diode cp
diode cp, Total:427 items.
The international standard classification for "diode cp" includes: Electronic display devices , Optoelectronics. Laser equipment , Capacitors , Flat steel products and semi-products , Diodes , Aerospace electric equipment and systems , Glass products , Fluorescent lamps. Discharge lamps .
The Chinese standard classification for "diode cp" includes: Technical management , Technical management , Technical Management , Special electronic technology material , Computer peripherals , Microwave and millimeter wave diode and triode , Steel sheet and strip , Semiconductor diode , Electronic components , Power semiconductor device and parts , Semiconductor rectifier devices , Industrial technical glass , Semiconductor emitting device , Optical communication equipment , Electric light source products .
Professional Standard - Education
- JY 182-1984 vacuum diode
工业和信息化部
- SJ/T 11767-2020 Measurement method of low-frequency noise parameters for diodes
- SJ/T 11624-2016 Specifications of LED devices for LED displays
- SJ/T 2749-2016 Semiconductor Laser Diode Test Methods
- QC/T 1038-2016 Light-emitting diodes (LED) and modules for automotive
- QB/T 5478-2020 LED-UV curing offset ink
Professional Standard - Military and Civilian Products
- WJ 2100-2004 Test method for silicon photodiodes and silicon avalanche photodiodes
- WJ 2506-1998 Verification Regulations for Photodiode Dynamic Tester
- WJ 2539-1999 Verification Regulations for Temperature Measuring Diode Meter
- WJ 2265-1995 Specifications for Preamplified Silicon Avalanche Photodiodes
未注明发布机构
- ANSI C82.16-2015 Light-Emitting Diode Drivers — Methods of Measurement
- JEDEC JESD282B.02-2023 SILICON RECTIFIER DIODES
- ANSI C78.51-2016 Electric Lamps — LED (Light Emitting Diode) Lamps — Method of Designation
Professional Standard - Electron
- SJ 909-1974 Detail specification for silicon voltage regulator diodes,Type 2CW50~149
- SJ 2727-1986 Detail specification for general purpose silicon rectifier diodes,Type 2CZ313
- SJ 2750-1987 Outline dimensions for semiconductor laser diodes
- SJ 1228-1977 Detail specification for germanium wideband detector diodes,Type 2AP30~2AP31
- SJ 1806-1981 Detail specification for silicon band switching varialbe capacitance diodes,Type 2CC110,2CC210,2CC310,2CC410,2CC130
- SJ/T 11281-2007 Test methods of LED panels
- SJ 2749-1987 Method of measurement for semiconductor laser diodes
- SJ/T 11401-2009 Series program for semiconductor light emitting diodes
- SJ 1805-1981 Detail specification for silicon frequency modulated variable capacitance diodes,Type 2CC126
- SJ/T 11281-2017 Measure methods of light emitting diode (LED) displays
- SJ/T 2216-2015 Technical specification for photodiode of silicon
- SJ 1386-1978 Measurement conditions for noise-generator diodes and gas discharge noise tubes
- SJ 2216-1982 Silicon photodiodes
- SJ 1946-1981 Detail specification for silicon voltage booster diodes,Type 2CN4C,2DN4C,2CN5C and 2DN5C
- SJ 1381-1978 Structure and technology of test diode
- SJ 2218-1982 Semiconductor photocouplers in the diode mode
- SJ 1229-1977 Detail specification for germanium switching diodes,Type 2AK1~20
- SJ 1392-1978 Methods of measurement for excess noise power of noise-generator diodes
- SJ 1225-1977 Detail specification for germanium detector diodes,Type 2AP11~2AP17
- SJ 1947-1981 Detail specification for silicon power rectifier diodes,Type 2CZ32B,2DZ32B,2CZ33B and 2DZ33B
- SJ 2725-1986 Detail specification for general purpose silicon rectifier diodes,Type 2CZ311
- SJ 2717-1986 Detail specification for silicon general purpose rectifier diodes,Type 2CZ301
- SJ 2726-1986 Detail specification for general purpose silicon rectifier diodes,Type 2CZ312
- SJ/T 11470-2014 Epitaxial wafers of light-emitting diodes
- SJ 1226-1977 Detail specification for germanium detector diodes,Type 2AP9~2AP10
- SJ 20788-2000 Measurment method for thermal impedance of semiconductor diodes
- SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
- SJ 2747-1987 Blank detail specification for step-function recovery diodes
- SJ 1389-1978 Methods of measurement for diodes leakage current between electrodes of noise-generator diodes
- SJ/T 2354-2015/0352 Measuring methods for photodiodes of PIN、APD
- SJ/T 11397-2009 Phosphors for light emitting diodes
- SJ 1227-1977 Detail specification for germanium detector diodes,Type 2AP1~2AP8,2AP21 and 2AP27
- SJ 1388-1978 Methods of measurement for anode conductance of noise-generator diodes
- SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes
- SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
- SJ 20785-2000 Measuring methods for super luminescent diode module
- SJ 910-1974 Detail specification for silicon voltage regulator diodes,Type 3DW50~202
- SJ 2140-1982 Methods of measurement for limiting voltage of silicon current regulator diodes
- SJ 2137-1982 General procedures of measurement for silicon current-regulator diodes
- SJ 2005-1982 Detail specification for N channel junction pair field-effect transistors,Type CS34
- SJ/T 11141-2017 Generic specification for LED displays
- SJ/T 11471-2014 Measurement methods for epitaxial wafers of light-emitting diodes
Taiwan Provincial Standard of the People's Republic of China
- CNS 13810-1997 Lead Frames for Light Emitting Diodes
- CNS 13808-1997 Epitaxial Wafers for Light Emitting Diodes
- CNS 13652-1996 Reliability Testing for Light Emitting Diode(for Communication)
- CNS 13654-1996 Measuring Methods for Photodiode(for Communication)
- CNS 13648-1996 Measuring Methods for Laser Diode(for Communication)
- CNS 13092-1992 Measuring Method for LED Outdoor Display Panels
- CNS 13807-1997 Methods of Test of Epoxy for Light Emitting Diodes
- CNS 11830-1987 Measuring Methods for Light Emitting Diodes (for Indication)
