GB/T 28893-2012 in English

SUPERSEDED

Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results

Issued on:2012-11-05
Implemented on:2013-06-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $240.00
$233.00

Standard No:	GB/T 28893-2012
Document status:	SUPERSEDED
Superseded by:	GB/T 28893-2024 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
Superseded on:	2024-10-01
Title in English:	Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
Title in Chinese:	表面化学分析俄歇电子能谱和X射线光电子能谱测定峰强度的方法和报告结果所需的信息
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2012-11-05
Implemented on:	2013-06-01
ICS Classification:	71.040.40-Chemical analysis
Chinese Classification:	G04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	x-ray photoelectron spectroscopy auger electron spectroscopy peak intensities peak intensity measurement method peak intensity measurements
Related Topics:	X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy Auger electrons and x-ray photoelectrons Auger Electron Spectroscopy X-ray Photoelectron Spectroscopy xps peak Auger spectroscopy and photoelectron spectroscopy energy spectrum X-ray Photoelectron Spectroscopy+ X-ray photoelectron spectroscopy Electron Spectroscopy aes Auger Electronics xps peak xps peak peak rate spectral peak splitting peak peak area X-ray Spectroscopy and Electron Spectroscopy spectral peak splitting peak intensity english xps and aes Infrared spectrum analysis peak to peak ray photoelectron spectroscopy aes auger spectrum photoelectron spectroscopy The energy spectrum peak position of lead Electron Spectrum High energy spectrum information What analysis is used for x-electron spectroscopy surface energy spectrum peak intensity english aes Auger Electron Spectroscopy How to split the spectrum Sensitivity of Auger Electron Spectroscopy aes auger electronics x-ray and auger electrons aes or xps Spectral peak shape and x-ray photoelectron spectroscopy X-ray Photoelectron Spectroscopy X-ray photoelectron spectroscopy test. spectral line X-ray Photoelectron Spectroscopy Auger Electron Spectroscopy Auger electrons and x-rays Peak area Electron Photoelectron Spectroscopy Auger electron beam Auger Electron Optoelectronics Photoelectric Spectroscopy Fitted peak Spectral peak area x-ray auger x-electron spectroscopy X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy Electronic Auger Electric Female Peak strength aes and xps Light peak intensity Spectral peak change aes Auger Electron Spectrum x Transmission spectrum peak X-ray photoelectron spectroscopy and its applications spectral kurtosis overlapping peaks Peak Intensity Peak Area x-ray optoelectronics auger electrons The peak of the transmission spectrum Auger Electron Spectroscopy Results Peak separation surface spectrum aes Auger Electron Spectroscopy spectral kurtosis Auger Peak peak separation Base peak for mass spectrometry Spectrum + peak area Analysis in mass spectrometry results Spectral peak area Spectral peak area X-ray Auger Electron Spectroscopy Peak Spectrum Auger aes X-ray Auger Electron Spectroscopy Auger Electronics and Optoelectronics electron ray spectrum Analysis of energy spectrum results spectral line x-ray photoelectron spectral peak area method energy spectrum x-ray energy spectrum Spectrum and peaks x-ray peak energy spectroscopy sum peak energy spectrum Secondary electrons and backscattered electrons X-rays and Auger photoelectron energy Auger Electron Spectroscopy Ion Sputtering Auger Electron Optoelectronics Auger Electron Spectroscopy and X-rays Auger electrons and x-rays spectrum electron auger electronics and x Partition of the emission spectrum ftir spectrum analysis peak Electron Spectroscopy and Energy Spectroscopy Photoelectron Spectroscopy and Auger Electrons Mass Spectrometry Molecular Peaks Mass spectrum molecular weight peak Auger spectrum Peak Purity Report Peak Purity Report Photoelectron Spectroscopy and Auger Electron Spectroscopy AES Auger Electron Spectrum Peaks and spectrum peak broadening Spectrum and Determination method report x-ray peak spectral peak peak peak area Chromatographic peak performance Electron Spectroscopy Spectral range electron x-ray spectrum spectral peak aes electron spectroscopy x-ray photoelectron spectroscopy x-ray photoelectron spectroscopy