High energy semiconductor laser
High energy semiconductor laser, Total:53 items.
The international standard classification for "High energy semiconductor laser" includes: Optoelectronics. Laser equipment , Other fiber optic equipment , Ophthalmic equipment , Therapy equipment .
The Chinese standard classification for "High energy semiconductor laser" includes: Laser device , Carrier communication equipment , Others , Optical communication equipment , Medical ultrasound, laser, high-frequency instrument and equipment , Technical management .
Group Standards of the People's Republic of China
- T/JGXH 008-2020 Diode pump solid state laser
- T/CASME 698-2023 Semiconductor laser therapy apparatus
- T/CVIA 134-2024 Semiconductor laser device testing methods
- T/JGXH 017-2024 Intelligent semiconductor laser therapy instrument
- T/QGCML 2041-2023 878 nm high power semiconductor laser chip
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31359-2015 Test methods of semiconductor lasers
- GB/T 15167-1994 General specification for light source of semiconductor lasers
- GB/T 31358-2015 General specification for semiconductor lasers
- GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
- GB/T 21548-2008 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
Jilin Provincial Standard of the People's Republic of China
- DB22/T 2725-2017 980 nm fiber grating semiconductor laser
Professional Standard - Post and Telecommunication
- YD/T 1687.2-2007 Technical Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 1:2.5Gbit/s Uncooled Direct Modulation Semiconductor Laser Assembly
- YD/T 1687.1-2007 Technical Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 1:2.5Gbit/s Cooled Direct Modulation Semiconductor Laser Assembly
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 15651.4-2017 Semiconductor devices-Discrete devices-Part 5-4:Optoelectronic devices-Semiconductor lasers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 21548-2021 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
Professional Standard - Medicine
- YY 1289-2016 Laser treating equipment―Ophthalmic semiconductor laser photocoagulators
- YY 0845-2011 Laser therapeutic equipment—Diode laser equipment for photodynamic therapy
Professional Standard - Electron
- SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
- SJ/T 11402-2009 Technical specification of semiconductor laser chip used in optical fiber communication
- SJ/T 11856.3-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 3: Electric Absorption Modulated Semiconductor Laser Chips for Light Sources
- SJ/T 11856.1-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 1: Fabry-Perot Type and Distributed Feedback Type Semiconductor Laser Chips for Light Sources
- SJ 2749-1987 Method of measurement for semiconductor laser diodes
- SJ/T 11856.2-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 2: Vertical Cavity Surface Emitting Semiconductor Laser Chips for Light Sources
- SJ 2750-1987 Outline dimensions for semiconductor laser diodes
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication
Military Standard of the People's Republic of China-General Armament Department
- GJB 3519-1999 General Specification for Semiconductor Laser Diodes
Taiwan Provincial Standard of the People's Republic of China
- CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
工业和信息化部
- SJ/T 2749-2016 Semiconductor Laser Diode Test Methods
国家药监局
- YY/T 1751-2020 Therapeutic laser equipment—Laser diode irradiation therapeutic equipment for nasal cavity
British Standards Institution (BSI)
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
- 19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
- BS EN 61207-7:2013 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
- 23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
- BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
- BS ISO 17915:2018 Optics and photonics. Measurement method of semiconductor lasers for sensing
International Electrotechnical Commission (IEC)
- IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
GSO
- GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- OS GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- BH GSO IEC 60747-5-4:2016 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- BH GSO ISO/TS 17915:2017 Optics and photonics -- Measurement method of semiconductor lasers for sensing
- OS GSO ISO/TS 17915:2015 Optics and photonics -- Measurement method of semiconductor lasers for sensing
IET - Institution of Engineering and Technology
- DISTRB FEEDB SEMI LAS-1998 Distributed Feedback Semiconductor Lasers
International Organization for Standardization (ISO)
- ISO/TS 17915:2013 Optics and photonics.Measurement method of semiconductor lasers for sensing
- ISO 17915:2018 Optics and photonics - Measurement method of semiconductor lasers for sensing
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers
Korean Agency for Technology and Standards (KATS)
- KS C 6942-1999 General rule of laser diode modules for fiber optic transmission
SCC
- BS PD ISO/TS 17915:2013 Optics and photonics. Measurement method of semiconductor lasers for sensing
Association Francaise de Normalisation
- NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
(U.S.) Telecommunications Industries Association
- TIA-455-128-1996(2014) Procedures for Determining Threshold Current of Semiconductor Lasers
- TIA-455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers
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