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Database: 365,228(8 Aug 2026)

diode cp

diode cp, Total:427 items.

The international standard classification for "diode cp" includes: Electronic display devices , Optoelectronics. Laser equipment , Capacitors , Flat steel products and semi-products , Diodes , Aerospace electric equipment and systems , Glass products , Fluorescent lamps. Discharge lamps .

The Chinese standard classification for "diode cp" includes: Technical management , Technical management , Technical Management , Special electronic technology material , Computer peripherals , Microwave and millimeter wave diode and triode , Steel sheet and strip , Semiconductor diode , Electronic components , Power semiconductor device and parts , Semiconductor rectifier devices , Industrial technical glass , Semiconductor emitting device , Optical communication equipment , Electric light source products .


Professional Standard - Education

工业和信息化部

Professional Standard - Military and Civilian Products

  • WJ 2100-2004 Test method for silicon photodiodes and silicon avalanche photodiodes
  • WJ 2506-1998 Verification Regulations for Photodiode Dynamic Tester
  • WJ 2539-1999 Verification Regulations for Temperature Measuring Diode Meter
  • WJ 2265-1995 Specifications for Preamplified Silicon Avalanche Photodiodes

未注明发布机构

Professional Standard - Electron

  • SJ 909-1974 Detail specification for silicon voltage regulator diodes,Type 2CW50~149
  • SJ 2727-1986 Detail specification for general purpose silicon rectifier diodes,Type 2CZ313
  • SJ 2750-1987 Outline dimensions for semiconductor laser diodes
  • SJ 1228-1977 Detail specification for germanium wideband detector diodes,Type 2AP30~2AP31
  • SJ 1806-1981 Detail specification for silicon band switching varialbe capacitance diodes,Type 2CC110,2CC210,2CC310,2CC410,2CC130
  • SJ/T 11281-2007 Test methods of LED panels
  • SJ 2749-1987 Method of measurement for semiconductor laser diodes
  • SJ/T 11401-2009 Series program for semiconductor light emitting diodes
  • SJ 1805-1981 Detail specification for silicon frequency modulated variable capacitance diodes,Type 2CC126
  • SJ/T 11281-2017 Measure methods of light emitting diode (LED) displays
  • SJ/T 2216-2015 Technical specification for photodiode of silicon
  • SJ 1386-1978 Measurement conditions for noise-generator diodes and gas discharge noise tubes
  • SJ 2216-1982 Silicon photodiodes
  • SJ 1946-1981 Detail specification for silicon voltage booster diodes,Type 2CN4C,2DN4C,2CN5C and 2DN5C
  • SJ 1381-1978 Structure and technology of test diode
  • SJ 2218-1982 Semiconductor photocouplers in the diode mode
  • SJ 1229-1977 Detail specification for germanium switching diodes,Type 2AK1~20
  • SJ 1392-1978 Methods of measurement for excess noise power of noise-generator diodes
  • SJ 1225-1977 Detail specification for germanium detector diodes,Type 2AP11~2AP17
  • SJ 1947-1981 Detail specification for silicon power rectifier diodes,Type 2CZ32B,2DZ32B,2CZ33B and 2DZ33B
  • SJ 2725-1986 Detail specification for general purpose silicon rectifier diodes,Type 2CZ311
  • SJ 2717-1986 Detail specification for silicon general purpose rectifier diodes,Type 2CZ301
  • SJ 2726-1986 Detail specification for general purpose silicon rectifier diodes,Type 2CZ312
  • SJ/T 11470-2014 Epitaxial wafers of light-emitting diodes
  • SJ 1226-1977 Detail specification for germanium detector diodes,Type 2AP9~2AP10
  • SJ 20788-2000 Measurment method for thermal impedance of semiconductor diodes
  • SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
  • SJ 2747-1987 Blank detail specification for step-function recovery diodes
  • SJ 1389-1978 Methods of measurement for diodes leakage current between electrodes of noise-generator diodes
  • SJ/T 2354-2015/0352 Measuring methods for photodiodes of PIN、APD
  • SJ/T 11397-2009 Phosphors for light emitting diodes
  • SJ 1227-1977 Detail specification for germanium detector diodes,Type 2AP1~2AP8,2AP21 and 2AP27
  • SJ 1388-1978 Methods of measurement for anode conductance of noise-generator diodes
  • SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes
  • SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
  • SJ 20785-2000 Measuring methods for super luminescent diode module
  • SJ 910-1974 Detail specification for silicon voltage regulator diodes,Type 3DW50~202
  • SJ 2140-1982 Methods of measurement for limiting voltage of silicon current regulator diodes
  • SJ 2137-1982 General procedures of measurement for silicon current-regulator diodes
  • SJ 2005-1982 Detail specification for N channel junction pair field-effect transistors,Type CS34
  • SJ/T 11141-2017 Generic specification for LED displays
  • SJ/T 11471-2014 Measurement methods for epitaxial wafers of light-emitting diodes