- CNS 3998-1989 Method of Test for Small Signal Diodes
- CNS 8383-1982 Forward Transient Measurement on Semiconductor Diodes
- CNS 13651-1996 Measuring Methods for Light Emitting Diode(for Communication)
- CNS 13811-1997 Numerical-Type Reflectors for Light Emitting Diodes
- CNS 13809-1997 Light Emitting Diode Dice
- CNS 13655-1996 Reliability Testing for Photodiode(for Communication)
- CNS 11829-1987 Light Emitting Diodes (for Indication)
Professional Standard - Ferrous Metallurgy
- YB/T 4215-2010 Cold rolled precision strip for the lead frame of diode
Jiangxi Provincial Standard of the People's Republic of China
- DB36/T 579-2010 LED(Light emitting diode)Road light
Professional Standard - Aerospace
- QJ 2493-1993 Acceptance specification for microwave diodes and transistors
- QJ 1299-1987 Specification for Screening of Silicon Microwave Mixer and Detector Diodes
- QJ 2362-1992 Screening Specification for Step Recovery Diodes
- QJ 1907-1990 PIN Diode Screening Specifications
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6589-2002 Semiconductor Devices—Discrete deveice—Part 3-2:Signal (including switching) and regulator diodes—Blank detail specification for voltage-regulator diodes and voltage-reference diodes (e
- GB/T 6570-1986 Measuring methods for microwave diodes
- GB/T 15137-1994 Blank detail specification for Gunn diodes
- GB/T 6588-2000 Semiconductor devices--Discrete devices--Part 3:Signal(including switching)and regulator diodes--Section One--Blank detail specification for signal diodes,switching diodes and controlle
- GB/T 15178-1994 Blank detail specification for variable capacitance diodes
- GB/T 6351-1998 Semiconductor devices--Discrete devices Part 2:Rectifier diodes Section One--Blank detail specification for rectifier diodes(including avalanche recti-fier diodes),ambient and case-rate
- GB/T 16894-1997 Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A
- GB 51209-2016 Code for design of light emitting diode plant
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35846-2018 Lighting glass tube for light emitting diode
Professional Standard - Machinery
- JB/T 5841-1991 ZH Series 200A and above Case Rated High Voltage Rectifier Diode
- JB/T 10875-2008 Measuring methods for optical proerties of LEDs
- JB/T 7624-2013 Testing Methods for Rectifier Diodes
- JB/T 5837-1991 ZP Series 2000A and above Case - Rated Rectifier Diodes
- JB/T 5186-1991 Silicon photodiodes for cameras
Fujian Provincial Standard of the People's Republic of China
- DB35/T 2107-2022 Ultraviolet light-emitting diode evaluation method
- DB35/T 1611-2016 COB Package White Light Emitting Diode Technical Specifications
- DB35/T 1370-2013 Light-emitting diode chip point test method
- DB35/T 1176-2011 Power LEDs for road lighting
- DB35/T 1193-2011 Semiconductor LED chip
Professional Standard - Urban Construction
- CJ/T 361-2011 Light emitting diode (LED) lamp used in waterscape
Military Standard of the People's Republic of China-General Armament Department
- GJB 3930-2000 General specification for infrared emitting diodes
- GJB 2146A-2011 General specification for semiconductor light-emitting diode devices
- GJB 2146-1994 General specification for light-emitting diode solid-state displays
- GJB 3519-1999 General Specification for Semiconductor Laser Diodes
Group Standards of the People's Republic of China
- T/QDAS 070-2021 Formula of boron diffusion liquid source for diode diffuser
- T/QGCML 097-2021 Diode diffuser packaging technical specification
- T/CSA 047-2019 Measurement Method for Real Thermal Resistance and Impedance of Light Emitting Diodes
- T/COEMA 004LCD-2022 Polarizer film for the Organic Light-Emitting Diode TV Display
- T/QGCML 030-2020 Conventional Electrical Standards for Diode Diffusion Sheets
- T/CSA 015-2012 Organic light emitting diode (OLED) lighting—Measuring methods
- T/CIECCPA 003-2019 Specification for green production and processing of LED
- T/CSTM 01039-2023 Substrate glass for mini light emitting diodes
- T/ZZB 2332-2021 Polished sapphire substrate for LED
- T/CPIA 0052-2023 Module diodes for photovoltaic module junction boxes
- T/QDAS 094-2022 Mixed Acid Formula for Diode GPP Groove Cleaning
- T/QGCML 3251-2024 Light-emitting diode thermal impedance test method
- T/DZJN 210-2023 Light emitting diode (LED) intelligent all-in-one machine
- T/CVIA 11-2016 Organic Light Emitting Diode (OLED) TV Measurement Methods
- T/QDAS 050-2020 Research and development procedures for diode diffusers
邮电部
- YD/T 0835-1996 Avalanche photodiode detection method
- YD/T 0834-1996 Distributed feedback laser diode detection method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 36613-2018 Probe test method for light emitting diode chips
Professional Standard - Post and Telecommunication
- YD/T 835-1996 Test Method of Avalanche Photodiodes
- YD/T 834-1996 Test Method of Distributed Feedback Laser Diodes
- YD/T 701-1993 Test Method for Semiconductor Laser Diode Assembly
机械电子工业部
- JB 5837-1991 ZP series case rated rectifier diodes above 2000A
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1630-2015 3528/5050 Encapsulated Chip LED
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5905-2006 Specification for fast recovery diodes, 600A and above
Professional Standard - Aviation
- HB 5831-1983 Technical Requirements of Semiconductor Diode and Triode for Aviation
Professional Standard - Light Industry
- QB/T 4057-2010 LEDs for general lighting—Performance requirements
International Electrotechnical Commission (IEC)
- IEC 60747-3-1:1986 Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
- IEC 60747-3:2013 Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
- IEC 60747-3:1985 Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes.
