GB/T 16894-1997 in English

VALID

Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A

Issued on:1997-06-02
Implemented on:1998-03-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $150.00
$146.00

Standard No:	GB/T 16894-1997
Document status:	VALID
Title in English:	Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A
Title in Chinese:	大于100A,环境和管壳额定的整流二极管(包括雪崩整流二极管)空白详细规范
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1997-06-02
Implemented on:	1998-03-01
ICS Classification:	31.080.10-Diodes
Chinese Classification:	K46-Power semiconductor device and parts
Professional Classification:	GB-National Standard
Related Keywords:	blank detail specification blank detail specifications international electrotechnical commission scopethe international electrotechnical commission electronic device quality assessment system
Related Topics:	Rectifier Diode Inspection gb/t+16894-1997+ Diode br diode cp diode rectifier diode Rectifier Diode Inspection Boundary Diode Devices Rated photodiode ambient air capillary Avalanche Diode UV GBT16894 GBT3-1997 Avalanche rectifier diode Naming rules for diodes and transistors Diode industry Pipe rectifier tube bundle rectifier Does the detailed specification of the test outline belong to the method? diode execution gbt3-1997

《GB/T 16894-1997大于100A，环境和管壳额定的整流二极管（包括雪崩整流二极管）空白详细规范》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
详见本标准。

Scope

The International Electrotechnical Commission electronic device quality assessment system follows the charter of the International Electrotechnical Commission and works under the authorization of the International Electrotechnical Commission. The purpose of the assessment system is to define the quality assessment procedure in such a way that an electronic device released by one Member State as complying with the applicable scope requirements is also acceptable in other Member States without further testing. This blank detail specification is one of the semiconductor device-series blank detail specifications and should be used together with the following specifications of the International Electrotechnical Commission. IEC747-10/QC700000 (1991) Part 10 of Semiconductor Devices: General Specifications for Discrete Devices and Integrated Circuits IEC747-11/QC750100 (1985) Part 11 of Semiconductor Devices: Sub-Specifications for Discrete Devices. required information

More samples: JGJ 94-2008 YD/T 3934-2021 GB 50021-2001(2009)

Sample only — not a preview of GB/T 16894-1997