Taiwan Provincial Standard of the People's Republic of China

Professional Standard - Ferrous Metallurgy

  • YB/T 4215-2010 Cold rolled precision strip for the lead frame of diode

Jiangxi Provincial Standard of the People's Republic of China

Professional Standard - Aerospace

  • QJ 2493-1993 Acceptance specification for microwave diodes and transistors
  • QJ 1299-1987 Specification for Screening of Silicon Microwave Mixer and Detector Diodes
  • QJ 2362-1992 Screening Specification for Step Recovery Diodes
  • QJ 1907-1990 PIN Diode Screening Specifications

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 6589-2002 Semiconductor Devices—Discrete deveice—Part 3-2:Signal (including switching) and regulator diodes—Blank detail specification for voltage-regulator diodes and voltage-reference diodes (e
  • GB/T 6570-1986 Measuring methods for microwave diodes
  • GB/T 15137-1994 Blank detail specification for Gunn diodes
  • GB/T 6588-2000 Semiconductor devices--Discrete devices--Part 3:Signal(including switching)and regulator diodes--Section One--Blank detail specification for signal diodes,switching diodes and controlle
  • GB/T 15178-1994 Blank detail specification for variable capacitance diodes
  • GB/T 6351-1998 Semiconductor devices--Discrete devices Part 2:Rectifier diodes Section One--Blank detail specification for rectifier diodes(including avalanche recti-fier diodes),ambient and case-rate
  • GB/T 16894-1997 Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A
  • GB 51209-2016 Code for design of light emitting diode plant

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Professional Standard - Machinery

Fujian Provincial Standard of the People's Republic of China

Professional Standard - Urban Construction

  • CJ/T 361-2011 Light emitting diode (LED) lamp used in waterscape

Military Standard of the People's Republic of China-General Armament Department

  • GJB 3930-2000 General specification for infrared emitting diodes
  • GJB 2146A-2011 General specification for semiconductor light-emitting diode devices
  • GJB 2146-1994 General specification for light-emitting diode solid-state displays
  • GJB 3519-1999 General Specification for Semiconductor Laser Diodes

Group Standards of the People's Republic of China

邮电部

国家市场监督管理总局、中国国家标准化管理委员会

Professional Standard - Post and Telecommunication

机械电子工业部

  • JB 5837-1991 ZP series case rated rectifier diodes above 2000A

Guangdong Provincial Standard of the People's Republic of China

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

  • GJB 5905-2006 Specification for fast recovery diodes, 600A and above

Professional Standard - Aviation

  • HB 5831-1983 Technical Requirements of Semiconductor Diode and Triode for Aviation

Professional Standard - Light Industry

International Electrotechnical Commission (IEC)