- IEC 60747-3-2:1986 Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference d
- IEC 60747-3/AMD1:1991 Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 1
- IEC 60747-3/AMD2:1993 Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 2
- IEC TS 62504:2011 General lighting - LEDs and LED modules - Terms and definitions
- IEC 91/926/PAS:2010 Electronic circuit board for high-brightness LEDs
- IEC TS 62861:2017 Guidelines for principal component reliability testing for LED light sources and LED luminaires
- IEC 62931:2017 GX16t-5 capped tubular led lamp - Safety specifications
- IEC 60747-2-1:1989 Semiconductor devices; discrete devices; part 2: rectifier diodes; section one: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
- IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
- IEC 60747-2-2:1993 Semiconductor devices; discrete devices; part 2: rectifier diodes; section 2: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
- IEC 62979:2017 Photovoltaic modules - Bypass diode - Thermal runaway test
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60747-3-1:2006 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
- KS C IEC 60747-3-2:2006 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
- KS C IEC 60747-3:2016 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes
- KS C IEC 60747-3:2006 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes
- KS C 5205-2002 RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
- KS C 7120-1990 Light Emitting Diodes(for Indication)
- KS C IEC 60747-3-1-2006(2021) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diod
- KS C IEC 60747-3-1-2006(2016) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diod
- KS C 7120-2021 Light Emitting Diodes(for Indication)
- KS C IEC 60747-3-1-2021 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
- KS C IEC 60747-3-2-2021 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
- KS C 7120-1990(2016) Light Emitting Diodes(for Indication)
- KS C 7120-1990(2021) Light Emitting Diodes(for Indication)
- KS C 7003-1981 Measuring methods for small signal diodes
- KS C IEC 60747-3-2-2006(2016) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, exclud
- KS C 5205-1980(2000) RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
- KS C 7003-1996 Measuring methods for small signal diodes
- KS C IEC 60747-3-2-2006(2021) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, exclud
- KS C 7104-2020 Standard of measuring the performance of light emitting diodes
- KS C 6990-2001 General rules of photodiodes for fiber optic transmission
- KS C 7003-2017(2022) Measuring methods for small signal diodes
- KS C 7003-2017 Measuring methods for small signal diodes
- KS C 5300-1992 General rules of light emitting diodes for fiber optic transmission
- KS C 7121-1990 Measuring Methods for Light Emitting Diodes (for Indication)
- KS C 5203-1980 RELIABILITY ASSURED SMALL SIGNAL DIODES
- KS C 6045-1991(2001) TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
- KS C 6905-2001 General rules of laser diodes for fiber optic transmission
- KS C 7121-1990(2021) Measuring Methods for Light Emitting Diodes (for Indication)
- KS C 5203-1980(2000) RELIABILITY ASSURED SMALL SIGNAL DIODES
- KS C 5300-1992(2022) General rules of light emitting diodes for fiber optic transmission
- KS C 5301-1992 Test methods of light emitting diodes for fiber optic transmission
- KS C 6045-1986 TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
- KS C 6905-2001(2021) General rules of laser diodes for fiber optic transmission
- KS C 6991-2001 Test methods of photodiodes for fiber optic transmission
- KS C IEC 60747-2-1-2006(2021) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
- KS C IEC 60747-2-1-2006(2016) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
- KS C 7121-2021 Measuring Methods for Light Emitting Diodes (for Indication)
- KS C 6045-2002 TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
- KS C 5203-2002 RELIABILITY ASSURED SMALL SIGNAL DIODES
- KS C 5213-1981(1997) RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
- KS C IEC 60747-2-2-2021 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
- KS C 5213-1981 RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
- KS C 6906-2001 Test methods of laser diodes for fiber optic transmission
- KS C IEC 60747-2-1-2021 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
- KS C 6991-2013 TEST METHODS OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
- KS C 6942-2014 General rule of laser diode modules for fiber optic transmission
- KS C 6942-2019 General rule of laser diode modules for fiber optic transmission
- KS C IEC 60747-2-2:2006 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
- KS C IEC 60747-2-2-2006(2021) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for current
- KS C IEC 60747-2-2-2006(2016) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for current
- KS C 7104-2005 Standard of measuring the performance of light emitting diodes
