Photoelectron spectroscopy sample preparation

Photoelectron spectroscopy sample preparation, Total:77 items.

The international standard classification for "Photoelectron spectroscopy sample preparation" includes: Measurement of electrical and magnetic quantities , Chemical analysis , IT applications in science , Optical measuring instruments , Analytical chemistry .

The Chinese standard classification for "Photoelectron spectroscopy sample preparation" includes: Integrated test system , Basic standards and general methods , Computer application , Electron optics and other physical optics instrument , Basic standards and general methods .

Professional Standard - Electron

SJ/Z 3206.8-1989 Geneeral rules for preparation of standard sample for spectrum analysis
SJ/Z 3206.7-1989 Geneeral rules for preparation and sampling sample for emission spectrum analysis
SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 31472-2015 Standard guide to charge control and charge referencing techniques in X-ray photoelectron spectroscopy
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

Group Standards of the People's Republic of China

T/CAIA SH004-2015 Rice-Determination of cadmium-Solid sampling electrothermal vaporization atomic fluorescence spectrometry

Korean Agency for Technology and Standards (KATS)

KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction

British Standards Institution (BSI)

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale

International Organization for Standardization (ISO)

ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

GSO

OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale

American Society for Testing and Materials (ASTM)

ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM B982-12 Standard Specification for Sampling and Sample Preparation of Lead and Lead Alloys for Optical Emission Spectrometric OR ICP Analysis
ASTM B982-14 Standard Specification for Sampling and Sample Preparation of Lead and Lead Alloys for Optical Emission Spectrometric or ICP Analysis
ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM B982-14e1 Standard Specification for Sampling and Sample Preparation of Lead and Lead Alloys for Optical Emission Spectrometric or ICP Analysis
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-24 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy

SCC

BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
CIE 076-1988 Intercomparison on measurement of (total) spectral radiance factor of luminescent specimens

Standard Association of Australia （SAA）

AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS 2611:1983 Lead and lead alloys - Sampling and preparation of solid samples for optical emission spectrometry
AS 2612:1983 Aluminium and aluminium alloys - Sampling and preparation of solid samples for optical emission spectrometry

RO-ASRO

STAS 2015/2-1985 CAST IRONS AND STEELS Sampling and samples prcparation for spectral analysis

GOSTR

GOST 9717.2-2018 Copper. Method of spectral analysis by metal standard specimens with photographic registration of spectrum
GOST 9716.2-1979 Copper-zinc alloys. Method spectral analysis of metal standard spesimens with photoelectric registration of spectrum

RU-GOST R

GOST 9717.2-1982 Copper. Method of spectral analysis of metal standart specimens with photographic registration of spectrum