  • IEC 60747-3-1:1986 Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
  • IEC 60747-3:2013 Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
  • IEC 60747-3:1985 Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes.
  • IEC 60747-3-2:1986 Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference d
  • IEC 60747-3/AMD1:1991 Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 1
  • IEC 60747-3/AMD2:1993 Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 2
  • IEC TS 62504:2011 General lighting - LEDs and LED modules - Terms and definitions
  • IEC 91/926/PAS:2010 Electronic circuit board for high-brightness LEDs
  • IEC TS 62861:2017 Guidelines for principal component reliability testing for LED light sources and LED luminaires
  • IEC 62931:2017 GX16t-5 capped tubular led lamp - Safety specifications
  • IEC 60747-2-1:1989 Semiconductor devices; discrete devices; part 2: rectifier diodes; section one: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
  • IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
  • IEC 60747-2-2:1993 Semiconductor devices; discrete devices; part 2: rectifier diodes; section 2: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
  • IEC 62979:2017 Photovoltaic modules - Bypass diode - Thermal runaway test

Korean Agency for Technology and Standards (KATS)

  • KS C IEC 60747-3-1:2006 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
  • KS C IEC 60747-3-2:2006 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
  • KS C IEC 60747-3:2016 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes
  • KS C IEC 60747-3:2006 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes
  • KS C 5205-2002 RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
  • KS C 7120-1990 Light Emitting Diodes(for Indication)
  • KS C IEC 60747-3-1-2006(2021) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diod
  • KS C IEC 60747-3-1-2006(2016) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diod
  • KS C 7120-2021 Light Emitting Diodes(for Indication)
  • KS C IEC 60747-3-1-2021 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section one:Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
  • KS C IEC 60747-3-2-2021 Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
  • KS C 7120-1990(2016) Light Emitting Diodes(for Indication)
  • KS C 7120-1990(2021) Light Emitting Diodes(for Indication)
  • KS C 7003-1981 Measuring methods for small signal diodes
  • KS C IEC 60747-3-2-2006(2016) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, exclud
  • KS C 5205-1980(2000) RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
  • KS C 7003-1996 Measuring methods for small signal diodes
  • KS C IEC 60747-3-2-2006(2021) Semiconductor devices-Discrete devices-Part 3:Signal (including switching) and regulator diodes-Section Two:Blank detail specification for voltage-regulator diodes and voltage-reference diodes, exclud
  • KS C 7104-2020 Standard of measuring the performance of light emitting diodes
  • KS C 6990-2001 General rules of photodiodes for fiber optic transmission
  • KS C 7003-2017(2022) Measuring methods for small signal diodes
  • KS C 7003-2017 Measuring methods for small signal diodes
  • KS C 5300-1992 General rules of light emitting diodes for fiber optic transmission
  • KS C 7121-1990 Measuring Methods for Light Emitting Diodes (for Indication)
  • KS C 5203-1980 RELIABILITY ASSURED SMALL SIGNAL DIODES
  • KS C 6045-1991(2001) TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
  • KS C 6905-2001 General rules of laser diodes for fiber optic transmission
  • KS C 7121-1990(2021) Measuring Methods for Light Emitting Diodes (for Indication)
  • KS C 5203-1980(2000) RELIABILITY ASSURED SMALL SIGNAL DIODES
  • KS C 5300-1992(2022) General rules of light emitting diodes for fiber optic transmission
  • KS C 5301-1992 Test methods of light emitting diodes for fiber optic transmission
  • KS C 6045-1986 TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
  • KS C 6905-2001(2021) General rules of laser diodes for fiber optic transmission
  • KS C 6991-2001 Test methods of photodiodes for fiber optic transmission
  • KS C IEC 60747-2-1-2006(2021) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
  • KS C IEC 60747-2-1-2006(2016) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
  • KS C 7121-2021 Measuring Methods for Light Emitting Diodes (for Indication)
  • KS C 6045-2002 TESTING METHODS FOR SEMICONDUCTOR RECTIFIER DIODES
  • KS C 5203-2002 RELIABILITY ASSURED SMALL SIGNAL DIODES
  • KS C 5213-1981(1997) RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
  • KS C IEC 60747-2-2-2021 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
  • KS C 5213-1981 RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
  • KS C 6906-2001 Test methods of laser diodes for fiber optic transmission
  • KS C IEC 60747-2-1-2021 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
  • KS C 6991-2013 TEST METHODS OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
  • KS C 6942-2014 General rule of laser diode modules for fiber optic transmission
  • KS C 6942-2019 General rule of laser diode modules for fiber optic transmission
  • KS C IEC 60747-2-2:2006 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
  • KS C IEC 60747-2-2-2006(2021) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for current
  • KS C IEC 60747-2-2-2006(2016) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for current
  • KS C 7104-2005 Standard of measuring the performance of light emitting diodes
  • KS C 6990-2013 GENERAL RULES OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION

