electron energy x-ray

electron energy x-ray, Total:300 items.

The international standard classification for "electron energy x-ray" includes: Optical equipment , Chemical analysis , Optical measuring instruments , Other standards related to analytical chemistry , IT applications in science , Nuclear energy in general , Electronic tubes , Measurement of electrical and magnetic quantities , Protection against crime , Radiation protection , Other standards related to nuclear energy , Non-destructive testing , Radiographic equipment , Analytical chemistry , Refractories .

The Chinese standard classification for "electron energy x-ray" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Computer application , Nuclear instrument and detector in general , Other electron tube , Chemistry , Integrated test system , Crime judging technology , Basic standards and general method , Ionizating Radiation Measurement , General nuclear instrument , Basic standards and general methods , Technical management , Medical radiographic equipment , Diagnostic standard for occupational diseases , Siliceous refractory .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
GB/T 25185-2010 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 19500-2025 Surface chemical analysis—General rules for X-ray photoelectron spectroscopic analysis method
GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 41105.3-2021 Non-destructive testing―Measurement and evaluation of the X-ray tube voltage―Part 3:Spectrometric method
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 15447-2008 Conversion method of absorbed doses in different materials irradiated by X γ rays and election beams
GB/T 32869-2016 Nanotechnologies-Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
GB/T 12079-2012 Measurements of the photoelectric properties for X-ray tubes
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 45772-2025 Surface chemical analysis—Electron spectroscopies—Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 12079-1989 Measurements of the photoelectric properties for X-ray tubes
GB/T 17723-1999 Surface composition analysis method of gold-plated products by EDX
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/Z 32490-2016 Surface chemical analysis--X-ray photoelectron spectroscopy--Procedures for determining backgrounds
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 15447-1995 Conversion method of absorbed doses in different materials irradiated by X 、 γ rays and electron beams
GB/T 43598-2023 Nanotechnology—Measurement for oxygen content and C/O of graphene powder—X-ray photoelectron spectroscopy
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 28633-2012 Surface chemical analysis—X-ray photoelectron spectroscopy—Repeatability and constancy of intensity scale
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Nuclear Industry

EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis

Group Standards of the People's Republic of China

T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy

Military Standard of the People's Republic of China-General Armament Department

GJB 5814-2006 Testing method of X-ray dose enhancement effect for military electronic devices

Professional Standard - Electron

SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
SJ/T 11096-1996 Measuring methods for medical X-ray television equipments

Professional Standard - Machinery

JB/T 14714-2024 Lithium-ion battery X-ray inspection equipment

Professional Standard - Public Safety Standards

GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 2338-2025 Forensic Science Tape Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis

Professional Standard - Medicine

YY/T 0829-2011 Characteristics and test methods for imaging system of positron emission and X-ray computed tomography

Professional Standard - Hygiene

WS/T 117-1999 Specification of estimation of eye lens dose from X、γ、β rays and electron beams

National Metrological Technical Specifications of the People's Republic of China

JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
JJF 1346-1990 ~

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

National Health Commission of the People's Republic of China

WS/T 837-2024 Performance Assurance Technical Guidelines for Positron Emission and X-ray Computed Tomography (PET/CT) Systems

Professional Standard - Commodity Inspection

SN/T 2003.5-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electrical and electronic equipment. Part 5: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy

Professional Standard - Ferrous Metallurgy

YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 16129:2020-01 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 6809-1:1976-09 Clinical dosimetry; therapeutical application of x-ray, gamma-ray and electron beams
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 15472:2019-09 Draft Document - Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 6845-1:1980 Test the protection performance of protective materials against X-rays and gamma rays X-rays up to 400 kV
DIN 51418-2:1996-09 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN ISO 15472 E:2019 Draft Document - Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 6809-4:2020-04 Clinical dosimetry - Part 4: X-ray therapy with X-ray tube voltages between 10 kV and 300 kV
DIN 51418-1 E:2007-07 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 54109-1:1964 Nondestructive testing of X-ray and gamma-ray image quality
DIN EN 61262-5:1995 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 5: Determination of the detective quantum efficiency (IEC 61262-5:1994); German version EN 61262-5:1994

