Semiconductor Optical Properties

Semiconductor Optical Properties, Total:79 items.

The international standard classification for "Semiconductor Optical Properties" includes: Optoelectronics. Laser equipment .

The Chinese standard classification for "Semiconductor Optical Properties" includes: Others , Laser device , Special electronic technology material .

Group Standards of the People's Republic of China

T/QGCML 4323-2024 Intelligent semiconductor six-sided appearance optical image sorter
T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment
T/QGCML 4031-2024 Semiconductor optical wafer
T/JGXH 008-2020 Diode pump solid state laser
T/CASME 698-2023 Semiconductor laser therapy apparatus

Military Standard of the People's Republic of China-General Armament Department

GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices

Hebei Provincial Standard of the People's Republic of China

DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
GB/T 15167-1994 General specification for light source of semiconductor lasers
GB/T 31358-2015 General specification for semiconductor lasers

Jilin Provincial Standard of the People's Republic of China

DB22/T 2725-2017 980 nm fiber grating semiconductor laser

Professional Standard - Electron

SJ/T 11397-2009 Phosphors for light emitting diodes
SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 15651.4-2017 Semiconductor devices-Discrete devices-Part 5-4:Optoelectronic devices-Semiconductor lasers

HU-MSZT

MSZ 771/5-1979 Mechanical properties of semiconductor materials

British Standards Institution (BSI)

BS EN 62149-8:2014 Fibre optic active components and devices. Performance standards. Seeded reflective semiconductor optical amplifier devices
BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS EN 62149-9:2014 Fibre optic active components and devices. Performance standards. Seeded reflective semiconductor optical amplifier transceivers
BS ISO 17915:2018 Optics and photonics. Measurement method of semiconductor lasers for sensing
BS EN 61207-7:2013 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers
BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
PD IEC TR 61292-9:2023 Optical amplifiers. Semiconductor optical amplifiers (SOAs)
19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices

International Organization for Standardization (ISO)

ISO 17915:2018 Optics and photonics - Measurement method of semiconductor lasers for sensing
ISO/TS 17915:2013 Optics and photonics.Measurement method of semiconductor lasers for sensing

GSO

OS GSO ISO/TS 17915:2015 Optics and photonics -- Measurement method of semiconductor lasers for sensing
BH GSO ISO/TS 17915:2017 Optics and photonics -- Measurement method of semiconductor lasers for sensing
GSO ISO/TS 17915:2015 Optics and photonics -- Measurement method of semiconductor lasers for sensing
GSO IEC 62779-2:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
OS GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
BH GSO IEC 60747-5-4:2016 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

SCC

BS PD ISO/TS 17915:2013 Optics and photonics. Measurement method of semiconductor lasers for sensing
12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
CEI EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances
CEI EN 61207-7/EC:2014 Expression of performance of gas analyzers Part 7: Tunable semiconductor laser gas analyzers
CEI EN 61207-7:2014 Expression of performance of gas analyzers Part 7: Tunable semiconductor laser gas analyzers
DANSK DS/EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
DANSK DS/EN 61207-7/AC:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
BS PD IEC TR 61292-9:2023 Optical amplifiers-Semiconductor optical amplifiers (SOAs)
BS PD IEC/TR 61292-9:2013 Optical amplifiers-Semiconductor optical amplifiers (SOAs)
BS PD IEC/TR 61292-9:2017 Optical amplifiers-Semiconductor optical amplifiers (SOAs)

RU-GOST R

GOST R 59740-2021 Optics and photonics. Semiconductor lasers for the determination of low concentrations of substances. Methods for measuring characteristics
GOST R 59605-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Terms and definitions
GOST R 59607-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Methods of measuring photoelectric parameters and determining characteristics
GOST 24458-1980 Semiconductor optoelectronic couplers. Essential parameters
GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle

International Electrotechnical Commission (IEC)

IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 62149-8:2014 Fibre optic active components and devices - Performance standard - Part 8: Seeded reflective semiconductor optical amplifier devices
IEC 62149-9:2014 Fibre optic active components and devices - Performance standards - Part 9: Seeded reflective semiconductor optical amplifier transceivers
IEC 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 62007-2:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

Association Francaise de Normalisation

XP CEN/TS 16599:2014 Photocatalysis - Determination of irradiation conditions to test the photocatalytic properties of semiconductor materials
NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF EN 61207-7:2014 Gas analyzer performance expression - Part 7: Tunable semiconductor laser gas analyzers
NF EN 62779-2:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage

ESD - ESD ASSOCIATION

EP118-2007 Physics of Semiconductor Devices

RO-ASRO

STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
STAS 12258/7-1987 OPTOELECTRONIC SEMICONDIC- TOH DEVICES PHOTOVOLTAIC CELLS Terminology and essential cliarac! eristics
STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties

German Institute for Standardization

DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).

Spanish Association for Standardization (UNE)

UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)

European Committee for Electrotechnical Standardization（CENELEC）

EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers

IEC - International Electrotechnical Commission

IEC 62951-7:2019 Semiconductor devices – Flexible and stretchable semiconductor devices – Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor (Edition 1.0)

European Committee for Standardization (CEN)

PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions