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semiconductor device curve tracers scopethis standard semiconductor tube characteristic traverser semiconductor tube semiconductor characteristic grapher resource conserving dangerous goods code imo international convention serum lactate dehydrogenase
GB/T 13974-1992 in English

GB/T 13974-1992 in English

SUPERSEDED

methods for semiconductor device curve tracers

  • Issued on:1992-12-19
  • Implemented on:1993-07-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $210.00
$204.00
Standard No: GB/T 13974-1992
Document status: SUPERSEDED
Superseded by: GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
Superseded on: 2013-06-01
Title in English: methods for semiconductor device curve tracers
Title in Chinese: 半导体管特性图示仪测试方法
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 1992-12-19
Implemented on: 1993-07-01
Professional Classification: GB-National Standard
Related Keywords: semiconductor device curve tracers scopethis standard
semiconductor tube characteristic traverser
semiconductor tube
semiconductor
characteristic grapher
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《GB/T 13974-1992半导体管特性图示仪测试方法》由TC153(全国电子测量仪器标准化技术委员会)归口,主管部门为工业和信息化部(电子)。
本标准规定了半导体管特性图示仪的测试方法及误差计算等。本标准所用的术语符合GB/T13974《半导体管特性图示仪通用技术条件》中第三章的规定。本标准适用于测试GB/T13973中所规定的性能特性。


Scope

This standard specifies the test method and error calculation of the semiconductor tube characteristic grapher (hereinafter referred to as the grapher). The terms used in this standard comply with the provisions of Chapter III of GB/T13973 "General Technical Conditions for Semiconductor Tube Characteristic Traverser". This standard is suitable for testing the performance characteristics specified in GB/T13973.

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