semiconductor curve
semiconductor curve, Total:38 items.
The international standard classification for "semiconductor curve" includes: Components for aerospace construction , Nuclear energy in general , Electricity. Magnetism. Electrical and magnetic measurements .
The Chinese standard classification for "semiconductor curve" includes: Pipe fittings, clamps and seals , Nuclear instrument and detector in general , Electronic measurement and equipment in general .
Professional Standard - Aviation
- HB 4-55-1995 Conduit Bending Radius
- HB 4-55-2002 Radius for tube crook
Professional Standard - Aerospace
- QJ 918-1985 Radius for Tube Crook
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
Professional Standard - Electron
- SJ/T 11775-2021 Multi-wire saw used for semiconductor materials
- SJ/T 11773-2021 Semiconductor integrated circuit stamped lead frame
Group Standards of the People's Republic of China
- T/QGCML 4338-2024 Assembly of small radius curve bridges
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JEP78-1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors
Society of Automotive Engineers (SAE)
- SAE AS33611-1997 Tube Bend Radii
British Standards Institution (BSI)
- BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
- BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
- BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
- BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
- BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
CZ-CSN
- CSN 34 5910-1986 Gold bonding wire for semiconductor devices
- CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
German Institute for Standardization
- DIN 41772:1979 Static power convertors; semiconductor rectifier equipment, shapes and letter symbols of characteristic curves
- DIN 50439:1982 Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
- DIN 41772 Beiblatt 1:1979-02 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
- DIN 41772:1979-02 Static power convertors; semiconductor rectifier equipment, shapes and letter symbols of characteristic curves
- DIN 41772 Bb.1:1979 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
- DIN 41772 Beiblatt 1:1979 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
- DIN 41776:1983 Static power convertors; semiconductor rectifier equipment with I characteristic for charging of batteries; requirements
Japanese Industrial Standards Committee (JISC)
- JIS C 2805:2010 Crimp-type terminal lugs for copper conductors
KR-KS
- KS C IEC 62951-1-2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates
Korean Agency for Technology and Standards (KATS)
- KS C IEC 62951-1:2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates
American Society for Testing and Materials (ASTM)
- ASTM F72-24 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM F72-06 Standard Specification for Gold Wire for Semiconductor Lead Bonding
- ASTM F584-87(2005) Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
- ASTM F584-87(1999) Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
- ASTM F487-88(2001) Standard Specification for Fine Aluminum-1% Silicon Wire for Semiconductor Lead-Bonding
- ASTM F72-17e1 Standard Specification for Gold Wire for Semiconductor Lead Bonding
GSO
- GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
Standard Association of Australia （SAA）
- AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
International Electrotechnical Commission (IEC)
- IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
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