Spectral Energy Analysis

Spectral Energy Analysis, Total:351 items.

The international standard classification for "Spectral Energy Analysis" includes: Chemical analysis , Other standards related to analytical chemistry , Chemical laboratories. Laboratory equipment , Optical measuring instruments , Metrology and measurement. Physical phenomena (Vocabularies) , Nickel, chromium and their alloys , Particle size analysis. sieving , Aluminium and aluminium alloys , Analytical chemistry in general , Metalliferous minerals , Other non-ferrous metals and their alloys , Corrosion of metals , Materials for aluminium production , Cadmium, cobalt and their alloys , Copper and copper alloys , Non-ferrous metals , Textiles in general , Chemical analysis of metals .

The Chinese standard classification for "Spectral Energy Analysis" includes: Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Basic standards and general methods , Heavy metals and their alloys analysis method , Sieving, Sieve Plate and Sieve Screen , Heavy metal ore , Rare metals and their alloys analysis method , Basic standards and general methods , Technical Management , Precious metals and their alloys , Metallurgy material and auxiliary material in general , Metal physical property test method , Light metals and their alloys , chromatograph , Light metals and their alloys analysis method , Ionizating Radiation Measurement .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 5123-1985 Nickel-Method of spectral analysis
GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
GB/T 32198-2015 Standard practice for general techniques of infrared quantitative analysis
GB/T 5871-1986 Method for spectrographic analysis of aluminium and its alloys
GB/T 9259-1988 Terminology of emission spectochemical analysis
GB/T 8152.11-2006 Methods for chemical analysis of lead concentrates - Determination of mercury content - Atomic fluorescence spectrometer method
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 29858-2013 Standard guidelines for molecular spectroscopy multivariate calibration quantitative analysis
GB/T 19627-2005 Particle size analysis--Photon correlation spectroscopy
GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 15244-2013 Microbeam analysis—Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
GB/T 17359-2023 Microbeam analysis—Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 8151.15-2005 Methods for chemical analysis of zinc concentrates-Determination of mercury content-Atomic fluorescence spectrometry method
GB/T 16599-1996 Methods for emission spectrum analysis of molybdenum

工业和信息化部/国家能源局

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer

Professional Standard - Nuclear Industry

EJ/T 903.6-1994 Scintillator Performance Measurement Method Emission Spectroscopy
EJ/T 633-1992 Tube Excitation Energy Dispersive X-ray Fluorescence Analyzer

Taiwan Provincial Standard of the People's Republic of China

CNS 10006-1984 Method for Photoelectric Emission Spectrochemical Analysis of Iron And Steel
CNS 12416-1988 Genenral Rules for Emission Spectroscopic Analysis
CNS 12013-1987 Method of Test for Lead in Gasoline by Atomic Absorption Spectrometry
CNS 14341-1999 Optical spectrum analyzer
CNS 14896.14-2005 Titanium - Method for atomic emission spectrometric analysis
CNS 14896-14-2005 Titanium - Method for atomic emission spectrometric analysis
CNS 12416-2006 General rules for atomic emission spectrometry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 32997-2016 Surface chemical analysis―General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

Professional Standard - Electron

SJ/Z 3206.2-1989 Laser source and its performance requirements for determination of emision spectrum
SJ 2657-1986 Mothod of molybdeuum spectral analysis
SJ/Z 3206.11-1989 General rules for analysis of quantities of emision spectrum
SJ 2656-1986 Method for defermination of Tungsten by spectrometry
SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum

Group Standards of the People's Republic of China

T/SCS 000022-2024 Molybdenum alloys – Analysis of trace elements – Glow discharge mass spectrometry method
T/ZFB 0050-2023 Textiles—Quantitative analysis of Polyester-cotton blended fabric—Hyperspectral method
T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
T/QGCML 4229-2024 Spectral multi-source data analysis software
T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy

Professional Standard - Petroleum

SY/T 6189-2018 Quantitative analysis method for rock minerals by X-ray energy spectrum (EDS)
SY/T 6189-1996 Quantitative Analysis of Energy Spectra for Minerals in Rocks

