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Database: 365,228(8 Aug 2026)

semiconductor standard

semiconductor standard, Total:200 items.

The international standard classification for "semiconductor standard" includes: Semiconductor devices in general , Optoelectronics. Laser equipment , Semiconducting materials , Rectifiers. Convertors. Stabilized power supply , Plug-and-socket devices. Connectors , Testing of metals , Nuclear energy in general , Other products of non-ferrous metals , Electrical engineering (Vocabularies) , Chemical analysis , Integrated circuits. Microelectronics , Semiconductor devices , Electricity. Magnetism. Electrical and magnetic measurements , Components for aerospace construction , Other semiconductor devices , Electrical equipment of ships and of marine structures , Nuclear energy engineering , Measurement of force, weight and pressure , Other electromechanical components , Electromechanical components in general , Aerospace electric equipment and systems , Aluminium products , Glass products .

The Chinese standard classification for "semiconductor standard" includes: Semiconductor discrete devices in general , Optoelectronic device assembly , Semimetal and semiconductor material in general , Special electronic technology material , Power semiconductor device and parts , Precious metals and their alloys , Connector , Metal physical property test method , Nuclear instrument and detector in general , Semimetal and semiconductor material analysis method , Basic standards and general methods , Industrial gas and chemical gas , Laser device , Semiconductor integrated circuit , Microcircuit in general , Semiconductor triode , Dedicated processing equipment , Electronic measurement and equipment in general , Electronic components , Microwave and millimeter wave diode and triode , Power generation, transformation and distribution equipment for vessel , Electronic industry production equipment in general , Nuclear detector , Electrical, observation/communication and navigation equipment for vessel in general , Technical management , Technical management , Technical management , Technical Management , Technical management , Technical management , Transformer , Industrial automation and control device in general , Technical management , Light metals and their alloys , Telephone communication equipment , Quartz glass , Thermal Measurement .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 43366-2023 General specification for discrete semiconductor devices of space application
  • GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
  • GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
  • GB/T 3430-1989 The rule of type designation for semiconductor integrated circuits
  • GB/T 5201-2012 Test procedures for semiconductor charged particle detectors
  • GB/T 8750-2007 Gold bonding wire for semiconductor devices
  • GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials
  • GB/T 11499-2001 Letter symbols for discrete semiconductor devices
  • GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
  • GB/T 14264-2009 Semiconductor materials - Terms and definitions
  • GB/T 8750-2014 Gold bonding wire for semiconductor package
  • GB/T 14140-2025 Test method for measuring diameter of semiconductor wafer
  • GB/T 14264-2024 Terminology of semiconductor materials
  • GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
  • GB/T 29299-2012 General specification of semiconductor laser rangefinder
  • GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
  • GB/T 30116-2013 Requirements for Semiconductor Manufacturing Facility Electromagnetic Compatibility
  • GB/T 42974-2023 Semiconductor integrated circuits—Flash memory(FLASH)
  • GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices
  • GB/T 3859.4-2004 Semiconductor converter - Self-commutated semiconductor converters including direct d.c.converters
  • GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)
  • GB/T 13422-2013 Semiconductor converters—Electrical test methods
  • GB/T 45722-2025 Semiconductor devices—Constant current electromigration test
  • GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
  • GB/T 8750-2022 Gold-based bonding wire and bandlet for semiconductor package
  • GB/T 44375-2024 Requirements for load ports of 300mm semiconductor equipment
  • GB/T 31358-2015 General specification for semiconductor lasers
  • GB/T 31469-2015 Semiconductor materials cutting fluid
  • GB/T 22193-2008 Electrical installations in ships - Equipment - Semiconductor convertors
  • GB/T 34971-2017 Guide for gaseous effluent handling in semiconductor industry
  • GB/T 14548-2025 General specification for marine semiconductor convertors
  • GB/T 17950-2000 Semiconductor converter - Part 6: Application guide for the protection of semiconductor converters against overcurrent by fuses
  • GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
  • GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
  • GB/T 37031-2018 Semiconductor lighting terminology
  • GB/T 14844-1993 of semiconductor materials
  • GB/T 3859.2-1993 Semiconductor convertors Application guide
  • GB/T 15529-1995 Blank detail specification for LED numeric displays
  • GB/T 249-1989 The rule of type designation for discrete semiconductor
  • GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
  • GB/T 14113-1993 of packages for semiconductor integrated circuits
  • GB/T 20521.5-2025 Semiconductor Devices - Part 14-5: Semiconductor Sensors - PN Junction Semiconductor Temperature Sensors
  • GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
  • GB/T 8750-1997 Gold wire for semiconductor devices lead bonding
  • GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
  • GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification
  • GB/T 3859.1-1993 Semiconductor convertors—Specification of basic requirements
  • GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
  • GB/T 5839-1986 Rating systems for electronic tubes and semiconductor devise
  • GB/T 15872-1995 Power supply interface for semiconductor equipment
  • GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • GB/T 14844-2018 Designations of semiconductor materials
  • GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
  • GB/T 7581-1987 of outlines for semiconductor discrete devices
  • GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
  • GB/T 15872-2013 Power supply interface for semiconductor equipment
  • GB/T 13974-1992 methods for semiconductor device curve tracers
  • GB/T 20521.4-2025 Semiconductor Devices - Part 14-4: Semiconductor Sensors - Semiconductor Accelerometers
  • GB/T 2900.32-1994 Electrotechnical terminology - Power semiconductor device
  • GB/T 249-2017 The rule of type designation for discrete semiconductor devices
  • GB/T 14264-1993 Semiconductor materials-Terms and definitions