British Standards Institution (BSI)

BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS 326:1928 Electrical performance of transformers for X-ray purposes
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS EN 100012:1996 Harmonized system of quality assessment for electronic components - Basic specification - X-ray inspection of electronic components
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS EN 62220-1-2:2007 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Determination of the detective quantum efficiency - Detectors used in mammography
BS ISO 4037-4:2019 Radiological protection. X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy-Calibration of area and personal dosemeters in low energy X reference radiation fi...
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS EN 60601-2-54:2010 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
BS EN 60601-2-54:2009 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy

International Organization for Standardization (ISO)

ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 18118:2024 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO/ASTM 51431:2016 Practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing
BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BH GSO ISO 19318:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction

American Society for Testing and Materials (ASTM)

ASTM E2108-25 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM STP 485-1971 Energy dispersive X-ray analysis
ASTM STP 485 Energy Dispersion X-Ray Analysis
ASTM E1015-90 Methods for reporting spectra in X-ray photoelectron spectroscopy
ASTM E2108-10 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E995-25 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1588-25 Standard Test Method for Primer Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM STP 349-1964 Symposium on X-ray and Electron Probe Analysis
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E2108-00 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM ISO/ASTM 51431-05 Standard Practice for Dosimetry in Electron Beam and X-Ray (Bremsstrahlung) Irradiation Facilities for Food Processing
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-24 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
OS GSO ISO 19318:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction

Gosstandart of Russia

GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
GOST R ISO/ASTM 51431-2012 Practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing
GOST 22091.1-1984 X-ray devices. The methods of measuring of heater current and heater voltage
GOST 23197-1978 X-ray acceleration cameras. General specifications
GOST 22091.13-1984 X-ray devices. The method of measuring of grid-cathode capacity
GOST R 59603-2021 Agricultural seeds. Methods of digital X-Ray
PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

Swedish Institute for Standards

SIS SS IEC 573:1986 X-ray equipment - Measurement of the conversion factor of electro-opticalX-ray image intensifiers
SIS SS-ISO 8963:1990 Dosimetry of X and γ reference radiations for radiation protection over the energy range from 8 keV to 1,3 MeV
SIS SS IEC 520:1989 X-ray equipment — Entrance fieldsizes of electrooptical X-ray image intensifiers
SIS SS IEC 463:1983 Nuclear instrumentation - Low energy X or gamma radiation portable exposure r?te meters and monitors for use in radiological protection
SIS SS IEC 858:1987 X-ray equipment - Determination of the image distortion of electro-optical X-ray image intensifiers
SIS SS IEC 572:1986 X-ray equipment - Determination ofthe luminance distribution of electro-optical X-ray image intensifiers

Korean Agency for Technology and Standards (KATS)

KS D ISO 15472-2025 Surface chemical analysis ― X-ray photoelectron spectrometers — Calibration of energy scales
KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D ISO 15472-2003(2018) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS A 4509-1991(1996) METHODS OF EVALUATION DOSE EQUIVALENT BY FILM BADGES FOR X-RAYS, GAMMA RAYS AND THERMAL NEUTRONS
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS A IEC 60532-2016(2021) Radiation protection instrumentation－Installed dose ratemeters, warning assemblies and monitors－X and gamma radiation of energy between 50 keV and 7 MeV
KS A 4446-2006(2016) Measuring devices for X－ray tube voltage
KS A 4446-2021 Measuring devices for X－ray tube voltage
KS A 4446-2006(2021) Measuring devices for X－ray tube voltage
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15470-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS A 4919-1994 General requirements for personal X-ray and γ-ray dosemeters
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS A 4702-1997(2012) Capacitor discharge X- ray apparatus for chest indirect radiography
KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
KS M ISO 8754-2019 Petroleum products－Determination of sulfur content－Energy dispersive X－ray fluorescence method
KS D ISO 19318-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS M ISO 8754:2016 Petroleum products－Determination of sulfur content－Energy dispersive X－ray fluorescence method
KS C 3612-2008 High tension cables for X-ray apparatus
KS M ISO 8754:2019 Petroleum products－Determination of sulfur content－Energy dispersive X－ray fluorescence method
KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS A 4922-2005 Calibration phantom for X- and γ -ray personal dosimeters
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS A ISO 4037-1-2003(2018) Determination of response as a function of photon energy and X, gamma reference radiation for fixing dosimeters and dosimeters - Part 1: Radiation properties and methods of occurrence