Professional Standard - Non-ferrous Metal

YS/T 581.18-2012 Chemical analysis methods and physical properties of Aluminum Fluoride—Part 18:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
YS/T 84-2006 Basis iridium as spectral analysis
YS/T 536.7-2009 Methods for chemical analysis of bismuth—Determination of arsenic content—Atomic fluorescence spectrometric method
YS/T 84-1994 Iridium matrix for spectroscopic analysis
YS/T 536.11-2009 Method for chemical analysis of bismuth - Determination of mercury content - Atomic fluorescence spectrometric method
YS/T 555.4-2009 Methods for chemical analysis of molybdenum concentrate—Determination of tin content—Atomic fluorescence spectrometry
YS/T 83-2006 Basis palladium as spectral analysis
YS/T 631-2007 Methods for analysis of zinc-the optical emission spectrometry
YS/T 82-2006 Basis platinum as spectral analysis
YS/T 558-2006 Methods for emission spectrum analysis of molybdenum
YS/T 273.15-2012 Chemical analysis methods and physical properties of cryolite—Part 15:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
YS/T 581.16-2008 Chemical analysis methods and determination of physical performance of industrial aluminium fluoride Part 16:X-ray fluorescence spectrometric method for the determination of elements
YS/T 82-1994 Platinum substrates for spectroscopic analysis
YS/T 558-2009 Methods for emission spectrum analysis of molybdenum
YS/T 83-1994 Palladium Matrix for Spectroscopic Analysis
YS/T 559-2009 Methods for emission spectrum analysis of tungsten
YS/T 85-2006 Basis rhodium as spectral analysis
YS/T 273.14-2008 Chemical analysis methods and determination of physical performance of synthetic cryolity Part 14:X-ray fluorescence spectrometric method for the determination of elements content
YS/T 85-1994 Rhodium Matrix for Spectroscopic Analysis
YS/T 581.10-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 10: Determination of sulphur content by X-ray fluorescence spectrometric method
YS/T 872-2023 Methods for chemical analysis of gallium—— Determination of mercury and arsenic—— Atomic fluorescence spectrometer analytical method
YS/T 273.11-2006 Chemical analysis methods and physical properties of cryolite - Part 11: Determination of sulphur content by X-ray fluorescence spectrometric method

Professional Standard - Education

JY/T 002-1996 General rules for laser raman spectrum analysis
JY/T 0573-2020 General rules for laser Ramanspectrum analysis
JY/T 0566-2020 General rules for atomic fluorescence spectrometry
JY/T 0571-2020 General rules for fluorescence spectrometry

工业和信息化部

YS/T 581.15-2012 Methods for chemical analysis and determination of physical properties of aluminum fluoride Part 15: Determination of elemental content by X-ray fluorescence spectrometry (tablet pressing) method
YS/T 82-2020 Platinum matrix for spectral analysis
YS/T 84-2020 Iridium matrix for spectral analysis
YS/T 85-2020 Rhodium matrix for spectral analysis
YS/T 83-2020 Palladium matrix for spectral analysis

National Metrological Verification Regulations of the People's Republic of China

JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers

Professional Standard - Textile

FZ/T 01144-2018 Textiles-Quantitative analysis of fiber-Near-infrared spectroscopy method

Professional Standard - Aviation

HB 7716.5-2002 Spectrometric analysis of titanium alloys Part 5: Determination of trace molybdenum content -- Flame atomic absorption spectrometric method
HB 7716.10-2002 Spectrometric analysis of titanium alloys Part 10: Determination of trace manganese content -- Flame atomic absorption spectrometric method
HB 5219.3-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Copper Content with Atomical Absorption Spectrometry Method
HB 5219.5-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Iron Content with Atomical Absorption Spectrometry Method
HB 6731.2-1993 Determination of Magnesium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 5219.11-1998 Methods for Chemical Analysis of Magnesium Alloy- Determination of Nickel Content Through Atomical Absorption Spectrometry
HB 5219.8-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Manganese Content with Atomical Absorption Spectrometry Method
HB 7716.8-2002 Spectrometric analysis of titanium alloys Part 8: Determination of trace copper content -- Flame atomic absorption spectrometric method
HB 5219.13-1998 Methods for Chemical Analysis Ofmagnesium Alloy - Determination of Zinc Content Through Atomical Absorption Spectrometry
HB 5219.20-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Silver Content with Atomical Absorption Spectrometry Method

National Metrological Technical Specifications of the People's Republic of China

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

Professional Standard - Electricity

DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

SCC

BS ISO 22309:2006 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS)
VDI/VDE 2631 BLATT 11-2020 Shape measurement technology - spectral analysis (Fourier analysis, harmonic analysis)
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
BS EN 61290-1-1:1998 Optical spectrum analyzer
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
CEI EN 62129:2006 Calibration of optical spectrum analyzers
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS 1121B:1953 Spectrographic analysis of low alloy steel

Korean Agency for Technology and Standards (KATS)

KS D ISO 22309-2011(2016) Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D ISO 22309-2011(2021) Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D ISO 22309-2021 Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 22309:2011 Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS M 0028-2009(2019) General rules for light emission spectrochemical analysis
KS D 1682-2008 Methods for emission spectrochemical analysis of lead ingot
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D 1681-2003 Method for emission spectrochemica1 analysis of aluminium ingot
KS D 1653-1991 Method of spectrochemica analysis
KS D 1684-2008 Methods for emission spectrographic analysis of magnesium ingot
KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 3815-2011 Zinc and zinc alloys－Spectrographic analysis
KS D 2086-2004 Method for atomic emission spectrometric analysis of titanium
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 3815-2002(2006) Zinc and zinc alloys－Spectrographic analysis
KS M 0028-2019 General rules for light emission spectrochemical analysis
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
KS D ISO 3815:2011 Zinc and zinc alloys－Spectrographic analysis
KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS D 2558-1995 Method for emission spectrographic analysis of tantalum
KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
KS D 2553-2015 Tantalum－Method for atomic absorption spectrometric analysis
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis

International Organization for Standardization (ISO)

ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 22309:2011 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 13321:1996 Particle size analysis - Photon correlation spectroscopy
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 3815:1976 Zinc and zinc alloys; Spectrographic analysis
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO 18118:2024 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis

GSO

GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
BH GSO ISO 13321:2016 Particle size analysis -- Photon correlation spectroscopy
GSO ISO 13321:2013 Particle size analysis -- Photon correlation spectroscopy
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
OS GSO ISO 22309:2015 Microbeam analysis -- Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 11505:2017 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
GSO ISO 22309:2015 Microbeam analysis -- Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
OS GSO ISO 11505:2015 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis

Association Francaise de Normalisation

NF X11-672:1996 Particle size analysis. Photon correlation spectroscopy.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF X21-004*NF ISO 22309:2012 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above.
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF C93-845:2006 Calibration of optical spectrum analyzers.
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF ISO 22309:2012 Microbeam Analysis – Quantitative elemental analysis by energy selective spectrometry (EDS) of elements having an atomic number of 11 (Na) or greater
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF A06-590:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis.
NF EN 62129-1:2016 Calibration of wavelength measuring devices/optical frequency measuring devices - Part 1: optical spectrum analyzers
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF A07-510X2:1975 ANALYSIS OF NON-ALLOYED ALUMINIUM BY EMISSION SPECTROGRAPHY.
NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.

Japanese Industrial Standards Committee (JISC)

JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis

RO-ASRO

STAS 1706/17-1971 CUPPER speelrochemical analysis
STAS 11464-1980 IRON AND STEEL Spectrochemical analysis
STAS 5177-1981 EMISSION SPECTROGRAPHICAL ANALYSIS Terminology

Standard Association of Australia （SAA）

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS 4549.1:1999 Particle size analysis - Photon correlation spectroscopy
AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

British Standards Institution (BSI)

BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 22309:2011 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS EN 12019:1998 Zinc and Zinc Alloys - Optical Emission Spectrometric Analysis

American Society for Testing and Materials (ASTM)

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E168-92 Standard Practice for General Techniques of Infrared Quantitative Analysis
ASTM E1508-98(2003) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-98 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-12a(2019) Standard guide for quantitative analysis using energy dispersive spectroscopy
ASTM E1508-98(2008) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-12 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-12a Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM D5839-96(2001) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM D5839-96(2006) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM D5839-15(2023) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM C1255-93(2005) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-11 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-18 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-93(1999) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM D5839-15 Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM F1375-92(2005) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D5839-96 Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems

KR-KS

KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D 1655-2008(2024) Method for X-ray fluorescence spectrometric analysis of iron and steel

South African Bureau of Standard

SANS 5567:1968 Spectrographic analysis of copper
SANS 62129:2008 Calibration of optical spectrum analyzers