Military Standard of the People's Republic of China-General Armament Department

  • GJB 128-1986 Aerial photographic specification for military topographic mapping
  • GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
  • GJB 128B-2021 Semiconductor discrete device test methods
  • GJB 8120-2013 General specification for semiconductor optoelectronic module
  • GJB 33B-2021 General Specification for Semiconductor Discrete Devices
  • GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
  • GJB 3519-1999 General Specification for Semiconductor Laser Diodes
  • GJB 8119-2013 General specification for semiconductor optoelectronic device
  • GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
  • GJB 8121-2013 General specification for semiconductor optoelectronic assembly
  • GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
  • GJB 597B-2012 General specification for semiconductor integrated circuits
  • GJB 923B-2021 General Specification for Semiconductor Discrete Device Enclosures

Professional Standard - Electron

  • SJ 2220-1982 Semiconductor photocouplers in the Darlington transistor mode
  • SJ 1992-1981 Detail specification for N channel junction pair field-effect transistors,Type CS22
  • SJ 1990-1981 Detail specification for N channel junction pair field-effect transistors,Type CS20
  • SJ 2355.1-1983 General procedures of measurement for light-emitting deivces
  • SJ 2433-1984 Bonding sheet for semiconductor tubes
  • SJ 1979-1981 Detail specification for high frequency field-effect transistors,Type CS6
  • SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
  • SJ 20072-1992 Semiconductor discrete device-Detail specification for semiconductor opto-couplers for Type GH24,GH25 and GH26
  • SJ/T 10416-1993 Generic Apecification for chip for semiconductor discrete devices
  • SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
  • SJ 1487-1979 Detail specification for reverse blocking high-frequency thyristors
  • SJ 1975-1981 Detail specification for low frequency field-effect transistors,Type CS2
  • SJ/T 9533-1993 Grading standard of quality for semiconductor discrete devices
  • SJ 1978-1981 Detail specification for high frequency field-effect transistors,Type CS5
  • SJ/T 10424-1993 Glass powder for passivation packaging for use in semiconductor devices
  • SJ/Z 9021.1-1987 Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices
  • SJ/T 11395-2009 Semiconductor lighting terminology
  • SJ/T 11089-1996 Letter symbols for discrete semiconductor components
  • SJ 2558-1984 Detail specification for semiconductor light emitting numeric displays,Type SM1~18
  • SJ 909-1974 Detail specification for silicon voltage regulator diodes,Type 2CW50~149
  • SJ 1983-1981 Detail specification for low frequency low noise field-effect transistors,Type CS10
  • SJ 1977-1981 Detail specification for high frequency field-effect transistors,Type CS4
  • SJ 2750-1987 Outline dimensions for semiconductor laser diodes
  • SJ 50033/4-1994 Semiconductor discrete device-Detail specification for semiconductor red light emitting diodes for type GF111 of GP and GT classes
  • SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
  • SJ 50033/109-1996 Semiconductor optoelectronic devices - Detail specification for Types GJ903T and GJ9032T and GJ9034T semiconductor laser diodes
  • SJ 20642-1997 Semiconductor opto-electronic module-General specification for
  • SJ 1982-1981 Detail specification for high frequency field-effect transistors,Type CS9
  • SJ 1984-1981 Detail specification for low frequency low noise field-effect transistors,Type CS11
  • SJ 50033/3-1994 Semiconductor discrete device - Detail specification for semiconductor opto-couplers for type GH21, GH22 and GH23 of GP, GT and GCT classes
  • SJ/T 10414-2015 Solder for semiconductor device
  • SJ 1976-1981 Detail specification for low frequency field-effect transistors,Type CS3