- KS C 6990-2013 GENERAL RULES OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
British Standards Institution (BSI)
- BS IEC 60747-3:2013 Semiconductor devices. Discrete devices: Signal, switching and regulator diodes
- BS IEC 60747-5-8:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
- BS EN 120001:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- BS 9300 C199-276:1971 Detail specification for silicon voltage-regulator diodes
- BS 9300 C678-721:1980 Detail specification for silicon voltage regulator diodes
- BS 9300 C780-831:1971 Detail specification for silicon voltage regulator diodes
- BS PD IEC/TS 62861:2017 Guidelines for principal component reliability testing for LED light sources and LED luminaires
- BS 9300 C678-721:1971 Detail specification for silicon voltage regulator diodes
- BS EN 120001:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- BS 9300 C405-429:1971 Detail specifications for silicon voltage-regulator diodes
- BS 9300 C841-849:1971 Detail specification for silicon voltage regulator diodes
- BS 9300 C771-772:1971 Detail specification for coaxial mixer diodes
- BS 9300 C377-378:1971 Detail specifications for silicon coaxial mixer diodes
- 24/30490678 DC BS IEC 60747-5-18 Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method light emitting diodesof the macro photoluminescence for epitaxial wafers of micro light emitting diodes
- BS IEC 60747-5-11:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
- BS E9375:1975 Specification - Harmonized system of quality assessment for electronic components - Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes
- BS EN 62931:2017 GX16t-5 capped tubular LED lamp - Safety specifications
- BS 9300 C776-777:1971 Detail specification for germanium coaxial mixer diodes
- BS 9300 C476:1973 Detail specification for silicon avalanche rectifier diode
- BS 9300 C667-668:1971 Detail specification for silicon avalanche rectifier diodes
- BS 9300 C762:1971 Detail specification for mixer diodes for use at X-band frequencies
- BS EN 60747-2:2016 Semiconductor devices. Discrete devices. Rectifier diodes
- BS 9300 C762:1980 Detail specification for mixer diodes for use at X-band frequencies
- BS IEC 60747-4:2008 Semiconductor devices - Discrete devices - Microwave diodes and transistors
Defense Logistics Agency
- DLA MIL-L-376 C-1983 LEAD DIOXIDE, TECHNICAL
- DLA MIL-L-376 C (1)-1994 LEAD DIOXIDE, TECHNICAL
- DLA MIL-L-376 C NOTICE 1-1998 LEAD DIOXIDE, TECHNICAL
- DLA MIL-PRF-19500/735-2006 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, CENTER TAP, TYPE 1N7041CCU1 AND SINGLE DIODE TYPE 1N7045T3, JAN, JANTX, JANTXV, AND JANS
- DLA DSCC-DWG-91011 REV B-2003 SEMICONDUCTOR DEVICE, DIODE, ULTRA FAST
- DLA MIL-PRF-19500/681 C-2013 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, CENTER TAP, TYPE 1N6843CCU3, JAN, JANTX, JANTXV, AND JANS
- DLA MIL-PRF-19500/656 A-2008 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE OR COMMON ANODE CENTER TAP, TYPES 1N6785 AND 1N6785R, JAN, JANTX, JANTXV AND JANS
- DLA MIL-S-19500/236 A VALID NOTICE 3-2011 Semiconductor Device, Diode, Silicon Type 1N31
- DLA MIL-PRF-19500/187 B (1)-2012 SEMICONDUCTOR DIODE, DILICON, HIGH-VOLTAGE TYPE JAN1N2361
- DLA MIL-S-19500/298 VALID NOTICE 4-2011 Semiconductor Device, Diode, Silicon Type 1N1742A
- DLA MIL-S-19500/229 VALID NOTICE 3-2011 Semiconductor Device, Diode, Type 1N830AM (Navy)
- DLA DSCC-DWG-94022 REV G-2000 SEMICONDUCTOR DEVICE, DIODE, STANDARD RECOVERY
- DLA MIL-PRF-19500/730 A-2011 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, CENTER TAP, TYPES 1N7037CCU1, 1N7043CAT1, 1N7043CCT1, JAN, JANTX, JANTXV, AND JANS
- DLA MIL-S-19500/227 VALID NOTICE 3-2011 Semiconductor Device, Diode, Type 1N995M (Navy)
- DLA MIL-PRF-19500/730 B-2013 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, CENTER TAP, TYPES 1N7037CCU1, 1N7043CAT1, 1N7043CCT1, JAN, JANTX, JANTXV, AND JANS
- DLA MIL-S-19500/191 A (1)-1971 SEMICONDUCTOR DEVICE, DIODE, GERMANIUM, MIXER TYPE 1N263
- DLA MIL-PRF-19500/608 D-2009 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE, COMMON ANODE CENTER TAP, DOUBLER, TYPES 1N6660, 1N6660CCT1, 1N6660R, 1N6660CAT1, AND 1N6660DT1, JAN, JANTX, JANTXV, AND JANS
- DLA MIL-PRF-19500/608 D (1)-2010 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE, COMMON ANODE CENTER TAP, DOUBLER, TYPES 1N6660, 1N6660CCT1, 1N6660R, 1N6660CAT1, AND 1N6660DT1, JAN, JANTX, JANTXV, AND JANS
- DLA MIL PRF 19500/670A VALID NOTICE 2-2013 SEMICONDUCTOR DEVICE, DIODE, SILICON, BARRIER RECTIFIER, SCHOTTKY, TYPES 1N6826, 1N6826US, 1N6831 and 1N6831US JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
Japan Electronics and Information Technology Industries Association
- EIAJ ED 4910-1995 Light Emitting Diodes
JP-JEITA
- JEITA ED4912-2008 Light emitting diodes
Association Francaise de Normalisation
- NF C96-832:1981 Semiconductors. Microwave diodes. Schottky diodes. General requirements.
