Semiconductor performance
Semiconductor performance, Total:13 items.
The international standard classification for "Semiconductor performance" includes: .
The Chinese standard classification for "Semiconductor performance" includes: .
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4894-2024 MEMS semiconductor gas sensor performance testing method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14264-2024 Terminology of semiconductor materials
British Standards Institution (BSI)
- 12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
- BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
- BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
Magyar Szabványügyi Testület
- MSZ 771/5-1979 Mechanical properties of semiconductor materials
Comitato Elettrotecnico Italiano
- CEI EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances
Spanish Association for Standardization (UNE)
- UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
GCC Standardization Organization
- GSO IEC 62779-2:2021 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Association Francaise de Normalisation
- NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
German Institute for Standardization
- DIN EN 62779-2 E:2013-01 Draft Document - Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (IEC 47/2153/CD:2012)
International Electrotechnical Commission (IEC)
- IEC 62951-7:2019 Semiconductor devices – Flexible and stretchable semiconductor devices – Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor (Edition 1.0)
European Committee for Electrotechnical Standardization（CENELEC）
- EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
semiconductor layer,semiconductor cu,Photocatalytic properties of semiconductors,Photocatalytic properties of semiconductors,Semiconductor Catalytic Performance,Semiconductor Optical Properties,Semiconductors with photocatalytic properties,Catalytic performance semiconductor,Properties of Organic Semiconductor Materials,Semiconductor performance impact,Semiconductor Light Performance,Semiconductor performance,Flame Retardancy Physical Properties,Catalytic properties of semiconductors,Semiconductor performance,Semiconductor material properties,Semiconductor material properties,Performance Verification Performance Confirmation,Performance Confirmation Performance,Performance Verification Performance Confirmation