  • SJ 1981-1981 Detail specification for high frequency field-effect transistors,Type CS8
  • SJ 2218-1982 Semiconductor photocouplers in the diode mode
  • SJ 2219-1982 Semiconductor photocouplers in the transistor mode
  • SJ/T 11397-2009 Phosphors for light emitting diodes
  • SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
  • SJ/T 10414-1993 Solder for semicoductor device
  • SJ 50033/5-1994 Semiconductor discrete device-Detail specification for semiconductor yellow light emitting diodes for type GF311 of GP and GT classes
  • SJ 910-1974 Detail specification for silicon voltage regulator diodes,Type 3DW50~202
  • SJ 1987-1981 Detail specification for low frequency low noise field-effect transistors,Type CS14
  • SJ 50033/6-1994 Semiconductor discrete device-Detail specification for semiconductor green light emitting diodes for type GF411 of GP and GT classes
  • SJ/T 10535-1994 Tungsten boat for semiconductor devices
  • SJ 20786-2000 General specification for semiconductor opto-electronic assembly
  • SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
  • SJ 1989-1981 Detail specification for Nchannel junction pair field-effect transistors,Type CS19
  • SJ 1980-1981 Detail specification for high frequency field-effect transistors,Type CS7
  • SJ/Z 9021.4-1987 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor devices
  • SJ 1985-1981 Detail specification for low frequency low noise field-effect transistors,Type CS12

Group Standards of the People's Republic of China

Guangdong Provincial Standard of the People's Republic of China

Professional Standard - Machinery

Fujian Provincial Standard of the People's Republic of China

Professional Standard - Aerospace

  • QJ 787-1983 Semiconductor Discrete Devices - Specifications for Screening
  • QJ 1908A-1998 Acceptance Uncovering Check Method of Semiconductor Devices
  • QJ 1511A-1998 Semiconductor Discrete Devices - Specifications for Acceptance
  • QJ 1908-1990 Acceptance decapsulation inspection method for semiconductor devices
  • QJ 1511-1988 Acceptance Specification for Semiconductor Devices

Professional Standard - Non-ferrous Metal

Professional Standard - Post and Telecommunication

  • YD 576-1992 Semiconductor rectifier equipments For telecommunications
  • YD/T 940-1999 Semiconductor arrester for The over-voltage protection of telecommunications installations

Shanghai Provincial Standard of the People's Republic of China

Professional Standard - Building Materials

Jiangsu Provincial Standard of the People's Republic of China

  • DB32/ 3747-2020 Pollutant Emission Standards for the Semiconductor Industry

National Metrological Verification Regulations of the People's Republic of China

Jiangxi Provincial Standard of the People's Republic of China

  • DB3603/T 4-2022 Technical specifications for the manufacture of semiconducting glazes for electric porcelain

Anhui Provincial Standard of the People's Republic of China

  • DB34/ 4294-2022 Discharge Standards for Water Pollutants in the Semiconductor Industry

Professional Standard - Railway

  • TB/T 2437-1993 Specifications for locomotive semi-conductor converters

Professional Standard - Aviation

  • HB 5831-1983 Technical Requirements of Semiconductor Diode and Triode for Aviation

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers

German Institute for Standardization

British Standards Institution (BSI)

Czech Standards Institute (UNMZ)

GCC Standardization Organization

  • GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

Standard Association of Australia (SAA)

  • AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors

International Electrotechnical Commission (IEC)

  • IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

Japan Electronics and Information Technology Industries Association

  • JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)