Japanese Industrial Standards Committee (JISC)

JIS Z 4302:2002 Gamma-ray and hard X-ray film badges
JIS Z 4302:1997 Gamma-ray and hard X-ray film badges
JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
JIS Z 4716:2018 Measurement methods of leakage X-ray from X-ray examination rooms
JIS Z 4921:1994 Measuring devices for X-ray tube voltage
JIS Z 4503:1989 Methods of evaluating dose equivalent by film badges for gamma rays and hard X-ray
JIS Z 4328:1984 Radiation survey meters for X and gamma rays
JIS Z 4301:1997 X-ray film badges
JIS Z 4301:2002 X-ray film badges
JIS Z 4308:1991 Direct reading personal dosemeters for X and gamma radiation
JIS Z 4312:1990 Personal alarm dosemeters for X-rays and gamma-rays

Association Francaise de Normalisation

NF M60-513:1990 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY. PHOTON REFERENCE RADIATIONS AT ENERGIES BETWEEN 4 MEV AND 9 MEV.
NF M60-512:1984 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY.
NF M60-522:1998 X and gamma radiation. Indirect- or direct-reading capacitor-type pocket dosemeters.
NF M60-512-1:1998 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy. Part 1 : radiation characteristics and production methods.
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF EN 61676/A1:2009 Electromedical devices - Dosimetry instruments for non-invasive measurement of X-ray tube voltage in diagnostic radiology
NF EN IEC 61676:2023 Electromedical devices - Dosimetry devices for non-invasive measurement of X-ray tube voltage in diagnostic radiology
NF M07-053:1995 Petroleum products. Determination of sulfur content. Energy-dispersive-X-ray fluorescence method.
NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF S92-502:2013 Laboratory of medical biology - Anthroporadiometric measurements - Lungs - Measurement of X-ray and gamma-ray emissions of energy less than 200 keV
NF M60-512-2:2000 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Part 2 : dosimetry for radiation protection over the energy ranges 8 keV to 1,3 MeV and 4 MeV to 9 MeV.
NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
NF A09-230-1:1999 Non-destructive testing. Measurement and evaluation of the X-ray tube voltage. Part 1 : voltage divider method.

GCC Standardization Organization

GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 4037-4:2015 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy -- Part 4: Calibration of area and personal dosemeters in low energy X reference radiation fields
GSO ISO/TR 18392:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
GSO ISO/TS 10798:2013 Nanotechnologies -- Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO 15470:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
GSO IEC 61526:2015 Radiation protection instrumentation - Measurement of personal dose equivalents Hp(10) and Hp(0,07) for X, gamma, neutron and beta radiations - Direct reading personal dose equivalent meters
GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Austrian Standards

ONORM S 5233-1987 Dosimeters for use in radiotherapy with ionization Chambers forX-rays, y -rays and electron beams
ONORM S 5232-1983 Radiation protection dosimeters; warning dosimeters for y- and x-rays
ONORM S 5240-10-1998 Image quality assurance in X-ray diagnosis - Acceptancetesting in radiographic and fluoroscopic X-ray Systems

Standard Association of Australia （SAA）

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

German Welding Society

DVS 3205:2017-01 Protection from X-rays on electron beam machines for material processing
DVS 3205:2010-05 X-ray protection requirements in electron beam material processing

