GB/T 28632-2012 in English
VALIDSurface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- Issued on:2012-07-31
- Implemented on:2013-02-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$321.00
《GB/T 28632-2012表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率测定》由TC38(全国微束分析标准化技术委员会)归口,TC38SC2(全国微束分析标准化技术委员会表面化学分析分会)执行,主管部门为国家标准化管理委员会。
Scope
This standard specifies the method for measuring the lateral resolution of Auger electron spectrometer and X-ray photoelectron spectrometer under three conditions. The straight-edge method is suitable for instruments with expected lateral resolutions greater than 1 µm. The grid method is suitable for instruments whose lateral resolution is expected to be greater than 20nm and less than 1μm. The Golden Island rule applies to instruments with expected lateral resolutions less than 50nm. Appendix A, Appendix B and Appendix C give examples of band diagrams for measuring lateral resolution.

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