Semiconductor Magnetic

Semiconductor Magnetic, Total:171 items.

The international standard classification for "Semiconductor Magnetic" includes: Motors , Electricity. Magnetism. Electrical and magnetic measurements , Semiconductor devices in general , Semiconducting materials , Optoelectronics. Laser equipment , Electronic components in general .

The Chinese standard classification for "Semiconductor Magnetic" includes: Electronic industry production equipment in general , Electric drive control equipment , Electronic measurement and equipment in general , Semiconductor discrete devices in general , Semimetal and semiconductor material in general , Technical management , Optoelectronic device assembly , Reliability and maintainability .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
GB/T 3859.2-1993 Semiconductor convertors Application guide
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
GB/T 14264-1993 Semiconductor materials－Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 12667-2012 General specification for excitation assembly with semiconductors for synchronous motors
GB/T 30116-2013 Requirements for Semiconductor Manufacturing Facility Electromagnetic Compatibility
GB/T 12667-1990 General specification for excitation assembly with semiconductor for synchronous motor
GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 13974-1992 methods for semiconductor device curve tracers

Professional Standard - Electron

SJ 2433-1984 Bonding sheet for semiconductor tubes
SJ/T 11395-2009 Semiconductor lighting terminology
SJ 2073-1982 Cores for IF transformers and medium wave oscillator coil of transistor radio receivers
SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810

Hebei Provincial Standard of the People's Republic of China

DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer

Military Standard of the People's Republic of China-General Armament Department

GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler

National Metrological Technical Specifications of the People's Republic of China

JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1873-2016 semiconductor refrigeration wine cabinet

Group Standards of the People's Republic of China

T/QGCML 4031-2024 Semiconductor optical wafer
T/JSXH 0002-2020 Regeneration solution for semiconductor
T/CIE 144-2022 Reliability enhancement test of semiconductor devices

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37031-2018 Semiconductor lighting terminology

工业和信息化部

QB/T 5369-2019 Semiconductor refrigeration appliance

Semiconductor Equipment and Materials International (SEMI)

SEMI E33-94 SPECIFICATION FOR SEMICONDUCTOR MANUFACTURING FACILITY ELECTROMAGNETIC COMPATIBILITY

German Institute for Standardization

DIN V VDE V 0884-10:2006 Semiconductor devices - Magnetic and capacitive couplers for safe isolation
DIN EN IEC 63287-1:2020-06 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020 / Note: Date of issue 2020-05-08*Intended as replacem...
DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.

British Standards Institution (BSI)

BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
BS EN IEC 60747-17:2020 Semiconductor devices. Magnetic and capacitive coupler for basic and reinforced insulation
BS EN 62830-3:2017 Semiconductor devices. Semiconductor devices for energy harvesting and generation - Vibration based electromagnetic energy harvesting
BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS IEC 62830-3:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation. - Part 3: Vibration based electromagnetic energy harvesting
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS PD IEC TR 63304:2021 Permanent magnet (magnetically hard) materials. Methods of measurement of magnetic properties in an open magnetic circuit using a superconducting magnet
BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
23/30478757 DC BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines - Part 3. Guidelines for reliability qualification plans for power semiconductor module
BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
BS DD IEC/PAS 60747-17:2011 Semiconductor devices. Discrete devices. Magnetic and capacitive coupler for basic and reinforced isolation
BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 62951-3:2018 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 62951-8:2023 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for stretchability, flexibility, and stability of flexible resistive memory
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
BS IEC 60747-14-10:2019 Semiconductor devices. Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
BS IEC 62951-9:2022 Semiconductor devices. Flexible and stretchable semiconductor devices - Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
14/30297227 DC BS EN 62880-1. Semiconductor devices. Wafer level reliability for semiconductor devices. Copper stress migration test method
PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS IEC 60747-1:2006+A1:2010 Semiconductor devices - General
BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication
PD IEC TR 63304:2021 Permanent magnet (magnetically hard) materials. Methods of measurement of magnetic properties in an open magnetic circuit using a superconducting magnet

SCC

12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
CEI EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances
BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
IEC 60146:1973 Semiconductor convertors
CEI EN IEC 63287-1:2022 Semiconductor devices - Generic semiconductor qualification guidelines Part 1: Guidelines for IC reliability qualification
DIN IEC 60747-14-5 E:2008 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
AENOR UNE 21017:1959 BARE, SEMI-RIGID COPPER CABLES FOR ELECTRICAL CONDUCTORS
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
DANSK DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
CEI EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements
BS PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
07/30164953 DC IEC 60747-14-5. Semiconductor devices. Discrete devices. Part 14-5. Semiconductor sensors. PN-junction semiconductor temperature sensor
CEI EN 62258-1:2011 Semiconductor devices - Semiconductor die products Part 1: Procurement and use
MIL MIL-DTL-19491J-2014 Semiconductor Devices, Packaging of
BS IEC 60747-1:2006 Semiconductor devices. General

