GB/T 45722-2025 in English

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Standard No:	GB/T 45722-2025
Document status:	VALID
Title in English:	Semiconductor devices—Constant current electromigration test
Title in Chinese:	半导体器件恒流电迁移试验
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2025-05-30
Implemented on:	2025-09-01
ICS Classification:	31.080.01-Semiconductor devices in general
Chinese Classification:	L40-Semiconductor discrete devices in general
Professional Classification:	GB-National Standard
Related Keywords:	general constant current electromigration test method current electromigration test scopethis document semiconductor devices constant test electromigration
Related Topics:	Electromigration Hengban Electromigration of indium

《GB/T 45722-2025半导体器件恒流电迁移试验》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。

Scope

This document describes the general constant current electromigration test method for metal interconnects, connecting via chains and contact chains.

More samples: GB 50021-2001(2009) JC/T 2453-2018 DL/T 5154-2012

Sample only — not a preview of GB/T 45722-2025

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