ink
Korean Agency for Technology and Standards (KATS)
- KS C 6520-2021 Components and materials of semiconductor process —Measurement of wear characteristics by plasma
- KS C 6520-2019 Components and materials of semiconductor process —Measurement of wear characteristics by plasma
YU-JUS
- JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes
RO-ASRO
- STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology
American Society for Testing and Materials (ASTM)
- ASTM F42-02 Test methods for conductivity types of semiconductor materials
- ASTM F43-99 Semiconductor material resistivity test method
- ASTM D3004-97 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
- ASTM D3004-02 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
- ASTM D3004-08(2020) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
Indonesia Standards
- SNI 19-0429-1989 Guide for sampling of liquid and semi solid materials
Swedish Institute for Standards
- SS-EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
American National Standards Institute （ANSI)
- ANSI/ASTM D3004:2008 Specification for Extruded Crosslinked and Thermoplastic Semi-conducting, Conductor and Insulation Shielding Materials
Spanish Association for Standardization (UNE)
- UNE 61020:1975 REFRACTORY MATERIALS. GENERAL CHARACTERISTICS OF THE REFRACTORIES OF DEMI-SILICE
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