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semiconductor device curve tracers scopethis standard general specification test methods test methods semiconductor tube product standard requirements test methods introductionthis standard outlines procedures inland navigation eleetrification
GB/T 13973-2012 in English

GB/T 13973-2012 in English

VALID

General specification test methods for semiconductor device curve tracers

  • Issued on:2012-12-31
  • Implemented on:2013-06-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $600.00
$582.00
Standard No: GB/T 13973-2012
Document status: VALID
Title in English: General specification test methods for semiconductor device curve tracers
Title in Chinese: 半导体管特性图示仪通用规范
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2012-12-31
Implemented on: 2013-06-01
Superseding: GB/T 13973-1992 specification for semiconductor device curve tracers
GB/T 13974-1992 methods for semiconductor device curve tracers
ICS Classification: 17.220-Electricity. Magnetism. Electrical and magnetic measurements
Chinese Classification: L85-Electronic measurement and equipment in general
Professional Classification: GB-National Standard
Related Keywords: semiconductor device curve tracers scopethis standard
general specification test methods
test methods
semiconductor tube
product standard requirements
Related Topics: Semiconducting
Semiconductor photoelectric properties
Semiconductor photoelectric properties
cobalt semiconducting
Semiconductor Magnetic
Semiconductor Material Properties
Semiconductor Magnetic
Semiconductor performance
semiconductor curve
Tracer
Semiconductor properties
semiconductor effect
semiconductor curve
Range of use
Semiconductor High Frequency Characteristics
Semiconductor parameter meter
Isotropic characteristics of semiconductors
semiconductor diagram
Semi-dry transfer instrument
Four properties of semiconductors
semiconductor
Semiconductor UV Diagram
GBT13973
GB/T 13973-1992
GB/T 13973-2012
gb/t 13973-2018
gb/t 13973

《GB/T 13973-2012半导体管特性图示仪通用规范》由TC153(全国电子测量仪器标准化技术委员会)归口,主管部门为工业和信息化部(电子)。


Scope

This standard specifies the terms and definitions, requirements, test methods, quality inspection rules, marking, packaging, transportation, storage, etc. of the semiconductor tube characteristic tracer (hereinafter referred to as the tracer). The semiconductor tube characteristic tracer with DC parameters is also applicable to the semiconductor tube characteristic tracer with plug-in unit or accessory device. The product standard of the tracer shall meet the requirements of this standard. When the product standard requirements of the tracer exceed the requirements of this standard When required by the standard, the product standard shall prevail.

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