Electronic Components, Assemblies and Materials Association

ECA TEP 170-1972 X-Radiation Detection and Measurements for Microwave Tubes, Recommended Practice on

American National Standards Institute （ANSI)

ANSI N43.3-2008 General Radiation Safety - Installations Using Non-Medical X-Ray and Sealed Gamma-Ray Sources, Energies Up to 10 MeV
ANSI N43.3-1993 American National Standard for General radiation safety - Installations using Non-Medical X-ray and Sealed Gamma-Ray Sources, Energies Up To 10 MeV
ANSI/EIA 500-A:1989 Measurement of X-Radiation from Projection Cathode Ray Tubes, Recommended Practice for

International Atomic Energy Agency

SSG-8-2010 Radiation Safety of Gamma@ Electron and X Ray Irradiation Facilities

American Water Works Association (AWWA)

AWWA 51768 Identification of Low Pressure Reverse Osmosis Membrane Failure by X-Ray Photoelectron Spectroscopy

Danish Standards Foundation

DS/EN 100012:1995 Basic Specification: X-ray inspection of electronic components
DS/EN ISO 8754:1995 Petroleum products - Determination of sulfur content - Energy-dispersive-X-ray fluorescence method

American Nuclear Society (ANS)

6.1.1-1991 Neutron and Gamma-Ray Fluence-to-Dose Factors

Association of German Mechanical Engineers

DVS 3205-1992 X-ray protection for materials processing electron beam machines
DVS 3205-2010 Protection from X rays in electron beam machines for materials processing
DVS 3205-1993 X-ray protection for materials processing electron beam machines
VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors

Portuguese Institute of Quality

NP 3080-1985 Electronic component. X-ray inspection, basic specifications

Association for Electrical, Electronic & Information Technologies (VDE)

VDE 0412-4037-4-2019*DIN ISO 4037-4:2019 Radiation protection - X-ray and gamma-ray reference radiation fields for the calibration of dosimeters and dose rate measuring equipment and their response as a function of photon energy - Part 4: Calibration of area and personal dosimeters in low-energy

European Committee for Electrotechnical Standardization（CENELEC）

EN 100012:1995 Basic Specification: X-Ray Inspection of Electronic Components

Society of Automotive Engineers (SAE)

SAE J784A_197108 Residual Stress Measurement by X-Ray Diffraction
SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction
SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition

Lithuanian Standards Office

LST EN 100012-2001 Basic specification: X-ray inspection of electronic components

US Federal Contractor Registration (USFCR)

FCR FED HANDBOOK 57-1954 PHOTOGRAPHIC DOSIMETRY OF X- AND GAMMA RAYS
FCR FED H-08-4 VOL 1 65B-1981 BINS, X-RAY FILM STORAGE TYPE 9

Comitato Elettrotecnico Italiano

CEI EN IEC 62220-2-1:2025 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 2-1: Determination of dual-energy subtraction efficiency - Detectors used for dual-energy radiographic imaging

Bureau of Indian Standards

IS 8441-1977 Measurement method of X-radiation incident on electron tubes
IS 16880-2018 Practice for Dosimetry in Electron Beam and X-Ray (Bremsstrahlung) Irradiation Facilities for Food Processing
IS 1885 Pt.4/Sec.2-1973 Electrician's Glossary Part IV Electron Tubes Section 2: X-Ray Tubes
IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers

Ente Nazionale Italiano di Unificazione

UNI EN ISO 8754:1996 Petroleum products. Determination of sulfur content.. Energy-dispersive-X- ray fluorescence method.

COMMISSION FOR THE STANDARDS, METROLOGY AND QUALITY OF VIETNAM (STAMEQ)

TCVN 7249-2008 Standard practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing

Australian/New Zealand Standard (AU-AS/NZS)

AS/NZS 3200.2.44:2000 Medical electrical equipment - Particular requirements for safety - X-ray equipment for computed tomography

National Electrical Manufacturers Association（NEMA)

NEMA XR 9-1984(2000) X-Ray Machine Power Supply Guide