semiconducting material semiconducting material

semiconducting material semiconducting material, Total:49 items.

The international standard classification for "semiconducting material semiconducting material" includes: Semiconducting materials , Testing of metals in general , Testing of metals .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 14264-2009 Semiconductor materials - Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 14844-1993 of semiconductor materials
GB/T 31469-2015 Semiconductor materials cutting fluid
GB/T 4298-1984 The activation analysis method for the determination of elemental impurities in semiconductor silicon materials
GB/T 14264-1993 Semiconductor materials－Terms and definitions

SJ/T 11775-2021 Multi-wire saw used for semiconductor materials
SJ/T 11067-1996 Commonly used terms for semiconductor photoelectric materials and pyroelectric materials in infrared detecting materials
SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
SJ/T 10414-2015 Solder for semiconductor device
SJ/T 10414-1993 Solder for semicoductor device

GB/T 14844-2018 Designations of semiconductor materials
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials

T/ICMTIA CM0035-2023 Sealing gasket for semiconductor silicon material process device
T/SHDSGY 135-2023 New Energy Semiconductor Silicon Wafer Material Technology
T/CASME 798-2023 Specialized processing tools for semiconductor materials
T/SHPTA 071.2-2023 Semi-conductive rubber for high voltage cable accessories-Part 2:Semi-conductive rubber
T/CNIA 0143-2022 Ultrapure Resin Vessels for Trace Impurity Analysis of Semiconductor Materials

DB61/T 1250-2019 General Specification for Sic (Silicon Carbide) Material Semiconductor Discrete Devices

DIN SPEC 1994 E:2016-07 Testing of materials for semiconductor technology - Determination of anions in weak acids

BS IEC 62899-203:2024 Printed electronics - Materials. Semiconductor ink
BS IEC 62899-203:2018 Printed electronics. Materials. Semiconductor ink
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
BS EN 62047-18:2013 Semiconductor devices. Micro-electromechanical devices. Bend testing methods of thin film materials
21/30428334 DC BS EN IEC 62899-203. Printed electronics. Part 203. Materials. Semiconductor ink

IEC 62899-203:2018 Printed electronics - Part 203: Materials - Semiconductor ink
IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials

IEC 62899-203:2024 RLV Printed electronics - Part 203: Materials - Semiconductor ink

DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers
DIN 50439:1982 Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
DIN 50441-1:1996 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
DIN 50441-2:1998 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile
DIN SPEC 1994:2017-02 Testing of materials for semiconductor technology - Determination of anions in weak acids

KS C IEC 62899-203-2023 Printed electronics — Part 203: Materials — Semiconductor ink

SPC GB/T 14844-2018 Designations of semiconductor materials (TEXT OF DOCUMENT IS IN CHINESE)
SPC GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials (TEXT OF DOCUMENT IS IN CHINESE)

ANSI/ASTM D3004:2008 Specification for Extruded Crosslinked and Thermoplastic Semi-conducting, Conductor and Insulation Shielding Materials

ASTM D3004-02 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D3004-08(2020) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
ASTM D3004-97 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials