Electromigration

Electromigration, Total:8 items.

The international standard classification for "Electromigration" includes: Semiconductor devices in general , Geology. Meteorology. Hydrology .

The Chinese standard classification for "Electromigration" includes: Semiconductor discrete devices in general , Meteorology .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 45722-2025 Semiconductor devices—Constant current electromigration test

Professional Standard - Meteorology

• QX/T 72-2007 Determination of number size distribution of submicron particle by using Electrical Mobility Method

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

• IPC TM-650 5.5.4.8-1998 Test Coupon D - Resistance by Electromigration
• IPC TM-650 2.6.14A-1987 Resistance to Electromigration@ Polymer Solder Mask

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

• JEDEC JESD61A.01-2007 Isothermal Electromigration Test Procedure
• JEDEC JESD61A-2007 Isothermal Electromigration Test Procedure
• JEDEC JESD61-1997 Isothermal Electromigration Test Procedure

British Standards Institution (BSI)

• 08/30177255 DC BS EN 62415. Constant current electromigration test

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