semiconductor standard
semiconductor standard, Total:200 items.
The international standard classification for "semiconductor standard" includes: Semiconductor devices in general , Optoelectronics. Laser equipment , Semiconducting materials , Rectifiers. Convertors. Stabilized power supply , Plug-and-socket devices. Connectors , Testing of metals , Nuclear energy in general , Other products of non-ferrous metals , Electrical engineering (Vocabularies) , Chemical analysis , Integrated circuits. Microelectronics , Semiconductor devices , Electricity. Magnetism. Electrical and magnetic measurements , Components for aerospace construction , Other semiconductor devices , Electrical equipment of ships and of marine structures , Nuclear energy engineering , Measurement of force, weight and pressure , Other electromechanical components , Electromechanical components in general , Aerospace electric equipment and systems , Aluminium products , Glass products .
The Chinese standard classification for "semiconductor standard" includes: Semiconductor discrete devices in general , Optoelectronic device assembly , Semimetal and semiconductor material in general , Special electronic technology material , Power semiconductor device and parts , Precious metals and their alloys , Connector , Metal physical property test method , Nuclear instrument and detector in general , Semimetal and semiconductor material analysis method , Basic standards and general methods , Industrial gas and chemical gas , Laser device , Semiconductor integrated circuit , Microcircuit in general , Semiconductor triode , Dedicated processing equipment , Electronic measurement and equipment in general , Electronic components , Microwave and millimeter wave diode and triode , Power generation, transformation and distribution equipment for vessel , Electronic industry production equipment in general , Nuclear detector , Electrical, observation/communication and navigation equipment for vessel in general , Technical management , Technical management , Technical management , Technical Management , Technical management , Technical management , Transformer , Industrial automation and control device in general , Technical management , Light metals and their alloys , Telephone communication equipment , Quartz glass , Thermal Measurement .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 43366-2023 General specification for discrete semiconductor devices of space application
- GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
- GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
- GB/T 3430-1989 The rule of type designation for semiconductor integrated circuits
- GB/T 5201-2012 Test procedures for semiconductor charged particle detectors
- GB/T 8750-2007 Gold bonding wire for semiconductor devices
- GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials
- GB/T 11499-2001 Letter symbols for discrete semiconductor devices
- GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
- GB/T 14264-2009 Semiconductor materials - Terms and definitions
- GB/T 8750-2014 Gold bonding wire for semiconductor package
- GB/T 14140-2025 Test method for measuring diameter of semiconductor wafer
- GB/T 14264-2024 Terminology of semiconductor materials
- GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
- GB/T 29299-2012 General specification of semiconductor laser rangefinder
- GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
- GB/T 30116-2013 Requirements for Semiconductor Manufacturing Facility Electromagnetic Compatibility
- GB/T 42974-2023 Semiconductor integrated circuits—Flash memory(FLASH)
- GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices
- GB/T 3859.4-2004 Semiconductor converter - Self-commutated semiconductor converters including direct d.c.converters
- GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)
- GB/T 13422-2013 Semiconductor converters—Electrical test methods
- GB/T 45722-2025 Semiconductor devices—Constant current electromigration test
- GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
- GB/T 8750-2022 Gold-based bonding wire and bandlet for semiconductor package
- GB/T 44375-2024 Requirements for load ports of 300mm semiconductor equipment
- GB/T 31358-2015 General specification for semiconductor lasers
- GB/T 31469-2015 Semiconductor materials cutting fluid
- GB/T 22193-2008 Electrical installations in ships - Equipment - Semiconductor convertors
- GB/T 34971-2017 Guide for gaseous effluent handling in semiconductor industry
- GB/T 14548-2025 General specification for marine semiconductor convertors
