SJ 2749-1987 in English

SUPERSEDED

Method of measurement for semiconductor laser diodes

Issued on:1987-02-10
Implemented on:1987-10-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $250.00
$243.00

Standard No:	SJ 2749-1987
Document status:	SUPERSEDED
Superseded by:	SJ/T 2749-2016 Semiconductor Laser Diode Test Methods
Superseded on:	2016-06-01
Title in English:	Method of measurement for semiconductor laser diodes
Title in Chinese:	半导体激光二极管测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1987-02-10
Implemented on:	1987-10-01
Chinese Classification:	F01-Technical management
Professional Classification:	SJ-Electronics
Related Keywords:	semiconductor laser diodes semiconductor laser diodes laser semiconductor
Related Topics:	semiconducting light wave semiconductor photooxidation diode cp diode Semiconductor light agent two electrode system Double Excitation Spectrum laser polarization laser semiconductor semiconductor laser semiconductor photoluminescence two-dimensional semiconductor laser diode laser diode Diode test Semiconductor Light Performance leds and laser diodes diode laser laser half width led laser diode Clustered Diode Laser Series Diode Lasers Laser Pipe Measurement External cavity semiconductor laser Diode Test Method Rated photodiode External cavity semiconductor laser small semiconductor laser Diode Laser Orientation two-dimensional semiconductor semiconductor laser Test method for semiconductor laser diode components diode laser Electrode Conductivity Test Method Semiconductor Optical Measurement Semiconductor Test Technology Semiconductor Test Technology two electrode method Old-fashioned semiconductor laser edge semiconductor laser bipolar magnetic semiconductor Pole figure test method Diode test direct diode laser semiconductor dioxide Principles of Semiconductor Testing Semiconductor laser diode test method High energy semiconductor laser Domestic semiconductor laser Semiconductor lasers at home and abroad organic semiconductor laser UV laser diode Series Diode Lasers alaser Semiconductor Laser Series Photodiode Test Parameters semiconductor laser diode Diode Test Circuit Single Mode Laser Diode Semiconductor Kelvin Test Laser Pipe Measurement Semiconductor Process Management Secondary Antibody Excitation Light Class II laser Laser measurement of conductivity Disadvantages of si photodiodes laser transmission medium Semiconductor material luminescence characteristics testing Diode tester calibration Semiconductor polishing materials How to test diodes with a graphic analyzer Diode industry Semiconductor laser radiation pulse test method Semiconductor laser brightness diode execution Semiconductor laser head quality Semiconductor laser identification Laser particle size testing method Semiconductor laser industry Semiconductor protective film testing Semiconductor chemical purification methods Semiconductor Photocurrent Image Analysis Method

Scope

This standard is applicable to the testing of photoelectric parameters of semiconductor laser diodes. When referencing this standard, the relevant specific requirements shall be specified in the corresponding detailed specifications.

More samples: JC/T 2453-2018 YD/T 3934-2021 QC/T 942-2021

Sample only — not a preview of SJ 2749-1987

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