xps and aes
xps and aes, Total:25 items.
The international standard classification for "xps and aes" includes: Chemical analysis , Cellular materials , Thermal insulation .
The Chinese standard classification for "xps and aes" includes: Basic standards and general methods , Synthetic resin and plastic , Building construction and decoration engineering .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- GB/T 10801.2-2018 Rigid extruded polystyrene foam board for thermal insulation(XPS)
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- GB/T 30595-2024 Extruded polystyrene（XPS）board system for building thermal insulation
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
- GB/T 10801.2-2002 extruded polystyrene foam board for thermal insulation (XPS)
Shandong Provincial Standard of the People's Republic of China
- DB37/T 2532-2014 XPS extruded foam sheet production line
Group Standards of the People's Republic of China
- T/CPPIA 21-2022 Extruded polystyrene foam(XPS) board for floor heating
工业和信息化部
- QB/T 5167-2017 Extruded polystyrene foam board (XPS) for civil engineering application
- QB/T 5166-2017 Extruded polystyrene foam board (XPS) for cold storages
Liaoning Provincial Standard of the People's Republic of China
- DB21/T 2545-2015 XPS Composite Formwork External Thermal Insulation System Technical Regulations
International Organization for Standardization (ISO)
- ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
IETF - Internet Engineering Task Force
- RFC 6188-2011 The Use of AES-192 and AES-256 in Secure RTP
- RFC 8442-2018 ECDHE_PSK with AES-GCM and AES-CCM Cipher Suites for TLS 1.2 and DTLS 1.2
- RFC 5084-2007 Using AES-CCM and AES-GCM Authenticated Encryption in the Cryptographic Message Syntax (CMS)
British Standards Institution (BSI)
- BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
SCC
- 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
GM North America
- GM GMP.AES.001-1990 AES - Weather Resistant, Integrally Colored
Korean Agency for Technology and Standards (KATS)
- KS M 1062-2005 Determination of lead(Pb) and cadmium(Cd) in electronics byICP－AES/MS and AAS
- KS M 1064-2005 Determination of lead(Pb) and cadmium(Cd) in metals byICP－AES/MS and AAS
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