- NF C93-120-001*NF EN 120001:1992 Blank detail specification : light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- NF EN 120001:1992 Particular framework specification: light-emitting diodes, light-emitting diode arrays, light-emitting diode displays without resistance or internal logic circuits
- NF EN 120002:1992 Particular framework specification: infrared emitting diodes, networks of infrared emitting diodes
- NF C93-120-002*NF EN 120002:1992 Blank Detail Specification : Infrared emitting diodes, infrared emitting diode arrays
- NF EN 120005:1992 Special frame specification: photodiodes, photodiode arrays (Not intended for optical fiber applications}
- NF C93-871:1987 Digital transmitters with light emitting diodes.
- NF C93-120-005*NF EN 120005:1992 Blank detail specification : photodiodes, photodiode arrays (not intended for fibre optic applications)
- NF C86-502:1983 Harmonized system of quality assessment for electronic components. Blank detail specification. Infrared emitting diodes, infrared emitting diodes arrays.
- NF C86-508:1993 Blank detail specification. Light emitting diodes and infrared emitting diodes for fibre optic system or sub-system.
- NF C86-501:1983 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays.
- NF C86-818/A1:1981 Rectifier diodes at specified ambient temperature
- NF C96-821:1981 Semiconductor Devices High Power rectifier diodes
- NF C93-872:1987 Digital receivers with pin photodiode.
- NF C86-815:1981 Harmonised system of quality assessment for electronic components. Blank detail specification : voltage regulator diodes and voltage reference diodes.
- NF C57-379*NF EN 62979:2017 Photovoltaic module - Bypass diode - Thermal runaway test
- NF EN 62979:2017 Photovoltaic modules - Bypass diode - Thermal runaway test
Danish Standards Foundation
- DS/IEC 747-3-2:1987 Semiconductor devices. Discrete devices. Part 3: Signal (including switching) and regulator diodes. Section 2: Blank detail specification for voltage regulator diodes and voltage reference diodes, excluding temperature compensated precision refere di
- DS/IEC 747-3:1986 Semiconductor devices. Discrete devices. Part 3: Signal (including switching) and regulator diodes
- DS/IEC 747-3-1:1987 Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section 1: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
- DS/IEC 747-2-1:1990 Semiconductor devices. Discrete devices. Part 2: Rectifier diodes. Section one: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
ES-UNE
- UNE-EN 120001:1992 BDS: LIGHT EMITTING DIODES, LIGHT EMITTING DIODE ARRAYS, LIGHT EMITTING DIODE DISPLAYS WITHOUT INTERNAL LOGIC AND RESISTOR. (Endorsed by AENOR in September of 1996.)
- UNE-EN 120002:1992 Blank Detail Specification: Infrared emitting diodes, infrared emitting diode arrays
- UNE-EN 120005:1992 BDS: PHOTODIODES, PHOTODIODE ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS). (Endorsed by AENOR in September of 1996.)
- UNE-EN 120008:1993 BDS: LIGHT EMITTING DIODES AND INFRARED EMITTING DIODES FOR FIBRE OPTIC SYSTEM OR SUB-SYSTEM. (Endorsed by AENOR in September of 1996.)
- UNE-EN 120006:1992 BDS: PIN-PHOTODIODES FOR FIBRE OPTIC APPLICATIONS. (Endorsed by AENOR in September of 1996.)
- UNE-EN 62979:2017 Photovoltaic module - Bypass diode - Thermal runaway test (Endorsed by Asociación Española de Normalización in October of 2018.)
IECQ - IEC: Quality Assessment System for Electronic Components
- PQC 105-1992 Blank Detail Specification for Light Emitting Diodes@ Light Emitting Diode Arrays
- PQC 75-1991 Semiconductor Devices - Discrete Devices - Rectifier Diodes Blank Detail Specification: Rectifier Diodes (Including Avalanche Rectifier Diodes)@ Ambient and Case-Rated@ Greater Than 100 A
- QC 750101-1986 Semiconductor Devices Discrete Devices Part 3: Signal (Including Switching) and Regulator Diodes@ Section One - Blank Detail Specification for Signal Diodes@ Switching Diodes and Controlled-Avalanche Diodes (IEC 747-3-1 ED 1)
- QC 750105-1986 Semiconductor Devices; Discrete Devices Part 3: Signal (Including Switching) and Regulator Diodes Section Two-Blank Detail Specification for Voltage-Regulator Diodes and Voltage-Reference Diodes@ Exluding Temperature-Compensated Precision Ref. Diodes (IEC
- QC 750101/GB 0001 ISSUE 1-1990 Silicon Ambient Rated High Speed Switching Diode in Plastic Encapsulation
German Institute for Standardization
- DIN IEC 60747-3:1992 Semiconductor devices; discrete devices; part 3: signal diodes and regulator diodes; identical with IEC 60747-3:1985
- DIN EN 120001:1993-06 Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
- DIN EN 120002:1997-02 Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays; German version EN 120002:1992
- DIN EN 120005:1996 Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
- DIN EN 120001:1993 Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