British Standards Institution (BSI)

  • BS IEC 60747-3:2013 Semiconductor devices. Discrete devices: Signal, switching and regulator diodes
  • BS IEC 60747-5-8:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
  • BS EN 120001:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • BS 9300 C199-276:1971 Detail specification for silicon voltage-regulator diodes
  • BS 9300 C678-721:1980 Detail specification for silicon voltage regulator diodes
  • BS 9300 C780-831:1971 Detail specification for silicon voltage regulator diodes
  • BS PD IEC/TS 62861:2017 Guidelines for principal component reliability testing for LED light sources and LED luminaires
  • BS 9300 C678-721:1971 Detail specification for silicon voltage regulator diodes
  • BS EN 120001:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • BS 9300 C405-429:1971 Detail specifications for silicon voltage-regulator diodes
  • BS 9300 C841-849:1971 Detail specification for silicon voltage regulator diodes
  • BS 9300 C771-772:1971 Detail specification for coaxial mixer diodes
  • BS 9300 C377-378:1971 Detail specifications for silicon coaxial mixer diodes
  • 24/30490678 DC BS IEC 60747-5-18 Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method light emitting diodesof the macro photoluminescence for epitaxial wafers of micro light emitting diodes
  • BS IEC 60747-5-11:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
  • BS E9375:1975 Specification - Harmonized system of quality assessment for electronic components - Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes
  • BS EN 62931:2017 GX16t-5 capped tubular LED lamp - Safety specifications
  • BS 9300 C776-777:1971 Detail specification for germanium coaxial mixer diodes
  • BS 9300 C476:1973 Detail specification for silicon avalanche rectifier diode
  • BS 9300 C667-668:1971 Detail specification for silicon avalanche rectifier diodes
  • BS 9300 C762:1971 Detail specification for mixer diodes for use at X-band frequencies
  • BS EN 60747-2:2016 Semiconductor devices. Discrete devices. Rectifier diodes
  • BS 9300 C762:1980 Detail specification for mixer diodes for use at X-band frequencies
  • BS IEC 60747-4:2008 Semiconductor devices - Discrete devices - Microwave diodes and transistors

Defense Logistics Agency

Japan Electronics and Information Technology Industries Association

JP-JEITA

Association Francaise de Normalisation

  • NF C96-832:1981 Semiconductors. Microwave diodes. Schottky diodes. General requirements.
  • NF C93-120-001*NF EN 120001:1992 Blank detail specification : light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • NF EN 120001:1992 Particular framework specification: light-emitting diodes, light-emitting diode arrays, light-emitting diode displays without resistance or internal logic circuits
  • NF EN 120002:1992 Particular framework specification: infrared emitting diodes, networks of infrared emitting diodes
  • NF C93-120-002*NF EN 120002:1992 Blank Detail Specification : Infrared emitting diodes, infrared emitting diode arrays
  • NF EN 120005:1992 Special frame specification: photodiodes, photodiode arrays (Not intended for optical fiber applications}
  • NF C93-871:1987 Digital transmitters with light emitting diodes.
  • NF C93-120-005*NF EN 120005:1992 Blank detail specification : photodiodes, photodiode arrays (not intended for fibre optic applications)
  • NF C86-502:1983 Harmonized system of quality assessment for electronic components. Blank detail specification. Infrared emitting diodes, infrared emitting diodes arrays.
  • NF C86-508:1993 Blank detail specification. Light emitting diodes and infrared emitting diodes for fibre optic system or sub-system.
  • NF C86-501:1983 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays.
  • NF C86-818/A1:1981 Rectifier diodes at specified ambient temperature
  • NF C96-821:1981 Semiconductor Devices High Power rectifier diodes
  • NF C93-872:1987 Digital receivers with pin photodiode.
  • NF C86-815:1981 Harmonised system of quality assessment for electronic components. Blank detail specification : voltage regulator diodes and voltage reference diodes.
  • NF C57-379*NF EN 62979:2017 Photovoltaic module - Bypass diode - Thermal runaway test
  • NF EN 62979:2017 Photovoltaic modules - Bypass diode - Thermal runaway test

