Semiconductor material properties
Semiconductor material properties, Total:23 items.
The international standard classification for "Semiconductor material properties" includes: Semiconducting materials .
The Chinese standard classification for "Semiconductor material properties" includes: Semimetal and semiconductor material in general , Special electronic technology material .
Group Standards of the People's Republic of China
- T/SHDSGY 135-2023 New Energy Semiconductor Silicon Wafer Material Technology
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14264-2024 Terminology of semiconductor materials
- GB/T 14264-1993 Semiconductor materials－Terms and definitions
- GB/T 14264-2009 Semiconductor materials - Terms and definitions
- GB/T 31469-2015 Semiconductor materials cutting fluid
Professional Standard - Electron
- SJ/T 11775-2021 Multi-wire saw used for semiconductor materials
HU-MSZT
- MSZ 771/5-1979 Mechanical properties of semiconductor materials
European Committee for Standardization (CEN)
- PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
British Standards Institution (BSI)
- BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
- BS IEC 62899-203:2024 Printed electronics - Materials. Semiconductor ink
SCC
- DANSK DS/CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- DIN CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
- 12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
German Institute for Standardization
- DIN CEN/TS 16599:2014-07*DIN SPEC 7397:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
- DIN CEN/TS 16599:2014*DIN SPEC 7397:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
Association Francaise de Normalisation
- NF ISO 22197-4:2021 Technical ceramics - Test methods for the performance of semiconductor photocatalytic materials for air purification - Part 4: formaldehyde removal
- XP B44-014*XP CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- NF ISO 22197-5:2021 Technical ceramics - Test methods for the performance of semiconductor photocatalytic materials for air purification - Part 5: removal of methyl mercaptan
RO-ASRO
- STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology
Indonesia Standards
- SNI 19-0429-1989 Guide for sampling of liquid and semi solid materials
International Electrotechnical Commission (IEC)
- IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
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