Electron Spectroscopy

Electron Spectroscopy, Total:212 items.

The international standard classification for "Electron Spectroscopy" includes: Chemical analysis , IT applications in science , Optical measuring instruments , Analytical chemistry , Measurement of electrical and magnetic quantities , Analytical chemistry in general , Optical equipment , Electronic components in general , Chemical laboratories. Laboratory equipment , Particle size analysis. sieving , Ferroalloys , Chemical technology (Vocabularies) , Education , Cadmium, cobalt and their alloys .

The Chinese standard classification for "Electron Spectroscopy" includes: Basic standards and general methods , Computer application , Electron optics and other physical optics instrument , Basic standards and general methods , Integrated test system , Electrochemical, thermochemistry and optical profile type analyzer , Magnifier and microscope , Electronic element in general , Sieving, Sieve Plate and Sieve Screen , Steel and iron alloy analysis method , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Special instruments for teaching , Heavy metals and their alloys analysis method , Hygiene, safety and labor protection , Fuel oil .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 8322-2008 Molecular absorption spectrometry - Terminology
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/Z 32490-2016 Surface chemical analysis--X-ray photoelectron spectroscopy--Procedures for determining backgrounds
GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 35158-2017 Verification method for Auger electron spectrometers
GB/T 29783-2013 Determination of chromium(Ⅵ) in electrical and electronic products—Atomic fluorescence spectrometry
GB/T 7731.14-2008 Ferrotungsten - Determination of lead content - The polarographic method and inductively coupled plasma-atomic emission spectrometry
GB/T 31472-2015 Standard guide to charge control and charge referencing techniques in X-ray photoelectron spectroscopy
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 19500-2025 Surface chemical analysis—General rules for X-ray photoelectron spectroscopic analysis method
GB/T 44147-2024 The method of performance testing for liquid chromatography coupled atomic fluorescence spectrometer
GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 8322-1987 Molecular absorption spectrometry--Terminology
GB/T 45772-2025 Surface chemical analysis—Electron spectroscopies—Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 21191-2007 Atomic fluorescence spectrometer
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
GB/T 28893-2024 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
GB/T 19627-2005 Particle size analysis--Photon correlation spectroscopy
GB/T 42027-2022 Gas-phase molecular absorption spectrometer
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 30702-2014 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
GB/T 43847-2024 Optics and photonics—Spectral bands

Professional Standard - Electron

SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

Group Standards of the People's Republic of China

T/CAIA YQ004-2018 Performance testing method for liquid chromatograph coupled with atomic fluorescence spectrometer
T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
T/ZSA 39-2020 Characterization of Graphene - Work function - Ultraviolet photoelectron spectroscopy (UPS) method
T/ZGIA 002-2020 Graphene Test Methods Determination of Work Function Ultraviolet Photoelectron Spectroscopy
T/CSTM 00962-2022 Evaluation method for spectrometer performance of spark discharge atomic emission

Professional Standard - Agriculture

776兽药典二部-2015 Appendix Contents 0400 Spectroscopy 0412 Inductively Coupled Plasma Atomic Emission Spectrometry
72药典四部-2015 0411 Inductively coupled plasma atomic emission spectrometry
52药典四部-2020 0411 Inductively coupled plasma atomic emission spectrometry
781兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0412 Inductively Coupled Plasma Mass Spectrometry
775兽药典二部-2015 Appendix Contents 0400 Spectroscopy 0411 Inductively Coupled Plasma Mass Spectrometry
780兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0411 Inductively Coupled Plasma Atomic Emission Spectrometry

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 09-1992 Verification Regulations for Electron Spectrometer
JJG(教委) 013-1996 Verification Regulations for Electron Spectrometer

Professional Standard - Education

JY/T 013-1996 General rules for electron spectroscopic analysis
JY/T 0565-2020 General rules for electrothermal atomic absorption spectrometry

Taiwan Provincial Standard of the People's Republic of China

CNS 12416-2006 General rules for atomic emission spectrometry
CNS 14896.14-2005 Titanium - Method for atomic emission spectrometric analysis
CNS 14896-14-2005 Titanium - Method for atomic emission spectrometric analysis

Professional Standard - Non-ferrous Metal

YS/T 536.4-2009 Methods for chemical analysis of bismuth - Determination of silver content - Flame atomic absorption spectrophotometric method and electrothermal atomic absorption spectrometric method

Military Standard of the People's Republic of China-General Armament Department

GJB/Z 49.1A-2013 Military electronic components series type spectrum optical cable
GJB/Z 48.1A-2011 Series programmes for military electronic components and devices Optical fibres

Professional Standard - Commodity Inspection

SN/T 2004.1-2005 Determination of mercury in electrical and electronic equipment - Part 1: Hydride generation-atomic fluorescence spectrometric method

Jilin Provincial Standard of the People's Republic of China

DB22/T 1985-2013 Determination of Inorganic Arsenic in Feed by Liquid Chromatography-Atomic Fluorescence Spectrometry

Professional Standard - Petrochemical Industry

SH/T 0706-2001 Petroleum products-Determination of aluminium and silicon in fuel oils-Inductively coupled plasma emission and atomic absorption spectroscopy methods

Shandong Provincial Standard of the People's Republic of China

DB37/T 4090-2020 Determination of Inorganic Arsenic in Cosmetics by Liquid Chromatography-Atomic Fluorescence Spectrometry