- GB/T 17950-2000 Semiconductor converter - Part 6: Application guide for the protection of semiconductor converters against overcurrent by fuses
- GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
- GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
- GB/T 37031-2018 Semiconductor lighting terminology
- GB/T 14844-1993 of semiconductor materials
- GB/T 3859.2-1993 Semiconductor convertors Application guide
- GB/T 15529-1995 Blank detail specification for LED numeric displays
- GB/T 249-1989 The rule of type designation for discrete semiconductor
- GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
- GB/T 14113-1993 of packages for semiconductor integrated circuits
- GB/T 20521.5-2025 Semiconductor Devices - Part 14-5: Semiconductor Sensors - PN Junction Semiconductor Temperature Sensors
- GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
- GB/T 8750-1997 Gold wire for semiconductor devices lead bonding
- GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
- GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification
- GB/T 3859.1-1993 Semiconductor convertors—Specification of basic requirements
- GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
- GB/T 5839-1986 Rating systems for electronic tubes and semiconductor devise
- GB/T 15872-1995 Power supply interface for semiconductor equipment
- GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
- GB/T 14844-2018 Designations of semiconductor materials
- GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
- GB/T 7581-1987 of outlines for semiconductor discrete devices
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 15872-2013 Power supply interface for semiconductor equipment
- GB/T 13974-1992 methods for semiconductor device curve tracers
- GB/T 20521.4-2025 Semiconductor Devices - Part 14-4: Semiconductor Sensors - Semiconductor Accelerometers
- GB/T 2900.32-1994 Electrotechnical terminology - Power semiconductor device
- GB/T 249-2017 The rule of type designation for discrete semiconductor devices
- GB/T 14264-1993 Semiconductor materials-Terms and definitions
Military Standard of the People's Republic of China-General Armament Department
- GJB 128-1986 Aerial photographic specification for military topographic mapping
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
- GJB 128B-2021 Semiconductor discrete device test methods
- GJB 8120-2013 General specification for semiconductor optoelectronic module
- GJB 33B-2021 General Specification for Semiconductor Discrete Devices
- GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
- GJB 3519-1999 General Specification for Semiconductor Laser Diodes
- GJB 8119-2013 General specification for semiconductor optoelectronic device
- GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
- GJB 8121-2013 General specification for semiconductor optoelectronic assembly
- GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
- GJB 597B-2012 General specification for semiconductor integrated circuits
- GJB 923B-2021 General Specification for Semiconductor Discrete Device Enclosures
Professional Standard - Electron
- SJ 2220-1982 Semiconductor photocouplers in the Darlington transistor mode
- SJ 1992-1981 Detail specification for N channel junction pair field-effect transistors,Type CS22
- SJ 1990-1981 Detail specification for N channel junction pair field-effect transistors,Type CS20
- SJ 2355.1-1983 General procedures of measurement for light-emitting deivces
- SJ 2433-1984 Bonding sheet for semiconductor tubes
- SJ 1979-1981 Detail specification for high frequency field-effect transistors,Type CS6
- SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
- SJ 20072-1992 Semiconductor discrete device-Detail specification for semiconductor opto-couplers for Type GH24,GH25 and GH26
- SJ/T 10416-1993 Generic Apecification for chip for semiconductor discrete devices
- SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
- SJ 1487-1979 Detail specification for reverse blocking high-frequency thyristors
- SJ 1975-1981 Detail specification for low frequency field-effect transistors,Type CS2
- SJ/T 9533-1993 Grading standard of quality for semiconductor discrete devices
- SJ 1978-1981 Detail specification for high frequency field-effect transistors,Type CS5
- SJ/T 10424-1993 Glass powder for passivation packaging for use in semiconductor devices
- SJ/Z 9021.1-1987 Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices
- SJ/T 11395-2009 Semiconductor lighting terminology
- SJ/T 11089-1996 Letter symbols for discrete semiconductor components
- SJ 2558-1984 Detail specification for semiconductor light emitting numeric displays,Type SM1~18