- DIN EN 120002:1997 Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays; German version EN 120002:1992
- DIN EN 120005:1996-11 Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE 256-1963 SEMICONDUCTOR DIODES
- IEEE 503-1978 STANDARD FOR MEASUREMENT AND CHARACTERIZATION OF DIODE-TYPE CAMERA TUBES
U.S. Military Regulations and Norms
- ARMY MIL-PRF-49169B-1999 LIGHT-EMITTING DIODE ARRAY
- ARMY MIL-PRF-49169 B-1999 LIGHT-EMITTING DIODE ARRAY
- ARMY MIL-PRF-49169 B VALID NOTICE 1-2013 Light-Emitting Diode Array
- ARMY MIL-N-63400 (2)-1988 NETWORKS, CAPACITOR-RESISTOR
- ARMY MIL-N-63400 NOTICE 1-1997 NETWORKS, CAPACITOR-RESISTOR
- ARMY MIL-C-48487 C-1995 CIRCUIT CARD ASSEMBLY - LAMP DIODES
- ARMY MIL-C-48487 C REINST NOTICE 2-1996 CIRCUIT CARD ASSEMBLY - LAMP DIODES
- ARMY MIL-C-48487 C NOTICE 3-1997 CIRCUIT CARD ASSEMBLY - LAMP DIODES
- ARMY MIL-PRF-32243-2009 LIGHT EMITTING DIODE (LED) MILITARY DRIVING HEADLAMP
Lithuanian Standards Office
- LST EN 120001-2001 Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- LST EN 120002-2001 Blank detail specification. Infrared emitting diodes, infrared emitting diode arrays
- LST EN 120005-2001 Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications)
SE-SIS
- SIS SS-CECC 20001-1991 Blank detail specification: Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- SIS SS CECC 20002-1984 Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays
- SIS SS CECC 20005-1988 Blank detail specification: Photodiodes, photodiode-arrays (not intended for fibre optic aoolications)
- SIS SS-CECC 50009-1991 Blank detail specification:Case-rated rectifier diodes
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JESD211-2009 Zener and Voltage Regulator Diode Rating Verification and Characterization Testing
- JEDEC JESD381A-1992 Method of Diode “Q” Measurement
- JEDEC JESD307-1992 Voltage Regulator Diode Noise Voltage Measurement
- JEDEC JESD320-A-1992 Conditions for Measurement of Diode Static Parameters [Superseded: JEDEC EIA-302, JEDEC 302]
- JEDEC JESD282B.01-2002 Silicon Rectifier Diodes Revision of EIA-JESD282-B
SCC
- DANSK DS/EN 120001:2016 Blank Detail Specification: Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- DANSK DS/EN 120002:2016 Blank Detail Specification: Infrared emitting diodes, infrared emitting diode arrays
- NACE SP0575-2022 Internal Cathodic Protection (CP) Systems in Oil-Treating Vessels
- DANSK DS/EN 120005:2016 Blank Detail Specification: Photodiodes, photodiode arrays (not intended for fibre optic applications)
- BS 9300 C397-403:1971 Detail specification for silicon variable capacitance diodes
- BS QC 750001:1986 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
- MIL MIL-PRF-19500/735C-2020 Diode, Silicon, Schottky, Dual, Center Tap, Type 1N7041CCU1 and Single Diode Type 1N7045T3, JAN, JANTX, JANTXV, and JANS
- MIL MIL-PRF-19500/735B-2015 Diode, Silicon, Schottky, Dual, Center Tap, Type 1N7041CCU1 and Single Diode Type 1N7045T3, JAN, JANTX, JANTXV, and JANS
- BS 9300 C155-168:1971 Detail specifications for silicon voltage-regulator diodes
- MIL MIL-PRF-19500/620D-2001 SEMICONDUCTOR DEVICE, HERMETIC, DIODE, SILICON, TECTIFIER, SCHOTTKY BARRIER, TYPES 1N5822 AND 1N822US JAN, JANTX, JANTXV, JANJ, JANS, JANHC, AND JANKC (SUPERSEDING MIL-PRF-19500/620C) (S/S BY MIL-PRF-19500/620E)
- DIN EN 120008:1995 Blank detail specification: Light emitting diodes and infrared emitting diodes for fibre optic system or sub-system; German version EN 120008:1993
- MIL MIL-PRF-19500/735A-2009 Diode, Silicon, Schottky, Dual, Center Tap, Type 1N7041CCU1 and Single Diode Type 1N7045T3, JAN, JANTX, JANTXV, and JANS
- 10/30231573 DC BS EN 60747-3. Semiconductor devices. Part 3. Signal (including switching diodes) and regulator diodes
- MIL MIL-S-19500/352-1966 SEMICONDUCTOR DEVICE, DIODE, SILICON TYPE 1N831A
- MIL MIL-S-19500/298-1964 SEMICONDUCTOR DEVICE, DIODE, SILICON TYPE 1N1742A
- MIL MIL-PRF-32243A-2019 Light Emitting Diode (LED) Military Driving Headlamp
- CSA C865.2-2023 Light-emitting diode drivers — Performance characteristics
- MIL MIL-PRF-49169B-1999 LIGHT-EMITTING DIODE ARRAY (SUPERSEDING MIL-L-49169A)
- MIL MIL-PRF-32243-2009 Light Emitting Diode (LED) Military Driving Headlamp
- BS 9300 C556-563:1971 Detail specifications for silicon power rectifier diodes
- DIN EN 60747-3 E:2010 Draft Document - Semiconductor devices - Part 3: Signal (including switching diodes) and regulator diodes (IEC 47E/395/CD:2010)
- BS 9300 C564-571:1971 Detail specifications for silicon power rectifier diodes
- CAN/ULC-S8752-2012 STANDARD FOR ORGANIC LIGHT EMITTING DIODE (OLED)PANELS
- CAN/ULC S8752-2012 Standard for Organic Light Emitting Diode (LED) Panels
- BS 9300 C572-579:1971 Detail specifications for silicon power rectifier diodes
- BS CECC 20001:1983 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes, light emitting diode arrays