American Society for Testing and Materials (ASTM)

ASTM E1015-90 Methods for reporting spectra in X-ray photoelectron spectroscopy
ASTM E995-25 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E2108-25 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E995-04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM STP 269-1960 Atomic spectroscopy challenges
ASTM E2994-21 Standard Test Method for Analysis of Titanium and Titanium Alloys by Spark Atomic Emission Spectrometry and Glow Discharge Atomic Emission Spectrometry (Performance-Based Method)
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1452-92(1996) Practice of Preparation of Calibration Solutions for Spectroscopic and Atomic Spectroscopic Analysis
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM D6357-21 Standard Test Methods for Determination of Trace Elements in Coal, Coke, and Combustion Residues from Coal Utilization Processes by Inductively Coupled Plasma Atomic Emission Spectrometry, Inductively
ASTM E995-97 Standard Guide for Background Subtraction Techniques in Auger Electron and X-ray Photoelectron Spectroscopy
ASTM DS52-1974 NUCLEAR REACTOR NEUTRON ENERGY SPECTRA
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

Korean Agency for Technology and Standards (KATS)

KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15472-2025 Surface chemical analysis ― X-ray photoelectron spectrometers — Calibration of energy scales
KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS M 0016-2010 General rules for atomic absorption spectrochemical analysis
KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15470-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters

International Organization for Standardization (ISO)

ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 20473:2007 Optics and photonics - Spectral bands
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
ISO 13321:1996 Particle size analysis - Photon correlation spectroscopy
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 18118:2024 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 17852:2006 Water quality - Determination of mercury - Method using atomic fluorescence spectrometry
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 16129:2020-01 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51401 Beiblatt 1:2013-08 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401:2016 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN 51401 Beiblatt 1:2017-07 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51401:2016-11 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN 51401 E:2015-10 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN 51401 Beiblatt 1 E:2017-02 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401:2016-04 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN 51401 Beiblatt 1:2017 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401 E:2015 Draft Document - Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN 51401 Bb.1:2017 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401 Supplement 1 E:2017 Draft Document - Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401 Supplement 1 E:2017-02 Draft Document - Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 13321:2004 Particle size analysis - Photon correlation spectroscopy (ISO 13321:1996)

British Standards Institution (BSI)

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 20473:2007 Optics and photonics. Spectral bands
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
BS ISO 20903:2019 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 20903:2006 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS EN 62321-5:2014 Determination of certain substances in electrotechnical products. Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18118:2024 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 20473:2022 Optics and photonics — Spectral bands
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 20903:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
BH GSO ISO 13321:2016 Particle size analysis -- Photon correlation spectroscopy
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 18118:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

GCC Standardization Organization

GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 20473:2021 Optics and photonics — Spectral bands
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 13321:2013 Particle size analysis -- Photon correlation spectroscopy
GSO ISO 20903:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
GSO ISO/TR 18392:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
GSO ISO 11505:2015 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
GSO ISO 18118:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Japanese Industrial Standards Committee (JISC)

JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
JIS B 7079:2015 Optics and photonics -- Spectral bands
JIS K 1201-5:2024 Sodium carbonate for industrial use-Part 5: Determination of iron content-1, 10-Phenanthroline molecular absorption spectrometry, Atomic absorption spectrometry, Inductively coupled plasma atomic emission spectrometry
JIS K 1310-3:2024 Hydrochloric acid for industrial use-Part 3: Determination of iron content-1, 10-Phenanthroline molecular absorption spectrometry, Electrothermal type atomic absorption spectrometry, Inductively coupled plasma atomic emission spectrometry
JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS G 1258:1999 Iron and steel -- Methods for inductively coupled plasma atomic emission spectrometry

Association Francaise de Normalisation

NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF ISO 20473:2007 Optique et photonique - Bandes spectrales
NF S11-700*NF ISO 20473:2007 Optics and photonics - Spectral bands.
NF X43-275:2002 Air quality - Air in workplaces - Determination of elements present in the air in workplaces by atomic spectrometry
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
NF C05-100-4*NF EN 62321-4:2014 Determination of certain substances in electrotechnical products - Part 4 : mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP-OES and ICP-MS
NF EN ISO 17852:2008 Water quality - Mercury dosage - Atomic fluorescence spectrometry method

Standard Association of Australia （SAA）

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS 2134.1:1999 Recommended practice for chemical analysis by atomic absorption spectrometry - Flame atomic absorption spectrometry
AS 2134.1:1999(R2016) Recommended practice for chemical analysis by atomic absorption spectrometry - Flame atomic absorption spectrometry
AS 2134.1:1988 Recommended practice for chemical analysis by atomic absorption spectrometry - Flame atomic absorption spectrometry
AS 4549.1:1999 Particle size analysis - Photon correlation spectroscopy
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser

American National Standards Institute （ANSI)

ANSI/IES TM-27-20 IES STANDARD FORMAT FOR THE ELECTRONIC TRANSFER OF SPECTRAL DATA

Ente Nazionale Italiano di Unificazione

UNI EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis
UNI 9869:1991 Spectral Metamerism Index for light sources with continuous spectrum.

American Water Works Association (AWWA)

AWWA 51768 Identification of Low Pressure Reverse Osmosis Membrane Failure by X-Ray Photoelectron Spectroscopy

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC WP-008 CD-2005 Setting Up Ion Chromatography Capability
IPC WP-008-2005 Setting Up Ion Chromatography Capability