- SJ 909-1974 Detail specification for silicon voltage regulator diodes,Type 2CW50~149
- SJ 1983-1981 Detail specification for low frequency low noise field-effect transistors,Type CS10
- SJ 1977-1981 Detail specification for high frequency field-effect transistors,Type CS4
- SJ 2750-1987 Outline dimensions for semiconductor laser diodes
- SJ 50033/4-1994 Semiconductor discrete device-Detail specification for semiconductor red light emitting diodes for type GF111 of GP and GT classes
- SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
- SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
- SJ 20642-1997 Semiconductor opto-electronic module-General specification for
- SJ 1982-1981 Detail specification for high frequency field-effect transistors,Type CS9
- SJ 1984-1981 Detail specification for low frequency low noise field-effect transistors,Type CS11
- SJ 50033/3-1994 Semiconductor discrete device - Detail specification for semiconductor opto-couplers for type GH21, GH22 and GH23 of GP, GT and GCT classes
- SJ/T 10414-2015 Solder for semiconductor device
- SJ 1976-1981 Detail specification for low frequency field-effect transistors,Type CS3
- SJ 1981-1981 Detail specification for high frequency field-effect transistors,Type CS8
- SJ 2218-1982 Semiconductor photocouplers in the diode mode
- SJ 2219-1982 Semiconductor photocouplers in the transistor mode
- SJ/T 11397-2009 Phosphors for light emitting diodes
- SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
- SJ/T 10414-1993 Solder for semicoductor device
- SJ 50033/5-1994 Semiconductor discrete device-Detail specification for semiconductor yellow light emitting diodes for type GF311 of GP and GT classes
- SJ 910-1974 Detail specification for silicon voltage regulator diodes,Type 3DW50~202
- SJ 1987-1981 Detail specification for low frequency low noise field-effect transistors,Type CS14
- SJ 50033/6-1994 Semiconductor discrete device-Detail specification for semiconductor green light emitting diodes for type GF411 of GP and GT classes
- SJ/T 10535-1994 Tungsten boat for semiconductor devices
- SJ 20786-2000 General specification for semiconductor opto-electronic assembly
- SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
- SJ 1989-1981 Detail specification for Nchannel junction pair field-effect transistors,Type CS19
- SJ 1980-1981 Detail specification for high frequency field-effect transistors,Type CS7
- SJ/Z 9021.4-1987 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor devices
- SJ 1985-1981 Detail specification for low frequency low noise field-effect transistors,Type CS12
Group Standards of the People's Republic of China
- T/ZACA 041-2022 Mixed signal semiconductor device test equipment
- T/CASAS 002-2021 Terminology for wide bandgap semiconductors
- T/SZBSIA 006-2022 Semiconductor di e bonder technical?norm
- T/ZZB 1718-2020 Gold bonding wire for semiconductor package
- T/SZBSIA 007-2022 Semiconductor die bonder test specification
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1873-2016 semiconductor refrigeration wine cabinet
Professional Standard - Machinery
- JB/T 7059-1993 Guide for Preparation of Standard for Power Semiconductor Modules
- JB/T 5842-2005 Rings for dies of semiconductor devices
- JB/T 2423-1999 Type designation for power semiconductor device
- JB/T 4277-1996 Packing of Power Semiconductor Parts
- JB/T 7061-1993 Silicon Wafers Intended to Be Used in Power Semiconductor Devices
- JB/T 10501-2005 Ceramic parts of case for power semiconductor devices
- JB/T 10097-1999 Cases for Power Semiconductor Devices
- JB/T 5843-2005 Connectors for power semiconductor devices
- JB/T 7786-1995 Sampling Method for Test of Power Semiconductor Devices
- JB/T 5629-1991 Welding furnace for semiconductor devices. Grading of energy consumption
- JB/T 8661-1997 Construction Parts of Electric Semiconductor Modules
- JB/T 5844-1991 Directional relays and power relays with two input energizing quantities (IEC 60255-12: 1980 NEQ)
- JB/T 5631-1991 Epitaxial Furnace for Semiconductor Devices. Energy Efficiency Standard
- JB/T 5843-1991 Connectors for Power Semiconductor Devices
- JB/T 7063-1993 Rated Voltage and Current of Power Semiconductor Devices
- JB/T 7064-1993 General Specifications for Semiconductor Inverters
- JB/T 9687.1-1999 Molybdenum Disk for Power Semiconductor Devices
- JB/T 5835-2005 Components of gate terminal for power semiconductor devices
- JB/T 1505-1975 Method for Designing Types of Power Semiconductor Converters
- JB/T 9684-2000 Selecting guide of heat sink for power semiconductor device
- JB/T 7483-1994 Semiconductor resistance strain sensor
- JB/T 9687.2-1999 Tungsten disk for power semiconductor devices
