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Electron Spectroscopy

Electron Spectroscopy, Total:24 items.

The international standard classification for "Electron Spectroscopy" includes: Chemical analysis , Optical equipment , IT applications in science , Measurement of electrical and magnetic quantities , Optical measuring instruments .

The Chinese standard classification for "Electron Spectroscopy" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Basic standards and general methods , Electron optics and other physical optics instrument , Computer application , Integrated test system .


Professional Standard - Electron

  • SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy
  • SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

Professional Standard - Education

  • JY/T 013-1996 General rules for electron spectroscopic analysis

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
  • GB/T 19500-2025 Surface chemical analysis—General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • GB/T 35158-2017 Verification method for Auger electron spectrometers
  • GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
  • GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
  • GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy
  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
  • GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
  • GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
  • GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
  • GB/T 30702-2014 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis

Professional Standard - Machinery

  • JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method