- MIL MIL-PRF-19500/735-2006 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, CENTER TAP, TYPE 1N7041CCU1 AND SINGLE DIODE TYPE 1N7045T3, JAN, JANTX, JANTXV, AND JANS
- MIL MIL-S-19500/227-1962 SEMICONDUCTOR DEVICE, DIODE, TYPE 1N995M (NAVY)
- MIL MIL-S-19500/229-1962 SEMICONDUCTOR DEVICE, DIODE, TYPE 1N830AM (NAVY)
- MIL MIL-PRF-19500/761B-2020 Diode, Silicon, Schottky, Type 1N7069T1, JAN, JANTX, JANTXV, and JANS
- MIL MIL-PRF-19500/761-2010 Diode, Silicon, Schottky, Type 1N7069T1, JAN, JANTX, JANTXV, and JANS
- CSA C865.1-2023 Pilotes de diodes électroluminescentes — méthodes de mesure
European Standard for Electrical and Electronic Components
- EN 120002:1992 Blank detail specification: infrared emitting diodes, infrared emitting diode arrays
- EN 120005:1992 Blank detail specification: photodiodes, photodiode-arrays (not intended for fibre optic applications)
- EN 120001:1992 Blank detail specification; light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
- CECC 50 008- 004 Ambient Rated Rectifier Diode (En)
- CECC 50 008- 005 Ambient Rated Rectifier Diode (En)
- EN 150009:1992 Blank detail specification: case-rated rectifier diodes
- CECC 50 001- 026 ISSUE 3-1994 NL-CECC 50 001-26; Signal Diodes Type Number: BA314 (En)
Japanese Industrial Standards Committee (JISC)
- JIS C 7035:1985 Light emitting diodes (for indication)
- JIS C 8152-2:2012 Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light engines
- JIS C 5942:2010 General rules of laser diodes used for recording and playback
- JIS C 5942:1997 General rules of laser diodes used for recording and playback
- JIS C 8152-2 AMD 1:2014 Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light engines (Amendment 1)
- JIS C 8152-1:2012 Photometry of white light emitting diode for general lighting -- Part 1: LED packages
- JIS C 5943:2010 Measuring methods of laser diodes used for recording and playback
- JIS C 5943:1997 Measuring methods of laser diodes used for recording and playback
- JIS C 5990:1997 General rules of photodiodes for fiber optic transmission
- JIS C 7223:1978 Reliability assured voltage regulator diodes and voltage reference diodes
- JIS C 5950:1997 General rules of light emitting diodes for fiber optic transmission
- JIS C 7031:1993 Measuring methods for small signal diodes
- JIS C 5940:1997 General rules of laser diodes for fiber optic transmission
- JIS C 7036:1985 Measuring methods for light emitting diodes (for indication)
- JIS C 7221:1978 Reliability assured small signal diodes
- JIS C 7033:1975 Testing methods for semiconductor rectifier diodes
- JIS C 5991:1997 Measuring methods of photodiodes for fiber optic transmission
TH-TISI
- TIS 1970-2000 Semiconductor devices discrete devices part 3:signal (including switching)and regulator diodes section one-blank detail specification for signal diodes,switching diodes and controlled-avalanchediodes
- TIS 1971-2000 Semiconductor devices discrete devices part 3:signal (including switching)and regulator diodes section two-blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes
- TIS 1596-1999 Semiconductor devices.discrete devices.part 2: rectifier diodes section 2: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 a
RU-GOST R
- GOST R 54814-2011 Light emitted diodes and light emitting diode modules for general application. Terms and definitions
- GOST R 54814-2018 Light emitted diodes and light emitting diode modules for general application. Terms and definitions
- GOST 21011.1-1976 High-voltage kenotrons. The anode current measurement method
- GOST 17465-1980 Semiconductor diodes. Basic parameters
- GOST 28625-1990 Semiconductor devices. Discrete devices. Part 3. Signal (including switching) and regulator diodes. Section 2. Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diod
- GOST R 51106-1997 Lazers injection, lazer heads, lazers diodes matices, lazers diodes. Methods for measurement of parameters
- GOST 18986.10-1974 Semiconductor diodes. Methods for measuring inductance
- GOST 20693-1975 Hign-voltage kenotrons. Terms and definitions
- GOST 21011.2-1976 High-voltage kenotrons. The anode current measurement method within the voltage pulse
- GOST 18986.4-1973 Semiconductor diodes. Methods for measuring capacitance
- GOST 18986.6-1973 Semiconductor diodes. Method for measuring recovery charge
CZ-CSN
- CSN 35 8736-1964 Semiconductor diodes. Measurement of interelectrode capacitanoe
- CSN 35 8775-1987 Light-emitting diodes. Noise measurement in forward direction
- CSN 35 8732-1964 Semiconductor diodes. Measurement of forward current
- CSN 35 8786-1983 Varicaps. Electric parameter measurement methods
- CSN IEC 747-2-1:1993 Semiconductor devices. Diskrete devices. Part 2: Rectifier diodes. Section 1 - Blank detail specification for rectifier diodes (including avalanche diodes), ambient and case-rated, up to 100A
- CSN 35 8734-1975 Semieonductor devices. Diodcs. Measurement of reverse current.
