Electromigration

Electromigration, Total:20 items.

The international standard classification for "Electromigration" includes: Geology. Meteorology. Hydrology .

The Chinese standard classification for "Electromigration" includes: Meteorology .

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Professional Standard - Meteorology

• QX/T 72-2007 Determination of number size distribution of submicron particle by using Electrical Mobility Method

IPC - Association Connecting Electronics Industries

• IPC TM-650 5.5.4.8-1998 Test Coupon D - Resistance by Electromigration
• IPC TM-650 2.6.14A-1987 Resistance to Electromigration@ Polymer Solder Mask

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

• JEDEC JESD61A.01-2007 Isothermal Electromigration Test Procedure
• JEDEC JESD61A-2007 Isothermal Electromigration Test Procedure
• JEDEC JESD61-1997 Isothermal Electromigration Test Procedure

SCC

• 08/30177255 DC BS EN 62415. Constant current electromigration test
• CEI EN 62415:2011 Semiconductor devices - Constant current electromigration test
• DANSK DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
• DIN IEC 62415 E:2008 Draft Document - Constant Current Electromigration Test (IEC 47/1954/CD:2008)

Danish Standards Foundation

• DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test

Association Francaise de Normalisation

• NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
• NF C80-201*NF EN 62415:2010 Semiconductor devices - Constant current electromigration test.

German Institute for Standardization

• DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010

CENELEC - European Committee for Electrotechnical Standardization

• EN 62415:2010 Semiconductor devices - Constant current electromigration test

Spanish Association for Standardization (UNE)

• UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

International Electrotechnical Commission (IEC)

• IEC 62415:2010 Semiconductor devices - Constant current electromigration test

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

• IPC TM-650 2.6.14.1-2000 Electrochemical Migration Resistance Test

British Standards Institution (BSI)

• BS EN 62415:2010 Semiconductor devices - Constant current electromigration test

Lithuanian Standards Office

• LST EN 62415-2010 Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

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