BR-ABNT

ABNT P-EB-304-1969 "Spectral Analysis" Standard

RU-GOST R

GOST 12223.0-1976 Iridium. Method of spectral analysis
GOST 14316-1991 Molybdenum. Spectrum analysis methods
GOST 14339.5-1991 Tungsten. Methods of spectral analysis
GOST 12227.0-1976 Rodium. Method of spectral analysis
GOST 8776-1979 Cobalt. Methods of chemical-atomic-emission spectral analysis
GOST 8776-1999 Cobalt. Methods of chemical-atomic-emission spectral analysis
GOST 8857-1977 Lead. Method of spectral analysis
GOST 16274.8-1977 Bismuth. Spectral methods of analysis
GOST 15483.10-2004 Tin. Methods of atomic-emission spectral analysis
GOST 27611-1988 Cast iron. Photoelectrical sspeciral method of analisis
GOST 12228.1-1978 Ruthenium. Method of spectral analysis
GOST 22397-1977 Zinc powder. Method of spectral analysis
GOST 18895-1981 Steel. Method of photoelectric spectral analysis
GOST 30508-1997 Lead concentrates. Method of spectrum analysis
GOST 17261-1977 Zinc. Spectral method of analysis
GOST 17818.15-1990 Graphite. Method of spectrum analysis
GOST 15483.10-1978 Tin. Spectral methods for determination of bismuth, iron, copper, arsenic, lead, antimony, zinc and aluminium
GOST 18895-1997 Steel. Method of photoelectric spectral analysis
GOST 3221-1985 Primary aluminium. Methods of spectral analysis
GOST 7728-1979 Magnesium alloys. Methods of spectral analysis
GOST 7727-1981 Aluminium alloys. Methods of spectral analysis
GOST 12224.1-1978 Osmimum. Chemical-spectral method of analysis
GOST 1367.1-1983 Antimony. Spectral method for the determination of impurities without preliminary concentration
GOST 1367.11-1983 Antimony. Chemical-spectral method of analysis
GOST 13348-1974 Antimonous antimonides. Method of spectral analysis
GOST 23328-1995 Zinc alloys. Methods of spectral analysis
GOST 23328-1978 Zinc antifriction alloys. Methods of spectral analysis
GOST 7.28-1980 System of standards "information, libraries and publishing". Representation of extended Latin alphabet for information interchange on magnetic tapes
GOST 23902-1979 Titanium alloys. Methods of spectral analysis
GOST 12551.2-1982 Alloys platinum-copper. Methods of spectral analysis
GOST 16273.1-1985 Technical selenium. Method of spectral analysis
GOST 30082-1993 Zinc-aluminium alloys. Spectral method of analysis
GOST 27809-1988 Steel and cast iron. Methods of spectropgapnic analysis
GOST 9816.4-1984 Technical tellurium. Method of spectral analysis
GOST 12554.2-1983 Platinum-ruthenium alloys. Method of spectral analysis
GOST 16321.2-1970 Silver-copper alloys. Method of spectral analysis
GOST 12555.2-1983 Silver-platinum alloys. Method of spectral analysis
GOST 12558.2-1978 Palladium-silver alloys. Method of spectral of analysis
GOST 12562.2-1982 Alloys gold-platinum. Methods of spectral analysis
GOST 27809-1995 Cast iron and steel. Methods of spectrographic analysis
GOST 12556.2-1982 Alloys platinum-rhodium. Methods of spectral analysis
GOST 12553.2-1977 Platinum-palladium alloys. Method of spectral of analysis
GOST 12563.2-1983 Gold-palladium alloys. Method of spectral analysis
GOST R 55080-2012 Cast iron. Method of X-ray fluorescence (XRF) analysis
GOST 12550.2-1982 Palladium-iridium alloys. Methods of spectrografic analysis
GOST 16274.1-1977 Bismuth. Method of spectrochemical analysis

German Institute for Standardization

DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 22309 E:2015-05 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 22309:2015-11 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011)
DIN ISO 22309:2015 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011)
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 13321:2004 Particle size analysis - Photon correlation spectroscopy (ISO 13321:1996)
DIN ISO 11505:2018-02 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers
PREN 14726-2003 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis
EN 14726:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis

Danish Standards Foundation

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers

International Electrotechnical Commission (IEC)

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers

IN-BIS

IS 7658-1975 Spectral analysis method of aluminum

SE-SIS

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

European Committee for Electrotechnical Standardization（CENELEC）

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers

CEN - European Committee for Standardization

EN 14726:2019 Aluminium and aluminium alloys - Determination of the chemical composition of aluminium and aluminium alloys by spark optical emission spectrometry

Spanish Association for Standardization (UNE)

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 12019:1998 ZINC AND ZINC ALLOYS. OPTICAL EMISSION SPECTROMETRIC ANALYSIS.

GOSTR

GOST R 57987-2017 Polymer composites. Infrared spectroscopy. Multivariate quantitative analysis