GOST
- GOST R 70998-2023 Injection lasers, laser heads, laser diodes matrices, laser diodes. Parameters system
- GOST R 70873-2023 Semiconductor rectifier diodes and poles. Parameters system
- GOST R 70743-2023 Varicaps. Parameter system
- GOST R 70870-2023 High-voltage kenotrons. Parameters system
- GOST R 70999-2023 Semiconductor diodes. Parameters system
- GOST R 70744-2023 Semiconductor tunnel diodes. Parameter system
- GOST R 71081-2023 Microwave semiconductor diodes. Parameters system
YU-JUS
- JUS N.R1.421-1979 Rectffiar diodes. Measuring methods
- JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes
- JUS N.R1.374-1980 Semiconductor diodes. Essentialratings and chdracteristics. Ttmneldiodes
- JUS N.R1.375-1980 Semiconductor diode s. Essential ratings and characteristics. Variable capacitance diodes
- JUS N.R1.372-1979 Semiconductor diodes. Essential ratmgs and characteristics: rectifier diodes
- JUS N.R1.422-1980 Low-power signal di ode?. Measuring methods
- JUS N.R1.321-1979 Terms and definitions for semiconductor devices. Diodes
International Commission on Illumination (CIE)
- CIE 127-1997 Measurement of LEDs
PL-PKN
- PN T04804-1967 Low-power elec?ronic ?ubes Electrical ?es?s of yacuum diodes
- PN T01010 ArkusZ05-1974 Electronic tubes Vacuum diodes Terms and definitions
- PN T01504-67-1987 Diodes Measuring methods Series equivalent resistance
- PN T01504-61-1987 Diodes Measuring methods Recovered charge Q,
RO-ASRO
- STAS 7128/7-1986 LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED C1RCUITS Symbols for variable capacitance diodes and mixer diodes
- STAS 12123/3-1983 Semiconductor devices VOLTAGE REFERENCE DIODES AND VOLTAGE REGULATOR DIODES Measuring methodes for electrical characteristics
- STAS 12123/2-1983 Semiconductor devices LOW POWER SIGNAL DIODES, INCLUDING SWITCHING DIODES Measuring methods for electrical characteristics
AIA/NAS - Aerospace Industries Association of America Inc.
- NAS717-1963 Semiconductor Diodes (Rev 1)
PT-IPQ
- NP 3234-2-1987 Electronic originals. Electroluminescent diodes. Electroluminescent diode matrix, detailed specifications
- NP 3234-3-1987 Electronic originals. Infrared emitting diodes. Infrared emitting diode matrix, detailed specifications
Underwriters Laboratories (UL)
- UL 8752-2018 Organic light emitting diode (OLED) panels
- UL 8752-2012 Organic light emitting diode (OLED) panels
- UL SUBJECT 8752-2011 Outline of Investigation for Organic Light Emitting Diode(Oled) Panels
United States Navy
- NAVY A-A-59781-2005 LIGHT EMITTING DIODES FOR USE AS INDICATOR LIGHTS
Indonesia Standards
- SNI 7397-2008 LED (Light Emmiting Diode) signal lamps on the trains
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE No 256-1963 IEEE Test Procedure for Semiconductor Diodes
National Aeronautics and Space Administration (NASA)
- NASA-TM-73726-1977 Two phase choke flow in tubes with very large L/D
CENELEC - European Committee for Electrotechnical Standardization
- EN 120008:1993 Blank Detail Specification: Light Emitting Diodes and Infrared Emitting Diodes for Fibre Optic System or Sub-System
- EN 150006:1991 Blank Detail Specification: Variable Capacitance Diodes
(U.S.) Telecommunications Industries Association
- TIA-455-130-2007(2014) Elevated Temperature Life Test for Laser Diodes
- TIA-455-130-2001 Elevated Temperature Life Test for Laser Diodes
Society of Automotive Engineers (SAE)
- SAE ARP6253-2011 LEDs and Aircraft Applications
- SAE ARP5873-2007 LED Passenger Reading Light Assembly
- SAE J1889-2011 L.E.D. Signal and Marking Lighting Devices
SAE - SAE International
- SAE ARP6253A-2017 LEDs and Aircraft Applications
GSO
- GSO IEC 60747-3:2014 Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
- BH GSO IEC 62979:2022 Photovoltaic modules - Bypass diode - Thermal runaway test
National Association of Corrosion Engineers (NACE)
- NACE SP0575-2007 Internal Cathodic Protection (CP) Systems in Oil-Treating Vessels Item No. 21015
- NACE SP0575-1995 Internal Cathodic Protection (CP) Systems in Oil-Treating Vessels (Item No. 21015)
Canadian Standards Association (CSA)
- CAN/CSA-C22.2 NO.250.13-2014 Appareillages à diodes électroluminescentes (DEL) pour applications d’éclairage (deuxième édition)
- CAN/CSA-E61965-2004 Mechanical Safety of Cathode Ray Tubes (Second Edition)
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-130-2001 Elevated Temperature Life Test for Laser Diodes
NEMA - National Electrical Manufacturers Association
- NEMA C78.51-2016 Electric Lamps - LED (Light Emitting Diode) Lamps - Method of Designation
TIA - Telecommunications Industry Association
- TIA/EIA-455-130-2001 FOTP-130 Elevated Temperature Life Test for Laser Diodes
- TIA-455-127-1991 FOTP-127 Spectral Characterization of Multimode Laser Diodes
JP-JARI
- JRIS R1647-2021 Rolling stock - Light Emitting Diode(LED) type tail lamps
European Committee for Electrotechnical Standardization(CENELEC)
- EN 62979:2017 Photovoltaic module - Bypass diode - Thermal runaway test
Cp,cp+,diode cp,cp70,CP 46 1989,cp70,,cp-70,cp specification,cp 70,cp153,cp ultraviolet,Shallot cp,pcr CP,cp 80,cp-,cp number,asnt cp,cp pcr,cp profile,cp -4