Danish Standards Foundation

  • DS/IEC 747-3-2:1987 Semiconductor devices. Discrete devices. Part 3: Signal (including switching) and regulator diodes. Section 2: Blank detail specification for voltage regulator diodes and voltage reference diodes, excluding temperature compensated precision refere di
  • DS/IEC 747-3:1986 Semiconductor devices. Discrete devices. Part 3: Signal (including switching) and regulator diodes
  • DS/IEC 747-3-1:1987 Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section 1: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes
  • DS/IEC 747-2-1:1990 Semiconductor devices. Discrete devices. Part 2: Rectifier diodes. Section one: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A

ES-UNE

  • UNE-EN 120001:1992 BDS: LIGHT EMITTING DIODES, LIGHT EMITTING DIODE ARRAYS, LIGHT EMITTING DIODE DISPLAYS WITHOUT INTERNAL LOGIC AND RESISTOR. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 120002:1992 Blank Detail Specification: Infrared emitting diodes, infrared emitting diode arrays
  • UNE-EN 120005:1992 BDS: PHOTODIODES, PHOTODIODE ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS). (Endorsed by AENOR in September of 1996.)
  • UNE-EN 120008:1993 BDS: LIGHT EMITTING DIODES AND INFRARED EMITTING DIODES FOR FIBRE OPTIC SYSTEM OR SUB-SYSTEM. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 120006:1992 BDS: PIN-PHOTODIODES FOR FIBRE OPTIC APPLICATIONS. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 62979:2017 Photovoltaic module - Bypass diode - Thermal runaway test (Endorsed by Asociación Española de Normalización in October of 2018.)

IECQ - IEC: Quality Assessment System for Electronic Components

  • PQC 105-1992 Blank Detail Specification for Light Emitting Diodes@ Light Emitting Diode Arrays
  • PQC 75-1991 Semiconductor Devices - Discrete Devices - Rectifier Diodes Blank Detail Specification: Rectifier Diodes (Including Avalanche Rectifier Diodes)@ Ambient and Case-Rated@ Greater Than 100 A
  • QC 750101-1986 Semiconductor Devices Discrete Devices Part 3: Signal (Including Switching) and Regulator Diodes@ Section One - Blank Detail Specification for Signal Diodes@ Switching Diodes and Controlled-Avalanche Diodes (IEC 747-3-1 ED 1)
  • QC 750105-1986 Semiconductor Devices; Discrete Devices Part 3: Signal (Including Switching) and Regulator Diodes Section Two-Blank Detail Specification for Voltage-Regulator Diodes and Voltage-Reference Diodes@ Exluding Temperature-Compensated Precision Ref. Diodes (IEC
  • QC 750101/GB 0001 ISSUE 1-1990 Silicon Ambient Rated High Speed Switching Diode in Plastic Encapsulation

German Institute for Standardization

  • DIN IEC 60747-3:1992 Semiconductor devices; discrete devices; part 3: signal diodes and regulator diodes; identical with IEC 60747-3:1985
  • DIN EN 120001:1993-06 Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
  • DIN EN 120002:1997-02 Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays; German version EN 120002:1992
  • DIN EN 120005:1996 Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
  • DIN EN 120001:1993 Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
  • DIN EN 120002:1997 Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays; German version EN 120002:1992
  • DIN EN 120005:1996-11 Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