Auger peak analysis Auger electron peak Electron Spectrum- spectral ct peak photoelectron spectroscopy Peak height + peak area Titanium peak splitting How to Analyze Spectrum Results Auger electron x-ray Spectral peak+ hyperspectral peak spectral peak Spectrum+Peak+ surface electron spectroscopy Auger Electron Spectroscopy Sputtering Auger Electron Spectroscopy Analysis Report Auger electrons and x-rays x-rays and auger electrons x-photoelectron spectroscopy General Rules of X-ray Photoelectron Spectroscopy Analysis Methods xps aes Auger intensity Spectrometer and Peak Peak shape change zero peak in energy spectrum Spectrum results Auger peak aes electron spectrum Surface Atomic Energy Spectroscopy x spectrum Auger intensity Quantitative Analysis of Auger Electron Spectroscopy Auger intensity Auger Electron Surface Mass spectrometry peaks are small Auger electron + x-ray differential spectrum Auger Electron Spectroscopy Auger Surface Analysis Mass Spectrum Peak Intensity Ratio xps photoelectron spectroscopy Electron energy range xps peak+ xps photoelectron spectroscopy How to analyze the results of energy spectrum Auger Electron Spectroscopy vs X-rays Auger electron beam Auger rays Electron Spectroscopy Line intensity Spectral Method Report Single Electron Spectroscopy X-ray photoelectron spectroscopy Auger Electron Surface Electron Spectroscopy X-ray Photoelectron Spectroscopy Auger Electron Method Subspectrum X-ray photoelectron spectroscopy sample preparation method Sample Preparation for X-ray Photoelectron Spectroscopy How to determine the Auger electron peak in x-ray photoelectron spectroscopy xps measurement peak peak broadening How to analyze the results of energy spectrum Mass spectrum peak molecular weight How to use electron spectroscopy Auger Electron Spectroscopy and X-rays spectral kurtosis technique Auger Electron Spectroscopy Surface Quantitative Analysis Relative intensities of mass spectral peaks Mass spectral intensity peak x-ray photoelectron spectroscopy spectral kurtosis technique xps peak+ electron x-ray UV spectrum peak intensity UV photoelectron and X-ray photoelectron spectroscopy Auger Electron Spectroscopy Rays xps and aes x-ray peak broadening Peak Intensity Peak Area Secondary electrons and backscattering How to analyze Auger Peak Auger Electron Optoelectronics Secondary Electronics Auger electrons and x-ray photoelectrons Mass spectrum peak molecular weight Ray Intensity Method Base Peaks in Mass Spectrometry Spectrum of each electron Detection Analysis of X-ray Photoelectron Spectroscopy X-ray photoelectron spectroscopy test Auger Electron Spectroscopy Surface Inspection xps + peak Spectral peaks are based on Auger peak peak intensity spectral peak X-ray photoelectron spectrum peaks Photoelectron spectroscopy and X-ray spectroscopy Peak area + peak ratio of mass spectral peak intensities Ion peak intensity peak intensity How to semi-quantitatively analyze the Auger peak UV Photoelectron Spectroscopy and X-ray Photoelectron Spectroscopy Auger Peak Quantitative Analysis Peak area Peak intensity mass spectrometry molecular kurtosis Ion peak intensity spectral g peak Auger x-ray energy spectrum rays Spectrum x x-ray peak intensity Ion peak intensity Spectrum peak position Spectrum x UV spectrum peak intensity Electron Spectrum spectral intensity Sequencing result nesting spectral rays What does x-ray photoelectron spectroscopy measure? Multiplets in photoelectron spectra Positive and negative peaks in mass spectrum intensity of x-rays x-ray absorption spectrum peak position integrated peak GBT28893 GB/T 28893-2012 Intensity in spectral analysis table Analysis of the results of using electronic balance gb/t 28893-2024 gbt 28893-2024

《GB/T 28893-2012表面化学分析俄歇电子能谱和X射线光电子能谱测定峰强度的方法和报告结果所需的信息》由TC38（全国微束分析标准化技术委员会）归口，TC38SC2（全国微束分析标准化技术委员会表面化学分析分会）执行，主管部门为国家标准化管理委员会。

Scope

This standard specifies the necessary information required in the report of the analytical results of the peak intensity measurements of Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy. Information is provided on the uncertainty of the peak intensity measurement method and the resulting peak area.

More samples: DL/T 368-2010 JGJ 94-2008 GB 50021-2001(2009)

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