International Electrotechnical Commission (IEC)

IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
IEC 62830-3:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
IEC 62951-1:2017 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
IEC 60747-17:2020/COR1:2021 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation; Corrigendum 1
IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
IEC PAS 60747-17:2011 Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation
IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
IEC 60747-14-3:2001 Semiconductor devices - Part 14-3: Semiconductor sensors; Pressure sensors
IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
IEC TR 63304:2021 Methods of measurement of the magnetic properties of permanent magnet (magnetically hard) materials in an open magnetic circuit using a superconducting magnet
IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

VDE - VDE Verlag GmbH@ Berlin@ Germany

VDE V 0884-10-2006 Semiconductor devices - Magnetic and capacitive couplers for safe isolation

CZ-CSN

CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
CSN 35 8701 Z1-1997 Semiconductor naming
CSN 35 1531-1973 Silicon semiconductor rectifiers
CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions

YU-JUS

JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes
JUS N.R1.322-1979 Terms and definitions for semiconductor ?evices. Thyristors

IEC - International Electrotechnical Commission

IEC 62951-7:2019 Semiconductor devices – Flexible and stretchable semiconductor devices – Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor (Edition 1.0)
IEC 62779-2:2016 Dispositifs à semiconducteurs – Interface à semiconducteurs pour les communications via le corps humain – Partie 2: Caractérisation des performances d'interfa?age (Edition 1.0)
IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)

HU-MSZT

MSZ 771/5-1979 Mechanical properties of semiconductor materials
MSZ 9200/18-1980 Electronic signals. semiconductor

GSO

GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
GSO IEC 62779-2:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
GSO IEC 63287-1:2024 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
GSO IEC 62830-3:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
BH GSO IEC 62830-3:2022 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
GSO IEC 60747-14-2:2014 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
BH GSO IEC 60747-14-2:2016 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
OS GSO IEC 60747-14-4:2014 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
BH GSO IEC 60747-14-4:2016 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
OS GSO IEC 60747-14-3:2014 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
BH GSO IEC 60747-15:2016 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
BH GSO IEC 60747-14-10:2022 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

Standard Association of Australia （SAA）

AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
AS 1054:1973 Electromagnetic interference limits and measurements for semiconductor control devices
AS C379.1:1970 Mechanical standardization of semiconductor devices - Preparation of drawings of semiconductor devices

Spanish Association for Standardization (UNE)

UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
UNE-EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)

Association Francaise de Normalisation

NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF C96-287-1*NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : guidelines for IC reliability qualification
NF EN 62779-2:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage
NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Integrated circuit reliability qualification guidelines
NF C96-017:2020 Semiconductor devices - Part 17 : magnetic and capacitive coupler for basic and reinforced insulation
NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements

European Committee for Electrotechnical Standardization（CENELEC）

EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements

JP-JEITA

JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

NEMA - National Electrical Manufacturers Association

NEMA CB-4:1989 Semiconductor Graphite

National Fire Protection Association (NFPA)

NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

Danish Standards Foundation

DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

Korean Agency for Technology and Standards (KATS)

KS C IEC 62951-1:2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates
KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR
KS C 5212-1981(2002) GENERAL RULES FOR RELIABILITY ASSURED DISCRETE SEMICONDUCTOR DEVICES
KS C 5212-1981 GENERAL RULES FOR RELIABILITY ASSURED DISCRETE SEMICONDUCTOR DEVICES
KS C IEC 60747-14-1:2003 Semiconductor devices－Part 14－1：Semiconductor sensors－General and classification
KS C IEC 60747-14-1:2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors

KR-KS

KS C IEC 62951-1-2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 256-1963 SEMICONDUCTOR DIODES
IEEE 59-1962 SEMICONDUCTOR RECTIFIER COMPONENTS

RU-GOST R

GOST 24688-1981 Static semiconductor exciters for three-phase synchronous engines. General technical requirements

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD30E-2008 Descriptive Designation System for Semiconductor-device Packages

American National Standards Institute （ANSI)

ANSI/UL 1557-2013 Standard for Safety for Electrically Isolated Semiconductor Devices

RO-ASRO

STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties

Japanese Industrial Standards Committee (JISC)

JIS C 2500:2022 Methods of measurement of the magnetic properties of permanent magnet (magnetically hard) materials in an open magnetic circuit using a superconducting magnet

SE-SIS

SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SIS SEN 01 03 51-1966 Semiconductor devices Terminology

Defense Logistics Agency

DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF

BE-NBN

NBN C 95-001-1977 Semiconductor equipment. the term

US-Unspecified Preparing Activity

DI-QCIC-80924 A-2006 SEMICONDUCTOR PROCESS SPECIFICATION