U.S. Military Regulations and Norms

Lithuanian Standards Office

  • LST EN 120001-2001 Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • LST EN 120002-2001 Blank detail specification. Infrared emitting diodes, infrared emitting diode arrays
  • LST EN 120005-2001 Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications)

SE-SIS

  • SIS SS-CECC 20001-1991 Blank detail specification: Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • SIS SS CECC 20002-1984 Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays
  • SIS SS CECC 20005-1988 Blank detail specification: Photodiodes, photodiode-arrays (not intended for fibre optic aoolications)
  • SIS SS-CECC 50009-1991 Blank detail specification:Case-rated rectifier diodes

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

SCC

  • DANSK DS/EN 120001:2016 Blank Detail Specification: Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • DANSK DS/EN 120002:2016 Blank Detail Specification: Infrared emitting diodes, infrared emitting diode arrays
  • NACE SP0575-2022 Internal Cathodic Protection (CP) Systems in Oil-Treating Vessels
  • DANSK DS/EN 120005:2016 Blank Detail Specification: Photodiodes, photodiode arrays (not intended for fibre optic applications)
  • BS 9300 C397-403:1971 Detail specification for silicon variable capacitance diodes
  • BS QC 750001:1986 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
  • MIL MIL-PRF-19500/735C-2020 Diode, Silicon, Schottky, Dual, Center Tap, Type 1N7041CCU1 and Single Diode Type 1N7045T3, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/735B-2015 Diode, Silicon, Schottky, Dual, Center Tap, Type 1N7041CCU1 and Single Diode Type 1N7045T3, JAN, JANTX, JANTXV, and JANS
  • BS 9300 C155-168:1971 Detail specifications for silicon voltage-regulator diodes
  • MIL MIL-PRF-19500/620D-2001 SEMICONDUCTOR DEVICE, HERMETIC, DIODE, SILICON, TECTIFIER, SCHOTTKY BARRIER, TYPES 1N5822 AND 1N822US JAN, JANTX, JANTXV, JANJ, JANS, JANHC, AND JANKC (SUPERSEDING MIL-PRF-19500/620C) (S/S BY MIL-PRF-19500/620E)
  • DIN EN 120008:1995 Blank detail specification: Light emitting diodes and infrared emitting diodes for fibre optic system or sub-system; German version EN 120008:1993
  • MIL MIL-PRF-19500/735A-2009 Diode, Silicon, Schottky, Dual, Center Tap, Type 1N7041CCU1 and Single Diode Type 1N7045T3, JAN, JANTX, JANTXV, and JANS
  • 10/30231573 DC BS EN 60747-3. Semiconductor devices. Part 3. Signal (including switching diodes) and regulator diodes
  • MIL MIL-S-19500/352-1966 SEMICONDUCTOR DEVICE, DIODE, SILICON TYPE 1N831A
  • MIL MIL-S-19500/298-1964 SEMICONDUCTOR DEVICE, DIODE, SILICON TYPE 1N1742A
  • MIL MIL-PRF-32243A-2019 Light Emitting Diode (LED) Military Driving Headlamp
  • CSA C865.2-2023 Light-emitting diode drivers — Performance characteristics
  • MIL MIL-PRF-49169B-1999 LIGHT-EMITTING DIODE ARRAY (SUPERSEDING MIL-L-49169A)
  • MIL MIL-PRF-32243-2009 Light Emitting Diode (LED) Military Driving Headlamp
  • BS 9300 C556-563:1971 Detail specifications for silicon power rectifier diodes
  • DIN EN 60747-3 E:2010 Draft Document - Semiconductor devices - Part 3: Signal (including switching diodes) and regulator diodes (IEC 47E/395/CD:2010)
  • BS 9300 C564-571:1971 Detail specifications for silicon power rectifier diodes
  • CAN/ULC-S8752-2012 STANDARD FOR ORGANIC LIGHT EMITTING DIODE (OLED)PANELS
  • CAN/ULC S8752-2012 Standard for Organic Light Emitting Diode (LED) Panels
  • BS 9300 C572-579:1971 Detail specifications for silicon power rectifier diodes
  • BS CECC 20001:1983 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes, light emitting diode arrays
  • MIL MIL-PRF-19500/735-2006 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, CENTER TAP, TYPE 1N7041CCU1 AND SINGLE DIODE TYPE 1N7045T3, JAN, JANTX, JANTXV, AND JANS
  • MIL MIL-S-19500/227-1962 SEMICONDUCTOR DEVICE, DIODE, TYPE 1N995M (NAVY)
  • MIL MIL-S-19500/229-1962 SEMICONDUCTOR DEVICE, DIODE, TYPE 1N830AM (NAVY)
  • MIL MIL-PRF-19500/761B-2020 Diode, Silicon, Schottky, Type 1N7069T1, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/761-2010 Diode, Silicon, Schottky, Type 1N7069T1, JAN, JANTX, JANTXV, and JANS
  • CSA C865.1-2023 Pilotes de diodes électroluminescentes — méthodes de mesure

