Semiconductor Materials Microscope

Semiconductor Materials Microscope, Total:92 items.

The international standard classification for "Semiconductor Materials Microscope" includes: Testing of metals , Optical equipment , Animal feeding stuffs , Semiconducting materials , Coals , Leather and furs .

The Chinese standard classification for "Semiconductor Materials Microscope" includes: Metal physical property test method , Magnifier and microscope , Electron optics and other physical optics instrument , Cereal crop and forage crop in general , Semimetal and semiconductor material in general , Special electronic technology material , Coal petrography , Furs and leathers , Livestock and poultry feed and additive .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19864.1-2013 Stereomicroscopes—Part 1:Stereomicroscopes for general use
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes
GB/T 44558-2024 Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 19864.1-2005 Stereomicroscopes - Part 1: Stereomicroscopes for general use
GB/T 10155-1988 Stereomicroscope
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 6948-2008 Method of determining microscopically the reflectance of vitrinite in coal
GB/T 31469-2015 Semiconductor materials cutting fluid
GB/T 14264-1993 Semiconductor materials－Terms and definitions
GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 19863-2005 Testing of stereomicroscopes
GB/T 14698-2002 method of feed microscopy
GB/T 6948-1998 Microscopical determination of the reflectance of vitrinite in coal

Professional Standard - Machinery

JB/T 7816-1995 Stereomicroscope

Group Standards of the People's Republic of China

T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

Professional Standard - Agriculture

GB/T 14698-1993 Method for the test of feed microscopy

Professional Standard - Business

SB/T 10274-1996 Atlas of microscopic examination for feeds

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 38416-2019 Fur-Identification—Method of microscopy
GB/T 38408-2019 Leather—Identification—Method of microscopy

Sichuan Provincial Standard of the People's Republic of China

DB51/T 1791-2014 Leather Material Identification Microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 14698-2017 Identification method of feed material by microscopy
GB/T 34269-2017 Atlas of microscopic examination for feedstuff

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

British Standards Institution (BSI)

BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BS 7012-0:1989 Light microscopes - General introduction
BS 7011-0:1989 Consumable accessories for light microscopes. General introduction
BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
BS EN 62047-10:2011 Semiconductor devices. Micro-electromechanical devices. Micro-pillar compression test for MEMS materials

Korean Agency for Technology and Standards (KATS)

KS B 5614-1998 Stereo microscopes
KS B 5614-2018 Stereo microscopes
KS B 5614-2013 Stereo microscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B 5612-2019 Small size biological microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes

Japanese Industrial Standards Committee (JISC)

JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7139:1997 Stereo microscopes
JIS B 7139-1:2008 Stereomicroscopes -- Part 1: Minimum requirements for stereomicroscopes

Military Standards (MIL-STD)

DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC

German Institute for Standardization

DIN 50452-1:1995 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
DIN EN 60749-35:2007-03 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
DIN 50452-1:1995-11 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles

International Organization for Standardization (ISO)

ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes

GSO

BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO IEC 60749-35:2014 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
GSO IEC 60749-35:2014 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
OS GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
BH GSO ISO 11884-1:2015 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use
OS GSO ISO 11884-2:2013 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
BH GSO ISO 11884-2:2015 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes

KR-KS

KS B 5614-2023 Binocular stereo microscopes
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes

SCC

ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
DANSK DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
CEI EN 60749-35:2012 Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components
BS EN ISO 13366-1:1997 Milk. Enumeration of somatic cells-Microscopic method
BS 7011-3-3.2:1990 Consumable accessories for light microscopes. Cover glasses-Specification for materials and quality of finish

Danish Standards Foundation

DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Spanish Association for Standardization (UNE)

UNE-EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)

Association Francaise de Normalisation

NF EN 60749-35:2006 Dispositifs à semiconducteurs - Méthodes d'essai climatiques et mécaniques - Partie 35 : microscopie acoustique pour composants électroniques à boîtier plastique
NF V32-167:1985 Spices and condiments. Ground paprika ({Capsicum} {Annuum} {Linnaeus}). Microscopical examination.

HU-MSZT

MNOSZ 5536-1956 Microscope object sockets and tubes

Defense Logistics Agency

DLA A-A-52040 VALID NOTICE 1-2001 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
DLA A-A-52040 VALID NOTICE 2-2007 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
DLA A-A-52040-1992 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)

Lithuanian Standards Office

LST EN 60749-35-2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006)