- JB/T 10097-2000 Case for power semiconductor device
- JB/T 9644-1999 Reactor for semiconductor electric drive
- JB/T 7483-2005 Semiconductor resistance strain gauge force stransducer/sensor
- JB/T 5630-1991 Diffusion Furnace for Semiconductor Devices. Grading of Energy Consumption
- JB/T 11623-2013 Thick film metal oxide semiconductor gas sensor
Fujian Provincial Standard of the People's Republic of China
- DB35/T 1193-2011 Semiconductor LED chip
Professional Standard - Aerospace
- QJ 787-1983 Semiconductor Discrete Devices - Specifications for Screening
- QJ 1908A-1998 Acceptance Uncovering Check Method of Semiconductor Devices
- QJ 1511A-1998 Semiconductor Discrete Devices - Specifications for Acceptance
- QJ 1908-1990 Acceptance decapsulation inspection method for semiconductor devices
- QJ 1511-1988 Acceptance Specification for Semiconductor Devices
Professional Standard - Non-ferrous Metal
- YS/T 1105-2024 Silver bonding wire for semiconductor package
- YS/T 678-2008 Copper wire for semiconductor lead bonding
- YS/T 678-2024 Copper bonding wire for semiconductor package
- YS/T 641-2024 Aluminum bonding wire for semiconductor package
Professional Standard - Post and Telecommunication
- YD 576-1992 Semiconductor rectifier equipments For telecommunications
- YD/T 940-1999 Semiconductor arrester for The over-voltage protection of telecommunications installations
Shanghai Provincial Standard of the People's Republic of China
- DB31/ 374-2024 Semiconductor industry pollutant emission standards
Professional Standard - Building Materials
- JC/T 597-1995 Transparent quartz glass tubes for semiconductors
- JC/T 181-2011 Transparent quartz glass devices for semiconductor
Jiangsu Provincial Standard of the People's Republic of China
- DB32/ 3747-2020 Pollutant Emission Standards for the Semiconductor Industry
National Metrological Verification Regulations of the People's Republic of China
- JJG 363-1984 Semiconductor Themistor Themometer
- JJG(核工) 4-1991 Verification Regulations for Semiconductor Telescopes (Working Class)
Jiangxi Provincial Standard of the People's Republic of China
- DB3603/T 4-2022 Technical specifications for the manufacture of semiconducting glazes for electric porcelain
Anhui Provincial Standard of the People's Republic of China
- DB34/ 4294-2022 Discharge Standards for Water Pollutants in the Semiconductor Industry
Professional Standard - Railway
- TB/T 2437-1993 Specifications for locomotive semi-conductor converters
Professional Standard - Aviation
- HB 5831-1983 Technical Requirements of Semiconductor Diode and Triode for Aviation
National Metrological Technical Specifications of the People's Republic of China
- JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
German Institute for Standardization
- DIN EN IEC 62969-2:2018-09*VDE 0884-69-2:2018-09 Semiconductor devices – Semiconductor interface for automotive vehicles
- DIN EN IEC 62969-4:2019-03*VDE 0884-69-4:2019-03 Semiconductor devices – Semiconductor interface for automotive vehicles
- DIN EN IEC 62969-1:2018-08*VDE 0884-69-1:2018-08 Semiconductor devices – Semiconductor interface for automotive vehicles
- DIN EN IEC 62969-3:2018-12*VDE 0884-69-3:2018-12 Semiconductor devices – Semiconductor interface for automotive vehicles
- DIN EN 62779-1:2017-01*VDE 0884-79-1:2017-01 Semiconductor devices – Semiconductor interface for human body communication
- DIN EN 62779-2:2017-01*VDE 0884-79-2:2017-01 Semiconductor devices – Semiconductor interface for human body communication
- DIN EN 62779-3:2017-03*VDE 0884-79-3:2017-03 Semiconductor devices – Semiconductor interface for human body communication
- DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
British Standards Institution (BSI)
- BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
- BS IEC 60747-5-4:2022+A1:2024 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
- BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
- BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
- BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
Czech Standards Institute (UNMZ)
- CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
GCC Standardization Organization
- GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
Standard Association of Australia (SAA)
- AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
International Electrotechnical Commission (IEC)
- IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
Japan Electronics and Information Technology Industries Association
- JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)
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