European Standard for Electrical and Electronic Components

  • EN 120002:1992 Blank detail specification: infrared emitting diodes, infrared emitting diode arrays
  • EN 120005:1992 Blank detail specification: photodiodes, photodiode-arrays (not intended for fibre optic applications)
  • EN 120001:1992 Blank detail specification; light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • CECC 50 008- 004 Ambient Rated Rectifier Diode (En)
  • CECC 50 008- 005 Ambient Rated Rectifier Diode (En)
  • EN 150009:1992 Blank detail specification: case-rated rectifier diodes
  • CECC 50 001- 026 ISSUE 3-1994 NL-CECC 50 001-26; Signal Diodes Type Number: BA314 (En)

Japanese Industrial Standards Committee (JISC)

  • JIS C 7035:1985 Light emitting diodes (for indication)
  • JIS C 8152-2:2012 Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light engines
  • JIS C 5942:2010 General rules of laser diodes used for recording and playback
  • JIS C 5942:1997 General rules of laser diodes used for recording and playback
  • JIS C 8152-2 AMD 1:2014 Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light engines (Amendment 1)
  • JIS C 8152-1:2012 Photometry of white light emitting diode for general lighting -- Part 1: LED packages
  • JIS C 5943:2010 Measuring methods of laser diodes used for recording and playback
  • JIS C 5943:1997 Measuring methods of laser diodes used for recording and playback
  • JIS C 5990:1997 General rules of photodiodes for fiber optic transmission
  • JIS C 7223:1978 Reliability assured voltage regulator diodes and voltage reference diodes
  • JIS C 5950:1997 General rules of light emitting diodes for fiber optic transmission
  • JIS C 7031:1993 Measuring methods for small signal diodes
  • JIS C 5940:1997 General rules of laser diodes for fiber optic transmission
  • JIS C 7036:1985 Measuring methods for light emitting diodes (for indication)
  • JIS C 7221:1978 Reliability assured small signal diodes
  • JIS C 7033:1975 Testing methods for semiconductor rectifier diodes
  • JIS C 5991:1997 Measuring methods of photodiodes for fiber optic transmission

TH-TISI

  • TIS 1970-2000 Semiconductor devices discrete devices part 3:signal (including switching)and regulator diodes section one-blank detail specification for signal diodes,switching diodes and controlled-avalanchediodes
  • TIS 1971-2000 Semiconductor devices discrete devices part 3:signal (including switching)and regulator diodes section two-blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes
  • TIS 1596-1999 Semiconductor devices.discrete devices.part 2: rectifier diodes section 2: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 a

RU-GOST R

  • GOST R 54814-2011 Light emitted diodes and light emitting diode modules for general application. Terms and definitions
  • GOST R 54814-2018 Light emitted diodes and light emitting diode modules for general application. Terms and definitions
  • GOST 21011.1-1976 High-voltage kenotrons. The anode current measurement method
  • GOST 17465-1980 Semiconductor diodes. Basic parameters
  • GOST 28625-1990 Semiconductor devices. Discrete devices. Part 3. Signal (including switching) and regulator diodes. Section 2. Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diod
  • GOST R 51106-1997 Lazers injection, lazer heads, lazers diodes matices, lazers diodes. Methods for measurement of parameters
  • GOST 18986.10-1974 Semiconductor diodes. Methods for measuring inductance
  • GOST 20693-1975 Hign-voltage kenotrons. Terms and definitions
  • GOST 21011.2-1976 High-voltage kenotrons. The anode current measurement method within the voltage pulse
  • GOST 18986.4-1973 Semiconductor diodes. Methods for measuring capacitance
  • GOST 18986.6-1973 Semiconductor diodes. Method for measuring recovery charge

CZ-CSN

  • CSN 35 8736-1964 Semiconductor diodes. Measurement of interelectrode capacitanoe
  • CSN 35 8775-1987 Light-emitting diodes. Noise measurement in forward direction
  • CSN 35 8732-1964 Semiconductor diodes. Measurement of forward current
  • CSN 35 8786-1983 Varicaps. Electric parameter measurement methods
  • CSN IEC 747-2-1:1993 Semiconductor devices. Diskrete devices. Part 2: Rectifier diodes. Section 1 - Blank detail specification for rectifier diodes (including avalanche diodes), ambient and case-rated, up to 100A
  • CSN 35 8734-1975 Semieonductor devices. Diodcs. Measurement of reverse current.

GOST

YU-JUS

International Commission on Illumination (CIE)

PL-PKN

RO-ASRO

  • STAS 7128/7-1986 LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED C1RCUITS Symbols for variable capacitance diodes and mixer diodes
  • STAS 12123/3-1983 Semiconductor devices VOLTAGE REFERENCE DIODES AND VOLTAGE REGULATOR DIODES Measuring methodes for electrical characteristics
  • STAS 12123/2-1983 Semiconductor devices LOW POWER SIGNAL DIODES, INCLUDING SWITCHING DIODES Measuring methods for electrical characteristics

AIA/NAS - Aerospace Industries Association of America Inc.

PT-IPQ

  • NP 3234-2-1987 Electronic originals. Electroluminescent diodes. Electroluminescent diode matrix, detailed specifications
  • NP 3234-3-1987 Electronic originals. Infrared emitting diodes. Infrared emitting diode matrix, detailed specifications

Underwriters Laboratories (UL)

United States Navy

Indonesia Standards

  • SNI 7397-2008 LED (Light Emmiting Diode) signal lamps on the trains

Institute of Electrical and Electronics Engineers (IEEE)

National Aeronautics and Space Administration (NASA)

CENELEC - European Committee for Electrotechnical Standardization

  • EN 120008:1993 Blank Detail Specification: Light Emitting Diodes and Infrared Emitting Diodes for Fibre Optic System or Sub-System
  • EN 150006:1991 Blank Detail Specification: Variable Capacitance Diodes

(U.S.) Telecommunications Industries Association

Society of Automotive Engineers (SAE)

SAE - SAE International

GSO

National Association of Corrosion Engineers (NACE)

  • NACE SP0575-2007 Internal Cathodic Protection (CP) Systems in Oil-Treating Vessels Item No. 21015
  • NACE SP0575-1995 Internal Cathodic Protection (CP) Systems in Oil-Treating Vessels (Item No. 21015)

Canadian Standards Association (CSA)

American National Standards Institute (ANSI)

NEMA - National Electrical Manufacturers Association

  • NEMA C78.51-2016 Electric Lamps - LED (Light Emitting Diode) Lamps - Method of Designation

TIA - Telecommunications Industry Association

JP-JARI

  • JRIS R1647-2021 Rolling stock - Light Emitting Diode(LED) type tail lamps

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 62979:2017 Photovoltaic module - Bypass diode - Thermal runaway test